MD419Y - Device for high-precision measurement of critical temperature of superconducting samples - Google Patents

Device for high-precision measurement of critical temperature of superconducting samples Download PDF

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Publication number
MD419Y
MD419Y MDS20100207A MDS20100207A MD419Y MD 419 Y MD419 Y MD 419Y MD S20100207 A MDS20100207 A MD S20100207A MD S20100207 A MDS20100207 A MD S20100207A MD 419 Y MD419 Y MD 419Y
Authority
MD
Moldova
Prior art keywords
superconducting
critical temperature
precision measurement
chamber
samples
Prior art date
Application number
MDS20100207A
Other languages
Moldavian (mo)
Romanian (ro)
Inventor
Anatol Sidorenco
Andrei Surdu
Original Assignee
Inst De Ing Electronica Si Tehnologii Ind
Inst De Ing Electronic & Abreve & Scedil I Tehnologii Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inst De Ing Electronica Si Tehnologii Ind, Inst De Ing Electronic & Abreve & Scedil I Tehnologii Ind filed Critical Inst De Ing Electronica Si Tehnologii Ind
Priority to MDS20100207A priority Critical patent/MD419Z/en
Publication of MD419Y publication Critical patent/MD419Y/en
Publication of MD419Z publication Critical patent/MD419Z/en

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Abstract

The invention relates to electronic engineering for high-precision measurement of properties of films of superconducting materials and can be used in the manufacture of superconducting films with well-defined parameters.The device for high-precision measurement of critical temperature of superconducting samples includes a heat exchanger (1), connected through a holder (2) to a vacuum chamber (4), in which are placed a sample (6) and a thermometer (3). The chamber (4) is equipped with a conical cover (5), in which is made a through channel (7), whereby the chamber (4) is connected to a vacuum pump (8). The holder (2), the vacuum chamber (4) and the cover (5) are made of copper.The technical result is to increase the accuracy of measurement of critical temperature of superconducting samples.
MDS20100207A 2010-12-01 2010-12-01 Device for high-precision measurement of critical temperature of superconducting samples MD419Z (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
MDS20100207A MD419Z (en) 2010-12-01 2010-12-01 Device for high-precision measurement of critical temperature of superconducting samples

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MDS20100207A MD419Z (en) 2010-12-01 2010-12-01 Device for high-precision measurement of critical temperature of superconducting samples

Publications (2)

Publication Number Publication Date
MD419Y true MD419Y (en) 2011-09-30
MD419Z MD419Z (en) 2012-04-30

Family

ID=45815283

Family Applications (1)

Application Number Title Priority Date Filing Date
MDS20100207A MD419Z (en) 2010-12-01 2010-12-01 Device for high-precision measurement of critical temperature of superconducting samples

Country Status (1)

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MD (1) MD419Z (en)
  • 2010

Also Published As

Publication number Publication date
MD419Z (en) 2012-04-30

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Legal Events

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KA4Y Short-term patent lapsed due to non-payment of fees (with right of restoration)