MA43424A - Système et procédé de détection de défauts dans des surfaces spéculaires ou semi-spéculaires par projection photogrammétrique - Google Patents

Système et procédé de détection de défauts dans des surfaces spéculaires ou semi-spéculaires par projection photogrammétrique

Info

Publication number
MA43424A
MA43424A MA043424A MA43424A MA43424A MA 43424 A MA43424 A MA 43424A MA 043424 A MA043424 A MA 043424A MA 43424 A MA43424 A MA 43424A MA 43424 A MA43424 A MA 43424A
Authority
MA
Morocco
Prior art keywords
specular
defects
semi
detection
photogrammetric projection
Prior art date
Application number
MA043424A
Other languages
English (en)
Inventor
Martín Juan José Aguilar
Carnicer David Samper
Mazo Jorge Santolaria
Sancho Jesús Velázquez
Original Assignee
Univ Zaragoza
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Zaragoza filed Critical Univ Zaragoza
Publication of MA43424A publication Critical patent/MA43424A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/02—Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g. controlling overlapping of pictures
    • G01C11/025—Picture taking arrangements specially adapted for photogrammetry or photographic surveying, e.g. controlling overlapping of pictures by scanning the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C11/00—Photogrammetry or videogrammetry, e.g. stereogrammetry; Photographic surveying
    • G01C11/04—Interpretation of pictures
    • G01C11/06—Interpretation of pictures by comparison of two or more pictures of the same area
    • G01C11/12—Interpretation of pictures by comparison of two or more pictures of the same area the pictures being supported in the same relative position as when they were taken
    • G01C11/14—Interpretation of pictures by comparison of two or more pictures of the same area the pictures being supported in the same relative position as when they were taken with optical projection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
MA043424A 2015-12-07 2016-12-07 Système et procédé de détection de défauts dans des surfaces spéculaires ou semi-spéculaires par projection photogrammétrique MA43424A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES201531776A ES2630736B1 (es) 2015-12-07 2015-12-07 Sistema y método de detección de defectos en superficies especulares o semi-especulares mediante proyección fotogramétrica

Publications (1)

Publication Number Publication Date
MA43424A true MA43424A (fr) 2018-10-17

Family

ID=59013749

Family Applications (1)

Application Number Title Priority Date Filing Date
MA043424A MA43424A (fr) 2015-12-07 2016-12-07 Système et procédé de détection de défauts dans des surfaces spéculaires ou semi-spéculaires par projection photogrammétrique

Country Status (5)

Country Link
EP (1) EP3388781B1 (fr)
ES (1) ES2630736B1 (fr)
MA (1) MA43424A (fr)
PL (1) PL3388781T3 (fr)
WO (1) WO2017098071A1 (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020021808A1 (fr) * 2018-07-26 2020-01-30 コニカミノルタ株式会社 Dispositif et procédé d'inspection de surface
WO2020188319A1 (fr) * 2019-03-19 2020-09-24 Dehghanian Hosseinali Système d'inspection basé sur la réalité augmentée photogrammétrique
DE102019209934B4 (de) 2019-07-05 2024-02-15 Psa Automobiles Sa Elektronisches Gerät und Verfahren zur Visualisierung von Oberflächendefekten eines Werkstücks
GB2582397B (en) * 2019-10-04 2022-05-18 Degould Ltd Vehicle imaging station
WO2021099648A1 (fr) * 2019-11-18 2021-05-27 Asociacion Centro Tecnologico Ceit Système de contrôle tridimensionnel par vision photométrique
WO2021151412A1 (fr) * 2020-01-27 2021-08-05 Jan Nabatian Dispositif et procédé de détection automatique de dommages sur des véhicules
CN111650208B (zh) * 2020-06-01 2021-08-27 东华大学 一种巡游式机织面料疵点在线检测器
DE102020215599A1 (de) 2020-12-10 2022-06-15 Psa Automobiles Sa Vorrichtung zur Kennzeichnung von Oberflächendefekten auf einem Werkstück
DE102021202329A1 (de) 2021-03-10 2022-09-15 Psa Automobiles Sa Bearbeitungsgerät und System zur Bearbeitung von Oberflächendefekten von Werkstücken
CN113639714B (zh) * 2021-08-04 2023-09-26 深圳市亚锐智能科技有限公司 一种基于铝金属片金属片数量检测设备
CN114527072A (zh) * 2022-02-05 2022-05-24 上海研视信息科技有限公司 一种基于结构光扫描的钢板缺陷检测系统
CN115541598B (zh) * 2022-08-24 2024-05-14 深圳市二郎神视觉科技有限公司 汽车外观检测方法、装置及系统
CN116106330B (zh) * 2023-04-17 2023-06-20 武汉名杰模塑有限公司 一种汽车保险杠漆面缺陷检测装置及其检测方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3712513A1 (de) * 1987-04-13 1988-11-03 Roth Electric Gmbh Verfahren und vorrichtung zur erkennung von oberflaechenfehlern
US5477268A (en) * 1991-08-08 1995-12-19 Mazda Motor Corporation Method of and apparatus for finishing a surface of workpiece
US5471307A (en) * 1992-09-21 1995-11-28 Phase Shift Technology, Inc. Sheet flatness measurement system and method
JP2976869B2 (ja) * 1995-12-28 1999-11-10 日産自動車株式会社 表面欠陥検査装置
DE19944354C5 (de) * 1999-09-16 2011-07-07 Häusler, Gerd, Prof. Dr., 91056 Verfahren und Vorrichtung zur Vermessung von spiegelnden oder transparenten Prüflingen
US6266138B1 (en) * 1999-10-12 2001-07-24 Perceptron, Inc. System and method for detecting defects in a surface of a workpiece
JP3871963B2 (ja) * 2002-05-16 2007-01-24 住友化学株式会社 表面検査装置及び表面検査方法
US8705043B2 (en) * 2009-12-14 2014-04-22 Academia Sinica Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope
US20130057678A1 (en) * 2010-05-17 2013-03-07 Ford Espana S.L. Inspection system and method of defect detection on specular surfaces
CN102445167A (zh) * 2010-09-30 2012-05-09 旭硝子株式会社 表面形状的评价方法以及评价装置

Also Published As

Publication number Publication date
EP3388781A4 (fr) 2019-07-24
WO2017098071A1 (fr) 2017-06-15
EP3388781B1 (fr) 2023-06-07
PL3388781T3 (pl) 2023-10-16
ES2630736B1 (es) 2018-07-04
EP3388781C0 (fr) 2023-06-07
ES2630736A1 (es) 2017-08-23
EP3388781A1 (fr) 2018-10-17

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