LU51375A1 - - Google Patents
Info
- Publication number
- LU51375A1 LU51375A1 LU51375A LU51375A LU51375A1 LU 51375 A1 LU51375 A1 LU 51375A1 LU 51375 A LU51375 A LU 51375A LU 51375 A LU51375 A LU 51375A LU 51375 A1 LU51375 A1 LU 51375A1
- Authority
- LU
- Luxembourg
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
- G01T1/40—Stabilisation of spectrometers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/204—Measuring radiation intensity with scintillation detectors the detector being a liquid
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH897865A CH466876A (de) | 1965-06-26 | 1965-06-26 | Verfahren zur automatischen Kompensation der durch die Fluoreszenzlösung bedingten Instabilitätsfaktoren |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| LU51375A1 true LU51375A1 (OSRAM) | 1966-08-22 |
Family
ID=4346958
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| LU51375A LU51375A1 (OSRAM) | 1965-06-26 | 1966-06-21 |
Country Status (6)
| Country | Link |
|---|---|
| BE (1) | BE683094A (OSRAM) |
| CH (1) | CH466876A (OSRAM) |
| DE (1) | DE1623050B2 (OSRAM) |
| GB (1) | GB1152985A (OSRAM) |
| LU (1) | LU51375A1 (OSRAM) |
| NL (1) | NL163631C (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109814149A (zh) * | 2019-01-01 | 2019-05-28 | 中国人民解放军63653部队 | 基于屏蔽膜的锶-90快速低干扰测量技术 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4002909A (en) * | 1967-09-28 | 1977-01-11 | Packard Instrument Company, Inc. | Data analyzing system having provision for optimizing counting conditions and thus improving statistical counting validity for enabling accurate computation of sample activity levels in liquid scintillation spectrometry |
| CN115097513B (zh) * | 2022-06-20 | 2023-03-21 | 上海市计量测试技术研究院 | 能谱计数窗口的定位方法、装置、电子设备及存储介质 |
| CN116088026A (zh) * | 2022-12-15 | 2023-05-09 | 中国辐射防护研究院 | 一种闪烁液淬灭度评估方法 |
| CN116594054B (zh) * | 2023-07-18 | 2023-09-26 | 清华大学 | 一种233Pa标准γ源及其制备方法和应用 |
-
1965
- 1965-06-26 CH CH897865A patent/CH466876A/de unknown
-
1966
- 1966-06-16 GB GB2700066A patent/GB1152985A/en not_active Expired
- 1966-06-21 LU LU51375A patent/LU51375A1/xx unknown
- 1966-06-24 NL NL6608811A patent/NL163631C/xx active
- 1966-06-24 BE BE683094D patent/BE683094A/xx unknown
- 1966-06-27 DE DE1966S0104466 patent/DE1623050B2/de active Granted
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109814149A (zh) * | 2019-01-01 | 2019-05-28 | 中国人民解放军63653部队 | 基于屏蔽膜的锶-90快速低干扰测量技术 |
| CN109814149B (zh) * | 2019-01-01 | 2023-05-05 | 中国人民解放军63653部队 | 一种可用于锶-90直接测量的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| NL163631C (nl) | 1980-09-15 |
| DE1623050B2 (de) | 1977-01-20 |
| CH466876A (de) | 1968-12-31 |
| DE1623050A1 (de) | 1971-01-14 |
| NL6608811A (OSRAM) | 1966-12-27 |
| BE683094A (OSRAM) | 1966-12-01 |
| GB1152985A (en) | 1969-05-21 |