KR970072223A - A semiconductor manufacturing apparatus. - Google Patents
A semiconductor manufacturing apparatus. Download PDFInfo
- Publication number
- KR970072223A KR970072223A KR1019960010509A KR19960010509A KR970072223A KR 970072223 A KR970072223 A KR 970072223A KR 1019960010509 A KR1019960010509 A KR 1019960010509A KR 19960010509 A KR19960010509 A KR 19960010509A KR 970072223 A KR970072223 A KR 970072223A
- Authority
- KR
- South Korea
- Prior art keywords
- cooling
- lead frame
- semiconductor manufacturing
- manufacturing apparatus
- heater
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 8
- 239000004065 semiconductor Substances 0.000 title claims abstract description 8
- 238000001816 cooling Methods 0.000 claims abstract 9
- 239000000112 cooling gas Substances 0.000 claims abstract 7
- 238000010438 heat treatment Methods 0.000 claims abstract 7
- 239000000853 adhesive Substances 0.000 claims abstract 5
- 230000001070 adhesive effect Effects 0.000 claims abstract 5
- 238000007599 discharging Methods 0.000 claims abstract 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract 2
- 229910001873 dinitrogen Inorganic materials 0.000 claims abstract 2
- 239000007789 gas Substances 0.000 claims 2
- 230000001105 regulatory effect Effects 0.000 claims 2
- 239000011347 resin Substances 0.000 claims 1
- 229920005989 resin Polymers 0.000 claims 1
- 239000004593 Epoxy Substances 0.000 abstract 1
- 230000002950 deficient Effects 0.000 abstract 1
- 230000006866 deterioration Effects 0.000 abstract 1
- 238000004904 shortening Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/60—Attaching or detaching leads or other conductive members, to be used for carrying current to or from the device in operation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Die Bonding (AREA)
Abstract
본 발명은 반도체 제조장치에 관한 것으로서, 특히 다수의 칩을 접착제로 접착시킨 리드 프레임을 이송시키면서 히터에서 발생되는 열을 비접촉식으로 간접 가열하여 상기 접착제를 경화시키는 가열경화수단과, 상기 가열경화수단에서 가열된 리드 프레임 및 칩에 냉각 가스를 토출하여 강제적으로 냉각시키는 냉각수단을 구비하는 것을 특징으로 한다.The present invention relates to a semiconductor manufacturing apparatus and, more particularly, to a semiconductor manufacturing apparatus which includes a heating curing unit for indirectly heating a heat generated in a heater while transferring a lead frame to which a plurality of chips are bonded with an adhesive to cure the adhesive, And cooling means for forcibly cooling the heated lead frame and the chip by discharging the cooling gas.
따라서, 본 발명에서는 에폭시 등의 접착제에 의해 접착된 리드 프레임 및 칩이 히터에서 발생된 열을 비접촉식으로 전달 받아서 가열경화된 후 질소 가스 등의 냉각 가스에 의해 강제적으로 냉각됨으로써 직접 가열에 의한 리드 프레임 및 칩의 열화나 특성 변화 등의 발생을 방지함과 동시에 변형 등에 의한 불량율의 발생을 최소화할 수 있으며, 특히 대기 시간을 단축시켜 생산성을 향상시킬 수 있는 등의 여러 가지 효과가 있다.Therefore, in the present invention, the lead frame and the chip bonded by an adhesive such as epoxy are received in a non-contact manner and heat-cured, and then forcedly cooled by a cooling gas such as nitrogen gas, And deterioration of the chip and change in characteristics, and at the same time, it is possible to minimize the occurrence of defective rate due to deformation and the like, and in particular, productivity can be improved by shortening the standby time.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is a trivial issue, I did not include the contents of the text.
제1도는 본 발명에 따른 반도체 제조장치를 도시한 개략적인 평면도이다.FIG. 1 is a schematic plan view showing a semiconductor manufacturing apparatus according to the present invention.
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019960010500A KR100196389B1 (en) | 1996-04-08 | 1996-04-08 | Apparatus for manufacturing semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019960010500A KR100196389B1 (en) | 1996-04-08 | 1996-04-08 | Apparatus for manufacturing semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970072223A true KR970072223A (en) | 1997-11-07 |
KR100196389B1 KR100196389B1 (en) | 1999-06-15 |
Family
ID=19455273
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960010500A KR100196389B1 (en) | 1996-04-08 | 1996-04-08 | Apparatus for manufacturing semiconductor device |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100196389B1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100302198B1 (en) * | 1998-03-17 | 2001-11-30 | 서경석 | Semiconductor fabrication equipment |
-
1996
- 1996-04-08 KR KR1019960010500A patent/KR100196389B1/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100302198B1 (en) * | 1998-03-17 | 2001-11-30 | 서경석 | Semiconductor fabrication equipment |
Also Published As
Publication number | Publication date |
---|---|
KR100196389B1 (en) | 1999-06-15 |
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FPAY | Annual fee payment |
Payment date: 20130130 Year of fee payment: 15 |
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