KR970064189U - Probing point alignment device for wafer probe station - Google Patents

Probing point alignment device for wafer probe station

Info

Publication number
KR970064189U
KR970064189U KR2019960012853U KR19960012853U KR970064189U KR 970064189 U KR970064189 U KR 970064189U KR 2019960012853 U KR2019960012853 U KR 2019960012853U KR 19960012853 U KR19960012853 U KR 19960012853U KR 970064189 U KR970064189 U KR 970064189U
Authority
KR
South Korea
Prior art keywords
alignment device
probe station
wafer probe
point alignment
probing point
Prior art date
Application number
KR2019960012853U
Other languages
Korean (ko)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019960012853U priority Critical patent/KR970064189U/en
Publication of KR970064189U publication Critical patent/KR970064189U/en

Links

KR2019960012853U 1996-05-22 1996-05-22 Probing point alignment device for wafer probe station KR970064189U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019960012853U KR970064189U (en) 1996-05-22 1996-05-22 Probing point alignment device for wafer probe station

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019960012853U KR970064189U (en) 1996-05-22 1996-05-22 Probing point alignment device for wafer probe station

Publications (1)

Publication Number Publication Date
KR970064189U true KR970064189U (en) 1997-12-11

Family

ID=60925962

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019960012853U KR970064189U (en) 1996-05-22 1996-05-22 Probing point alignment device for wafer probe station

Country Status (1)

Country Link
KR (1) KR970064189U (en)

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