KR970049526A - Reset generation circuit - Google Patents
Reset generation circuit Download PDFInfo
- Publication number
- KR970049526A KR970049526A KR1019950058888A KR19950058888A KR970049526A KR 970049526 A KR970049526 A KR 970049526A KR 1019950058888 A KR1019950058888 A KR 1019950058888A KR 19950058888 A KR19950058888 A KR 19950058888A KR 970049526 A KR970049526 A KR 970049526A
- Authority
- KR
- South Korea
- Prior art keywords
- output
- gate
- data
- registers
- latch
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0793—Remedial or corrective actions
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/24—Resetting means
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Microcomputers (AREA)
- Electronic Switches (AREA)
Abstract
본 발명은 사용자의 잘못된 프로그램에 내부 폭주시 IC내의 레지스터들을 리셋시키는 리셋트 발생회로에 관한 것으로서, 특히 집적회로 내부의 폭주를 감지하는 폭주 감지부와, 데이타 버스를 통해 데이타가 입력되면 클럭에 동기되어 입력된 데이타를 출력하고 내부 리셋트 신호에 의해 클리어되는 D 플립플롭과, 상기 폭주 감지부의 반전 출력과 상기 D 플립플롭의 출력을 논리 조합하는 앤드 게이트와, 상기 앤드 게이트의 출력을 소정시간 래치시키는 R-S 래치와, 상기 R-S 래치의 반적 출력에 의해 초기화되는 N(여기서, N은자연수)개의 레지스터로 이루어진 데이타 레지스터와, 일측은 공통으로 접지되고 일측은 상기 데이타 레지스터의 N개의 Q 출력단에 각각 연결되는 N개의 배타적 노아 게이트와, 배타적 노아 게이트의 출력에 의해 각각 턴온/턴오프되는 직렬 결합의 N개의 N모스 트랜지스터와, 상기 배타적 노아 게이트의 출력에 의해 각각 턴온/턴오프되는 병렬 결합의 N개의 P모스 트랜지스터로 구성되고 상기 N모스 트랜지스터의 드레인단과 P모스 트랜지스터의 소오스단은 공통으로 상기 R-S 래치의 셋트단에 인버터를 통해 연결되어, IC폭주시 IC내의 모든 레지스터들이 초기화될때까지 내부 리셋트 신호를 지연시킴으로써, IC의 고집적, 대용량화에 따라 칩의 사이즈가 커져 상기 내부 리셋트 신호에 의해 초기화되어야 하는 레지스터의 숫자가 많아져도 내부 리셋트 신호의 펄스폭의 감쇠없이 IC내의 레지스터들을 모두 정확하게 리셋시킬 수 있다.The present invention relates to a reset generation circuit for resetting the registers in the IC when the internal runaway to the user's wrong program, in particular a runaway detector for detecting runaway in the integrated circuit, and synchronized with the clock when data is input through the data bus Outputs the input data and is cleared by an internal reset signal, an AND gate configured to logically combine an inverted output of the congestion detecting unit and an output of the D flip-flop, and latches the output of the AND gate for a predetermined time. And a data register consisting of N registers (where N is a natural number), which is initialized by the RS output of the RS latch, and one side is commonly grounded, and one side is connected to each of the N Q output terminals of the data register. N exclusive Noah gates and the outputs of the exclusive Noah gates are turned on and off respectively. Is composed of N N-MOS transistors in series coupling and N P-MOS transistors in parallel coupling turned on / off by an output of the exclusive NOR gate, respectively, and a drain terminal of the N-MOS transistor and a source terminal of the P-MOS transistor are It is commonly connected to the set terminal of the RS latch through an inverter, and delays the internal reset signal until all registers in the IC are initialized during IC congestion, thereby increasing the size of the chip according to the high integration and large capacity of the IC. Even if the number of registers to be initialized by the signal is large, all registers in the IC can be accurately reset without attenuation of the pulse width of the internal reset signal.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제3도는 본 발명에 따른 리셋트 발생 회로도.3 is a reset generation circuit diagram according to the present invention.
제4도는 상기 제3도의 각 부의 동작 파형도.4 is an operational waveform diagram of each part of FIG.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950058888A KR0161863B1 (en) | 1995-12-27 | 1995-12-27 | Reset generator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950058888A KR0161863B1 (en) | 1995-12-27 | 1995-12-27 | Reset generator |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970049526A true KR970049526A (en) | 1997-07-29 |
KR0161863B1 KR0161863B1 (en) | 1999-01-15 |
Family
ID=19445110
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950058888A KR0161863B1 (en) | 1995-12-27 | 1995-12-27 | Reset generator |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0161863B1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100471137B1 (en) * | 1997-10-31 | 2005-06-07 | 삼성전자주식회사 | Data processor having reduced register-clear-instruction execution cycles |
KR100519285B1 (en) * | 1998-03-20 | 2005-11-25 | 엘지전자 주식회사 | Apparatus and method for delaying bus reset |
-
1995
- 1995-12-27 KR KR1019950058888A patent/KR0161863B1/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100471137B1 (en) * | 1997-10-31 | 2005-06-07 | 삼성전자주식회사 | Data processor having reduced register-clear-instruction execution cycles |
KR100519285B1 (en) * | 1998-03-20 | 2005-11-25 | 엘지전자 주식회사 | Apparatus and method for delaying bus reset |
Also Published As
Publication number | Publication date |
---|---|
KR0161863B1 (en) | 1999-01-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5852373A (en) | Static-dynamic logic circuit | |
KR910013734A (en) | Noise-Tolerant Input Buffers | |
JP3820559B2 (en) | Mode register set circuit of semiconductor device | |
US6052008A (en) | Generation of true and complement signals in dynamic circuits | |
KR970002666A (en) | Address buffer blocks noise | |
KR920001523A (en) | Semiconductor integrated circuit including detection circuit | |
KR970049526A (en) | Reset generation circuit | |
KR970078020A (en) | Memory devices including latch circuits | |
JPH03192915A (en) | Flip-flop | |
TW367653B (en) | Division circuit of 4/5 | |
KR970022759A (en) | Memory address transition detection circuit | |
KR100303073B1 (en) | Clock generator for cmos circuits with dynamic registers | |
US6737888B1 (en) | Method for skipping a latch in timing-sensitive dynamic circuits of a multi-clocked system with unspecific underlap requirement | |
JP2000295081A (en) | Register circuit and latch circuit | |
JP3012276B2 (en) | Output circuit | |
KR850004180A (en) | Semiconductor integrated devices | |
KR930001172Y1 (en) | Cmos logic element integrated circuit | |
KR970007263B1 (en) | Micro controller test rom | |
KR910002131A (en) | Sequential multi-processing counter | |
KR940005872Y1 (en) | Output buffer | |
SU832726A1 (en) | Address register | |
KR920003276B1 (en) | Sequential "1" detecting circuit | |
KR950003849Y1 (en) | D flip-flop | |
KR0172769B1 (en) | Write-recovery circuit of static ram | |
SU1148114A1 (en) | Logic element |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20050718 Year of fee payment: 8 |
|
LAPS | Lapse due to unpaid annual fee |