KR970046792U - Pogo pin for connecting the probe card of the semiconductor memory tester - Google Patents

Pogo pin for connecting the probe card of the semiconductor memory tester

Info

Publication number
KR970046792U
KR970046792U KR2019950039680U KR19950039680U KR970046792U KR 970046792 U KR970046792 U KR 970046792U KR 2019950039680 U KR2019950039680 U KR 2019950039680U KR 19950039680 U KR19950039680 U KR 19950039680U KR 970046792 U KR970046792 U KR 970046792U
Authority
KR
South Korea
Prior art keywords
semiconductor memory
probe card
pogo pin
memory tester
tester
Prior art date
Application number
KR2019950039680U
Other languages
Korean (ko)
Other versions
KR0134905Y1 (en
Inventor
박병옥
김도경
Original Assignee
현대전자산업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대전자산업주식회사 filed Critical 현대전자산업주식회사
Priority to KR2019950039680U priority Critical patent/KR0134905Y1/en
Publication of KR970046792U publication Critical patent/KR970046792U/en
Application granted granted Critical
Publication of KR0134905Y1 publication Critical patent/KR0134905Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR2019950039680U 1995-12-11 1995-12-11 Pogo pin for probe card connection of semiconductor memory tester KR0134905Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950039680U KR0134905Y1 (en) 1995-12-11 1995-12-11 Pogo pin for probe card connection of semiconductor memory tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950039680U KR0134905Y1 (en) 1995-12-11 1995-12-11 Pogo pin for probe card connection of semiconductor memory tester

Publications (2)

Publication Number Publication Date
KR970046792U true KR970046792U (en) 1997-07-31
KR0134905Y1 KR0134905Y1 (en) 1999-03-20

Family

ID=19432950

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950039680U KR0134905Y1 (en) 1995-12-11 1995-12-11 Pogo pin for probe card connection of semiconductor memory tester

Country Status (1)

Country Link
KR (1) KR0134905Y1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100734296B1 (en) * 2005-12-19 2007-07-02 삼성전자주식회사 Socket pin having a self cleaning function and test apparatus including the socket pin

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100403039B1 (en) * 1996-12-14 2003-12-18 삼성전자주식회사 Method for mounting and demounting removable jig for hard disk drive test using pogo-pin

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100734296B1 (en) * 2005-12-19 2007-07-02 삼성전자주식회사 Socket pin having a self cleaning function and test apparatus including the socket pin

Also Published As

Publication number Publication date
KR0134905Y1 (en) 1999-03-20

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20090922

Year of fee payment: 12

LAPS Lapse due to unpaid annual fee