KR970046787U - Socket for package inspection - Google Patents

Socket for package inspection

Info

Publication number
KR970046787U
KR970046787U KR2019950038648U KR19950038648U KR970046787U KR 970046787 U KR970046787 U KR 970046787U KR 2019950038648 U KR2019950038648 U KR 2019950038648U KR 19950038648 U KR19950038648 U KR 19950038648U KR 970046787 U KR970046787 U KR 970046787U
Authority
KR
South Korea
Prior art keywords
socket
package inspection
inspection
package
Prior art date
Application number
KR2019950038648U
Other languages
Korean (ko)
Other versions
KR200148615Y1 (en
Inventor
김형익
Original Assignee
엘지반도체주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지반도체주식회사 filed Critical 엘지반도체주식회사
Priority to KR2019950038648U priority Critical patent/KR200148615Y1/en
Publication of KR970046787U publication Critical patent/KR970046787U/en
Application granted granted Critical
Publication of KR200148615Y1 publication Critical patent/KR200148615Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
KR2019950038648U 1995-12-06 1995-12-06 Package test socket KR200148615Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950038648U KR200148615Y1 (en) 1995-12-06 1995-12-06 Package test socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950038648U KR200148615Y1 (en) 1995-12-06 1995-12-06 Package test socket

Publications (2)

Publication Number Publication Date
KR970046787U true KR970046787U (en) 1997-07-31
KR200148615Y1 KR200148615Y1 (en) 1999-06-15

Family

ID=19432267

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950038648U KR200148615Y1 (en) 1995-12-06 1995-12-06 Package test socket

Country Status (1)

Country Link
KR (1) KR200148615Y1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010084797A (en) * 2000-02-29 2001-09-06 박종섭 Socket for semiconductor package test

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010084797A (en) * 2000-02-29 2001-09-06 박종섭 Socket for semiconductor package test

Also Published As

Publication number Publication date
KR200148615Y1 (en) 1999-06-15

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20040218

Year of fee payment: 6

LAPS Lapse due to unpaid annual fee