KR970025017U - 파형 검사 조정기용 픽스쳐 착탈장치 - Google Patents

파형 검사 조정기용 픽스쳐 착탈장치

Info

Publication number
KR970025017U
KR970025017U KR2019950032575U KR19950032575U KR970025017U KR 970025017 U KR970025017 U KR 970025017U KR 2019950032575 U KR2019950032575 U KR 2019950032575U KR 19950032575 U KR19950032575 U KR 19950032575U KR 970025017 U KR970025017 U KR 970025017U
Authority
KR
South Korea
Prior art keywords
removal device
waveform inspection
fixture removal
inspection regulator
regulator
Prior art date
Application number
KR2019950032575U
Other languages
English (en)
Other versions
KR0133270Y1 (ko
Inventor
염기건
편희수
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR2019950032575U priority Critical patent/KR0133270Y1/ko
Publication of KR970025017U publication Critical patent/KR970025017U/ko
Application granted granted Critical
Publication of KR0133270Y1 publication Critical patent/KR0133270Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2815—Functional tests, e.g. boundary scans, using the normal I/O contacts

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
KR2019950032575U 1995-11-07 1995-11-07 파형 검사 조정기용 픽스쳐 착탈장치 KR0133270Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950032575U KR0133270Y1 (ko) 1995-11-07 1995-11-07 파형 검사 조정기용 픽스쳐 착탈장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950032575U KR0133270Y1 (ko) 1995-11-07 1995-11-07 파형 검사 조정기용 픽스쳐 착탈장치

Publications (2)

Publication Number Publication Date
KR970025017U true KR970025017U (ko) 1997-06-20
KR0133270Y1 KR0133270Y1 (ko) 1999-03-30

Family

ID=19428317

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950032575U KR0133270Y1 (ko) 1995-11-07 1995-11-07 파형 검사 조정기용 픽스쳐 착탈장치

Country Status (1)

Country Link
KR (1) KR0133270Y1 (ko)

Also Published As

Publication number Publication date
KR0133270Y1 (ko) 1999-03-30

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