KR970018656A - Method for manufacturing semiconductor device having non-flat semiconductor substrate - Google Patents

Method for manufacturing semiconductor device having non-flat semiconductor substrate Download PDF

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Publication number
KR970018656A
KR970018656A KR1019950031359A KR19950031359A KR970018656A KR 970018656 A KR970018656 A KR 970018656A KR 1019950031359 A KR1019950031359 A KR 1019950031359A KR 19950031359 A KR19950031359 A KR 19950031359A KR 970018656 A KR970018656 A KR 970018656A
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KR
South Korea
Prior art keywords
semiconductor substrate
insulating film
oxide film
manufacturing
pattern
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Application number
KR1019950031359A
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Korean (ko)
Inventor
배승렬
Original Assignee
김광호
삼성전자 주식회사
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Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019950031359A priority Critical patent/KR970018656A/en
Publication of KR970018656A publication Critical patent/KR970018656A/en

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Abstract

본 발명은 반도체장치의 제조방법, 특히 표면이 굴곡진 반도체기판의 제조방법에 관한 것으로서, 그 제조방법은 표면이 평탄한 반도체기판(10)상에 소정패턴의 절연막을 형성하는 공정과; 상기 절연막을 마스크로 사용하여 상기 절연막의 패턴들사이에 있는 노출된 반도체기판(10)상에 산화막(14)을 형성하는 공정과; 상기 절연막과 상기 산화막(14)을 제거하여 표면이 굴곡진 반도체기판(11A)을 형성하는 공정을 포함한다. 본 발명의 반도체장치는 표면이 굴곡진 반도체기판(10A)을 사용하고 있기 때문에, 평탄한 반도체기판(10)을 사용하는 것보다 상대적으로 큰 길이와 폭을 갖는 소자가 제조될 수 있다. 따라서, 실질적인 소자패턴의 설계에 있어서 그 패턴의 크기보다도 더욱 큰 패턴을 갖는 소자가 반도체기판상에 형성될 수 있어서, 그 장치의 내압을 유지할 수 있을 뿐만 아니라 그 설계면적의 감소효과가 있다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing a semiconductor device, particularly a method of manufacturing a curved semiconductor substrate, the method comprising: forming an insulating film of a predetermined pattern on a semiconductor substrate 10 having a flat surface; Forming an oxide film (14) on the exposed semiconductor substrate (10) between the patterns of the insulating film by using the insulating film as a mask; And removing the insulating film and the oxide film 14 to form a curved semiconductor substrate 11A. Since the semiconductor device of the present invention uses the curved semiconductor substrate 10A, a device having a relatively large length and width can be manufactured than using the flat semiconductor substrate 10. Therefore, in designing a substantial element pattern, an element having a pattern larger than the size of the pattern can be formed on the semiconductor substrate, so that the breakdown voltage of the device can be maintained and the design area can be reduced.

Description

비평탄한 반도체 기판을 갖는 반도체 장치의 제조방법Method for manufacturing semiconductor device having non-flat semiconductor substrate

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제2도는 본 발명의 실시예에 따라 제조된 반도체장치의 부분적 구조를 보여주는 단면도2 is a cross-sectional view showing a partial structure of a semiconductor device manufactured according to an embodiment of the present invention.

제3A도 내지 제3G도는 발명의 실시예에 따른 반도체장치의 제조방법의 제조공정들을 보여주는 단면도3A to 3G are cross-sectional views showing manufacturing processes of a method of manufacturing a semiconductor device in accordance with an embodiment of the present invention.

Claims (6)

표면이 평탄한 반도체기판(10)상에 소정패턴의 절연막을 형성하는 공정과; 상기 절연막을 마스크로 사용하여 상기 절연막의 패턴들사이에 있는 노출된 반도체기판(10)상에 산화막(14)을 형성하는 공정과; 상기 절연막과 상기 산화막(14)을 제거하여 표면이 굴곡진 반도체기판(11A)을 형성하는 공정을 포함하는 반도체장치의 제조방법Forming an insulating film of a predetermined pattern on the semiconductor substrate 10 having a flat surface; Forming an oxide film (14) on the exposed semiconductor substrate (10) between the patterns of the insulating film by using the insulating film as a mask; And removing the insulating film and the oxide film 14 to form a curved semiconductor substrate 11A. 제1항에 있어서, 상기 절연막은 상기 반도체기판(10)상에 형성된 산화막(11)과 이 산화막(11)상에 형성된 질화막(12)로 이루어진 반도체장치의 제조방법The method of manufacturing a semiconductor device according to claim 1, wherein the insulating film is composed of an oxide film 11 formed on the semiconductor substrate 10 and a nitride film 12 formed on the oxide film 11. 제1항에 있어서, 상기 반도체기판(11A)은 그 표면의 굴곡진 부분이 연속적으로 이루어진 반도체장치의 제조방법The method of manufacturing a semiconductor device according to claim 1, wherein the semiconductor substrate (11A) has a curved portion on its surface continuously. 제1항에 있어서, 상기 질화막(12)은 LPCVD법에 의해서 약 500~2000Å 두께를 갖고 형성되고, 그리고 상기 산화막(11)은 약 100~500Å 두께를 갖도록 형성되는 반도체장치의 제조방법The method of claim 1, wherein the nitride film 12 is formed to have a thickness of about 500 to 2000 microns by LPCVD, and the oxide film 11 is formed to have a thickness of about 100 to 500 microseconds. 제1항에 있어서, 상기 산화막(14)은 3000~10000Å 두께를 갖도록 형성되는 반도체장치의 제조방법The method of claim 1, wherein the oxide film 14 is formed to have a thickness of 3000 to 10000 GPa. 제1항에 있어서, 상기 굴곡진 표면의 구조를 상기 마스크의 패턴에 의해서 결정되는 반도체장치의 제조방법The method of claim 1, wherein the structure of the curved surface is determined by a pattern of the mask.
KR1019950031359A 1995-09-22 1995-09-22 Method for manufacturing semiconductor device having non-flat semiconductor substrate KR970018656A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950031359A KR970018656A (en) 1995-09-22 1995-09-22 Method for manufacturing semiconductor device having non-flat semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950031359A KR970018656A (en) 1995-09-22 1995-09-22 Method for manufacturing semiconductor device having non-flat semiconductor substrate

Publications (1)

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KR970018656A true KR970018656A (en) 1997-04-30

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KR1019950031359A KR970018656A (en) 1995-09-22 1995-09-22 Method for manufacturing semiconductor device having non-flat semiconductor substrate

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KR (1) KR970018656A (en)

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