KR970003251U - Auto prober device for wafer testing - Google Patents

Auto prober device for wafer testing

Info

Publication number
KR970003251U
KR970003251U KR2019950015870U KR19950015870U KR970003251U KR 970003251 U KR970003251 U KR 970003251U KR 2019950015870 U KR2019950015870 U KR 2019950015870U KR 19950015870 U KR19950015870 U KR 19950015870U KR 970003251 U KR970003251 U KR 970003251U
Authority
KR
South Korea
Prior art keywords
wafer testing
prober device
auto prober
auto
wafer
Prior art date
Application number
KR2019950015870U
Other languages
Korean (ko)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to KR2019950015870U priority Critical patent/KR970003251U/en
Publication of KR970003251U publication Critical patent/KR970003251U/en

Links

KR2019950015870U 1995-06-30 1995-06-30 Auto prober device for wafer testing KR970003251U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950015870U KR970003251U (en) 1995-06-30 1995-06-30 Auto prober device for wafer testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950015870U KR970003251U (en) 1995-06-30 1995-06-30 Auto prober device for wafer testing

Publications (1)

Publication Number Publication Date
KR970003251U true KR970003251U (en) 1997-01-24

Family

ID=60872428

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950015870U KR970003251U (en) 1995-06-30 1995-06-30 Auto prober device for wafer testing

Country Status (1)

Country Link
KR (1) KR970003251U (en)

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