KR970044971U - Device for fixing the specimen for drop test - Google Patents
Device for fixing the specimen for drop testInfo
- Publication number
- KR970044971U KR970044971U KR2019950044565U KR19950044565U KR970044971U KR 970044971 U KR970044971 U KR 970044971U KR 2019950044565 U KR2019950044565 U KR 2019950044565U KR 19950044565 U KR19950044565 U KR 19950044565U KR 970044971 U KR970044971 U KR 970044971U
- Authority
- KR
- South Korea
- Prior art keywords
- specimen
- fixing
- drop test
- drop
- test
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950044565U KR200158453Y1 (en) | 1995-12-20 | 1995-12-20 | Fixing device of drop test sample |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950044565U KR200158453Y1 (en) | 1995-12-20 | 1995-12-20 | Fixing device of drop test sample |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970044971U true KR970044971U (en) | 1997-07-31 |
KR200158453Y1 KR200158453Y1 (en) | 1999-10-15 |
Family
ID=19436313
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019950044565U KR200158453Y1 (en) | 1995-12-20 | 1995-12-20 | Fixing device of drop test sample |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR200158453Y1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101841399B1 (en) | 2017-09-19 | 2018-03-22 | 박명원 | Test sample fixing zig for micro hardness tester |
-
1995
- 1995-12-20 KR KR2019950044565U patent/KR200158453Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR200158453Y1 (en) | 1999-10-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
LAPS | Lapse due to unpaid annual fee |