KR970044971U - Device for fixing the specimen for drop test - Google Patents

Device for fixing the specimen for drop test

Info

Publication number
KR970044971U
KR970044971U KR2019950044565U KR19950044565U KR970044971U KR 970044971 U KR970044971 U KR 970044971U KR 2019950044565 U KR2019950044565 U KR 2019950044565U KR 19950044565 U KR19950044565 U KR 19950044565U KR 970044971 U KR970044971 U KR 970044971U
Authority
KR
South Korea
Prior art keywords
specimen
fixing
drop test
drop
test
Prior art date
Application number
KR2019950044565U
Other languages
Korean (ko)
Other versions
KR200158453Y1 (en
Inventor
최양욱
Original Assignee
현대자동차주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 현대자동차주식회사 filed Critical 현대자동차주식회사
Priority to KR2019950044565U priority Critical patent/KR200158453Y1/en
Publication of KR970044971U publication Critical patent/KR970044971U/en
Application granted granted Critical
Publication of KR200158453Y1 publication Critical patent/KR200158453Y1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
KR2019950044565U 1995-12-20 1995-12-20 Fixing device of drop test sample KR200158453Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950044565U KR200158453Y1 (en) 1995-12-20 1995-12-20 Fixing device of drop test sample

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950044565U KR200158453Y1 (en) 1995-12-20 1995-12-20 Fixing device of drop test sample

Publications (2)

Publication Number Publication Date
KR970044971U true KR970044971U (en) 1997-07-31
KR200158453Y1 KR200158453Y1 (en) 1999-10-15

Family

ID=19436313

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950044565U KR200158453Y1 (en) 1995-12-20 1995-12-20 Fixing device of drop test sample

Country Status (1)

Country Link
KR (1) KR200158453Y1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101841399B1 (en) 2017-09-19 2018-03-22 박명원 Test sample fixing zig for micro hardness tester

Also Published As

Publication number Publication date
KR200158453Y1 (en) 1999-10-15

Similar Documents

Publication Publication Date Title
DE19680786T1 (en) Semiconductor device test device
DK0775910T3 (en) Device for testing ferromagnetic materials
DE69502814D1 (en) RESOLUTION TEST DEVICE
DE69633376D1 (en) Measuring device for intraocular substances
FI96800B (en) Device for performing the analysis
DE69723261D1 (en) IMMUNOCHROMATOGRAPHIC TEST DEVICE
NO20002263D0 (en) Device for non-destructive testing
DE69633600D1 (en) Light shield device for micro test plates
DE69617148D1 (en) probe sample
DE59610542D1 (en) MEASURING DEVICE
DE69605757D1 (en) IC test device
DE69402434D1 (en) Test device for banknotes
NO960149D0 (en) test Device
KR970044971U (en) Device for fixing the specimen for drop test
KR970003247U (en) Wafer inspection device
IT1276785B1 (en) DEVICE FOR MEASURING FABRICS
KR960034687U (en) Bridge inspection device
DE69416728D1 (en) Test device
KR970045070U (en) Drop tester
KR970010710U (en) Specimen curing device
KR970010687U (en) Vibration measurement device
FI951426A0 (en) Measuring device
UA1010S (en) DEVICE FOR ANALYSIS
KR960002603U (en) Gradient testing device
BR9503168A (en) Testing device

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee