KR960024298U - Device Alignment Device of Semiconductor Device Inspector - Google Patents
Device Alignment Device of Semiconductor Device InspectorInfo
- Publication number
- KR960024298U KR960024298U KR2019940036201U KR19940036201U KR960024298U KR 960024298 U KR960024298 U KR 960024298U KR 2019940036201 U KR2019940036201 U KR 2019940036201U KR 19940036201 U KR19940036201 U KR 19940036201U KR 960024298 U KR960024298 U KR 960024298U
- Authority
- KR
- South Korea
- Prior art keywords
- inspector
- alignment
- semiconductor
- semiconductor device
- alignment device
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940036201U KR0110046Y1 (en) | 1994-12-27 | 1994-12-27 | Device-arranging apparatus for semiconductor device inspector |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019940036201U KR0110046Y1 (en) | 1994-12-27 | 1994-12-27 | Device-arranging apparatus for semiconductor device inspector |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960024298U true KR960024298U (en) | 1996-07-22 |
KR0110046Y1 KR0110046Y1 (en) | 1998-10-01 |
Family
ID=19403064
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019940036201U KR0110046Y1 (en) | 1994-12-27 | 1994-12-27 | Device-arranging apparatus for semiconductor device inspector |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0110046Y1 (en) |
-
1994
- 1994-12-27 KR KR2019940036201U patent/KR0110046Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0110046Y1 (en) | 1998-10-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20070904 Year of fee payment: 11 |
|
LAPS | Lapse due to unpaid annual fee |