KR960024298U - Device Alignment Device of Semiconductor Device Inspector - Google Patents

Device Alignment Device of Semiconductor Device Inspector

Info

Publication number
KR960024298U
KR960024298U KR2019940036201U KR19940036201U KR960024298U KR 960024298 U KR960024298 U KR 960024298U KR 2019940036201 U KR2019940036201 U KR 2019940036201U KR 19940036201 U KR19940036201 U KR 19940036201U KR 960024298 U KR960024298 U KR 960024298U
Authority
KR
South Korea
Prior art keywords
inspector
alignment
semiconductor
semiconductor device
alignment device
Prior art date
Application number
KR2019940036201U
Other languages
Korean (ko)
Other versions
KR0110046Y1 (en
Inventor
최양환
Original Assignee
미래산업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미래산업주식회사 filed Critical 미래산업주식회사
Priority to KR2019940036201U priority Critical patent/KR0110046Y1/en
Publication of KR960024298U publication Critical patent/KR960024298U/en
Application granted granted Critical
Publication of KR0110046Y1 publication Critical patent/KR0110046Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
KR2019940036201U 1994-12-27 1994-12-27 Device-arranging apparatus for semiconductor device inspector KR0110046Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019940036201U KR0110046Y1 (en) 1994-12-27 1994-12-27 Device-arranging apparatus for semiconductor device inspector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019940036201U KR0110046Y1 (en) 1994-12-27 1994-12-27 Device-arranging apparatus for semiconductor device inspector

Publications (2)

Publication Number Publication Date
KR960024298U true KR960024298U (en) 1996-07-22
KR0110046Y1 KR0110046Y1 (en) 1998-10-01

Family

ID=19403064

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019940036201U KR0110046Y1 (en) 1994-12-27 1994-12-27 Device-arranging apparatus for semiconductor device inspector

Country Status (1)

Country Link
KR (1) KR0110046Y1 (en)

Also Published As

Publication number Publication date
KR0110046Y1 (en) 1998-10-01

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Legal Events

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A201 Request for examination
E701 Decision to grant or registration of patent right
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FPAY Annual fee payment

Payment date: 20070904

Year of fee payment: 11

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