KR960011693A - TDO output device with boundary scan structure - Google Patents

TDO output device with boundary scan structure Download PDF

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Publication number
KR960011693A
KR960011693A KR1019940023343A KR19940023343A KR960011693A KR 960011693 A KR960011693 A KR 960011693A KR 1019940023343 A KR1019940023343 A KR 1019940023343A KR 19940023343 A KR19940023343 A KR 19940023343A KR 960011693 A KR960011693 A KR 960011693A
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KR
South Korea
Prior art keywords
output
boundary scan
cells
register
tdo
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KR1019940023343A
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Korean (ko)
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KR970006020B1 (en
Inventor
곽재봉
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박성규
대우통신 주식회사
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Priority to KR1019940023343A priority Critical patent/KR970006020B1/en
Publication of KR960011693A publication Critical patent/KR960011693A/en
Application granted granted Critical
Publication of KR970006020B1 publication Critical patent/KR970006020B1/en

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/022—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in I/O circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318572—Input/Output interfaces
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

본 발명은 IEEE(Institute of Electrical and Electronics Engineers)에서 규정한 바운더리 스캔 구조(Boundary-Scan Architecture)에 관한 것으로서, 멀티플렉서(M1-M4)는 시프트 레지스터(10)에 인가되는 TDI에 따라 바운더리 스캔 입/출력 셀(30-1∼30-3)의 D플립플롭(D31-D33)중의 하나의 출력을 선택하여 출력한다. 이때, D플립플롭(D31-D33)의 출력은 실질적으로 TDO이므로 사용자는 원하는 바운더리 스캔 입/출력 셀(30-1∼30-9)내의 플립플롭(D31-D33)을 지정하여 그 바운더리 스캔 레지스터 이후의 레지스터를 거치지 않고 곧 바로 TDO로 출력시킬 있어 본 발명은 TDO의 출력시간을 절약할 수 있다는 효과가 있다.The present invention relates to a boundary-scan architecture defined by the Institute of Electrical and Electronics Engineers (IEEE), wherein the multiplexers M1-M4 are used for boundary scan input / output according to TDI applied to the shift register 10. One output of the D flip-flops D31-D33 of the output cells 30-1 to 30-3 is selected and output. At this time, since the output of the D flip-flop (D31-D33) is substantially TDO, the user designates the flip-flop (D31-D33) in the desired boundary scan input / output cells 30-1 to 30-9, and the boundary scan register. The present invention has an effect that the output time of the TDO can be saved because the TDO can be immediately output to the TDO without going through a subsequent register.

Description

바운더리 스캔 구조의 티디오(TDO) 출력 장치TDO output device with boundary scan structure

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명에 따른 바운더리 스캔 구조의 TDO 출력 장치의 블럭도.1 is a block diagram of a TDO output device having a boundary scan structure according to the present invention.

제2도는 본 발명에 따른 바운더리 스캔 구조의 TDO 출력 장치에 이루어지는 바운더리 스캔 입/출력 셀의 회로도.2 is a circuit diagram of a boundary scan input / output cell in a TDO output device having a boundary scan structure according to the present invention.

Claims (2)

입력되는 스캐닝신호를 데이타 레지스터의 출력에 동기되어 시프트시키도록 종접속되는 제1,2,3바운더리 스캔 셀로 형성되어 제3바운더리 스캔 셀이 스캔신호를 출력하는 바운더리 스캔 레지스터와, 업데이트 데이타 레지스터신호에 동기되어 상기 제1,2바운더리 스캔 셀의 스캐닝신호를 출력하는 제1,2업데이트 셀로 형성된 업데이트 레지스터와, 출력 인에이블신호 또는 상기 제1업데이트 레지스터의 출력을 외부 테스트신호에 따라 선택적으로 출력하는 제1멀트플렉서와, 출력 데이타신호 또는 제2업데이트 셀의 출력을 외부 테스트신호에 따라 선택적으로 출력하는 제2멀티플렉서와, 상기 제1멀티플렉서의 출력에 따라 상기 제2멀티플렉서의 출력을 선택적으로 출력하는 3상태 버퍼를 구비하는 바운더리 스캔 입/출력 셀들이 다수 형성된 바운더리 스캔 구조에 있어서, TDI를 순차적으로 시프트시키는 다수개의 시프트 셀들로 형성된 시프트 레지스터와; 상기 제1,2,3바운더리 스캔 셀과 상기 시프트 레지스터 사이에 구성되며, 상기 시프트 레지스터의 출력에 따라 상기 제1,2,3바운더리 스캔 셀의 출력을 선택적으로 TDO로서 출력하는 선택부를 더 구비하는 바운더리 스캔 구조의 TDO 출력 장치.A boundary scan register which is formed of first, second and third boundary scan cells which are vertically connected to shift the input scanning signal in synchronism with the output of the data register so that the third boundary scan cell outputs the scan signal and the update data register signal. An update register formed of first and second update cells synchronously outputting scanning signals of the first and second boundary scan cells, and selectively outputting an output enable signal or an output of the first update register according to an external test signal A first multiplexer, a second multiplexer for selectively outputting an output data signal or an output of the second update cell according to an external test signal, and an output of the second multiplexer selectively according to the output of the first multiplexer Boundary scan with multiple boundary scan input / output cells with tri-state buffer CLAIMS 1. A can structure comprising: a shift register formed of a plurality of shift cells for sequentially shifting a TDI; A selector configured between the first, second, and third boundary scan cells and the shift register, and selectively outputting the output of the first, second, and third boundary scan cells as a TDO according to the output of the shift register; TDO output device with boundary scan structure. 제1항에 있어서, 상기 선택회로는, 다수개의 멀티플렉서로 형성하는 것을 특징으로 하는 바운더리 스캔 구조의 TDO 출력 장치.The TDO output device according to claim 1, wherein the selection circuit is formed of a plurality of multiplexers. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019940023343A 1994-09-15 1994-09-15 Test data output apparatus of boundary scan architecture KR970006020B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019940023343A KR970006020B1 (en) 1994-09-15 1994-09-15 Test data output apparatus of boundary scan architecture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940023343A KR970006020B1 (en) 1994-09-15 1994-09-15 Test data output apparatus of boundary scan architecture

Publications (2)

Publication Number Publication Date
KR960011693A true KR960011693A (en) 1996-04-20
KR970006020B1 KR970006020B1 (en) 1997-04-23

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KR1019940023343A KR970006020B1 (en) 1994-09-15 1994-09-15 Test data output apparatus of boundary scan architecture

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010045378A (en) * 1999-11-04 2001-06-05 이구택 Oil burner used with gas fuel

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010045378A (en) * 1999-11-04 2001-06-05 이구택 Oil burner used with gas fuel

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KR970006020B1 (en) 1997-04-23

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