KR960008826B1 - Redundancy circuit of semiconductor device - Google Patents

Redundancy circuit of semiconductor device Download PDF

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Publication number
KR960008826B1
KR960008826B1 KR93027766A KR930027766A KR960008826B1 KR 960008826 B1 KR960008826 B1 KR 960008826B1 KR 93027766 A KR93027766 A KR 93027766A KR 930027766 A KR930027766 A KR 930027766A KR 960008826 B1 KR960008826 B1 KR 960008826B1
Authority
KR
South Korea
Prior art keywords
unit
transistor
semiconductor device
redundancy circuit
fuse
Prior art date
Application number
KR93027766A
Other languages
Korean (ko)
Other versions
KR950020750A (en
Inventor
Jae-Jin Lee
Original Assignee
Hyundai Electronics Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hyundai Electronics Ind filed Critical Hyundai Electronics Ind
Priority to KR93027766A priority Critical patent/KR960008826B1/en
Publication of KR950020750A publication Critical patent/KR950020750A/en
Application granted granted Critical
Publication of KR960008826B1 publication Critical patent/KR960008826B1/en

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Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G11C29/787—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using a fuse hierarchy
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/83—Masking faults in memories by using spares or by reconfiguring using programmable devices with reduced power consumption
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability

Abstract

a precharge unit; an externally programmable fuse(Faa); a transistor unit(MN1-MN16) for selecting a word line or a bit line of a cell array; a repair sensing unit(11) for applying different voltages to common sources depending on the repairing history of the circuit; signal outputs(OUT1,2) for outputting enable signals for redundancy operation and normal operation by receiving signals from a node between the precharge unit and a fuse unit, and a common source of a transistor.
KR93027766A 1993-12-15 1993-12-15 Redundancy circuit of semiconductor device KR960008826B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR93027766A KR960008826B1 (en) 1993-12-15 1993-12-15 Redundancy circuit of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR93027766A KR960008826B1 (en) 1993-12-15 1993-12-15 Redundancy circuit of semiconductor device

Publications (2)

Publication Number Publication Date
KR950020750A KR950020750A (en) 1995-07-24
KR960008826B1 true KR960008826B1 (en) 1996-07-05

Family

ID=19371018

Family Applications (1)

Application Number Title Priority Date Filing Date
KR93027766A KR960008826B1 (en) 1993-12-15 1993-12-15 Redundancy circuit of semiconductor device

Country Status (1)

Country Link
KR (1) KR960008826B1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100510995B1 (en) * 1999-01-09 2005-08-31 주식회사 하이닉스반도체 Repair circuit of semiconductor device
KR100526455B1 (en) * 1999-04-15 2005-11-08 주식회사 하이닉스반도체 Semiconductor device including redundancy enable circuitry

Also Published As

Publication number Publication date
KR950020750A (en) 1995-07-24

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