KR950009549A - 자기 저항 장치 및 그 장치를 구비하는 자기 헤드 - Google Patents
자기 저항 장치 및 그 장치를 구비하는 자기 헤드 Download PDFInfo
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- KR950009549A KR950009549A KR1019940023554A KR19940023554A KR950009549A KR 950009549 A KR950009549 A KR 950009549A KR 1019940023554 A KR1019940023554 A KR 1019940023554A KR 19940023554 A KR19940023554 A KR 19940023554A KR 950009549 A KR950009549 A KR 950009549A
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- KR
- South Korea
- Prior art keywords
- stack
- substrate
- parallel
- magnetoresistive device
- multilayer structure
- Prior art date
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- 239000000758 substrate Substances 0.000 claims abstract description 12
- 239000000470 constituent Substances 0.000 claims abstract 4
- 239000013078 crystal Substances 0.000 claims 3
- 239000002184 metal Substances 0.000 claims 3
- 229910052751 metal Inorganic materials 0.000 claims 3
- 239000000203 mixture Substances 0.000 claims 3
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 claims 2
- 150000001875 compounds Chemical class 0.000 claims 2
- 238000002955 isolation Methods 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 2
- 239000000463 material Substances 0.000 claims 1
- 238000000034 method Methods 0.000 claims 1
- 230000008021 deposition Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
- G11B5/3916—Arrangements in which the active read-out elements are coupled to the magnetic flux of the track by at least one magnetic thin film flux guide
- G11B5/3919—Arrangements in which the active read-out elements are coupled to the magnetic flux of the track by at least one magnetic thin film flux guide the guide being interposed in the flux path
- G11B5/3922—Arrangements in which the active read-out elements are coupled to the magnetic flux of the track by at least one magnetic thin film flux guide the guide being interposed in the flux path the read-out elements being disposed in magnetic shunt relative to at least two parts of the flux guide structure
- G11B5/3925—Arrangements in which the active read-out elements are coupled to the magnetic flux of the track by at least one magnetic thin film flux guide the guide being interposed in the flux path the read-out elements being disposed in magnetic shunt relative to at least two parts of the flux guide structure the two parts being thin films
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S428/00—Stock material or miscellaneous articles
- Y10S428/922—Static electricity metal bleed-off metallic stock
- Y10S428/9265—Special properties
- Y10S428/928—Magnetic property
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12465—All metal or with adjacent metals having magnetic properties, or preformed fiber orientation coordinate with shape
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12472—Microscopic interfacial wave or roughness
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12535—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.] with additional, spatially distinct nonmetal component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12993—Surface feature [e.g., rough, mirror]
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- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Hall/Mr Elements (AREA)
- Magnetic Heads (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
자기 저항 장치는 스택 구조체를 구성하는데, 상기 스택 구조체는 다중 구조체를 제공하는 표면을 갖는 비전도성 기판을 구성하고, 상기 표면은 상호 거의 평행하는 복수의 홈으로 이루어져 있으며. 각 홈은 제1면 및 제2면을 갖고, 모든 제1면은 거의 평면적이고 상호 평행하며, 다층 구조체의 구성층은 평행인 방식으로 각각의 상기 제1면상의 스택내에 제공되고, 이들 스택의 두께로써 각각의 스택은 각각 바로 인접한 스택과 물리적으로 접촉하게 되며, 또한 다층 구조체의 자기 저항 효과는 상기 홈에 거의 수직인 면내 방향으로 기판의 평면을 통하여 전기 전압 기울기를 인가함으로써 측정가능한데. 이에 따라, 기판의 흠이 있는 표면을 가로질러 다층 구조체를 통해 측정가능한 전기 전류의 흐름을 유도하고, 바로 인접한 스택간의 전기 접촉 영역의 범위를 제외하고 방향이 각 스택의 구성층에 거의 수직인 방식으로 전류가 한 스택에서 다음 스택으로 흐르게 된다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명에 따른 자기 저항 장치 (magneto-resistance device)에 응용할 수 있는 비전도성 기판의 부분단면도,
제2도는 본 발명에 따른 홈이 있는 표면들 중 하나를 제공하는 제1도에 도시된 동일한 기판의 부분 단면도,
제3도는 발명의 다층 구조체의 용착에 따른 제2도에 도시된 홈이 있는 기판의 개략도,
제4도는 제3도의 개략적인 해석도로서, 기판 평면을 통해 인가되는 전기 전압 기울기에 의해 유도되는 전기 전류의 경로를 개략적으로 도시한 도면.
Claims (9)
- 다층 구조체를 제공하는 표면을 갖는 기판을 갖는 스택 구조체를 구비하는 자기 저항 장치에 있어서, 상기 표면은 상호 평행하는 복수의 홈으로 구성되며, 각 홈은 제1 및 제2면을 갖고, 모든 면은 평면적이고 상호 평행하며, 다층 구조체의 구성층은 평행하는 방식으로 각각의 상기 제1면상의 스택내에 제공되고, 제1면에 대한 수직 방향에 있는 스택의 두께로서 각 스택이 각각 바로 인접한 스택과 물리적으로 접촉하게 하는 것을 특징으로 하는 자기 저항 장치.
- 제1항에 있어서, 상기 홈들은 V자형으로 되어 있고 바로 인접해 있으며, 연속적인 제1면의 수직 격리 거리(d1) 및 연속적인 제2면의 수직 격리 거리(d2) 모두가 0.01 - 10㎛ 범위에 있는 것을 특징으로 하는 자기 저항 장치.
- 제1항 또는 제2항에 있어서, 상기 기판은 Si, Ge, Ⅱ-Ⅵ족 반도체 화합물, Ⅲ-Ⅴ족 반도체 화합물 및 이들의 혼합물로 형성된 원자단으로부터 선택되는 단결성 물질을 구성하는 것을 특징으로 하는 자기 저항 장치.
- 제3항에 있어서, 상기 기판은 각각의 제1면이 (111) 결정면인 방식으로 (100) 또는 (211) 결정면에 에칭되는 홈을 갖는 InP 또는 Si 단결정인 것을 특징으로 하는 자기 저항 장치.
- 제2항 내지 제4항중 어느 한 항에 있어서, d1>d2인 것을 특징으로 하는 자기 저항 장치.
- 제2항 내지 제5항중 어느 한 항에 있어서, 각각의 스택은 연속적으로, 두께(dC<d1)를 갖는 제1의 높은 전도성 금속층, 다음에 총 두께(d1-dC)를 갖는 다층, 그리고 다음으로 근사 두께(dC)를 갖는 제2의 높은 전도성 금속층을 차례로 구성하는 것을 특징으로 하는 자기 저항 장치.
- 제1항 내지 제6항중 어느 한 항에 있어서, 각각의 스택은 Fe/Cr/Fe, Co/Ag/Co, Co/Cu/Co, MnFe/NiFe/Cu/NiFe, NiXFeYCoZ/Cu/NiX`Fe|Y`CoZ`, NiXFeYCoZ/Ag/NiX`FeY`CoZ`, NiXFeYCoZ/Co-/Cu/Co/NiX`FeY`CoZ`, NiXFeYCoZ/Co/Ag/Co/NiX`FeY`CoZ` 및 이들의 혼합물로 형성되는 원자단으로부터 선택되는 금속층의 1개 이상의 다중항을 구비하는데, X, Y, Z, X`, Y` 및 Z`의 개개 값은 모두 0내지 1의 범위에 있고, X+Y+Z=1=X`+Y`+Z`인 것을 특징으로 하는 자기 저항 장치.
- 제1항 내지 제7항중 어느 한 항에 기재된 자기 저항 장치를 구비하는 것을 특징으로 하는 자기 헤드
- 다층 구조체를 제공하는 표면을 갖는 기판을 구성하는 혼합물질에 있어서, 상기 기판은 상호 평행인 복수의 홈으로 구성되고, 각 홈은 제1면 및 제2면을 가지며, 모든 제1면은 평면적이고 상호 평행하며, 다층 구조체의 구성층은 평행하는 방식으로 각각의 상기 제1면상의 스택내에 제공되고, 스택의 두께로써 각 스택이 각각 바로 인접한 스택과 물리적으로 접촉하게 하는 것을 특징으로 하는 혼합 물질.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP93202759 | 1993-09-24 | ||
EP93202759.2 | 1993-09-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR950009549A true KR950009549A (ko) | 1995-04-24 |
Family
ID=8214119
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940023554A KR950009549A (ko) | 1993-09-24 | 1994-09-16 | 자기 저항 장치 및 그 장치를 구비하는 자기 헤드 |
Country Status (6)
Country | Link |
---|---|
US (1) | US5527626A (ko) |
EP (1) | EP0645759A3 (ko) |
JP (1) | JPH07170002A (ko) |
KR (1) | KR950009549A (ko) |
SG (1) | SG44873A1 (ko) |
TW (1) | TW279977B (ko) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5736921A (en) * | 1994-03-23 | 1998-04-07 | Sanyo Electric Co., Ltd. | Magnetoresistive element |
US5585198A (en) * | 1993-10-20 | 1996-12-17 | Sanyo Electric Co., Ltd. | Magnetorsistance effect element |
JPH08130337A (ja) * | 1994-09-09 | 1996-05-21 | Sanyo Electric Co Ltd | 磁気抵抗素子及びその製造方法 |
DE69513630T2 (de) * | 1994-10-05 | 2000-06-21 | Koninklijke Philips Electronics N.V., Eindhoven | Magnetische mehrlagenanordnung, die eine doppelbarrierenstruktur mit resonantem tunneleffekt enthält |
EP0789250A3 (en) * | 1996-02-12 | 1997-10-01 | Read Rite Corp | Giant magnetoresistive thin film transducer with a flow guide structure |
US5627704A (en) * | 1996-02-12 | 1997-05-06 | Read-Rite Corporation | Thin film giant magnetoresistive CPP transducer with flux guide yoke structure |
EP0801380A3 (en) * | 1996-04-10 | 1998-03-04 | Read-Rite Corporation | Giant magnetoresistive transducer with increased output signal |
US6223420B1 (en) | 1998-12-04 | 2001-05-01 | International Business Machines Corporation | Method of making a read head with high resistance soft magnetic flux guide layer for enhancing read sensor efficiency |
US6707648B2 (en) * | 2000-05-19 | 2004-03-16 | Nih N University | Magnetic device, magnetic head and magnetic adjustment method |
US6538856B1 (en) | 2000-06-21 | 2003-03-25 | International Business Machines Corporation | Read head with spin valve sensor having sense current in plane (CIP) thence sense current perpendicular to plane (CPP) |
US6731477B2 (en) | 2001-09-20 | 2004-05-04 | Hitachi Global Storage Technologies Netherlands B.V. | Current-perpendicular-to-plane spin-valve sensor with metallic oxide barrier layer and method of fabrication |
JP2004014001A (ja) * | 2002-06-06 | 2004-01-15 | Fuji Photo Film Co Ltd | 磁気抵抗効果型ヘッド |
US7352541B2 (en) * | 2004-04-30 | 2008-04-01 | Hitachi Global Storage Technologies Netherlands B.V. | CPP GMR using Fe based synthetic free layer |
US7477490B2 (en) * | 2004-06-30 | 2009-01-13 | Seagate Technology Llc | Single sensor element that is naturally differentiated |
US7492554B2 (en) * | 2005-01-21 | 2009-02-17 | International Business Machines Corporation | Magnetic sensor with tilted magnetoresistive structures |
US7715141B2 (en) * | 2007-03-09 | 2010-05-11 | International Business Machines Corporation | Shield biasing for MR devices |
US9134386B2 (en) * | 2011-06-28 | 2015-09-15 | Oracle International Corporation | Giant magnetoresistive sensor having horizontal stabilizer |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3334956A (en) * | 1963-06-17 | 1967-08-08 | Coleman Instr Corp | Selective diffraction grating system |
US3542453A (en) * | 1967-10-25 | 1970-11-24 | Frederick W Kantor | Grating device composed of elongated layers |
US4477794A (en) * | 1981-08-10 | 1984-10-16 | Matsushita Electric Industrial Co., Ltd. | Magnetoresistive element |
US4591889A (en) * | 1984-09-14 | 1986-05-27 | At&T Bell Laboratories | Superlattice geometry and devices |
FR2648942B1 (fr) * | 1989-06-27 | 1995-08-11 | Thomson Csf | Capteur a effet magnetoresistif |
US5251170A (en) * | 1991-11-04 | 1993-10-05 | Nonvolatile Electronics, Incorporated | Offset magnetoresistive memory structures |
US5189367A (en) * | 1991-11-21 | 1993-02-23 | Nec Research Institute, Inc. | Magnetoresistor using a superlattice of GaAs and AlGaAs |
FR2702919B1 (fr) * | 1993-03-19 | 1995-05-12 | Thomson Csf | Transducteur magnétorésistif et procédé de réalisation. |
-
1994
- 1994-04-25 TW TW083103689A patent/TW279977B/zh active
- 1994-09-16 SG SG1996008943A patent/SG44873A1/en unknown
- 1994-09-16 KR KR1019940023554A patent/KR950009549A/ko not_active Application Discontinuation
- 1994-09-16 EP EP94202670A patent/EP0645759A3/en not_active Withdrawn
- 1994-09-22 JP JP6228150A patent/JPH07170002A/ja active Pending
-
1996
- 1996-11-22 US US08/562,247 patent/US5527626A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5527626A (en) | 1996-06-18 |
TW279977B (ko) | 1996-07-01 |
SG44873A1 (en) | 1997-12-19 |
EP0645759A3 (en) | 1996-05-22 |
EP0645759A2 (en) | 1995-03-29 |
JPH07170002A (ja) | 1995-07-04 |
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