KR950004474U - 전극간격 외장 측정기가 부착된 반도체 식각장비 - Google Patents
전극간격 외장 측정기가 부착된 반도체 식각장비Info
- Publication number
- KR950004474U KR950004474U KR2019930012659U KR930012659U KR950004474U KR 950004474 U KR950004474 U KR 950004474U KR 2019930012659 U KR2019930012659 U KR 2019930012659U KR 930012659 U KR930012659 U KR 930012659U KR 950004474 U KR950004474 U KR 950004474U
- Authority
- KR
- South Korea
- Prior art keywords
- measuring instrument
- external electrode
- electrode gap
- etching equipment
- gap measuring
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019930012659U KR960009902Y1 (ko) | 1993-07-09 | 1993-07-09 | 전극간격 외장 측정기가 부착된 반도체 식각장비 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019930012659U KR960009902Y1 (ko) | 1993-07-09 | 1993-07-09 | 전극간격 외장 측정기가 부착된 반도체 식각장비 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950004474U true KR950004474U (ko) | 1995-02-18 |
KR960009902Y1 KR960009902Y1 (ko) | 1996-11-18 |
Family
ID=19358814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019930012659U KR960009902Y1 (ko) | 1993-07-09 | 1993-07-09 | 전극간격 외장 측정기가 부착된 반도체 식각장비 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR960009902Y1 (ko) |
-
1993
- 1993-07-09 KR KR2019930012659U patent/KR960009902Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR960009902Y1 (ko) | 1996-11-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20041018 Year of fee payment: 9 |
|
LAPS | Lapse due to unpaid annual fee |