KR950004429U - 집적회로 리드프레임 본딩 검사장치 - Google Patents

집적회로 리드프레임 본딩 검사장치

Info

Publication number
KR950004429U
KR950004429U KR2019930013930U KR930013930U KR950004429U KR 950004429 U KR950004429 U KR 950004429U KR 2019930013930 U KR2019930013930 U KR 2019930013930U KR 930013930 U KR930013930 U KR 930013930U KR 950004429 U KR950004429 U KR 950004429U
Authority
KR
South Korea
Prior art keywords
integrated circuit
lead frame
inspection device
circuit lead
frame bonding
Prior art date
Application number
KR2019930013930U
Other languages
English (en)
Other versions
KR950008677Y1 (ko
Inventor
손천구
심융만
Original Assignee
아남산업 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 아남산업 주식회사 filed Critical 아남산업 주식회사
Priority to KR2019930013930U priority Critical patent/KR950008677Y1/ko
Publication of KR950004429U publication Critical patent/KR950004429U/ko
Application granted granted Critical
Publication of KR950008677Y1 publication Critical patent/KR950008677Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR2019930013930U 1993-07-26 1993-07-26 집적회로 리드프레임 본딩 검사장치 KR950008677Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930013930U KR950008677Y1 (ko) 1993-07-26 1993-07-26 집적회로 리드프레임 본딩 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930013930U KR950008677Y1 (ko) 1993-07-26 1993-07-26 집적회로 리드프레임 본딩 검사장치

Publications (2)

Publication Number Publication Date
KR950004429U true KR950004429U (ko) 1995-02-17
KR950008677Y1 KR950008677Y1 (ko) 1995-10-12

Family

ID=19359819

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930013930U KR950008677Y1 (ko) 1993-07-26 1993-07-26 집적회로 리드프레임 본딩 검사장치

Country Status (1)

Country Link
KR (1) KR950008677Y1 (ko)

Also Published As

Publication number Publication date
KR950008677Y1 (ko) 1995-10-12

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