KR950002141A - Laser diode and its manufacturing method - Google Patents

Laser diode and its manufacturing method Download PDF

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Publication number
KR950002141A
KR950002141A KR1019930012232A KR930012232A KR950002141A KR 950002141 A KR950002141 A KR 950002141A KR 1019930012232 A KR1019930012232 A KR 1019930012232A KR 930012232 A KR930012232 A KR 930012232A KR 950002141 A KR950002141 A KR 950002141A
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KR
South Korea
Prior art keywords
layer
ridge
current blocking
mask
gaas
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Application number
KR1019930012232A
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Korean (ko)
Inventor
김종렬
Original Assignee
김광호
삼성전자 주식회사
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Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019930012232A priority Critical patent/KR950002141A/en
Publication of KR950002141A publication Critical patent/KR950002141A/en

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Abstract

본 발명은 레이저 다이오드 및 제조방법에 관한 것이다.The present invention relates to a laser diode and a manufacturing method.

본 발명 레이저 다이오드는, 전류차단층의 소재가 캡층과 같은 소재인 GaAs이며, 그 상단면이 상기 리지의 상단면보다 높게 위치되는 구조를 가지며, 그 방법에 있어서는, 마스크에 의해 마스킹되지 않은 부위를 p-크래딩층에 이르기까지 에칭하여 마스크 밑에 리지를 형성하는 단계와, 상기 리지의 양측에 결정 성장과정을 통해 GaAs 전류차단층을 상기 중간층에까지 이르도록 형성하는 단계와, 상기 마스크를 제거한 후 공히 노출된 상기 중간층과 상기 전류차단층의 상부를 소정 두께 에치하는 단계를 갖는다. 이로써 레이저 다이오드의 제작이 상대적으로 간편해지고, 특히 리지 상부의 재성장시 계면 특성의 안정화가 가능하고, 저항 및 제반 전기적 특성이 제공되게 된다.The laser diode of the present invention is GaAs whose material of the current blocking layer is the same material as the cap layer, and has a structure in which the top surface thereof is positioned higher than the top surface of the ridge, and in this method, a portion not masked by the mask is p. Etching to the cladding layer to form a ridge under the mask; forming a GaAs current blocking layer to reach the intermediate layer through crystal growth on both sides of the ridge; Etching the upper portion of the intermediate layer and the current blocking layer to a predetermined thickness. This makes the fabrication of laser diodes relatively simple, in particular, stabilization of interfacial properties during regrowth of the ridge top, and resistance and overall electrical properties are provided.

Description

레이저 다이오드와 그 제조 방법Laser diode and its manufacturing method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제6도는 본 발명 레이저 다이오드의 개략적 단면도.6 is a schematic cross-sectional view of the laser diode of the present invention.

Claims (4)

n-GaAs 기판의 상부에 n-(Al0.7Ga)0.5InP 크래딩층(Cladding Layer), GaInP 활성층(Active Layer), p-AlGaInP 크래딩층, GaInP 버퍼층(Buffer Layer), GaAs 캡층(Cap Layer)이 순차적으로 형성되고, 상기 p-AlGaInP 크래딩의 상부에는 상기 버퍼층이 포함되는 리지가 형성되고 이 리지의 양측에는 전류차단층이 마련된 레이저 다이오드에 있어서, 상기 전류차단층의 소재가 GaAs이며, 그 상단면이 상기 리지의 상단면보다 높게 위치되는 구조를 가지는 것을 특징으로 하는 레이저 다이오드.On top of the n-GaAs substrate, n- (Al 0.7 Ga) 0.5 InP cladding layer, GaInP active layer, p-AlGaInP cladding layer, GaInP buffer layer, GaAs cap layer In the laser diode formed sequentially, the ridge including the buffer layer is formed on the p-AlGaInP cladding and the current blocking layer is provided on both sides of the ridge, the material of the current blocking layer is GaAs, the upper end A laser diode, characterized in that the surface has a structure positioned higher than the top surface of the ridge. 제1항에 있어서, 전류차단층의 표면이 상기 버퍼층의 표면보다 높게 위치되는 것을 특징으로 하는 레이저 다이오드.The laser diode of claim 1, wherein the surface of the current blocking layer is located higher than the surface of the buffer layer. GaAs 기판에 GaInP 활성층, n-AlGaInP 크래딩층과 p-AlGaInP이 마련된 레이어 다이오드를 제조함에 있어서, 상기 기판 위에 제1층인 n-크래딩충, 활성층, p-크래딩층, 버퍼층을 성장하는 단계와, 상기 버퍼층위에 GaAs 중간층과 제1마스크층을 형성하는 리지형성을 위한 형태로 상기 제1마스크층을 패터닝하여 현상하는 단계와, 상기 마스크에 의해 마스킹되지 않은 부위를 p-크래딩층에 이르기까지 에칭하여 상기 마스크 밑에 리지를 형성하는 단계와, 상기 리지의 양측에 결정 성장과정을 통해 GaAs 전류차단층을 상기 중간층에까지 이르도록 형성하는 단계와, 상기 마스크를 제거한 후 공히 노출된 상기 중간층과 상기 전류차단층의 상부를 소정 두께 에치하는 단계와, 상기 중간층과 전류차단층 위에 캡층을 형성하는 단계를 포함하는 것을 특징으로 하는 레이저 다이오드의 제조방법.In the fabrication of a layer diode provided with a GaInP active layer, an n-AlGaInP cladding layer and a p-AlGaInP on a GaAs substrate, a step of growing an n-cladding layer, an active layer, a p-cladding layer, and a buffer layer as a first layer on the substrate; Patterning and developing the first mask layer in a form for forming a ridge forming a GaAs intermediate layer and a first mask layer on a buffer layer, and etching the unmasked portion to the p-cladding layer by the mask. Forming a ridge under the mask, forming a GaAs current blocking layer to reach the intermediate layer through crystal growth on both sides of the ridge, and removing the mask to expose the intermediate layer and the current blocking layer. Etching the upper portion by a predetermined thickness, and forming a cap layer on the intermediate layer and the current blocking layer. Method for producing iodine. 제3항에 있어서, 상기 결정 성정 단계에서의 온도는 520∼580℃의 범위로 결정하는 것을 특징으로 하는 레이저 다이오드 제조방법.The method of claim 3, wherein the temperature in the crystallization step is determined in the range of 520 ~ 580 ℃. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019930012232A 1993-06-30 1993-06-30 Laser diode and its manufacturing method KR950002141A (en)

Priority Applications (1)

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KR1019930012232A KR950002141A (en) 1993-06-30 1993-06-30 Laser diode and its manufacturing method

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KR1019930012232A KR950002141A (en) 1993-06-30 1993-06-30 Laser diode and its manufacturing method

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KR950002141A true KR950002141A (en) 1995-01-04

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