KR940025494U - 메모리 불량비트 검출회로 - Google Patents

메모리 불량비트 검출회로

Info

Publication number
KR940025494U
KR940025494U KR2019930005812U KR930005812U KR940025494U KR 940025494 U KR940025494 U KR 940025494U KR 2019930005812 U KR2019930005812 U KR 2019930005812U KR 930005812 U KR930005812 U KR 930005812U KR 940025494 U KR940025494 U KR 940025494U
Authority
KR
South Korea
Prior art keywords
detection circuit
bit detection
bad bit
memory bad
memory
Prior art date
Application number
KR2019930005812U
Other languages
English (en)
Other versions
KR960002965Y1 (ko
Inventor
양영호
Original Assignee
금성일렉트론주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론주식회사 filed Critical 금성일렉트론주식회사
Priority to KR2019930005812U priority Critical patent/KR960002965Y1/ko
Publication of KR940025494U publication Critical patent/KR940025494U/ko
Application granted granted Critical
Publication of KR960002965Y1 publication Critical patent/KR960002965Y1/ko

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/1201—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising I/O circuitry
KR2019930005812U 1993-04-13 1993-04-13 메모리 불량비트 검출회로 KR960002965Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930005812U KR960002965Y1 (ko) 1993-04-13 1993-04-13 메모리 불량비트 검출회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930005812U KR960002965Y1 (ko) 1993-04-13 1993-04-13 메모리 불량비트 검출회로

Publications (2)

Publication Number Publication Date
KR940025494U true KR940025494U (ko) 1994-11-18
KR960002965Y1 KR960002965Y1 (ko) 1996-04-11

Family

ID=19353599

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930005812U KR960002965Y1 (ko) 1993-04-13 1993-04-13 메모리 불량비트 검출회로

Country Status (1)

Country Link
KR (1) KR960002965Y1 (ko)

Also Published As

Publication number Publication date
KR960002965Y1 (ko) 1996-04-11

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