KR930009351U - Flip chip testing device - Google Patents

Flip chip testing device

Info

Publication number
KR930009351U
KR930009351U KR2019910017062U KR910017062U KR930009351U KR 930009351 U KR930009351 U KR 930009351U KR 2019910017062 U KR2019910017062 U KR 2019910017062U KR 910017062 U KR910017062 U KR 910017062U KR 930009351 U KR930009351 U KR 930009351U
Authority
KR
South Korea
Prior art keywords
testing device
flip chip
chip testing
flip
testing
Prior art date
Application number
KR2019910017062U
Other languages
Korean (ko)
Other versions
KR950000410Y1 (en
Inventor
백영상
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910017062U priority Critical patent/KR950000410Y1/en
Publication of KR930009351U publication Critical patent/KR930009351U/en
Application granted granted Critical
Publication of KR950000410Y1 publication Critical patent/KR950000410Y1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/10—Bump connectors ; Manufacturing methods related thereto
    • H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
    • H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR2019910017062U 1991-10-14 1991-10-14 Flip chip testing apparatus KR950000410Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910017062U KR950000410Y1 (en) 1991-10-14 1991-10-14 Flip chip testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910017062U KR950000410Y1 (en) 1991-10-14 1991-10-14 Flip chip testing apparatus

Publications (2)

Publication Number Publication Date
KR930009351U true KR930009351U (en) 1993-05-26
KR950000410Y1 KR950000410Y1 (en) 1995-01-25

Family

ID=19320541

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910017062U KR950000410Y1 (en) 1991-10-14 1991-10-14 Flip chip testing apparatus

Country Status (1)

Country Link
KR (1) KR950000410Y1 (en)

Also Published As

Publication number Publication date
KR950000410Y1 (en) 1995-01-25

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