KR930009179A - Manufacturing method of laser diode - Google Patents

Manufacturing method of laser diode Download PDF

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Publication number
KR930009179A
KR930009179A KR1019910017752A KR910017752A KR930009179A KR 930009179 A KR930009179 A KR 930009179A KR 1019910017752 A KR1019910017752 A KR 1019910017752A KR 910017752 A KR910017752 A KR 910017752A KR 930009179 A KR930009179 A KR 930009179A
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KR
South Korea
Prior art keywords
layer
manufacturing
laser diode
gaas
alxgaas
Prior art date
Application number
KR1019910017752A
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Korean (ko)
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KR0179017B1 (en
Inventor
임시종
Original Assignee
이헌조
주식회사 금성사
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Priority to KR1019910017752A priority Critical patent/KR0179017B1/en
Publication of KR930009179A publication Critical patent/KR930009179A/en
Application granted granted Critical
Publication of KR0179017B1 publication Critical patent/KR0179017B1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

본 발명은 레이저 다이오드의 제조방법과 관련된 것으로서, 종래에는 이러한 레이저 다이오드 제조공정이 적어도 3회의 에페공정, 1회의 포토에칭 공정, 선택성장의 SiO2공정등 많은 제조 공정을 수반하므로서 그 제조과정이 복잡한 것이었고, 한편으로는 소위 CCD를 고려한 설계가 아니므로 초고출력을 얻는데 상당한 제약이 뒤따른다는 문제점등이 있었으나 , 본 발명에서는 이러한 종래 기술의 문제점을 개선할 수 있도록 단순한 공정에 COD등의 현상을 배제하므로서 초고출력 레이저 다이오드를 얻을 수 있도록, n-GaAs기판(11)을 기재로 하여 그위에 n-AlxGaAs clad층(12), p-AlyGAAs층(13), p-AlxGaAs clad층(14), n-GaAs층(15)을 차례로 성층시키는 제1공정과, n-GaAs층(15)에 역사다리꼴 면적의 골을 내는 포토에칭의 제2공정 및 그위에 다시 p-AlxGaAs층(16)과 p-GaAs Cap층(17)을 성층시키는 제3공정으로 된 레이저 다이오드의 제조방법을 제공하는데 있다.The present invention relates to a method of manufacturing a laser diode, which is conventionally complicated because such a laser diode manufacturing process involves many manufacturing processes, such as at least three epee processes, one photoetching process, and a selective growth SiO 2 process. On the other hand, there is a problem that there is a considerable limitation in obtaining ultra-high output because it is not a design considering the CCD, but the present invention excludes a phenomenon such as COD in a simple process to improve the problems of the prior art. The n-AlxGaAs clad layer 12, the p-AlyGAAs layer 13, the p-AlxGaAs clad layer 14, n on the n-GaAs substrate 11 as a base material so that an ultra-high power laser diode can be obtained. A first step of sequentially stacking the GaAs layer 15, a second step of photoetching in which the n-GaAs layer 15 has an inverted trapezoidal area, and again the p-AlxGaAs layer 16 and the p- Castle GaAs Cap Layer (17) The present invention provides a method of manufacturing a laser diode in a third step of lamination.

Description

레이저 다이오드의 제조방법Manufacturing method of laser diode

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 종래의 레이저 다이오드 구조를 나타낸 참고도.1 is a reference diagram showing a conventional laser diode structure.

제2도는 본발명에 의한 제조된 레이저 다이오드의 참고 사시도.2 is a reference perspective view of a laser diode manufactured according to the present invention.

제3도는 제2도의 A-A선 단면도.3 is a cross-sectional view taken along the line A-A of FIG.

제4도는 제2도의 B-B선 단면도.4 is a cross-sectional view taken along the line B-B in FIG.

Claims (3)

n-GaAs기판(11) 그위에 n-AlxGaAs clad층(12), p-AlyGAAs층(13), p-AlxGaAs clad층(14), n-GaAs층(15)을 차례로 성층시키는 제1공정과, n-GaAs층(15)에 V홈을 형성시킴과 동시에 벽개면 부분을 소정 깊이로 에칭해내는 포토에칭의 제2공정 및 그위에 다시 p-AlxGaAs층(16)및 p-GaAs Cap층(17)을 성층시키는 제3공정을 포함한 제조방법을 특징으로 하는 레이저 다이오드 제조방법.a first step of sequentially forming an n-AlxGaAs clad layer 12, a p-AlyGAAs layer 13, a p-AlxGaAs clad layer 14, and an n-GaAs layer 15 on the n-GaAs substrate 11; , the second process of photoetching the V-groove in the n-GaAs layer 15 and etching the cleaved surface portion to a predetermined depth, and again the p-AlxGaAs layer 16 and the p-GaAs Cap layer 17 A method for manufacturing a laser diode, comprising a manufacturing method including a third step of stratifying a layer). 제1항에 있어서, 제1공정은 LPE, MOVCD, MBE 방법으로 될 수 있고 MOCVD나 MBE기법의 경우에는 액티브층인 p-AlyGaAs층(13)을 QW나 MQW로 사용하는 수단을 특징으로 하는 레이저 다이오드의 제조방법.2. The laser according to claim 1, wherein the first process can be an LPE, a MOVCD, or an MBE method, and in the case of the MOCVD or MBE method, the p-AlyGaAs layer 13, which is an active layer, is used as a QW or MQW. Method of manufacturing a diode. 제1항 또는 제3항에 있어서, 제2공정에서 벽개면에서의 에칭깊이 및 에칭폭을 조절하여 열발생을 억제할 수 있도록 되고, 그 에칭 깊이는 적어도 0.1-10㎛, 에칭을 2-50㎛의 범위로 된 것을 특징으로 하는 레이저 다이오드의 제조방법.The method according to claim 1 or 3, wherein in the second step, the etching depth and the etching width at the cleaved surface can be adjusted to suppress heat generation, and the etching depth is at least 0.1-10 mu m and the etching is performed at 2-50 mu m. Method for producing a laser diode, characterized in that the range. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019910017752A 1991-10-10 1991-10-10 Method of manufacturing laser diode KR0179017B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019910017752A KR0179017B1 (en) 1991-10-10 1991-10-10 Method of manufacturing laser diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019910017752A KR0179017B1 (en) 1991-10-10 1991-10-10 Method of manufacturing laser diode

Publications (2)

Publication Number Publication Date
KR930009179A true KR930009179A (en) 1993-05-22
KR0179017B1 KR0179017B1 (en) 1999-04-15

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019910017752A KR0179017B1 (en) 1991-10-10 1991-10-10 Method of manufacturing laser diode

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Publication number Publication date
KR0179017B1 (en) 1999-04-15

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