KR930003588U - 슬리브 장착 번인보드 - Google Patents

슬리브 장착 번인보드

Info

Publication number
KR930003588U
KR930003588U KR2019910010943U KR910010943U KR930003588U KR 930003588 U KR930003588 U KR 930003588U KR 2019910010943 U KR2019910010943 U KR 2019910010943U KR 910010943 U KR910010943 U KR 910010943U KR 930003588 U KR930003588 U KR 930003588U
Authority
KR
South Korea
Prior art keywords
sleeve
board
burn
mounted burn
Prior art date
Application number
KR2019910010943U
Other languages
English (en)
Other versions
KR940003758Y1 (ko
Inventor
장현철
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910010943U priority Critical patent/KR940003758Y1/ko
Publication of KR930003588U publication Critical patent/KR930003588U/ko
Application granted granted Critical
Publication of KR940003758Y1 publication Critical patent/KR940003758Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019910010943U 1991-07-15 1991-07-15 슬리브 장착 번인보드 KR940003758Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910010943U KR940003758Y1 (ko) 1991-07-15 1991-07-15 슬리브 장착 번인보드

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910010943U KR940003758Y1 (ko) 1991-07-15 1991-07-15 슬리브 장착 번인보드

Publications (2)

Publication Number Publication Date
KR930003588U true KR930003588U (ko) 1993-02-26
KR940003758Y1 KR940003758Y1 (ko) 1994-06-09

Family

ID=19316500

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910010943U KR940003758Y1 (ko) 1991-07-15 1991-07-15 슬리브 장착 번인보드

Country Status (1)

Country Link
KR (1) KR940003758Y1 (ko)

Also Published As

Publication number Publication date
KR940003758Y1 (ko) 1994-06-09

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Legal Events

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