KR920013838U - Structure of socket for device tester - Google Patents
Structure of socket for device testerInfo
- Publication number
- KR920013838U KR920013838U KR2019900021174U KR900021174U KR920013838U KR 920013838 U KR920013838 U KR 920013838U KR 2019900021174 U KR2019900021174 U KR 2019900021174U KR 900021174 U KR900021174 U KR 900021174U KR 920013838 U KR920013838 U KR 920013838U
- Authority
- KR
- South Korea
- Prior art keywords
- socket
- device tester
- tester
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019900021174U KR970000835Y1 (en) | 1990-12-27 | 1990-12-27 | Ic socket |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019900021174U KR970000835Y1 (en) | 1990-12-27 | 1990-12-27 | Ic socket |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920013838U true KR920013838U (en) | 1992-07-27 |
KR970000835Y1 KR970000835Y1 (en) | 1997-02-10 |
Family
ID=19307960
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019900021174U KR970000835Y1 (en) | 1990-12-27 | 1990-12-27 | Ic socket |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR970000835Y1 (en) |
-
1990
- 1990-12-27 KR KR2019900021174U patent/KR970000835Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR970000835Y1 (en) | 1997-02-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69219612D1 (en) | Testing device | |
DE69212673D1 (en) | Test sample generation device | |
KR910003462A (en) | Fixing device | |
DE69032623D1 (en) | SAMPLE TEST UNIT | |
KR900007081A (en) | Probe device | |
NO168403C (en) | DEVICE FOR FIXING SCHOOLS | |
DE69029747D1 (en) | DEVELOPMENT DEVICE | |
IT1223683B (en) | FIXING DEVICE | |
DE69215282D1 (en) | Immunological test procedure | |
DE69025110D1 (en) | Test device | |
DE69130755D1 (en) | Test facility | |
DE59107958D1 (en) | MEASURING DEVICE | |
KR900020791U (en) | Power test device | |
DE69127149D1 (en) | Circuit test procedure | |
DE69117097D1 (en) | Test fixtures | |
KR920013838U (en) | Structure of socket for device tester | |
KR920003412U (en) | D-board for semiconductor device test | |
DE69302684D1 (en) | Test device | |
DK512788A (en) | BUILT-IN TEST EQUIPMENT | |
KR920009913U (en) | Drop unit of drop tester | |
KR910018712U (en) | Connection pin connection device of test board | |
KR920002633U (en) | Hull-Sell Tester | |
KR920013735U (en) | Structure of semiconductor device | |
KR920012950U (en) | Device test circuit | |
KR920017220U (en) | Socket for IC test |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20050120 Year of fee payment: 9 |
|
EXPY | Expiration of term |