KR920017220U - Socket for IC test - Google Patents

Socket for IC test

Info

Publication number
KR920017220U
KR920017220U KR2019910001850U KR910001850U KR920017220U KR 920017220 U KR920017220 U KR 920017220U KR 2019910001850 U KR2019910001850 U KR 2019910001850U KR 910001850 U KR910001850 U KR 910001850U KR 920017220 U KR920017220 U KR 920017220U
Authority
KR
South Korea
Prior art keywords
socket
test
Prior art date
Application number
KR2019910001850U
Other languages
Korean (ko)
Other versions
KR940002723Y1 (en
Inventor
배정환
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019910001850U priority Critical patent/KR940002723Y1/en
Publication of KR920017220U publication Critical patent/KR920017220U/en
Application granted granted Critical
Publication of KR940002723Y1 publication Critical patent/KR940002723Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
KR2019910001850U 1991-02-06 1991-02-06 Socket for ic testing KR940002723Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910001850U KR940002723Y1 (en) 1991-02-06 1991-02-06 Socket for ic testing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910001850U KR940002723Y1 (en) 1991-02-06 1991-02-06 Socket for ic testing

Publications (2)

Publication Number Publication Date
KR920017220U true KR920017220U (en) 1992-09-17
KR940002723Y1 KR940002723Y1 (en) 1994-04-23

Family

ID=19310698

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910001850U KR940002723Y1 (en) 1991-02-06 1991-02-06 Socket for ic testing

Country Status (1)

Country Link
KR (1) KR940002723Y1 (en)

Also Published As

Publication number Publication date
KR940002723Y1 (en) 1994-04-23

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20050322

Year of fee payment: 12

EXPY Expiration of term