KR920003468A - Morse manufacturing method using two-layer polycrystalline silicon film - Google Patents
Morse manufacturing method using two-layer polycrystalline silicon film Download PDFInfo
- Publication number
- KR920003468A KR920003468A KR1019900010432A KR900010432A KR920003468A KR 920003468 A KR920003468 A KR 920003468A KR 1019900010432 A KR1019900010432 A KR 1019900010432A KR 900010432 A KR900010432 A KR 900010432A KR 920003468 A KR920003468 A KR 920003468A
- Authority
- KR
- South Korea
- Prior art keywords
- polycrystalline silicon
- morse
- gate
- silicon film
- manufacturing
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Abstract
내용 없음.No content.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.
제1도는 종래의 구성 단면도.1 is a cross-sectional view of a conventional configuration.
제2도는 본 발명의 공정 단면도.2 is a cross-sectional view of the process of the present invention.
* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings
1 : 기판 2 : 필드산화막1 substrate 2 field oxide film
3 : 질화막 4 : 다결정 실리콘막3: nitride film 4: polycrystalline silicon film
5,7 : 산화막 6 : 측벽 스페이서5,7 oxide film 6: sidewall spacer
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019900010432A KR930002059B1 (en) | 1990-07-10 | 1990-07-10 | M.o.s. manufacturing method using polysilicon |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019900010432A KR930002059B1 (en) | 1990-07-10 | 1990-07-10 | M.o.s. manufacturing method using polysilicon |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920003468A true KR920003468A (en) | 1992-02-29 |
KR930002059B1 KR930002059B1 (en) | 1993-03-22 |
Family
ID=19301102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019900010432A KR930002059B1 (en) | 1990-07-10 | 1990-07-10 | M.o.s. manufacturing method using polysilicon |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR930002059B1 (en) |
-
1990
- 1990-07-10 KR KR1019900010432A patent/KR930002059B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR930002059B1 (en) | 1993-03-22 |
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