KR920001185A - 편광회절소자 및 그것을 사용한 편광 검출장치 - Google Patents

편광회절소자 및 그것을 사용한 편광 검출장치 Download PDF

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Publication number
KR920001185A
KR920001185A KR1019910009730A KR910009730A KR920001185A KR 920001185 A KR920001185 A KR 920001185A KR 1019910009730 A KR1019910009730 A KR 1019910009730A KR 910009730 A KR910009730 A KR 910009730A KR 920001185 A KR920001185 A KR 920001185A
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South Korea
Prior art keywords
diffraction grating
lattice
diffraction
lattice spacing
polarization
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KR1019910009730A
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English (en)
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KR960012782B1 (ko
Inventor
요시오 요시다
다까히로 미야께
야수오 나까다
유끼오 구라다
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쓰지 하루오
샤프 가부시끼가이샤
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Priority claimed from JP2158076A external-priority patent/JPH087099B2/ja
Priority claimed from JP2226320A external-priority patent/JP2613962B2/ja
Application filed by 쓰지 하루오, 샤프 가부시끼가이샤 filed Critical 쓰지 하루오
Publication of KR920001185A publication Critical patent/KR920001185A/ko
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Publication of KR960012782B1 publication Critical patent/KR960012782B1/ko

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B7/00—Recording or reproducing by optical means, e.g. recording using a thermal beam of optical radiation by modifying optical properties or the physical structure, reproducing using an optical beam at lower power by sensing optical properties; Record carriers therefor
    • G11B7/12—Heads, e.g. forming of the optical beam spot or modulation of the optical beam
    • G11B7/135—Means for guiding the beam from the source to the record carrier or from the record carrier to the detector
    • G11B7/1353—Diffractive elements, e.g. holograms or gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/22—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using a variable element in the light-path, e.g. filter, polarising means
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G02B27/283—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising used for beam splitting or combining
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4261—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element with major polarization dependent properties
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/4272—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1809—Diffraction gratings with pitch less than or comparable to the wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1814—Diffraction gratings structurally combined with one or more further optical elements, e.g. lenses, mirrors, prisms or other diffraction gratings
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B11/00—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor
    • G11B11/10—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field
    • G11B11/105—Recording on or reproducing from the same record carrier wherein for these two operations the methods are covered by different main groups of groups G11B3/00 - G11B7/00 or by different subgroups of group G11B9/00; Record carriers therefor using recording by magnetic means or other means for magnetisation or demagnetisation of a record carrier, e.g. light induced spin magnetisation; Demagnetisation by thermal or stress means in the presence or not of an orienting magnetic field using a beam of light or a magnetic field for recording by change of magnetisation and a beam of light for reproducing, i.e. magneto-optical, e.g. light-induced thermomagnetic recording, spin magnetisation recording, Kerr or Faraday effect reproducing
    • G11B11/10532—Heads
    • G11B11/10541—Heads for reproducing
    • G11B11/10543—Heads for reproducing using optical beam of radiation

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Optical Head (AREA)
  • Polarising Elements (AREA)

Abstract

내용 없음

Description

편광회절소자 및 그것을 사용한 편광 검출장치
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 편광검출장치의 개략구성도.
제2도는 제1도의 편광검출장치를 -y방향에서 본 평면도.
제3도는 편광회절소자의 사시도.

Claims (7)

  1. 복수의 면을 가지는 평편상의 투명기판과, 투명기판의 하나의 면에 형성된 제1의 회절격자와, 투명기판의 상기 제1의 회절격자와 다른 하나의 면상에 형성된 제2의 회절격자를 포함하고, 상기 제1 및 제2의 회절격자의 격자간격이 서로 같고, 상기 제1의 회절격자의 격자방향과 해당 제2의 회절격자의 격자방향과가, 소정의 미소각을 이루고 있는 편광회절소자.
  2. 클레임(1)에 기재의 편광회절소자이며, 상기 제1의 회절격자의 격자방향과 상기 제2의 회절격자의 격자방향과의 이루는 각이 10° 이하이다.
  3. 클레임(1)에 기재의 편광회절소자이며, 상기 제1의 회절격자와 제2의 회절격자의 상기 제2의 회절격자의 격자간격은 상기 편광회절소자에 입사하는 광의 파장의 0.5~2배로 설정되어 있다.
  4. 복수의 면을 가지는 평편상의 투명기판과, 투명기판의 하나의 면에 형성된 제1의 회절격자와, 투명기판의 상기 제1의 회절격자와 다른 하나의 면상에 형성된 제2의 회절격자와, 상기 제1의 회절격자와 제2의 회절격자와를 투과한 광속과 상기 제1의 회절격자와 제2의 회절격자와로 회절된 광속과가 입사되는 집광렌즈와, 상기 투과광과 회절광과를 각각 수광하는 한쌍의 광검출기와를 포함하며, 상기 제1및 제2의 회절격자의 격자간격이 서로 거의 같고, 상기 제1의 회절격자의 격자방향과 해당 제2의 회절격자의 격자방향과가, 소정의 미소각을 이루고 있는 편광검출장치.
  5. 복수의 면을 가지는 평편상의 투명기판과, 투명기판의 하나의 면상에 형성되어, 입사광의 파장정도의 격자간격을 가지는 제1의 회절격자와, 기판의 상기 제1의 회절격자와 다른 하나의 면상에 형성되어, 입사광의 파장정도의 격자간격을 가지는 제2의 회절격자와를 포함하며, 상기 제1의 회절격자와 격자방향과 상기 제2의 회절격자의 격자방향과의 일치하도록 형성되어, 상기 제1의 회절격자의 격자간격이(D1)과 상기 제2의 회절격자의 격자간격(D2)와가 다음의 식 0＜1λ(1/D1-1/D2)(1-(λ/2D1)2)-(1/2)1≤0.35 또는 0＜1λ(1/D1-1/D2)(1-(λ/2D2)2)-(1/2)1≤0.35를 만족시키도록 형성되어 있는 편광회절소자.
  6. 복수의 면을 가지는 평편상의 기판과, 기판의 하나의 면상에 형성되어, 입사광의 파장장도의 격자간격을 가지는 제1의 회절격자와 기판의 상기 회절격자와 다른 하나의 면상에 형성되어, 입사광의 파장정도의 격자간격을 가지는 제2의 회절격자와, 상기 제1의 회절격자와 제2의 회절격자와를 투과한 광속과 상기 제1의 회절격자와 제2의 회절격자와의 회절된 광속과가 입사되는 집광렌즈와, 상기 투과광과 회절광과를 각각 수광하는 한쌍의 광검출기와를 포함하며, 상기 제1의 회절격자의 격자방향과 제2의 회절격자의 격자방향과가 일치하도록 형성되어, 상기 제1의 회절격자의 격자간격(D1)과 상기 제2의 회절격자의 격자간격(D2)와가 다음의 식 0＜1λ(1/D1-1/D2)(1-(λ/2D1)2)-(1/2)1≤0.35 또는 0＜1λ(1/D1-1/D2)(1-(λ/2D2)2)-(1/2)1≤0.35를 만족시키도록 형성되어 있는 편광검출장치.
  7. 클레임(6)에 기재된 편광검출장치이며, 입사광의 상기 제1의 회절격자에 대한 입사각 θ가 다음의 식 sin-1(λ/2D1)≤θ≤sin-1(λ(1/D1-A/D2) 또는 sin-1(λ(1/01-λ2/D2)≤θ≤sin-1(λ/2D1)를 만족시키도록 제1의 회절격자의 위치와 설정되어 있다.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019910009730A 1990-06-13 1991-06-13 편광회절소자 및 그것을 사용한 편광검출장치 KR960012782B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2-158076 1990-06-13
JP90-158076 1990-06-13
JP2158076A JPH087099B2 (ja) 1990-06-13 1990-06-13 偏光検出装置
JP2-226320 1990-08-27
JP2226320A JP2613962B2 (ja) 1990-08-27 1990-08-27 偏光検出装置

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KR920001185A true KR920001185A (ko) 1992-01-30
KR960012782B1 KR960012782B1 (ko) 1996-09-24

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Country Status (5)

Country Link
US (1) US5257131A (ko)
EP (1) EP0462757B1 (ko)
KR (1) KR960012782B1 (ko)
CA (1) CA2043978C (ko)
DE (1) DE69114769T2 (ko)

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US5258871A (en) * 1992-06-01 1993-11-02 Eastman Kodak Company Dual diffraction grating beam splitter
EP0790606B1 (en) * 1992-08-07 2001-10-24 Matsushita Electric Industrial Co., Ltd. Optical storage apparatus
US5434708A (en) * 1992-09-08 1995-07-18 Eastman Kodak Company Optical reproducing apparatus ultilizing a polarization beam splitter
JP2810281B2 (ja) * 1992-09-28 1998-10-15 シャープ株式会社 偏光検出装置
TW265419B (ko) * 1994-06-07 1995-12-11 Philips Electronics Nv
US5751681A (en) * 1997-03-17 1998-05-12 Nec Corporation Tracking signal detection with a photodetector receiving one of a ∓1st-order polarized light
US7577076B2 (en) * 2003-03-14 2009-08-18 Ricoh Company, Ltd. Tilt sensor using diffraction grating
AU2003304304A1 (en) * 2003-07-05 2005-01-21 Carl Zeiss Smt Ag Device for the polarization-specific examination of an optical system
FR2862768B1 (fr) * 2003-11-21 2006-02-24 Commissariat Energie Atomique Separateur de polarisation a reseau polarisant
EP1720161A4 (en) * 2004-02-27 2008-02-27 Konica Minolta Opto Inc OPTICAL OBJECT SYSTEM, OPTICAL DETECTION DEVICE AND OPTICAL INFORMATION RECORDING / REPRODUCING DEVICE

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CA1174882A (en) * 1981-02-23 1984-09-25 Charles J. Kramer Plane grating polarizing beamsplitter
NL8601876A (nl) * 1986-07-18 1988-02-16 Philips Nv Inrichting voor het aftasten van een optische registratiedrager.
JPH0711515B2 (ja) * 1987-09-21 1995-02-08 旭化成工業株式会社 糖化アルブミンの分離方法
DE3855532T2 (de) * 1987-12-24 1997-04-30 Kuraray Co Polarisierendes optisches Element und Einrichtung unter Benutzung desselben
JPH0212105A (ja) * 1988-06-29 1990-01-17 Nec Corp 複屈折回折格子型偏光子
JPH0265037A (ja) * 1988-08-31 1990-03-05 Hitachi Ltd カラー受像管用電子銃
US4993789A (en) * 1988-09-15 1991-02-19 Jonathan R. Biles Dual wavelength polarization selective holographic optical element
DE3938639A1 (de) * 1988-11-21 1990-05-23 Ricoh Kk Optische aufzeichnungs-/wiedergabeeinrichtung
JPH02259702A (ja) * 1989-03-31 1990-10-22 Sharp Corp 偏光回折素子
US5085496A (en) * 1989-03-31 1992-02-04 Sharp Kabushiki Kaisha Optical element and optical pickup device comprising it
JP2716793B2 (ja) * 1989-04-07 1998-02-18 株式会社リコー デュアルグレーティングを用いた光ピックアップ装置
JPH0610551B2 (ja) * 1989-06-05 1994-02-09 三機工業株式会社 蓄冷熱システム
JPH03137841A (ja) * 1989-10-20 1991-06-12 Ricoh Co Ltd 光ピックアップ装置

Also Published As

Publication number Publication date
EP0462757A2 (en) 1991-12-27
US5257131A (en) 1993-10-26
EP0462757A3 (en) 1992-10-28
DE69114769D1 (de) 1996-01-04
EP0462757B1 (en) 1995-11-22
CA2043978C (en) 1999-08-10
CA2043978A1 (en) 1991-12-14
KR960012782B1 (ko) 1996-09-24
DE69114769T2 (de) 1996-05-02

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