KR910008716B1 - 증착용 산화 이트륨 조성물 및 반사 방지막의 제조 방법 - Google Patents
증착용 산화 이트륨 조성물 및 반사 방지막의 제조 방법 Download PDFInfo
- Publication number
- KR910008716B1 KR910008716B1 KR1019880701199A KR880701199A KR910008716B1 KR 910008716 B1 KR910008716 B1 KR 910008716B1 KR 1019880701199 A KR1019880701199 A KR 1019880701199A KR 880701199 A KR880701199 A KR 880701199A KR 910008716 B1 KR910008716 B1 KR 910008716B1
- Authority
- KR
- South Korea
- Prior art keywords
- composition
- deposition
- oxide
- yttrium
- titanium oxide
- Prior art date
Links
- 239000000203 mixture Substances 0.000 title claims description 25
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 title claims description 12
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 238000001704 evaporation Methods 0.000 title claims 2
- 230000008020 evaporation Effects 0.000 title claims 2
- 239000010408 film Substances 0.000 claims description 21
- 230000008021 deposition Effects 0.000 claims description 19
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 12
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 12
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 11
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims description 11
- 229910001928 zirconium oxide Inorganic materials 0.000 claims description 11
- 238000007740 vapor deposition Methods 0.000 claims description 9
- 239000010409 thin film Substances 0.000 claims description 7
- 229910052727 yttrium Inorganic materials 0.000 claims description 5
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 3
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims 1
- 239000010703 silicon Substances 0.000 claims 1
- 238000000151 deposition Methods 0.000 description 17
- 239000000758 substrate Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 8
- 238000002310 reflectometry Methods 0.000 description 8
- 229910010413 TiO 2 Inorganic materials 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000012788 optical film Substances 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
- 238000012887 quadratic function Methods 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/44—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/622—Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/62218—Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products obtaining ceramic films, e.g. by using temporary supports
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/083—Oxides of refractory metals or yttrium
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/02168—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells the coatings being antireflective or having enhancing optical properties for the solar cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Organic Chemistry (AREA)
- Sustainable Development (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Sustainable Energy (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Structural Engineering (AREA)
- Physical Vapour Deposition (AREA)
- Surface Treatment Of Optical Elements (AREA)
- Inorganic Compounds Of Heavy Metals (AREA)
- Photovoltaic Devices (AREA)
- Surface Treatment Of Glass (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62023946A JPS63192856A (ja) | 1987-02-04 | 1987-02-04 | 蒸着用酸化イツトリウム組成物及び反射防止膜の製造方法 |
JP62-23946 | 1987-02-04 | ||
PCT/JP1988/000103 WO1988005963A1 (en) | 1987-02-04 | 1988-02-04 | Yttrium oxide composition for use in evaporation and process for preparing anti-reflection film thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890700927A KR890700927A (ko) | 1989-04-28 |
KR910008716B1 true KR910008716B1 (ko) | 1991-10-19 |
Family
ID=12124709
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019880701199A KR910008716B1 (ko) | 1987-02-04 | 1988-02-04 | 증착용 산화 이트륨 조성물 및 반사 방지막의 제조 방법 |
Country Status (6)
Country | Link |
---|---|
JP (1) | JPS63192856A (fi) |
KR (1) | KR910008716B1 (fi) |
CN (1) | CN1017164B (fi) |
DE (2) | DE3890060C2 (fi) |
SE (1) | SE8803506D0 (fi) |
WO (1) | WO1988005963A1 (fi) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2850371B2 (ja) * | 1989-06-19 | 1999-01-27 | 松下電器産業株式会社 | 画像出力装置 |
CN102140621A (zh) * | 2011-03-10 | 2011-08-03 | 苏州大学 | 一种致密复合二氧化钛薄膜的制备方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4246043A (en) * | 1979-12-03 | 1981-01-20 | Solarex Corporation | Yttrium oxide antireflective coating for solar cells |
DE3613501A1 (de) * | 1986-04-22 | 1987-10-29 | Stefan Dipl Ing Donnerhack | Verfahren zur antikatalytischen beschichtung von thermoelementen |
-
1987
- 1987-02-04 JP JP62023946A patent/JPS63192856A/ja active Pending
- 1987-11-12 CN CN87107819A patent/CN1017164B/zh not_active Expired
-
1988
- 1988-02-04 WO PCT/JP1988/000103 patent/WO1988005963A1/en active Application Filing
- 1988-02-04 KR KR1019880701199A patent/KR910008716B1/ko not_active IP Right Cessation
- 1988-02-04 DE DE19883890060 patent/DE3890060C2/de not_active Expired - Lifetime
- 1988-02-04 DE DE19883890060 patent/DE3890060T/de active Pending
- 1988-10-03 SE SE8803506A patent/SE8803506D0/xx not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
DE3890060C2 (de) | 1990-08-16 |
CN87107819A (zh) | 1988-08-17 |
CN1017164B (zh) | 1992-06-24 |
SE8803506L (sv) | 1988-10-03 |
DE3890060T (fi) | 1989-03-23 |
JPS63192856A (ja) | 1988-08-10 |
SE8803506D0 (sv) | 1988-10-03 |
KR890700927A (ko) | 1989-04-28 |
WO1988005963A1 (en) | 1988-08-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0828696B1 (en) | Mixed oxide high index optical coating material and method | |
US3934961A (en) | Three layer anti-reflection film | |
EP1008868B1 (en) | Optical-thin-film material, process for its production, and optical device making use of the optical-thin-film material | |
JPS5522704A (en) | Multilayer antireflecting film | |
CN1033471C (zh) | 用于生产高折射率光学涂层的蒸镀用材料 | |
JP3723580B2 (ja) | 中程度の屈折率の光学コーテイング製造用の蒸気析出素材 | |
KR910008716B1 (ko) | 증착용 산화 이트륨 조성물 및 반사 방지막의 제조 방법 | |
Bulkin et al. | Properties and applications of electron cyclotron plasma deposited SiOxNy films with graded refractive index profiles | |
JPH07111484B2 (ja) | プラスチック製光学部品の反射防止膜とその形成方法 | |
GB1466640A (en) | Multiple layer of anti-reflection coatings for optical purposes | |
CN1030864C (zh) | 蒸镀材料及其利用该材料制造的光学薄膜 | |
La Serra et al. | Preparation and characterization of thin films of TiO2 PbO and TiO2 Bi2O3 compositions | |
JPH0238921B2 (fi) | ||
JPH07331412A (ja) | 赤外線用光学部品及びその製造方法 | |
JPS59148002A (ja) | 蒸着およびスパツタ用酸化ジルコニウム組成物およびそれを用いる光学用薄膜の製造方法 | |
KR20110098720A (ko) | 하프늄 산화물 또는 지르코늄 산화물 코팅 | |
EP0168165A1 (en) | Opto-electronic and electro-optic devices | |
JPH10123303A (ja) | 反射防止光学部品 | |
JPS6151283B2 (fi) | ||
KR920001277B1 (ko) | 합성 수지제 광학부품의 반사방지막 제조 방법 | |
JPH02148002A (ja) | 光学部品 | |
JP3353931B2 (ja) | 光学薄膜とこの光学薄膜を形成した光学部品及び反射防止膜とこの反射防止膜を形成したプラスチック製光学部品 | |
JPH0197902A (ja) | 反射防止膜を有する光学的装置 | |
Harker et al. | Tailored target approach to the deposition of gradient index optical filters | |
JPS5855901A (ja) | 反射鏡の製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 19941018 Year of fee payment: 4 |
|
LAPS | Lapse due to unpaid annual fee |