KR910005815Y1 - 모니터의 자체 성능 검사 회로 - Google Patents
모니터의 자체 성능 검사 회로 Download PDFInfo
- Publication number
- KR910005815Y1 KR910005815Y1 KR2019870015479U KR870015479U KR910005815Y1 KR 910005815 Y1 KR910005815 Y1 KR 910005815Y1 KR 2019870015479 U KR2019870015479 U KR 2019870015479U KR 870015479 U KR870015479 U KR 870015479U KR 910005815 Y1 KR910005815 Y1 KR 910005815Y1
- Authority
- KR
- South Korea
- Prior art keywords
- stage
- diode
- resistor
- transistor
- output
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 claims description 5
- 238000011056 performance test Methods 0.000 claims description 5
- 239000003086 colorant Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 208000003464 asthenopia Diseases 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 208000016255 tiredness Diseases 0.000 description 1
- 230000003867 tiredness Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/02—Diagnosis, testing or measuring for television systems or their details for colour television signals
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Abstract
Description
Claims (1)
- 2진 카운터(2)에 수평 플라이백 펄스(1)와 클리어 (CL)를 접속하고, 첫번째 스테이지에서 n번 카운터된 스테이지 펄스의 출력단에 다이오드(D6)(D7) 저항(R3)(R4)을 각각 연결하고, 저항(R3)을 트랜지스터(Q2)의 베이스에 접속하며, 콜렉터에는 저항(R10)을 통하여 동작 전원에 연결하고, 에미터에는 다이오드(D13)를 접속하여적색 출력단(R)을 인출하며, n+1번 스테이지의 출력단에는 다이오드(D8)(D9)와 저항(R5)(R6)(R7) 및 트랜지스터(Q3)와 다이오드(D14)를 통하여 녹색 출력단(G)을 인출하고, n+2번 스테이지의 출력단에는 다이오드(D10)(D11), 저항(R7)(R8)(R12), 트랜지스터(Q4)와 다이오드(D15)를 통하여 청색 출력단(B)을 인출하는 한편, n+3번 스테이지의 출력단에는 저항(R1) 콘덴서(C)로 구성된 미분회로(3)와 저항(R9)및 트랜지스(Q5)의 베이스에 접속하고, 트랜지스터(Q5)의 에미터에는 다이오드(D11)(D9)(D7)(D12)를 각각 연결함과 동시에 2진카운터(2)의 n번째 내지 n+3번째 스테이지 각 출력단에 다이오드(D2-D5)를 각각 접속하여 백색 출력단(W)을 인출하고, 동작스위치(SW) 및 클리어(CL)에 다이오드(D1)와 저항 (R2)을 연결하여서 된 모니터 자체 성능 검사 회로.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019870015479U KR910005815Y1 (ko) | 1987-09-09 | 1987-09-09 | 모니터의 자체 성능 검사 회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019870015479U KR910005815Y1 (ko) | 1987-09-09 | 1987-09-09 | 모니터의 자체 성능 검사 회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890008055U KR890008055U (ko) | 1989-05-18 |
KR910005815Y1 true KR910005815Y1 (ko) | 1991-08-03 |
Family
ID=19267762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019870015479U KR910005815Y1 (ko) | 1987-09-09 | 1987-09-09 | 모니터의 자체 성능 검사 회로 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR910005815Y1 (ko) |
-
1987
- 1987-09-09 KR KR2019870015479U patent/KR910005815Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR890008055U (ko) | 1989-05-18 |
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