KR910005062A - Semiconductor test method - Google Patents

Semiconductor test method Download PDF

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Publication number
KR910005062A
KR910005062A KR1019900011826A KR900011826A KR910005062A KR 910005062 A KR910005062 A KR 910005062A KR 1019900011826 A KR1019900011826 A KR 1019900011826A KR 900011826 A KR900011826 A KR 900011826A KR 910005062 A KR910005062 A KR 910005062A
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KR
South Korea
Prior art keywords
test method
semiconductor test
terminal
test
terminals
Prior art date
Application number
KR1019900011826A
Other languages
Korean (ko)
Other versions
KR930006962B1 (en
Inventor
아이이치로 사쿠모토
아키라 마수코
Original Assignee
아오이 죠이치
가부시키가이샤 도시바
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Publication of KR910005062A publication Critical patent/KR910005062A/en
Application granted granted Critical
Publication of KR930006962B1 publication Critical patent/KR930006962B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

내용 없음.No content.

Description

반도체 시험방법Semiconductor test method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명의 일시시예에 관한 반도체 시험방법을 실시하기 위한 기본 구성을 나타낸 도면.1 is a diagram showing a basic configuration for carrying out a semiconductor test method according to one embodiment of the present invention.

제2도는 본 발명의 반도체 시험방법에 관한 각 신호의 상태를 나타낸 타이밍 챠트.2 is a timing chart showing the state of each signal according to the semiconductor test method of the present invention.

Claims (1)

출력단자를 이네이블 또는 디스에이블상태로 하는 것이 가능한 반도체장치의 시험방법에 있어서, 복수의 출력단자(O1~O8)를 공통 접속하고, 그 접속점을 반도체 시험장치(102)의 측정단자에 접속하며, 상기 공통 접속된 복수의 출력단자중 피측정단자를 이네이블 상태로 하고, 그 이외의 단자를 디스에이블상태로 하여 시험을 행하도록 한 것을 특징으로 하는 반도체 시험방법.In a test method of a semiconductor device capable of enabling or disabling an output terminal, a plurality of output terminals O 1 to O 8 are commonly connected, and the connection point is connected to the measurement terminal of the semiconductor test apparatus 102. And conducting the test with the other terminal of the plurality of output terminals connected in common being enabled and the other terminals being disabled. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019900011826A 1989-08-03 1990-08-01 Semiconductor testing method KR930006962B1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP1201853A JP2633692B2 (en) 1989-08-03 1989-08-03 Semiconductor test method
JP89-201853 1989-08-03
JP1-201853 1989-08-03

Publications (2)

Publication Number Publication Date
KR910005062A true KR910005062A (en) 1991-03-29
KR930006962B1 KR930006962B1 (en) 1993-07-24

Family

ID=16447970

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900011826A KR930006962B1 (en) 1989-08-03 1990-08-01 Semiconductor testing method

Country Status (2)

Country Link
JP (1) JP2633692B2 (en)
KR (1) KR930006962B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1065034A (en) * 1996-08-21 1998-03-06 Ngk Spark Plug Co Ltd Wiring substrate for electronic parts and package of electronic parts

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0634025B2 (en) * 1983-05-11 1994-05-02 株式会社日立製作所 Multi-terminal electronic circuit characteristic test equipment

Also Published As

Publication number Publication date
KR930006962B1 (en) 1993-07-24
JPH0365674A (en) 1991-03-20
JP2633692B2 (en) 1997-07-23

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