KR900007091U - 투명평행면체를 이용한 점광원의 평행주사 - Google Patents

투명평행면체를 이용한 점광원의 평행주사

Info

Publication number
KR900007091U
KR900007091U KR2019880016333U KR880016333U KR900007091U KR 900007091 U KR900007091 U KR 900007091U KR 2019880016333 U KR2019880016333 U KR 2019880016333U KR 880016333 U KR880016333 U KR 880016333U KR 900007091 U KR900007091 U KR 900007091U
Authority
KR
South Korea
Prior art keywords
light source
point light
parallel scanning
transparent parallelepiped
parallelepiped
Prior art date
Application number
KR2019880016333U
Other languages
English (en)
Other versions
KR910004649Y1 (ko
Inventor
박단
문여익
양길호
이창섭
Original Assignee
금성전선 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성전선 주식회사 filed Critical 금성전선 주식회사
Priority to KR2019880016333U priority Critical patent/KR910004649Y1/ko
Publication of KR900007091U publication Critical patent/KR900007091U/ko
Application granted granted Critical
Publication of KR910004649Y1 publication Critical patent/KR910004649Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
KR2019880016333U 1988-09-30 1988-09-30 투명평행면체를 이용한 점광원의 평행주사 KR910004649Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019880016333U KR910004649Y1 (ko) 1988-09-30 1988-09-30 투명평행면체를 이용한 점광원의 평행주사

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019880016333U KR910004649Y1 (ko) 1988-09-30 1988-09-30 투명평행면체를 이용한 점광원의 평행주사

Publications (2)

Publication Number Publication Date
KR900007091U true KR900007091U (ko) 1990-04-03
KR910004649Y1 KR910004649Y1 (ko) 1991-07-01

Family

ID=19279963

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019880016333U KR910004649Y1 (ko) 1988-09-30 1988-09-30 투명평행면체를 이용한 점광원의 평행주사

Country Status (1)

Country Link
KR (1) KR910004649Y1 (ko)

Also Published As

Publication number Publication date
KR910004649Y1 (ko) 1991-07-01

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Legal Events

Date Code Title Description
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee