KR890014080U - 표면저항 측정장치 - Google Patents
표면저항 측정장치Info
- Publication number
- KR890014080U KR890014080U KR2019870023884U KR870023884U KR890014080U KR 890014080 U KR890014080 U KR 890014080U KR 2019870023884 U KR2019870023884 U KR 2019870023884U KR 870023884 U KR870023884 U KR 870023884U KR 890014080 U KR890014080 U KR 890014080U
- Authority
- KR
- South Korea
- Prior art keywords
- measuring device
- surface resistance
- resistance measuring
- resistance
- measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019870023884U KR900010027Y1 (ko) | 1987-12-30 | 1987-12-30 | 표면저항 측정장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019870023884U KR900010027Y1 (ko) | 1987-12-30 | 1987-12-30 | 표면저항 측정장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR890014080U true KR890014080U (ko) | 1989-08-10 |
KR900010027Y1 KR900010027Y1 (ko) | 1990-10-29 |
Family
ID=19271092
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019870023884U KR900010027Y1 (ko) | 1987-12-30 | 1987-12-30 | 표면저항 측정장치 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR900010027Y1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100703929B1 (ko) * | 2005-11-22 | 2007-04-06 | 금능정밀(주) | 휴대폰 케이스의 표면저항 측정장치 |
-
1987
- 1987-12-30 KR KR2019870023884U patent/KR900010027Y1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100703929B1 (ko) * | 2005-11-22 | 2007-04-06 | 금능정밀(주) | 휴대폰 케이스의 표면저항 측정장치 |
Also Published As
Publication number | Publication date |
---|---|
KR900010027Y1 (ko) | 1990-10-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 19961211 Year of fee payment: 8 |
|
LAPS | Lapse due to unpaid annual fee |