KR890004532Y1 - Condensor measurement circuit - Google Patents

Condensor measurement circuit Download PDF

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KR890004532Y1
KR890004532Y1 KR2019860010331U KR860010331U KR890004532Y1 KR 890004532 Y1 KR890004532 Y1 KR 890004532Y1 KR 2019860010331 U KR2019860010331 U KR 2019860010331U KR 860010331 U KR860010331 U KR 860010331U KR 890004532 Y1 KR890004532 Y1 KR 890004532Y1
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South Korea
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capacitor
measured
multiplexer
terminal
amplifier
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KR2019860010331U
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KR880002996U (en
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감도영
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삼성전자 주식회사
한형수
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

내용 없음.No content.

Description

콘덴서 측정회로Capacitor Measuring Circuit

제1도는 본 고안의 회로도이다.1 is a circuit diagram of the present invention.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

1 : 사인파발생기 2,4 : 멀티플렉서1: Sine wave generator 2,4: Multiplexer

3 : 측정하고자하는 콘덴서가 삽입된 인쇄회로기판 5 : 차동증폭부3: printed circuit board in which a capacitor to be measured is inserted 5: differential amplifier

6 : 정류부 7 : 아날로그/디지탈변환기6: rectifier 7: analog / digital converter

8 : CPU 9 : 메모리소자8 CPU 9 memory element

OP1∼OP5: OP앰프 PC1∼PC3: 인쇄회로기판사에 삽입된 피측정콘덴서OP 1 to OP 5 : OP amplifier PC 1 to PC 3 : Capacitor to be inserted into the printed circuit board

본 고안은 인쇄회로기판(PCB : Printed Circuit Board)상에 삽입되어 배선되어진 콘덴서의 오삽입 여부를 측정하기 위한 콘덴서 측정회로에 관한 것으로, 특히 피측정콘덴서에 연결되어 있는 주변회로의 영향을 받지않고 콘덴서자체만의 고유임피던스값을 측정할수 있도록 콘덴서 측정회로에 관한 것이다.The present invention relates to a capacitor measuring circuit for measuring a misinsertion of a capacitor inserted and wired on a printed circuit board (PCB). In particular, the present invention is not affected by a peripheral circuit connected to a capacitor under measurement. The present invention relates to a capacitor measuring circuit so that the inherent impedance value of the capacitor itself can be measured.

일반적으로 부품이 삽입되어 배선되어져 있는 인쇄회로 기판이 정해진 기능을 옳바로 수행하고 있는지 여부를 확인하기 위해서는 인쇄회로 기판상에 삽입되어 배선된 부품들 중에서 먼저 정격치를 갖는 콘덴서가 제대로 삽입되어 설계규격 범위내에서 동작하고 있는지여부를 검사한 다음 완성품으로 조립을 해 주어야지만 완성된 제품의 불량발생을 배제할 수가 있게된다.In general, in order to check whether a printed circuit board to which parts are inserted and wired correctly performs a predetermined function, a capacitor having a rated value among the components inserted and wired on the printed circuit board is properly inserted so that the design specification range After checking whether it is operating in the inside and then assembling it to the finished product, it is possible to exclude the occurrence of defective product.

그런데 이렇게 인쇄회로 기판상에 삽입된 콘덴서의 임피던스를 측정하고자 하는 경우 종래에는 통상적으로 멀티테스터를 이용하여 측정하고 있었기 때문에 측정되느 콘덴서 주변에 연결된 콘덴서의 영향으로 말미암아 콘덴서 자체의 고유임피던스값만을 알수가 없고, 병렬로 연결된 콘덴서의 합성임피던스값만을 알 수가 있게되어 정격치의 콘덴서가 제대로 삽입되었는지를 확인하기가 곤란하였다.However, in order to measure the impedance of a capacitor inserted on a printed circuit board, conventionally, since a conventional test was performed using a multi-tester, only the inherent impedance value of the capacitor itself was unknown due to the influence of the capacitor connected to the capacitor. It was difficult to check whether the capacitor of the rated value was correctly inserted because only the composite impedance value of the capacitor connected in parallel was known.

본 고안은 상기와 같은 문제점을 개선하고자 고안된 것으로, 특정하고자 하는 피측정콘덴서와 주변콘덴서의 전위차를 동일하게 하여 주변콘덴서로는 전류가 인가되지 못하게 하고, 또 측정하고자 하는 피측정콘데서에만 전류가 인가되도록 하므로서 피측정콘덴서의 전위차로 임피던스 값을 계산해내므로써 주변에 연결된 영향이 없는 피측정콘덴서에 대해서만의 정확한 콘덴서의 임피던스값을 측정할수 있도록 된 콘덴서 측정회로를 제공하고자 함에 그 목적이 있다.The present invention is designed to improve the above problems, the same potential difference between the capacitor to be measured and the capacitor to be specified so that the current is not applied to the peripheral capacitor, the current is applied only to the measured capacitor to be measured. The purpose of the present invention is to provide a capacitor measuring circuit which can measure the impedance value of the capacitor only for the capacitor without the influence connected to the peripheral by calculating the impedance value by the potential difference of the capacitor under measurement.

이하 본 고안이 구성 및 작용, 효과를 예시도면에 의거하여 상세히 설명하면 다음과 같다.Hereinafter, the present invention will be described in detail with reference to the configuration, operation, and effects as follows.

본 고안은 시인파발생기(1)에 저항(R1)(R2)과 OP앰프(OP2)를 통하여 멀티플렉서(2)내의 스위치(SW3)(SW4)가 연결되고, 상기 멀티플렉서(2)내의 스위치(SW3)(SW4)의 접속점에는 측정하고자 하는 콘덴서가 삽입된 인쇄기판회로(3)의 피측정콘덴서 일단에 전압을 인가하기 위한 단자가 연결되며, OP앰프(OP1)에는 멀티플레서(SW1)(SW2)를 통해서 측정하고자 하는 콘덴서가 삽입된 인쇄회로기판(3)내의 외부소자의 영향을 제거하기 위한 등전위 인가단자가 연결되고, 상기 측정하고자 하는 콘덴서가 삽입된 인쇄회로기판(2)내의 피측정콘덴서(PC1)의 다른 일단에는 멀티플렉서(2)를 통하여 OP엠프(OP3∼OP5)와 저항(R3∼R11)및 스위치(SW7∼SW11)로 구성되어진 피측정콘덴서(PC1)의 양단의 임피던스 신호를 증폭시키는 차동증폭부(5)가 연결되며, 상기 차동증폭부(5)에는 정류부(6)와 아날로그/디지탈변환기(7), CPU(8)및 메모리소자(9)가 차례로 연결구조로 되어 있다.The present invention is connected to the switch (SW 3 ) (SW 4 ) in the multiplexer (2) through the resistor (R 1 ) (R 2 ) and the OP amplifier (OP 2 ) to the visual wave generator (1), the multiplexer (2) The terminal for applying a voltage to one end of the capacitor under measurement of the printed circuit board 3 into which the capacitor to be measured is inserted is connected to the connection point of the switch SW 3 and SW 4 in the OP switch OP 1 . Through the multiplexer SW 1 and SW 2 , an equipotential application terminal for removing the influence of external elements in the printed circuit board 3 into which the capacitor to be measured is inserted is connected, and the capacitor is to be printed. the other end of the measurement capacitor (PC 1) in the circuit board (2) OP amplifier through a multiplexer (2) (3 OP ~OP 5) and the resistor (R 3 ~R 11) and a switch (SW 7 ~SW 11) and a differential amplifying part (5) for amplifying a signal across the impedance of the measured capacitor (PC 1) been configured to connect the differential increase Section 5 has a holding portion (6) and an analog / digital converter (7), CPU (8) and the memory device 9 is in turn connected structure.

제1도는 상기한 구조로 되어있는 본 고안의 회로도를 나타낸 것으로서, 인쇄회로기판(3)상에는 콘덴서(PC1∼PC3)을 비롯한 많은 부품들이 삽입되게 되는데, 이중병렬로 연결된 콘덴서(PC1)의 고유임피던스값을 측정하는 것을 예로들어 설명하면 다음과 같다.1 shows a circuit diagram of the present invention having the above-described structure, and many components including capacitors PC 1 to PC 3 are inserted onto the printed circuit board 3, and the capacitors PC 1 connected in parallel. Taking an example of measuring the intrinsic impedance of, it is as follows.

이 경우 CPU(8)에서는 멀티플렉서(2)(4)에 제어신호를 공급하여 스위치(SW1∼SW6)모두와 메모리소자(9)내에 미리 저장된 측정하고자 하는 용량의 콘덴서(PC1)의 값에 따라 스위치(SW7∼SW11)중 한개가 온되게 한다.In this case, the CPU 8 supplies the control signals to the multiplexers 2 and 4 so that both the switches SW 1 to SW 6 and the value of the capacitor PC 1 of the capacitance to be stored in advance in the memory element 9 are measured. To turn on one of the switches SW 7 to SW 11 .

이상태에서 사인파(Sine Wave)발생기(1)에서 출력된 신호가 OP앰프(OP1)의 (-)단자에 인가되면 OP앰프(OP2)에서는 "t-1" 배 증폭된 출력신호를 멀티플렉서(2)내의 스위치(SW4)를 통해서 측정하고자하는 콘덴서가 삽입된 인쇄회로기판(3)내의 피측정콘덴서(PC1)의 일단에 인가하게된다. 이때 볼 테이지 폴로워로 구성된 OP앰프(OP1)의 출력신호는 (+)단자의 전위와 같은 접지전위가 되어 측정하고자 하는 콘덴서가 삽입된 인쇄회로기판(3)내의 외부콘덴서(PC2)및 콘덴서(PC3)의 중간접속점에 인가되게 되고, 측정하고자 하는 콘덴서가 삽입된 인쇄회로기판(3)내의 피측정콘덴서(PC1)와 외부콘덴서(PC3)의 접속점에도 OP앰프(OP3)의 특성에 의해서(-)단자의 전위와 (+)단자의 전위가 같게되므로 접지전위가 인가되게 된다. 따라서 콘덴서(PC3)양단에서 전위차가 없어지게 되어 전류가 흐를수 없게 되므로 전류는 콘덴서(PC2)를 통해 OP앰프(OP1)로 흐르게 되는 한편, 외부콘덴서(OP2)는 피측정콘덴서(PC1)와 별개의 회로를 구성하게 되므로 콘덴서(PC1)의 임피던스측정에 아무런 영향을 주지 않게 된다. 따라서 OP앰프(OP2)의 출력신호에 대한 접속점(A)과 접속점(B)양단간의 임피던스는 피측정콘덴서(PC1)하나만의 임피던스가 되게 된다.The signal output from the sine wave (Sine Wave) generator (1) in this state of the OP amplifier (OP 1) (-) is applied to the terminal OP amplifier (OP 2) the multiplexer to "t-1" times the amplified output signal ( 2) The switch SW 4 is applied to one end of the capacitor to be measured PC 1 in the printed circuit board 3 into which the capacitor to be measured is inserted. At this time, the output signal of the OP amplifier OP 1 composed of the ball stage follower becomes the ground potential equal to the potential of the positive terminal, and thus the external capacitor PC 2 in the printed circuit board 3 into which the capacitor to be measured is inserted. capacitor and to be applied to the intermediate connection point of the (PC 3), to avoid the connection point of the measuring capacitors (PC 1) and the external capacitor (PC 3) in the printed circuit board 3, the capacitor is inserted to be measured OP amplifier (OP 3) The ground potential is applied because the potential of the (-) terminal and the (+) terminal are the same due to the characteristic of. Therefore, since the potential difference is eliminated at the both ends of the condenser PC 3 , the current cannot flow, and the current flows through the condenser PC 2 to the OP amplifier OP 1 , while the external capacitor OP 2 is connected to the condenser under measurement. Since PC 1 ) is composed of a separate circuit, it does not affect the impedance measurement of the capacitor (PC 1 ). Therefore, the impedance between the connection point A and the connection point B with respect to the output signal of the OP amplifier OP 2 becomes the impedance of only one capacitor to be measured PC 1 .

즉, 콘덴서(PC1)와 콘덴서(PC2)(PC3)가 병렬로 연결되어 있어도 콘덴서(PC1)하나만의 임피던스가 접속점(A)와 접속점(B)사이에 나타나게 된다. 따라서 미리 선택된 저항(R5)/측정하고자 하는 콘덴서(PC1)양단의 임피던스의 비를 차동증폭부(5)내의 OP앰프(OP3∼OP5)에 의하여 증폭시킨 다음 정류부(6)에서 정류시켜 아날로그/디지탈변환기(7)에 입력시키게 되면 상기 아날로그/디지탈변환기(7)에서는 디지탈신호로 변환시켜CPU(8)로 공급하게 되고, 그에따라 CPU에서는 미리 메모리소자(9)에 기억되어 있는 데이터와 비교하여 콘덴서의 용량을 측정하므로서 피측정콘덴서(PC1)가 허용범위내의것인지 오삽입된 것인지를 모니터나 프린터(표시되어 있지 않음)등을 통해서 알려주게 된다.That is, even when the capacitor PC 1 and the capacitor PC 2 (PC 3 ) are connected in parallel, the impedance of only the capacitor PC 1 appears between the connection point A and the connection point B. Therefore, the ratio of the resistor R 5 selected in advance to the impedance across the capacitor PC 1 to be measured is amplified by the OP amplifiers OP 3 to OP 5 in the differential amplifier 5 , and then rectified by the rectifier 6. When the analog / digital converter 7 is inputted to the analog / digital converter 7, the analog / digital converter 7 converts the digital signal into a digital signal and supplies the same to the CPU 8. Accordingly, the CPU stores data previously stored in the memory element 9. By measuring the capacity of the capacitor, the monitor or printer (not shown) indicates whether the capacitor under test (PC 1 ) is within the allowable range or is incorrectly inserted.

또한, 콘덴서(PC2)를 측정하고자 할 경우에는 OP앰프(OP2)의 출력단자에 측정하고자 하는 콘덴서(PC2)의 일단을 연결시키고, 콘덴서(PC1)와 콘덴서(PC3)중간접속점에 등전위를 형성시켜 주기위한 OP앰프(OP1)의 출력단자를 연결시키며, 측정하고자 하는 콘덴서(PC2)의 다른 일단에는 등정위인 OP앰프(OP3)의 단자의 전원을 연결시켜 주게되므로써 상기한 바와같이 측정하고자 하는 콘덴서(PC2)와 주변의 콘덴서(PC3)를 별개의 회로로 하여 콘덴서(PC2)의 임피던스만을 측정할 수 있게 되는 것이다.Also, when you want to measure the condenser (PC 2), the OP amplifier (OP 2) connected to one end of the capacitor (PC 2) to be measured to the output terminal and, a capacitor (PC 1) and the capacitor (PC 3) an intermediate connection point of the By connecting the output terminal of the OP amplifier (OP 1 ) to form an equipotential to the other end, and the other end of the capacitor (PC 2 ) to be measured to connect the power of the terminal of the OP amplifier (OP 3 ) of equipotential a capacitor to the (PC 2) and around the capacitor (PC 3) to be measured, as a separate circuit it is possible to only measure the impedance of the capacitor (PC 2).

상기한 바와같이 본 고안은 주변회로와 함께 연결된 콘덴서를 전위차로써 분리하여 측정하도록 하므로서 콘덴서자체의 고유용량값을 주변회로의 영향없이 정확하게 측정할 수 있고, 이에따라 제품조립시의 신뢰성을 높이며, 작업능률을 증진시킬수 있는 장점이 있다.As described above, the present invention allows the capacitor connected with the peripheral circuit to be measured separately by the potential difference, so that the intrinsic capacitance value of the capacitor can be accurately measured without the influence of the peripheral circuit, thereby increasing reliability in assembling the product and improving work efficiency. There is an advantage that can be promoted.

Claims (1)

통상의 아날로그/디지탈변환기(7), CPU(8)및 메모리소자(9)를 구비한 부품측정회로에 있어서, 사인파발생기(1)에는 저항(R1)(R2)과 OP앰프(OP2)를 통해 멀티플렉서(2)내의 스위치(SW3)(SW4)가 연결되고, 상기 멀티플레서(2)내의 스위치(SW3)(SW4)에는 측정하고자하는 콘덴서에 일정전압을 인가시키기 위한 단자가 연결되며, 볼테이지 폴로워로 구성된 OP앰프(OP1)의 출력단자에는 멀티플렉서(2)내의 스위치(SW1) (SW2)를통해서 측정이 불필요한 콘덴서의 한단자에 등전위를 인가시키는 단자가 연결되고, 측정하고자 하는 콘덴서의 한등전위 단자와 연결되어 있는 멀티플렉서(2)내의 스위치(SW5)(SW6)에는 OP앰프(OP3∼OP5)와 멀티플렉서(4)및 저항(R4∼R11)으로 구성되어 측정하고자 하는 콘덴서 양단의 임피던스신호를 증폭시키는차동증폭부(5)가 연결되며, 상기 차동증폭부(5)의 출력단에는 정류부(6)와 상기 통상의 아날로그/디지탈변환기(7)가 차례로 연결되어, 주변결합소자의 영향을 받지않고, 피측정콘덴서만의 임피던스를 신속히 측정할 수 있도록 된 것을 특징으로 하는 콘덴서 측정회로.In a component measuring circuit having a conventional analog / digital converter (7), a CPU (8), and a memory element (9), a sine wave generator (1) includes a resistor (R 1 ) (R 2 ) and an OP amplifier (OP 2). Is connected to the switch (SW 3 ) (SW 4 ) in the multiplexer (2), the terminal for applying a constant voltage to the capacitor to be measured in the switch (SW 3 ) (SW 4 ) in the multiplexer (2) The output terminal of the OP amplifier OP 1 composed of a voltage follower has a terminal for applying an equipotential to one terminal of a capacitor that is not required to be measured through a switch SW 1 (SW 2 ) in the multiplexer 2. The switches SW 5 and SW 6 in the multiplexer 2 connected to the equal potential terminal of the capacitor to be measured are connected to the OP amplifiers OP 3 to OP 5 , the multiplexer 4, and the resistors R 4 to. R 11 ) is connected to a differential amplifier (5) for amplifying the impedance signal across the capacitor to be measured, The rectifier 6 and the conventional analog / digital converter 7 are sequentially connected to the output terminal of the differential amplifier 5 so that the impedance of the capacitor under measurement can be quickly measured without being influenced by the peripheral coupling element. Capacitor measurement circuit, characterized in that.
KR2019860010331U 1986-07-16 1986-07-16 Condensor measurement circuit KR890004532Y1 (en)

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KR2019860010331U KR890004532Y1 (en) 1986-07-16 1986-07-16 Condensor measurement circuit

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KR2019860010331U KR890004532Y1 (en) 1986-07-16 1986-07-16 Condensor measurement circuit

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KR880002996U KR880002996U (en) 1988-04-11
KR890004532Y1 true KR890004532Y1 (en) 1989-07-08

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