KR880701879A - 파괴물 부스러기 검지기 - Google Patents

파괴물 부스러기 검지기

Info

Publication number
KR880701879A
KR880701879A KR1019880700626A KR880700626A KR880701879A KR 880701879 A KR880701879 A KR 880701879A KR 1019880700626 A KR1019880700626 A KR 1019880700626A KR 880700626 A KR880700626 A KR 880700626A KR 880701879 A KR880701879 A KR 880701879A
Authority
KR
South Korea
Prior art keywords
debris detector
debris
detector
Prior art date
Application number
KR1019880700626A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR880701879A publication Critical patent/KR880701879A/ko

Links

Classifications

    • G01N15/132—
    • G01N2015/138—
KR1019880700626A 1986-10-03 1988-06-03 파괴물 부스러기 검지기 KR880701879A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/915,185 US4775833A (en) 1986-10-03 1986-10-03 Lodged debris detector for a particle analyzer
PCT/US1987/002537 WO1988002486A1 (en) 1986-10-03 1987-10-02 Debris detector

Publications (1)

Publication Number Publication Date
KR880701879A true KR880701879A (ko) 1988-11-05

Family

ID=25435371

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019880700626A KR880701879A (ko) 1986-10-03 1988-06-03 파괴물 부스러기 검지기

Country Status (11)

Country Link
US (1) US4775833A (ko)
EP (1) EP0285657A4 (ko)
JP (1) JPH02503351A (ko)
KR (1) KR880701879A (ko)
CN (1) CN1012015B (ko)
AU (1) AU601253B2 (ko)
BR (1) BR8707488A (ko)
CA (1) CA1279698C (ko)
ES (1) ES2005632A6 (ko)
NZ (1) NZ222026A (ko)
WO (1) WO1988002486A1 (ko)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5675517A (en) * 1995-04-25 1997-10-07 Systemix Fluorescence spectral overlap compensation for high speed flow cytometry systems
GB9624096D0 (en) * 1996-11-20 1997-01-08 Microbial Systems Ltd Apparatus and method of use thereof
US6418802B1 (en) 1996-11-21 2002-07-16 Michael Anthony Wood Particle sizing apparatus and method of use thereof
US5907240A (en) * 1997-05-12 1999-05-25 Cdc Technologies, Inc. Method and apparatus for cell differentiation by measuring apparent cell size, membrane integrity and intracellular complexity
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US8146407B2 (en) * 2008-06-20 2012-04-03 Beckman Coulter, Inc. Particle counter with electronic detection of aperture blockage
JP5083287B2 (ja) * 2009-09-11 2012-11-28 セイコーエプソン株式会社 検出装置、物理量測定装置及び電子機器
US9768137B2 (en) 2012-04-30 2017-09-19 Taiwan Semiconductor Manufacturing Company, Ltd. Stud bump structure for semiconductor package assemblies
CA2896727C (en) 2013-03-12 2020-07-14 Novelis Inc. Methods of and apparatus for determining particle inclusion and size in molten metal
EP2948752B1 (en) 2013-03-12 2017-05-03 Novelis, Inc. Methods of and apparatus for measuring metal cleanliness
CN104515725B (zh) * 2013-09-30 2017-08-22 深圳迈瑞生物医疗电子股份有限公司 一种识别异常粒子的方法和系统及其细胞分析仪
FR3034520B1 (fr) 2015-04-02 2020-02-14 Horiba Abx Sas Dispositif de comptage de particules
FR3058524B1 (fr) * 2016-11-07 2019-01-25 Institut National De La Sante Et De La Recherche Medicale Procede de caracterisation d'un echantillon sanguin

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3259842A (en) * 1959-08-19 1966-07-05 Coulter Electronics Particle analyzing device
US3259891A (en) * 1964-05-01 1966-07-05 Coulter Electronics Debris alarm
US3668531A (en) * 1966-02-23 1972-06-06 Coulter Electronics Pulse analyzing apparatus
CH566008A5 (ko) * 1973-12-14 1975-08-29 Secheron Atel
US3938038A (en) * 1974-07-01 1976-02-10 Coulter Electronics, Inc. Method and apparatus for providing primary coincidence correction during particle analysis
US3987391A (en) * 1974-12-02 1976-10-19 Coulter Electronics, Inc. Method and apparatus for correcting total particle volume error due to particle coincidence
DE2929272A1 (de) * 1979-07-19 1981-02-12 Siemens Ag Ueberwachungseinrichtung fuer die spannungsbelastung eines kondensators
US4412175A (en) * 1981-04-30 1983-10-25 Coulter Electronics, Inc. Debris alarm
JPS5921220A (ja) * 1982-07-24 1984-02-03 三菱電機株式会社 過電圧保護継電装置
US4558310A (en) * 1982-09-29 1985-12-10 Mcallise Raymond J Current sensing device and monitor
JPS61124850A (ja) * 1984-11-21 1986-06-12 Eruma Kogaku Kk 超純水の不純物測定装置

Also Published As

Publication number Publication date
AU8325387A (en) 1988-04-21
BR8707488A (pt) 1988-12-06
NZ222026A (en) 1990-03-27
US4775833A (en) 1988-10-04
CA1279698C (en) 1991-01-29
JPH0358660B2 (ko) 1991-09-06
CN87106641A (zh) 1988-06-22
WO1988002486A1 (en) 1988-04-07
ES2005632A6 (es) 1989-03-16
JPH02503351A (ja) 1990-10-11
EP0285657A4 (en) 1990-01-08
CN1012015B (zh) 1991-03-13
EP0285657A1 (en) 1988-10-12
AU601253B2 (en) 1990-09-06

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Legal Events

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WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid