KR880013858U - 에코믹서의 지연시간 측정회로 - Google Patents

에코믹서의 지연시간 측정회로

Info

Publication number
KR880013858U
KR880013858U KR2019860022283U KR860022283U KR880013858U KR 880013858 U KR880013858 U KR 880013858U KR 2019860022283 U KR2019860022283 U KR 2019860022283U KR 860022283 U KR860022283 U KR 860022283U KR 880013858 U KR880013858 U KR 880013858U
Authority
KR
South Korea
Prior art keywords
eco
mixer
delay time
time measurement
measurement circuit
Prior art date
Application number
KR2019860022283U
Other languages
English (en)
Other versions
KR900001513Y1 (ko
Inventor
이병희
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR2019860022283U priority Critical patent/KR900001513Y1/ko
Publication of KR880013858U publication Critical patent/KR880013858U/ko
Application granted granted Critical
Publication of KR900001513Y1 publication Critical patent/KR900001513Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
KR2019860022283U 1986-12-31 1986-12-31 에코믹서의 지연시간 측정회로 KR900001513Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019860022283U KR900001513Y1 (ko) 1986-12-31 1986-12-31 에코믹서의 지연시간 측정회로

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019860022283U KR900001513Y1 (ko) 1986-12-31 1986-12-31 에코믹서의 지연시간 측정회로

Publications (2)

Publication Number Publication Date
KR880013858U true KR880013858U (ko) 1988-08-30
KR900001513Y1 KR900001513Y1 (ko) 1990-02-28

Family

ID=19258783

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019860022283U KR900001513Y1 (ko) 1986-12-31 1986-12-31 에코믹서의 지연시간 측정회로

Country Status (1)

Country Link
KR (1) KR900001513Y1 (ko)

Also Published As

Publication number Publication date
KR900001513Y1 (ko) 1990-02-28

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