KR880003187A - 감광막의 접착도 측정방법 - Google Patents

감광막의 접착도 측정방법 Download PDF

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Publication number
KR880003187A
KR880003187A KR1019860006773A KR860006773A KR880003187A KR 880003187 A KR880003187 A KR 880003187A KR 1019860006773 A KR1019860006773 A KR 1019860006773A KR 860006773 A KR860006773 A KR 860006773A KR 880003187 A KR880003187 A KR 880003187A
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KR
South Korea
Prior art keywords
photosensitive film
film
measuring
measuring adhesion
silicon oxide
Prior art date
Application number
KR1019860006773A
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English (en)
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KR940004660B1 (ko
Inventor
박명덕
Original Assignee
구자학
주식회사 금성사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 구자학, 주식회사 금성사 filed Critical 구자학
Priority to KR1019860006773A priority Critical patent/KR940004660B1/ko
Publication of KR880003187A publication Critical patent/KR880003187A/ko
Application granted granted Critical
Publication of KR940004660B1 publication Critical patent/KR940004660B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00—Investigating materials by mechanical methods
    • G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/50—Conditioning of the sorbent material or stationary liquid

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

내용 없음

Description

감광막의 접착도 측정방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
첨부된 도면은 본 발명의 측정방법을 보인 설명도이다.
* 도면의 주요부분에 대한 부호의 설명
1 : 실리콘 산화막 2 : 감광막
3, 3' : 이오닉 솔루션 4, 4' : 프로우브
5 : 전압원 6 : 암메타

Claims (1)

  1. 실리콘 산화막(1)에 도포된 감광막(2)의 양측을 현상하여 그 현상된 부위에 이오닉 솔루션(3)(3')을 설치하여 실리콘 산화막(1)과 감광막(2)에 접촉되게 하고, 그 이오닉 솔루션(3)(3')에 프로우브(4)(4時)를 접촉시키고, 전압원(5)으로 포텐셜 전압을 인가한 후 암메타(6)로 흐르는 전류를 측정하여 감광막의 접착도를 측정함을 특징으로 하는 감광막의 접착도 측정방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019860006773A 1986-08-16 1986-08-16 감광막의 접착도 측정방법 KR940004660B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019860006773A KR940004660B1 (ko) 1986-08-16 1986-08-16 감광막의 접착도 측정방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019860006773A KR940004660B1 (ko) 1986-08-16 1986-08-16 감광막의 접착도 측정방법

Publications (2)

Publication Number Publication Date
KR880003187A true KR880003187A (ko) 1988-05-14
KR940004660B1 KR940004660B1 (ko) 1994-05-27

Family

ID=19251738

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860006773A KR940004660B1 (ko) 1986-08-16 1986-08-16 감광막의 접착도 측정방법

Country Status (1)

Country Link
KR (1) KR940004660B1 (ko)

Also Published As

Publication number Publication date
KR940004660B1 (ko) 1994-05-27

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