KR860008329U - 순차회로의 시험장치 - Google Patents

순차회로의 시험장치

Info

Publication number
KR860008329U
KR860008329U KR2019840013749U KR840013749U KR860008329U KR 860008329 U KR860008329 U KR 860008329U KR 2019840013749 U KR2019840013749 U KR 2019840013749U KR 840013749 U KR840013749 U KR 840013749U KR 860008329 U KR860008329 U KR 860008329U
Authority
KR
South Korea
Prior art keywords
test equipment
circuit test
sequential circuit
sequential
equipment
Prior art date
Application number
KR2019840013749U
Other languages
English (en)
Other versions
KR870000638Y1 (ko
Inventor
이무영
Original Assignee
주식회사금성사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사금성사 filed Critical 주식회사금성사
Priority to KR2019840013749U priority Critical patent/KR870000638Y1/ko
Publication of KR860008329U publication Critical patent/KR860008329U/ko
Application granted granted Critical
Publication of KR870000638Y1 publication Critical patent/KR870000638Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019840013749U 1984-12-21 1984-12-21 순차회로의 시험장치 KR870000638Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019840013749U KR870000638Y1 (ko) 1984-12-21 1984-12-21 순차회로의 시험장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019840013749U KR870000638Y1 (ko) 1984-12-21 1984-12-21 순차회로의 시험장치

Publications (2)

Publication Number Publication Date
KR860008329U true KR860008329U (ko) 1986-07-24
KR870000638Y1 KR870000638Y1 (ko) 1987-02-21

Family

ID=70161983

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019840013749U KR870000638Y1 (ko) 1984-12-21 1984-12-21 순차회로의 시험장치

Country Status (1)

Country Link
KR (1) KR870000638Y1 (ko)

Also Published As

Publication number Publication date
KR870000638Y1 (ko) 1987-02-21

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 19951226

Year of fee payment: 10

LAPS Lapse due to unpaid annual fee