KR850008026A - Block division semiconductor memory device having divided bit lines - Google Patents

Block division semiconductor memory device having divided bit lines Download PDF

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Publication number
KR850008026A
KR850008026A KR1019850003762A KR850003762A KR850008026A KR 850008026 A KR850008026 A KR 850008026A KR 1019850003762 A KR1019850003762 A KR 1019850003762A KR 850003762 A KR850003762 A KR 850003762A KR 850008026 A KR850008026 A KR 850008026A
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South Korea
Prior art keywords
bit line
memory device
semiconductor memory
cell array
data
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KR1019850003762A
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Korean (ko)
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요시히로(외 1) 다께매
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야마모도 다꾸마
후지쓰 가부시끼가이샤
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Publication of KR850008026A publication Critical patent/KR850008026A/en

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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices

Abstract

내용 없음No content

Description

분할된 비트라인들을 갖는 블록분할 반도체 메모리장치Block division semiconductor memory device having divided bit lines

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제9도는 본 발명에 의한 절반 비트라인을 갖는 다이나믹 램의 제1실시예의 회로도, 제10도는 제9도의 감지증폭기의 회로도, 제11도는 본 발명에 의한 절반 비트라인들을 갖는 다이나믹 램의 제2실시예의 회로도9 is a circuit diagram of a first embodiment of a dynamic RAM having a half bit line according to the present invention, FIG. 10 is a circuit diagram of a sense amplifier of FIG. 9, and FIG. 11 is a second embodiment of a dynamic ram having half bit lines according to the present invention. Schematic diagram

Claims (11)

다수의 블록들로 분할된 메모리셀 에레이 (1,2,‥‥, 1-1, 1-2, 2-1, 2-2‥‥)와, 하나의 상기 다수 블록들에 대해 제공되는 다수의 부분비트 라인수단(BL1,BL1,BL2,BL2‥‥)와 상기 다수외 블록들의 각각의 부분비트 라인수단에 공통으로 제공되는 다수의 버스비트라인수단(BL0,BL0)와 상기 다수의 버스티트라인수단중 하나와 상기 다수의 부분비트라인 수단중 하나간에 각각 연결되는 다수의 데이타 전송수단(Q1,Q1'/,Q2,Q2',‥‥)와 그리고 각각의 부분비트 라인수단으로부터 선택된 데이타 전송수단을 통하여 각 버스 비트라인 수단으로 상기 메모리셀 어레이의 데이타를 전송시타도록 적어도 하나의 상기 복수의 데이타 전송수단을 선택하여 도통시키기 위해 상기 다수의 데이타 전송수단에 연결되는 선택수단을 포함하는 반도체 메모리 장치.A memory cell array (1, 2, ..., 1-1, 1-2, 2-1, 2-2 ...) divided into a plurality of blocks, and a plurality of blocks provided for one of the plurality of blocks A plurality of bus bit line means BL 0 and BL 0 which are provided in common to the partial bit line means BL 1 , BL 1 , BL 2 , BL 2. A plurality of data transfer means (Q 1 , Q 1 '/, Q 2 , Q 2 ', ...) connected between one of the plurality of burst line means and one of the plurality of partial bit line means, respectively; and The plurality of data transfer means for selecting and conducting at least one of the plurality of data transfer means to transfer data of the memory cell array from each partial bit line means to each bus bit line means. And a selection means connected to the semiconductor memory device. 제1항에서, 다수의 감지증폭기들(SA1,SA2‥‥)을 더 포함하되, 각각은 상기 다수의 부분 비트라인 수단의 전위를 증폭시키기 위해 상기 다수의 부분비트라인 수단중 하나에 연결되는 것이 특징인 반도체 메모리 장치.2. The apparatus of claim 1 , further comprising a plurality of sense amplifiers SA 1 , SA 2 ..., each connected to one of said plurality of bit line means for amplifying the potential of said plurality of bit line means. A semiconductor memory device characterized in that the. 제2항에서, 상기 다수의 부분 비트라인 수단은 상기 복수의 감지증폭기 들중 하나에 연결되는 배수형인 한쌍의 부분 비트라인들(BL1,BL1,BL2,BL2,‥‥)을 포함하는 것이 특징인 반도체 메모리 장치.3. The apparatus of claim 2, wherein the plurality of partial bit line means comprises a pair of partial bit lines BL 1 , BL 1 , BL 2 , BL 2 , ..., which are multiples of one of the plurality of sense amplifiers. The semiconductor memory device characterized in that. 제2항에서, 상기 복수의 부분 비트라인 수단은 상기 복수의 감지 증폭기들중 하나에 연결되는 개방형인 한쌍의 부분 비트라인들(BL1,BL1,BL2,B2,‥‥)을 포함하는 것이 특징인 반도체 메모리 장치.3. The apparatus of claim 2, wherein the plurality of partial bit line means comprises a pair of open partial bit lines BL 1 , BL 1 , BL 2 , B 2 , ..., which are connected to one of the plurality of sense amplifiers. The semiconductor memory device characterized in that. 제1항에서, 공통데이타 버스수단(DB,DB)와, 그리고 상기 복수의 버스비트라인 수단중 하나를 선택하고 또한 상기 공통데이타 버스수단에 그것을 연결하기 위해 상기 다수의 버스비트라인 수단과 상기 공통데이타 버스 수단간에 연결되는 선택수단L(D)를 때 포함하는 것이 특징인 반도체 메모리 장치.2. The apparatus of claim 1, further comprising: common data bus means (DB, DB) and said plurality of bus bit line means and said common to select one of said plurality of bus bit line means and to connect it to said common data bus means. And a selection means L (D) connected between the data bus means. 제2항에서, 각각의 상기 복수의 감지증폭기들은 능동복원 회로를 갖고있는 것이 특징인 반도체 메모리 장치.3. The semiconductor memory device of claim 2, wherein each of said plurality of sense amplifiers has an active recovery circuit. 제6항에서, 상기 복수의 데이타 전송수단을 도통시킴이 없이 각 부분 비트라인 수단에 상기 메모리 셀어레이의 각 블록의 데이타를 전송시키기 위해 상기 메모리 셀어레이에 연결되는 정화수단을 더 포함하는 것이 특징인 반도체 메모리 장치.7. The apparatus of claim 6, further comprising purifying means connected to said memory cell array for transferring data of each block of said memory cell array to each partial bitline means without conducting said plurality of data transfer means. Semiconductor memory device. 제6항에서, 상기 다수의 데이타 전송수단중 단 하나를 도통시켜 각 부분 비트라인 수단에 상기 메모리 셀어레이의 각 블리의 데이타를 전송시키도록 상기 메모록셀과 상기 다수의 데이타 전송수단에 연결되는 정화수단을 더 포함하는 것이 특징인 반도체 메모리 장치.7. The purifying apparatus according to claim 6, wherein the memo-lock cell and the plurality of data transfer means are connected to each other so as to conduct only one of the plurality of data transfer means to transfer data of each bled of the memory cell array to each partial bit line means. A semiconductor memory device, characterized in that it further comprises means. 제1항에서, 상기 복수의 부분 비트수단의 더 높은 전위를 풀엎시키도록 상기 다수의 버스 비트라인수단중 하나에 각각 연결되는 능동복원회로들(AR)을 때 포함하는 것이 특징인 반도체 메모리 장치.2. The semiconductor memory device according to claim 1, comprising active recovery circuits (AR) each connected to one of said plurality of bus bit line means to pull down the higher potentials of said plurality of partial bit means. 제9항에서, 상기 다수의 데이타 전송수단을 도통시킴이 없이 각각의 부분 비트라인 수단에 상기 디모리 셀어레이의 각 블록의 데이타를 전송시키도록 상기 메모리 셀어리이에 연결되는 정화수단을 더 포함하는 것이 특징인 반도체 메모리 장치10. The apparatus of claim 9, further comprising: purging means connected to the memory cell array to transfer data of each block of the demory cell array to each partial bitline means without conducting the plurality of data transfer means. Semiconductor memory device 제9항에서, 상기 다수의 데이타 전송수단중 단 하나만을 도통시켜서 각각의 부분 비트라인 수단에 상기 메모리 셀어레이의 각 블록의 데이타를 전송시키도록 상기 메모리 셀어레이와 상기 다수의 데이터 전송수단에 연결되는 정화수단을 더 포함하는 것이 특징인 반도체 메모리 장치.10. The memory cell array of claim 9, wherein only one of the plurality of data transfer means is connected to the memory cell array and the plurality of data transfer means to transfer data of each block of the memory cell array to each partial bit line means. A semiconductor memory device, characterized in that it further comprises purifying means. ※ 참고사창 : 최초출원 내용에 의하여 공개하는 것임.※ Reference window: This is to be disclosed based on the initial application.
KR1019850003762A 1984-05-30 1985-05-30 Block division semiconductor memory device having divided bit lines KR850008026A (en)

Applications Claiming Priority (2)

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JP59110288A JPS60253096A (en) 1984-05-30 1984-05-30 Semiconductor storage device
JP59-110288 1984-05-30

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100324013B1 (en) * 1994-04-27 2002-05-13 박종섭 Data transfer method of semiconductor device and device thereof

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0169460B1 (en) * 1984-07-26 1991-05-15 Texas Instruments Incorporated Dynamic memory array with segmented and quasi-folded bit lines
US4658377A (en) * 1984-07-26 1987-04-14 Texas Instruments Incorporated Dynamic memory array with segmented bit lines
JPS6192495A (en) * 1984-10-11 1986-05-10 Nippon Telegr & Teleph Corp <Ntt> Semiconductor memory device
US4819207A (en) * 1986-09-30 1989-04-04 Kabushiki Kaisha Toshiba High-speed refreshing rechnique for highly-integrated random-access memory
JP2713929B2 (en) * 1987-11-25 1998-02-16 株式会社東芝 Semiconductor storage device
JP2720158B2 (en) * 1988-01-22 1998-02-25 株式会社日立製作所 Semiconductor storage device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100324013B1 (en) * 1994-04-27 2002-05-13 박종섭 Data transfer method of semiconductor device and device thereof

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