KR850007814A - New Nickel / Indium Alloys Used in the Manufacturing of Electrical Contact Electrical Devices - Google Patents

New Nickel / Indium Alloys Used in the Manufacturing of Electrical Contact Electrical Devices Download PDF

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Publication number
KR850007814A
KR850007814A KR1019850002905A KR850002905A KR850007814A KR 850007814 A KR850007814 A KR 850007814A KR 1019850002905 A KR1019850002905 A KR 1019850002905A KR 850002905 A KR850002905 A KR 850002905A KR 850007814 A KR850007814 A KR 850007814A
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KR
South Korea
Prior art keywords
indium
alloy
nickel
chelating agent
electrical contact
Prior art date
Application number
KR1019850002905A
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Korean (ko)
Inventor
조셉 사뮤엘즈 죠지
Original Assignee
로이 에이취. 맷신길
알라이드 코오포레이션
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Publication date
Application filed by 로이 에이취. 맷신길, 알라이드 코오포레이션 filed Critical 로이 에이취. 맷신길
Publication of KR850007814A publication Critical patent/KR850007814A/en

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    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C19/00Alloys based on nickel or cobalt

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electroplating And Plating Baths Therefor (AREA)
  • Contacts (AREA)

Abstract

내용 없음No content

Description

전기접촉부위 전기장치의 제조에 사용되는 새로운 니켈/인듐합금New Nickel / Indium Alloys Used in the Manufacturing of Electrical Contact Electrical Devices

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도 내지 10도는 본 발명에 의한 인쇄회로판의 공정단계별 단면도이다.1 to 10 are cross-sectional views of process steps of a printed circuit board according to the present invention.

Claims (10)

합금전체중량의 약 0.1-95중량% 인듐 및 니켈로 구성되는 니켈/인듐합금으로 전기도금된 전기접촉 부위를 포함하는 개선점, 전기접촉부위를 가지는 형태의 개선된 전기장치.An improvement, comprising an electrical contact portion electroplated with a nickel / indium alloy consisting of about 0.1-95 wt% indium and nickel of the total weight of the alloy; 제1항에 있어서, 상기 인듐의 중량%가 합금전체무게의 약 2-20중량%인 것을 특징으로 하는 장치.The apparatus of claim 1 wherein the weight percent of indium is about 2-20 weight percent of the total weight of the alloy. 제2항에 있어서, 상기 인듐의 중량%가 합금전체중량의 약 4-14중량%인 것을 특징으로 하는 장치.The apparatus of claim 2 wherein the weight percent of indium is about 4-14 weight percent of the total weight of the alloy. 제1항에 있어서, 상기 합금은 pH가 5 혹은 그 이하인 수성전조로부터 전해석출되며, 상기 전조는 (a) 최소 약 0.5M 니켈양이온 및 최소 0.001M의 인듐양이온, (b) 약 2.6M까지의 염소이온, (c) 전조의 pH가 5 혹은 그 이하가 되도록 유지하는데 충분한 량의 완층물질, (d) 유효량의 1 혹은 그 이상의 킬레이트제, (e) 물을 포함하는 것을 특징으로 하는 장치.The method of claim 1, wherein the alloy is electrolytically precipitated from an aqueous precursor having a pH of 5 or less, wherein the precursor comprises (a) at least about 0.5M nickel cation and at least 0.001M indium cation, and (b) up to about 2.6M. A device comprising chlorine ions, (c) an amount of complete material sufficient to maintain the pH of the precursor at 5 or below, (d) an effective amount of one or more chelating agents, and (e) water. 제4항에 있어서, 상기 킬레이트제는 하이드록시카복실산과 이들의 염으로 구성되는 그룹에서 선택된 것을 특징으로 하는 장치.The device of claim 4, wherein the chelating agent is selected from the group consisting of hydroxycarboxylic acids and salts thereof. 제5항에 있어서, 상기 킬레이트제는 시트르산(citric acid) 말르산(melic acid) 혹은 이들의 염이며 상기 전조내에 있어서의 상기 킬레이트제양은 약 0.2M-1.3M인 것을 특징으로 하는 장치.6. The device of claim 5, wherein the chelating agent is citric acid maleic acid or a salt thereof and the chelating agent in the precursor is about 0.2M-1.3M. 제6항에 있어서, 상기 킬레이트제는 카복실산 및 이들의 염으로 구성되는 그룹으로부터 선택된 것을 특징으로 하는 장치.The device of claim 6, wherein the chelating agent is selected from the group consisting of carboxylic acids and salts thereof. 제7항에 있어서, 상기 킬레이트제는 말론산(malonic acid)이나 타타르산(tartir acid)인 것을 특징으로 하는 장치.8. The device of claim 7, wherein the chelating agent is malonic acid or tartaric acid. 제1항에 있어서, 나아가 상기 전기접촉부위상에 도금된 상기 니켈/인듐합금의 전부 혹은 일부상에 전기도금된 금 및 금을 기초로 한 합금들로 구성되는 그룹으로부터 선택된 물질을 포함하는 것을 특징으로 하는 장치.2. The material of claim 1 further comprising a material selected from the group consisting of gold and gold based alloys electroplated on all or a portion of the nickel / indium alloy plated on the electrical contact portion. Device. 제1항에 있어서, 상기 전기접촉부위상에 도금된 니켈/인듐합금의 두께가 최소 약 1.0미크론인 것을 특징으로 하는 장치.The device of claim 1, wherein the nickel / indium alloy plated on the electrical contact is at least about 1.0 micron thick. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019850002905A 1984-04-30 1985-04-30 New Nickel / Indium Alloys Used in the Manufacturing of Electrical Contact Electrical Devices KR850007814A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US60543584A 1984-04-30 1984-04-30
US605435 1984-04-30

Publications (1)

Publication Number Publication Date
KR850007814A true KR850007814A (en) 1985-12-09

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019850002905A KR850007814A (en) 1984-04-30 1985-04-30 New Nickel / Indium Alloys Used in the Manufacturing of Electrical Contact Electrical Devices

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JP (1) JPS60255947A (en)
KR (1) KR850007814A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2550188B2 (en) * 1988-11-25 1996-11-06 株式会社日立製作所 Oxide-based high temperature superconductor, joining method and brazing material

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Publication number Publication date
JPS60255947A (en) 1985-12-17

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