KR840001710U - 적외선 막두께 측정기 - Google Patents

적외선 막두께 측정기

Info

Publication number
KR840001710U
KR840001710U KR2019820007186U KR820007186U KR840001710U KR 840001710 U KR840001710 U KR 840001710U KR 2019820007186 U KR2019820007186 U KR 2019820007186U KR 820007186 U KR820007186 U KR 820007186U KR 840001710 U KR840001710 U KR 840001710U
Authority
KR
South Korea
Prior art keywords
film thickness
thickness meter
infrared film
infrared
meter
Prior art date
Application number
KR2019820007186U
Other languages
English (en)
Other versions
KR860001691Y1 (ko
Inventor
다까부미 후모도
Original Assignee
후지덴기 세이조오 가부시기 가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 후지덴기 세이조오 가부시기 가이샤 filed Critical 후지덴기 세이조오 가부시기 가이샤
Publication of KR840001710U publication Critical patent/KR840001710U/ko
Application granted granted Critical
Publication of KR860001691Y1 publication Critical patent/KR860001691Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
KR2019820007186U 1981-10-17 1982-09-11 적외선 막두께 측정기 KR860001691Y1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP56-153463 1981-10-17
JP1981153463U JPS5857911U (ja) 1981-10-17 1981-10-17 赤外線膜厚計

Publications (2)

Publication Number Publication Date
KR840001710U true KR840001710U (ko) 1984-05-17
KR860001691Y1 KR860001691Y1 (ko) 1986-07-25

Family

ID=15563107

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019820007186U KR860001691Y1 (ko) 1981-10-17 1982-09-11 적외선 막두께 측정기

Country Status (5)

Country Link
US (1) US4510389A (ko)
JP (1) JPS5857911U (ko)
KR (1) KR860001691Y1 (ko)
DE (1) DE3233507A1 (ko)
GB (1) GB2111672B (ko)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI73319C (fi) * 1984-12-04 1987-09-10 Pertti Puumalainen Foerfarande foer maetning av egenskaperna i en tvaerprofil hos en kontinuerlig materialbana.
GB8506149D0 (en) * 1985-03-09 1985-04-11 Haigh Chadwick Ltd Textile structure measurement
US5259716A (en) * 1987-12-16 1993-11-09 Dai Nippon Insatsu Kabushiki Kaisha Container conveyor for conveying a container to an inspecting station
DE3854045T2 (de) * 1987-12-16 1996-03-28 Dainippon Printing Co Ltd Anordnung zur kontrolle der dicke eines kunststoffbehälters sowie kontrollsystem dafür.
US5139406A (en) * 1987-12-16 1992-08-18 Dai Nippon Insatsu Kabushiki Kaisha Apparatus and system for inspecting wall thickness of synthetic resin containers
WO1990004164A1 (en) * 1988-10-07 1990-04-19 Andros Analyzers Incorporated Anesthetic agent identification analyzer and contamination detector
US5091647A (en) * 1990-12-24 1992-02-25 Ford Motor Company Method and apparatus for measuring the thickness of a layer on a substrate
US5250811A (en) * 1991-12-20 1993-10-05 Eastman Kodak Company Method for determining compositional information of a multilayer web
JPH08178627A (ja) * 1994-12-26 1996-07-12 Sumitomo Wiring Syst Ltd 管厚検査方法
WO2001065204A1 (en) * 2000-03-01 2001-09-07 Plastic Technologies, Inc. Method and apparatus for measuring wall thickness of a plastic container
EP1719970A3 (en) * 2000-03-01 2009-11-18 Plastic Technologies, Inc. Method and apparatus for measuring wall thickness of a plastic container
TW591202B (en) * 2001-10-26 2004-06-11 Hermosa Thin Film Co Ltd Dynamic film thickness control device/method and ITS coating method
US6872895B2 (en) * 2002-02-12 2005-03-29 Pressco Technology Inc. Apparatus and method for providing spatially-selective on-line mass or volume measurements of manufactured articles
CN1877304B (zh) * 2005-06-10 2010-04-28 深圳迈瑞生物医疗电子股份有限公司 单种麻醉气体类型编码识别的方法和装置
CN112716484A (zh) * 2020-12-28 2021-04-30 常州福普生电子科技有限公司 一种足底压力分布扫描装置及其使用方法
CN116811085B (zh) * 2023-06-06 2024-02-20 广东汇发塑业科技有限公司 一种多层共挤吹膜机的运行状态实时评估方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3372305A (en) * 1966-04-15 1968-03-05 Carborundum Co Silicon carbide igniter
US3536919A (en) * 1968-01-22 1970-10-27 Gen Electric Infrared radiation source with improved ceramic glower rod mounts
JPS589362B2 (ja) * 1978-03-10 1983-02-21 旭化成株式会社 赤外線多層フイルム膜厚測定方法及びその測定装置
GB2077426B (en) * 1980-05-30 1983-12-14 Fuji Electric Co Ltd Apparatus for measuring film thickness
JPS5757206A (en) * 1980-09-24 1982-04-06 Japan Sensaa Corp:Kk Method of measuring thickness of hollow film such as inflation film and black body furnace for measurement

Also Published As

Publication number Publication date
KR860001691Y1 (ko) 1986-07-25
GB2111672B (en) 1986-05-29
JPS5857911U (ja) 1983-04-19
US4510389A (en) 1985-04-09
DE3233507A1 (de) 1983-04-28
GB2111672A (en) 1983-07-06

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