KR20230016496A - Alignment device for microscope - Google Patents

Abstract

Disclosed is an alignment device for a microscope, which moves a specific point of a sample to be inspected into a field of view of an objective lens of the microscope when a microscope user selects the specific point of the sample to be inspected. The alignment device for a microscope comprises: a sample holder which provides a seating space for a sample; a camera unit which generates a sample image by photographing the sample placed in the sample holder; an image output unit which receives the sample image from the camera unit and outputs the same as an image; an input unit which receives a selection signal for an inspection point from the sample image output through the image output unit; a multi-axis stage which is installed under the camera unit and the objective lens of the microscope to move the sample holder from an initial position to an inspection position, has a stand for seating the sample holder, and moves the sample holder in two or more directions through the stand to adjust a position of the sample holder; and a control unit which controls the multi-axis stage according to the selection signal so that an enlarged image of the inspection point is captured by the objective lens. According to the present invention, by simply inputting the inspection point of the sample, the sample is automatically repositioned to provide a magnified image of the inspection point, which makes it easy to observe the inspection point of the sample.

Description

Alignment device for microscope {ALIGNMENT DEVICE FOR MICROSCOPE}

The present invention relates to an aligning device for a microscope that automatically moves a selected point of a sample to an observation position of a microscope, and more particularly, when a microscope user selects a specific point of a sample to be inspected, the sample is viewed through an objective lens field of view of the microscope. It relates to an aligning device for a microscope that moves a specific point of

In general, a microscope is a kind of magnifying glass, and is used to observe microstructures that cannot be discerned with the naked eye. These microscopes are primarily used for observing cells and biological samples in biology, biomedical research, medical diagnostics, and materials science.

Representative types of microscopes include an optical microscope using a glass lens and using visible light, an electron microscope using a magnetic lens and using short-wavelength electrons, and a cantilever and a sample surface adjacent to each other, and a cantilever probe There is an atomic force microscope that uses the attractive and repulsive forces generated between the atoms at the tip and the atoms on the sample surface to understand the structure of the atomic unit.

In particular, optical microscopes include a general optical microscope (light or bright-field microscope) that makes magnified images using an objective lens, a phase contrast microscope that can easily observe living cells using differences in refractive index, and an object An interference microscope that can easily observe the structure of a transparent specimen with the interference phenomenon of light wavelengths by overlapping the object light transmitted through the specimen and the interference light separated from the light using the phenomenon of retarding light. A dark-field microscope using this indirectly illuminated phenomenon and easily observed in a relatively dark place, using two polarizing prisms (or Nicol prisms) placed at 90 degree angles to each other in the path of light rays. It is divided into a polarizing microscope that uses the principle that light is not transmitted when it is formed, and a fluorescence microscope that uses the principle that fluorescence is emitted when short-wavelength ultraviolet rays are irradiated on a sample.

As one of the technologies related to the above-described optical microscope, a microscope module is disclosed in Patent Registration No. 10-1527925. 1 is a cross-sectional view showing an embodiment of a conventional microscope device.

Referring to FIG. 1 , a conventional microscope apparatus can implement an inverted microscope and an upright microscope at the same time using one microscope, so that it can be used as an inverted microscope and an upright microscope according to the user's convenience.

More specifically, the microscope device includes a stage (1) on which a sample is seated, a light source unit (2) for irradiating light onto the sample on the stage (1), and light passing through the sample is refracted so that the image of the sample is magnified. An objective lens unit 3, a lens tube 4 to which light passing through the objective lens unit 3 is transmitted, and an eyepiece unit disposed at one end of the lens tube 4 and allowing the user to view the image of the sample ( 5), and a frame 6 supporting the stage 1, the light source unit 2, and the objective lens unit 3, and optionally the positions of the light source unit 2 and the objective lens unit 3 are It is rotated around the stage 1 so that observation of an inverted image and an observation of an erect image can be selectively performed.

However, in the prior art, by rotating the positions of the light source unit 2 and the objective lens unit 3 around the stage 1, the observation of the sample seated on the stage 1 can be made upright or inverted, Since there is no configuration for fixing the frame 6 after being rotated, the positions of the light source unit 2 and the objective lens unit 3 are not fixed, causing a problem in that the image of the object may be shaken.

In addition, in the prior art, when an inspection point of a sample is selected in advance and observed, it is difficult to accurately position the inspection point under the objective lens unit 3 so as to enlarge it, and it takes a lot of time to observe the sample. In other words, since the range of the area viewed through the lens of the microscope is several microns, it is very difficult to find the inspection point of the sample to be inspected through the lens, requiring an expert, and experts also spend a lot of time searching for the inspection point through the lens. There was a problem taking this.

Republic of Korea Patent Registration No. 10-2026665 (Announced on September 30, 2019) Republic of Korea Patent Registration No. 10-1527925 (Announced on June 10, 2015) Republic of Korea Patent Registration No. 10-2091965 (Announced on March 20, 2020) Republic of Korea Patent No. 10-2043827 (Announced on November 12, 2019) Republic of Korea Patent No. 10-0754963 (2007.09.04 announcement)

Accordingly, an object of the present invention is to allow a microscope user to observe a desired point of a sample through a microscope by simply selecting a specific point of the sample without manually moving the sample. It is to provide an alignment device for a microscope that helps direct observation.

In order to achieve the above object of the present invention, in an embodiment of the present invention, a sample holder providing a seating space for a sample, a camera unit generating a sample image by photographing the sample seated in the sample holder, and the camera A video output unit for receiving a sample image from the unit and outputting it as an image; an input unit for receiving a selection signal for an inspection point in the sample image output through the video output unit; A multi-axis stage installed below the camera unit and the microscope objective lens, provided with a cradle for seating the sample holder, and adjusting the position of the sample holder by moving the sample holder in two or more directions through the cradle, and It provides an aligning device for a microscope including a control unit for controlling the multi-axis stage according to the selection signal so that an enlarged image of the inspection point is captured by the objective lens.

According to the present invention, the position of the sample is automatically adjusted simply by inputting the position of the inspection point, even if the user of the microscope does not manually find the position of the inspection point to be checked on the sample by looking through a lens or a monitor. , the inspection point of the sample can be easily observed.

In addition, since the present invention can secure an enlarged image of the test point of the sample simply by inputting the test point of the sample, even if you are not an expert in operating a microscope, you can easily obtain an enlarged image of the test point of the sample.

In addition, since the present invention can minimize a microscope user's manual action, efficient inspection work is possible and work time is shortened.

1 is a configuration diagram showing a conventional microscope module.
2 and 3 are perspective views for explaining an alignment device for a microscope according to the present invention.
Figure 4 is a block diagram for explaining the electrical connection of the microscope alignment device according to the present invention.
5 is a view showing three-axis movement of a multi-axis stage provided in an aligning device for a microscope according to the present invention.
6 is a view showing a photographed image of a camera unit provided in an aligning device for a microscope according to the present invention and a photographed image of a microscope.

Hereinafter, an aligning device for a microscope according to preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

2 and 3 are perspective views for explaining an alignment device for a microscope according to the present invention. Figure 4 is a block diagram for explaining the electrical connection of the microscope alignment device according to the present invention.

2 to 4, the aligning device for a microscope according to the present invention includes a sample holder 10 providing a seating space for a sample, and a camera for photographing a sample in the sample holder 10 and generating a sample image. The unit 20, the video output unit 30 that outputs the sample image as an image, the input unit 40 that receives the selection signal for the inspection point through the output sample image, and the sample holder 10 are seated. A multi-axis stage 50 having a cradle 52 for moving the sample holder 10 from an initial position to an inspection position, and a control unit controlling the multi-axis stage 50 according to the selection signal so that the inspection point is enlarged 60, and may optionally further include a height measuring unit 80 for generating height information by measuring the position of the sample at the initial position of the sample holder 10.

The control unit 60 may be configured independently like a control panel or may be installed to be embedded in a computer.

The aligning device for a microscope according to the present invention may be used in a microscope 100 including an eyepiece lens, an objective lens, and a light source unit for radiating light toward a sample positioned at an inspection position to magnify and observe a sample. Here, the microscope 100 is an optical device composed of a system of lenses, and means a device designed to observe an inspection point of a sample invisible to the naked eye by enlarging the inspection point. At this time, the microscope 100 may be understood to mean an optical microscope, but may also be an electron microscope in some cases.

The eyepiece is a series of lens systems that act like a magnifying glass, and the human eye can see an enlarged image produced by an objective lens through the eyepiece.

The objective lens may be a lens system that captures light emitted from an object of observation and converges the light to enlarge and form an image in an inverted state.

The light source serves to reflect light to the sample to be observed to brighten it, and an LED lamp or a reflector may be used.

If necessary, the microscope 100 may further include a focus adjustment unit and a lens spacing adjustment unit.

The focus adjusting unit may adjust the focus of the eyepiece, and the lens spacing adjusting unit may adjust the distance between the eyepieces. This is because the distance between both eyes is different for each user, and the focus must be set differently according to the sample to be observed. For example, the focus adjusting unit may control the focus of the eyepiece by controlling an adjusting screw composed of a fine screw or the like.

On the other hand, one direction on a horizontal plane is referred to as a first direction (X), and a direction perpendicular to the first direction (X) on a horizontal plane is referred to as a second direction (Y), and the first direction (X) and the second direction (Y) ) is referred to as a third direction (Z). In addition, the upper surface of the cradle 52 provided on the multi-axis stage 50 to provide a seating space for the sample holder 10 is parallel to the horizontal plane, and the sample is moved in the first direction (X) and While moving in the second direction (Y), it moves from the initial position to the inspection position.

5 is a view showing three-axis movement of a multi-axis stage provided in an aligning device for a microscope according to the present invention. Referring to FIG. 5 , the second direction (Y) is the front-back direction in which the cradle 52 moves from the lower part of the camera unit 20 to the lower part of the microscope 100, and the first direction (X) is the left-right direction, The third direction (Z) is a vertical direction.

When the microscope alignment device according to the present invention is used in a microscope, the sample stand installed in a general microscope is unnecessary and is removed.

Hereinafter, each component will be described in more detail with reference to the drawings.

Referring to FIG. 2 , the aligning device for a microscope according to the present invention may further include a frame part 70 .

The frame unit 70 provides an installation space for one or more of the camera unit 20, the image output unit 30, the input unit 40, the multi-axis stage 50, and the control unit 60, and the microscope ( 100) is placed around.

The frame unit 70 may be provided as one structure that is physically connected to each other, or may be provided as two or more structures that are physically separated from each other.

As a specific aspect, the frame unit 70 according to the present invention may be composed of a first vertical frame 72, a second vertical frame 74 and a horizontal frame 76.

The first vertical frame 72 is seated on an upper surface of a shelf or table mounted on a microscope, and may include a support plate at the bottom to increase a contact area with the shelf or table.

The second vertical frame 74 is disposed on the opposite side of the first vertical frame 72 centering on the microscope, and is seated on the upper surface of the shelf or table mounted on the microscope, and has a contact area with the shelf or table at the lower end. A supporting plate for increasing the may be provided.

The horizontal frame 76 is provided between the first vertical frame 72 and the second vertical frame 74 to connect the first vertical frame 72 and the second vertical frame 74, and the microscope ( 100) is preferably provided on top of the first vertical frame 72 and the second vertical frame 74 so as not to interfere.

A camera unit 20, an image output unit 30, an input unit 40, a control unit 60, A height measuring unit 80 and the like may be installed, and a multi-axis stage 50 may be installed on the first vertical frame 72 and the second vertical frame 74 .

Referring to FIG. 2 , the aligning device for a microscope according to the present invention includes a sample holder 10 .

The sample holder 10 provides a seating space for the sample, and is detachably installed on the top of the holder 52 or installed in a fixed type.

Such a sample holder 10 may be composed of a bottom plate formed in a circular shape or a square shape, and a side wall protruding upward along the edge of the bottom plate to limit the left and right movement of the sample.

As an embodiment, the bottom plate according to the present invention may be composed of an upper plate for fixing a sample and a lower plate attached to a magnet. At this time, the bottom plate is attached to the multi-axis stage 50 by magnetic force, and detached from the multi-axis stage 50 by an external force exceeding the magnetic force.

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"형 구조로 형성될 수 있다. As another embodiment, the bottom plate according to the present invention may be composed of a top plate for fixing a sample and an assembly module provided under the top plate so that the sample holder 10 can be assembled to the multi-axis stage 50. At this time, the upper and lower end surfaces of the assembly module are "

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"It can be formed into a type structure.

In addition, the sample holder 10 can be moved in the first direction (X), the second direction (Y), and the third direction (Z) by the movement of the holder 52.

6 is a view showing a photographed image of a camera unit provided in an aligning device for a microscope according to the present invention and a photographed image of a microscope.

Referring to FIGS. 2 to 4 , the aligning device for a microscope according to the present invention includes a camera unit 20 .

The camera unit 20 is electrically connected to the control unit 60, and takes a sample seated in the sample holder 10 in the optical system zone (b) preset in the control unit 60 to generate a sample image, , The sample image is provided to the control unit 60.

As shown in FIG. 6 , the camera unit 20 captures a sample and generates an enlarged sample image so that a user can select a specific point of the sample.

In addition, the camera unit 20 may be installed in the frame unit 70 to photograph the plane of the sample seated on the sample holder 10 in the optical system zone (b).

In addition, the camera unit 20 may include an auxiliary camera for photographing a sample seated in the sample holder 10 and generating a sample image, and a lens 22 for an auxiliary camera installed in the auxiliary camera.

Referring to FIG. 4 , the aligning device for a microscope according to the present invention includes an image output unit 30 .

The image output unit 30 is electrically connected to the control unit 60 and receives a sample image from the camera unit 20 and outputs it as an image, as shown in FIG. 6 .

The image output unit 30 may use a monitor, tablet PC, etc. to output a sample image enlarged from the sample as an image, and may be installed on the frame unit 70 or on a shelf or table mounted on the microscope 100. can be installed

Referring to FIG. 4 , the aligning device for a microscope according to the present invention includes an input unit 40 .

The input unit 40 is electrically connected to the control unit 60, and when a selection signal for an inspection point is input through the sample image output through the image output unit 30, the selection signal is transmitted to the control unit ( 60) is provided. At this time, one or a plurality of inspection points may be selected.

This input unit 40 may be composed of a touch pad, a mouse, a keyboard, or a combination thereof.

For example, when a user selects an inspection point in the sample image through a mouse in a state where a sample image is output through a monitor, the mouse provides a selection signal to the control unit 60 .

Meanwhile, the input unit 40 may receive lens information of an objective lens to observe a sample and provide the information to the control unit 60 . Typically, since a plurality of objective lenses are installed in the microscope 100, and each objective lens is configured to have a different length, the microscope user adjusts the position of the sample through the microscope align device, the sample or Lens information of the objective lens may be input through the input unit 40 so that the sample holder 10 does not collide with the objective lens to observe the sample.

At this time, if the name of each objective lens and its length information are stored in advance in the control unit 60, the input unit 40 provides the name of the objective lens to be used as lens information to the control unit 60.

If necessary, even if a selection signal is not input through the input unit 40, the control unit 60 may be configured to automatically detect the inspection point by analyzing the sample image through self-installed software.

Referring to FIGS. 2 to 4 , the aligning device for a microscope according to the present invention includes a multi-axis stage 50 .

The multi-axis stage 50 is installed below the camera unit 20 and the microscope objective lens so that the sample holder 10 can be moved from an initial position to an inspection position, and a cradle 52 for seating the sample holder 10 thereon. ) is provided, and the position of the sample holder 10 is adjusted by moving the sample holder 10 in two or more directions, preferably in three directions, through the holder 52.

The cradle 52 may be composed of a magnetic plate to stably fix the sample holder 10 having magnetic force, and may be provided with an assembly protrusion that can be assembled with an assembly module of the sample holder 10.

As the multi-axis stage 50 according to the present invention, a 2-axis stage or a 3-axis stage may be used, and a 3-axis stage is preferably used.

The two-axis stage moves the sample holder 10 seated on the cradle 52 in a first direction (X) and a second direction (Y) to reach the test position starting from an initial position. To this end, the 2-axis stage may include an X-axis motor for controlling left and right movement of the cradle 52 and a Y-axis motor for controlling forward and backward movement of the cradle 52 .

The three-axis stage moves the sample holder 10 seated on the holder 52 in the first direction (X), the second direction (Y), and the third direction (Z) to reach the test position starting from the initial position. let it To this end, the three-axis stage may include an X-axis motor for controlling the left and right movement of the cradle 52, a Y-axis motor for controlling the forward and backward movement of the cradle, and a Z-axis motor for controlling the vertical movement of the cradle. there is.

Since this multi-axis stage 50 is a well-known configuration, a detailed description thereof will be omitted.

Referring to FIGS. 2 to 4 , the aligning device for a microscope according to the present invention may further include a height measuring unit 80 .

The height measurement unit 80 is electrically connected to the control unit 60, and measures the height of the sample seated in the sample holder 10 in the setting zone (a) preset in the control unit 60 to obtain height information. is generated, and the height information is provided to the control unit 60.

The height measurement unit 80 measures the distance between the sample seated on the sample holder 10 and the height measurement unit 80 in the setting zone (a) to determine the position (height) of the sample seated on the sample holder 10. is measured, and height information about the sample is generated by analyzing the position (height) of the height measuring unit 80 and the distance between the height measuring unit 80 and the sample in order to adjust the distance between A and B in FIG. 6 .

To this end, the height measurement unit 80 may measure the distance by generating laser, infrared rays, radio waves (radar method), and the like toward the sample.

More specifically, the height measuring unit 80 is configured to transmit a signal (infrared, laser, etc.) for distance measurement to the specimen and receive a return signal from the specimen. In addition, the height measurement unit 80 calculates the time difference between the transmission signal and the return signal to calculate a distance value between the height measurement unit 80 and the sample, and the distance value and the position (height) value of the height measurement unit 80 After generating height information by analyzing, it is provided to the control unit 60.

This height measurement unit 80 measures the height of the test sample because the height of the test sample seated in the sample holder 10 may be different depending on the type.

Referring to FIG. 4 , the aligning device for a microscope according to the present invention includes a control unit 60 .

The control unit 60 controls the multi-axis stage 50 according to a selection signal provided from the input unit 40 so that an enlarged image of the inspection point selected through the sample image is captured by the objective lens of the microscope 100. After analyzing the selection signal to generate a control signal for the multi-axis stage 50, the control signal is provided to the multi-axis stage 50.

The control unit 60 captures setting zone coordinate information for measuring the height of the sample seated at the center of the sample holder through the height measurement unit 80 and the center of the sample seated in the sample holder through the camera unit. Optical system zone coordinate information that can be stored, and microscope zone coordinate information that can photograph the center of the sample seated in the sample holder through the objective lens can be stored in advance. In addition, the control unit 60 may control the movement of the cradle based on setting zone coordinate information, optical system zone coordinate information, and microscope zone coordinate information.

More specifically, the control unit 60 controls the multi-axis stage 50 according to the setting zone coordinate information when the power signal is input from the outside after the sample holder on which the sample is seated is mounted on the cradle 52 to cradle ( 52) is moved to the initial position of the setting zone (a), and the height of the sample can be automatically measured by controlling the height measurement unit 80.

When height information is collected from the height measurement unit 80, the control unit 60 may move the cradle 52 to the optical system zone b by controlling the multi-axis stage 50 according to the optical system zone coordinate information.

In addition, when height information is collected from the height measurement unit, the control unit 60 controls the multi-axis stage 50 to move the cradle on which the sample holder is seated below the camera unit 20, and the camera unit is seated in the sample holder. The height of the cradle may be adjusted through a multi-axis stage so as to align the sample to the focus of the camera unit 20 so as to generate a sample image by photographing the sample. Also, when the focus of the camera unit 20 is not correct due to a mechanical error or the like, the control unit 60 may operate to automatically control the multi-axis stage 50 to re-focus.

In addition, the control unit 60 generates a sample image by photographing the sample through the camera unit 20 when the camera unit 20 focuses on the sample, and outputs the sample image through the video output unit 30. print out

When the selection signal for the inspection point of the sample image is collected through the input unit 40, the control unit 60 controls the multi-axis stage 50 according to the microscope zone coordinate information to move the cradle 52 to the microscope zone (c). can be moved to

In addition, the control unit 60 controls the height measuring unit 80 to prevent the sample from colliding with the objective lens 110 when the cradle 52 on which the sample holder 10 is seated is moved under the objective lens 110. The multi-axis stage may be controlled so that the cradle 52 descends in the Z-axis direction according to the provided height information. In other words, when moving the holder 52 to the objective lens 110 of the microscope, the controller 60 avoids collision between the objective lens 110 and the sample and adjusts the focus of the objective lens 110 to the sample. The height position value of (52) is automatically analyzed.

In addition, when the focus of the microscope 100 is not correct due to a mechanical error or the like, the control unit 60 may operate to automatically control the multi-axis stage 50 to refocus the microscope 100 .

As a specific aspect, the control unit 60 according to the present invention includes a multi-axis stage controller 62 for controlling the movement of the multi-axis stage 50, and a lighting controller for controlling the brightness of the camera unit 20 and the microscope 100 (64).

The lighting controller 64 controls the lighting brightness of the camera unit 20 and the lighting brightness of the microscope 100 according to the position of the holder 52 . At this time, the lighting brightness of the camera unit 20 may be adjusted through the auxiliary camera light 25 installed under the auxiliary camera lens 22 .

If necessary, the control unit 60 may be provided with a positioning program capable of specifying an inspection point selected through the input unit 40 in the video image output through the video output unit 30 .

This positioning program divides the video image output through the video output unit 30 and designates coordinates, respectively. At this time, the control unit 60 extracts coordinates matched to the selection signal provided from the input unit 40 through a positioning program, and the position of the sample corresponding to the extracted coordinates is captured by the objective lens of the microscope 100. A control signal for adjusting the position of the sample holder 10 is generated, and the operation of the multi-axis stage 50 is controlled with the control signal. To this end, the control unit 60 stores a control signal of the cradle matched to the coordinates of the video image.

Here, the control signal is X-axis adjustment information for moving the sample holder 10 in the first direction (X) from the initial position and Y-axis adjustment for moving the sample holder 10 in the second direction (Y) from the initial position. contains information At this time, the second direction (Y) is located on the same horizontal line as the first direction (X) and is a direction perpendicular to the first direction (X).

In addition, the control unit 60 adjusts the height of the cradle 52 on which the sample holder 10 is seated through the multi-axis stage 50 to adjust the sample to the focus of the objective lens according to the lens information provided from the input unit 40. can More specifically, the control unit 60 adjusts the position of the sample holder 10 so that the focus of the inspection point photographed by the objective lens is automatically adjusted when lens information and a selection signal are provided through the input unit 40. A control signal is generated, and the operation of the multi-axis stage 50 is controlled by the control signal. Here, the control signal is X-axis adjustment information for moving the sample holder 10 in the first direction (X) from the initial position and Y-axis adjustment for moving the sample holder 10 in the second direction (Y) from the initial position. information, and Z-axis adjustment information for moving the sample holder 10 from the initial position in the third direction (Z). At this time, the third direction (Z) is a vertical direction perpendicular to the first direction (X) and the second direction (Y).

Although the above has been described with reference to preferred embodiments of the present invention, those skilled in the art can variously modify and change the present invention without departing from the spirit and scope of the present invention described in the claims below. You will understand that you can.

10: sample holder 20: camera unit
30: video output unit 40: input unit
50: multi-axis stage 52: cradle
60: control unit 70: frame unit
72: first vertical frame 74: second vertical frame
76: horizontal frame 80: height measurement unit
100: microscope

Claims (7)

A sample holder providing a seating space for the sample;
a camera unit generating a sample image by photographing the sample seated in the sample holder;
an image output unit that receives the sample image from the camera unit and outputs it as an image;
an input unit that receives a selection signal for a test point in the sample image output through the video output unit;
To move the sample holder from an initial position to an inspection position, a cradle is installed below the camera unit and the microscope objective lens, and a cradle for seating the sample holder is provided, and the cradle moves the sample holder in two or more directions through the cradle. a multi-axis stage for adjusting the position of the sample holder; and
A control unit for controlling the multi-axis stage according to the selection signal so that an enlarged image of the inspection point is captured by the objective lens. According to claim 1,
Aligning device for a microscope, characterized in that it further comprises a height measuring unit for generating height information by measuring the height of the sample seated in the sample holder, and providing the height information to the control unit. The method of claim 2, wherein the control unit
Alignment for a microscope characterized in that for controlling the multi-axis stage according to the height information provided from the height measuring unit so that the sample does not collide with the objective lens of the microscope when the cradle on which the sample holder is seated is moved to the objective lens of the microscope Device. The method of claim 2, wherein the control unit
When height information is collected from the height measuring unit, the cradle on which the sample holder is seated is moved below the camera unit, and the height of the cradle is adjusted through a multi-axis stage to adjust the sample to the focus of the camera unit. alignment device. The method of claim 2, wherein the control unit
Setting zone coordinate information capable of measuring the height of the sample seated at the center of the sample holder through the height measurement unit, optical system zone coordinate information capable of photographing the center of the sample seated in the sample holder through the camera unit, and the Microscope zone coordinate information capable of photographing the center of the sample seated in the sample holder through the objective lens is stored in advance, and the movement of the cradle is controlled based on the setting zone coordinate information, optical system zone coordinate information, and microscope zone coordinate information Alignment device for a microscope, characterized in that. According to claim 1,
The input unit receives lens information of an objective lens to observe a sample and provides it to the control unit,
The control unit adjusts the height of the cradle through a multi-axis stage to align the sample to the focus of the objective lens according to the lens information. The method of claim 1, wherein the control unit
A multi-axis stage controller for controlling the movement of the multi-axis stage, and
Alignment device for a microscope, characterized in that it comprises a lighting controller for controlling the illumination brightness of the camera unit and the light source unit of the microscope.

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