KR20220113000A - system and method for measuring the thickness of continuous prints based on X-ray fluorescence analysis - Google Patents

Abstract

The present invention relates to an X-ray fluorescence analysis device for measuring the thickness of continuous prints, which may comprise: a print box storing a liquid print; an X-ray generator which generates an X-ray having an energy for measuring heavy elements, before directly projecting the X-ray on the upper surface of the print box at an incident angle of 5 degrees or less; a collimator which adjusts the collimation of the X-ray which is directly projected by the X-ray generator; an X-ray optical system which allows the X-ray of which the collimation is adjusted to be reflected to generate an X-ray having an energy for measuring light elements before additionally projecting on the upper surface of the print box; and an X-ray detector which comes in contact with the upper surface of the print box to perform detection and spectrum analysis with respect to a fluorescent X-ray which is produced by the liquid print such that the kinds and content of the element contained in the liquid print may be checked and informed. Therefore, the thickness of the print may be measured in real time.

Description

X-ray fluorescence analysis system and method for measuring the thickness of continuous prints based on X-ray fluorescence analysis

The present invention relates to an X-ray fluorescence analyzer for continuous printing thickness measurement, which allows the thickness of a printing material to be measured in real time while continuously printing vinyl, fabric, or the like.

In the case of continuously printing a predetermined pattern on vinyl or fabric, it is very important to keep the printing thickness uniform.

Accordingly, a method of irradiating X-rays to a reference position of a print using an X-ray fluorescence analyzer, detecting and analyzing the reflected wave, and measuring the print thickness is widely used.

However, in the case of conveying the printed material, the position of the printed material is changed frequently when passing through the printed material conveying device. things become impossible

Therefore, in the prior art, there was no technology to measure the print thickness of continuous print in real time, but after measuring the thickness in a state where the print was fixed in position before or after transfer of the print, or after temporarily stopping the transfer of the print and then correcting the position of the print Only the method of measuring the print thickness and re-feeding the print was used.

As a result, conventionally, there is a limitation in that the time required for measuring the thickness of the printed material is unnecessarily increased, or the printing thickness monitoring operation over the entire section of the printed material cannot be performed.

Domestic Registered Patent No. 10-1241007 (Registration Date: March 04, 2013)

Accordingly, in order to solve the above problems, an object of the present invention is to provide an X-ray fluorescence analysis apparatus for continuous print thickness measurement that can measure the print thickness in real time while transferring the print.

Another object of the present invention is to provide an X-ray fluorescence analyzer for continuous print thickness measurement that allows the printing thickness measurement point to be constantly maintained regardless of the print position variation.

Another object of the present invention is to provide an X-ray fluorescence analyzer for continuous print thickness measurement, which can prevent unnecessary waste of power in advance by performing a print thickness measurement operation only on a pattern formation area.

The object of the present invention is not limited to the object mentioned above, and other objects not mentioned will be clearly understood by those of ordinary skill in the art from the following description.

As a means for solving the above problems, according to an embodiment of the present invention, the device frame having an open space through which a printed material can be transferred, and an upper surface having a through hole connected to the open space; a conveying device having a plurality of rollers attached and supported at the lower end of the open space within the frame of the apparatus, and conveying the printed matter by flattening the surface thereof through the plurality of rollers; an edge camera attached to an upper end of an open space within the frame of the device to acquire and provide an edge image photographed of an edge region of the printed matter; a center camera attached to the upper end of the open space within the frame of the device to acquire and provide a center image of the center region of the printed matter; an X-ray fluorescence analysis device attached to the upper surface of the device frame, irradiating X-rays to the center of the printed matter through the through-hole, and then receiving and analyzing the reflected wave of the X-rays to calculate the print thickness of the printed matter; and an X-ray analysis position controller configured to receive and analyze the edge image and the center image to calculate a print position variation, and then control the position of the X-ray fluorescence analyzer in real time according to the print position variation. X-ray fluorescence analysis system is provided.

The X-ray analysis position control unit includes: a coarse position adjuster for controlling the position of the X-ray fluorescence analysis device with a first precision; a fine position adjuster for controlling the position of the X-ray fluorescence analyzer with a second precision higher than the first precision; and after coarsely controlling the position of the X-ray fluorescence analyzer by extracting and using the edge position value from the edge image, further extracting and using the center value from the center image to determine the position of the X-ray fluorescence analyzer once again It is characterized in that it comprises a processor for controlling.

The system is characterized in that the edge camera is positioned at the front end of the device frame, and the center camera is positioned between the edge camera and the X-ray fluorescence analysis device.

The conveying device includes two auxiliary rollers respectively disposed at the front and rear ends of the device frame; and a main shaft roller positioned between the two auxiliary rollers so as to be led toward the X-ray fluorescence analysis device and configured to have a larger diameter than the auxiliary roller.

In addition, the system is characterized in that it further comprises a photo sensor for sensing and notifying whether the pattern is formed.

In this case, the X-ray fluorescence analysis apparatus is characterized in that the X-ray detection operation is selectively performed only on the pattern formation region.

As a means for solving the above problems, according to another embodiment of the present invention, an edge image obtained by photographing an edge region of a print is first obtained through an edge camera installed at a print inlet point, and then an edge camera and an X-ray fluorescence analysis device Secondary acquisition of a center image of the center area of the printed matter through the center camera installed therebetween; extracting an edge position value from the edge image, and coarsely controlling a position of the X-ray fluorescence analyzer based on the edge position value; further extracting and using a center value from the center image to fine control the position of the X-ray fluorescence analyzer once again; And X-ray fluorescence analysis method for continuous measurement of printing thickness, comprising the step of irradiating X-rays to the base of the printed matter through the X-ray fluorescence analyzer, and then calculating and notifying the printed thickness of the printed material by receiving and analyzing the reflected wave of the X-ray. provides

The method further comprises the step of sensing whether a pattern is formed through a photosensor located at the front end of the X-ray fluorescence analyzer, and determining whether the X-ray fluorescence analyzer detects X-rays according to whether the pattern is formed. .

The present invention allows the printing thickness to be measured in real time while transferring the printed matter, thereby minimizing the time required for measuring the printing thickness.

In addition, it is possible to secure the reliability of the printing thickness measurement operation by always maintaining the printing thickness measurement point constant regardless of the change in the position of the printed material.

In addition, by performing the printing thickness measurement operation only on the pattern formation area, it is possible to prevent unnecessary power wastage in advance.

1 and 2 are views for explaining an X-ray fluorescence analysis system for continuous print thickness measurement according to an embodiment of the present invention. FIG. 1 is a configuration diagram, and FIG. 2 is an external view.
3 and 4 are diagrams for explaining the detailed configuration of the X-ray analysis position control unit according to an embodiment of the present invention.
5 and 6 are diagrams for explaining a method for controlling a position of an X-ray fluorescence analyzer according to an embodiment of the present invention.
7 is a view for explaining in more detail a transfer device according to an embodiment of the present invention.
8 and 9 are diagrams for explaining an X-ray fluorescence analysis system for continuous print thickness measurement according to another embodiment of the present invention.

The following is merely illustrative of the principles of the invention. Therefore, those skilled in the art will be able to devise various devices that, although not explicitly described or shown herein, embody the principles of the present invention and are included within the spirit and scope of the present invention. Further, it is to be understood that all conditional terms and examples listed herein are, in principle, expressly intended solely for the purpose of enabling the concept of the present invention to be understood, and not limited to such specifically enumerated embodiments and states. should be

Moreover, it is to be understood that all detailed description reciting the principles, aspects, and embodiments of the invention, as well as specific embodiments, are intended to cover structural and functional equivalents of such matters. It is also to be understood that such equivalents include not only currently known equivalents, but also equivalents developed in the future, i.e., all devices invented to perform the same function, regardless of structure.

Thus, for example, the block diagrams herein are to be understood as representing conceptual views of illustrative circuitry embodying the principles of the present invention. Similarly, all flowcharts, state transition diagrams, pseudo code, etc. may be tangibly embodied on computer-readable media and be understood to represent various processes performed by a computer or processor, whether or not a computer or processor is explicitly shown. should be

1 and 2 are views for explaining an X-ray fluorescence analysis system for continuous print thickness measurement according to an embodiment of the present invention. FIG. 1 is a configuration diagram, and FIG. 2 is an external view.

1 and 2, the device 100 of the present invention includes a device frame 110, a transport device 120, an edge camera 130, a center camera 140, and an X-ray fluorescence analyzer 150. , and an X-ray analysis position control unit 160 and the like.

The device frame 110 is implemented to have an open space 111 through which the printed material 200 can be transported, and an upper surface formed in at least one through hole 112 connected to the open space 111 . In addition, it is attached to a plurality of wheels 113 at the lower end of the device frame 110 to support the device movement through this.

The transport device 120 includes a plurality of rollers 121 , 122 , and 123 that are attached and supported at the lower end of the open space in the device frame 110 , and the printed material 200 can be transported by flattening the surface thereof. This is to prevent the possibility of malfunction of the X-ray fluorescence analyzer due to the surface curvature of the printed material 200 in advance.

The edge camera 130 is attached to the top of the open space of the device frame 110 so as to photograph the pattern edge of the printed material 200 , and obtains and provides an edge image by photographing the edge region of the printed material 200 . At this time, the edge camera 130 is preferably located at the point where the print is introduced, that is, at the front end of the device frame so as to be located as far away from the X-ray fluorescence analyzer 150 as possible, which is based on the edge image. ) to secure the maximum time for position control.

The center camera 140 is attached to the upper end of the open space in the device frame 110 so as to photograph the pattern center of the printed material 200 , and obtains and provides a center image by photographing the center area of the printed material 200 . In this case, the center camera 140 may be positioned between the edge camera 130 and the X-ray fluorescence analyzer 150, which means that the position control amount of the X-ray fluorescence analyzer 150 based on the center image is relative to the edge image. because it is very small.

The X-ray fluorescence analyzer 150 includes an X-ray generator 151 and an X-ray detector 152 that are attached to the upper surface of the device frame 110 , and the device frame 110 through the X-ray generator 151 . After irradiating X-rays to the center of the printed matter 200 through the through-hole 112, the X-ray detector 152 receives and analyzes fluorescent X-rays generated in response to X-rays to calculate the print thickness and notify

The X-ray analysis position control unit 160 is attached to the upper surface of the device frame, grasps the amount of position variation of the printed matter, and then corrects the position of the X-ray fluorescence analyzer 150 in real time, so that the X-ray fluorescence analyzer 150 is the same. Enables real-time thickness measurement operation to be performed based on a point (eg, pattern center).

In particular, the X-ray analysis position control unit 160 of the present invention is provided with two position adjusters 161 and 162 having different position control speed and precision, and two position adjusters 161 and 162 using two images, namely an edge image and a center image. ) by multi-step control, the time and load required for position control can be minimized and the accuracy can be further improved.

3 and 4 are diagrams for explaining the detailed configuration of the X-ray analysis position control unit according to an embodiment of the present invention.

For reference, since the pattern of the printed matter is repeatedly printed in the central area except for both edges of the print, the print thickness of the print is generally measured based on a preset fixed position.

However, when measuring the print thickness while transferring the print as shown in FIG. 3 , a meandering phenomenon occurs in which the position value of the print is frequently changed by the transfer device 120 , and the X-ray fluorescence analyzer 150 according to the amount of change in the position of the print occurs. There is a problem in that the measurement result of the print thickness of

Therefore, as shown in Figure 4, the X-ray analysis position control unit of the present invention, as shown in Figure 4, two position adjusters (161, 162) with different position control precision, and two images, an edge image and a center image. A processor 163 for controlling the two position adjusters 161 and 162 in multiple stages is provided.

At this time, both the coarse and fine position adjusters 161 and 162 are constrained and coupled to the upper portion of the rail frame to be movable along the longitudinal direction of the rail frame in which the moving rail is installed in the longitudinal direction of the moving rail, and the X-ray fluorescence analyzer ( 150) can be implemented using a slider frame that supports attachment and an actuator that moves the slider frame back and forth along the longitudinal direction of the moving rail, but the precision is different from each other.

Of course, it will be of course that the specific implementation method of the coarse and fine position adjusters 161 and 162 can be variously changed within a range that can move the X-ray fluorescence analyzer 150 left and right (or horizontally).

5 and 6 are diagrams for explaining a method for controlling a position of an X-ray fluorescence analyzer according to an embodiment of the present invention.

First, the X-ray analysis position control unit 160 extracts the pattern edge position by photographing and analyzing the pattern edge area of the print using the edge camera 130 installed at the print inlet point, and comparing it with the preset edge reference position. Thus, an edge position variation amount d1 is obtained (S1).

Then, the coarse position adjuster 161 first roughly adjusts the position of the X-ray fluorescence analyzer 150 based on the edge position variation d1 ( S2 ).

And the X-ray analysis position control unit 160 extracts the pattern sensor position by photographing and analyzing the pattern center area of the printed matter approaching the X-ray fluorescence analyzer 150 through the center camera 140, and sets it to the preset center reference position. By comparison, a center position variation amount d2 is obtained (S3).

Then, an additional position control value D2 is calculated by subtracting the center position variation amount d2 from the position control result D1 of the coarse position adjuster 161, and the fine position adjuster 162 is added to the additional position control value D2. Accordingly, the position of the X-ray fluorescence analyzer 150 is precisely secondarily adjusted (S4).

Then, the position of the X-ray fluorescence analyzer 150 is always located at the pattern center of the print regardless of the amount of position variation of the print, and the print thickness is determined based on the pattern center by irradiating X-rays to the pattern center and receiving and analyzing the reflected wave. It is calculated and output (S5).

7 is a view for explaining in more detail a transfer device according to an embodiment of the present invention.

For reference, the X-ray irradiation surface of the X-ray fluorescence analyzer 150 should continuously maintain a flattened state without wrinkles. This is because, if wrinkles occur on the X-ray irradiation surface, the reflected waves of X-rays are irregularly scattered, and the X-ray fluorescence analyzer 150 erroneously measures the thickness of the printed matter accordingly.

Accordingly, the conveying device 120 of the present invention is located between two auxiliary rollers 121 and 122 and two auxiliary rollers 121 and 122 spaced apart from the front and rear ends of the apparatus frame 110, and X-ray fluorescence Equipped with the main shaft roller 123 drawn toward the analyzer 150, and by applying an appropriate tension to the printed matter through these, the surface wrinkle of the printed material can be completely removed.

In addition, in the present invention, the main spindle roller 123 has a larger diameter than the auxiliary rollers 122 and 123, so that the area where the X-rays of the X-ray fluorescence analyzer 150 reach and are reflected is proportional to the diameter of the main spindle roller. to make it wider.

That is, the printed material receives and reflects more X-rays by increasing the X-ray irradiation and reflection area, so that the X-ray fluorescence analyzer 150 may perform the print thickness measurement operation with improved sensitivity.

8 and 9 are diagrams for explaining an X-ray fluorescence analysis system for continuous print thickness measurement according to another embodiment of the present invention.

Referring to FIG. 8 , the device 100 of the present invention includes a device frame 110 , a transport device 120 , an edge camera 130 , a center camera 140 , an X-ray fluorescence analyzer 150 , and an X-ray analysis device. In addition to the position control unit 160, it is disposed at the front end of the X-ray detector 152 to be configured to further include a photo sensor 170 for sensing and notifying whether a pattern is formed.

For reference, the pattern printed on the printed matter has various patterns, and depending on the pattern pattern, the pattern forming area where the printed sample is printed and the pattern unformed area where the printed sample is not printed may be repeated, and in the pattern non-formed area, X Even if the line detection operation is normally performed, the print thickness measurement value is not obtained.

Accordingly, in the present invention, as shown in FIG. 9 , the pattern formation region and the non-pattern region are separated through the photosensor 170 , and the X-ray fluorescence analyzer 150 performs an X-ray detection operation on the pattern formation region in response thereto. However, the X-ray detection operation is temporarily stopped for the non-pattern area.

In this case, the total driving time of the X-ray detector is reduced by the ratio of the pattern-non-formed area, and the power consumption by the X-ray detector is also rapidly reduced in proportion thereto. That is, by reducing power consumption by the X-ray detector, the power efficiency of the entire system can be increased.

In the above, preferred embodiments of the present invention have been illustrated and described, but the present invention is not limited to the specific embodiments described above, and it is common in the technical field to which the present invention pertains without departing from the gist of the present invention as claimed in the claims. Various modifications may be made by those having the knowledge of, of course, and these modifications should not be individually understood from the technical spirit or perspective of the present invention.

Claims (8)

an apparatus frame having an open space through which printed matter can be transported, and an upper surface having a through hole connected to the open space;
a conveying device having a plurality of rollers attached and supported at the lower end of the open space in the apparatus frame, and transferring the printed matter by flattening the surface thereof through the plurality of rollers;
an edge camera attached to an upper end of the open space within the frame of the device to acquire and provide an edge image obtained by photographing an edge region of the printed matter;
a center camera attached to an upper end of an open space within the frame of the device to acquire and provide a center image obtained by photographing a center region of the printed matter;
an X-ray fluorescence analyzer attached to the upper surface of the device frame, irradiating X-rays to the center of the printed matter through the through hole, and then receiving and analyzing the reflected wave of the X-rays to calculate the print thickness of the printed matter; and
After receiving and analyzing the edge image and the center image to calculate the amount of change in the print position, the X-ray analysis position controller for real-time control of the position of the X-ray fluorescence analyzer according to the print position change amount X for continuous print thickness measurement line fluorescence analysis system. According to claim 1, wherein the X-ray analysis position control unit
a coarse position adjuster for positioning the X-ray fluorescence analyzer with first precision;
a fine position adjuster for positioning the X-ray fluorescence analyzer with a second precision higher than the first precision; and
After coarsely controlling the position of the X-ray fluorescence analyzer by extracting and using the edge position value from the edge image, the position of the X-ray fluorescence analyzer is again finely controlled by further extracting and using the center value from the center image X-ray fluorescence analysis system for continuous print thickness measurement, characterized in that it comprises a processor. According to claim 1,
The edge camera is located at the front end of the device frame,
The center camera is an X-ray fluorescence analysis system for continuous print thickness measurement, characterized in that it is positioned between the edge camera and the X-ray fluorescence analyzer. According to claim 1, wherein the transfer device is
two auxiliary rollers respectively disposed at the front and rear ends of the device frame; and
X-ray fluorescence analysis system for continuous print thickness measurement, characterized in that it is positioned between the two auxiliary rollers so as to lead toward the X-ray fluorescence analyzer, and comprises a main shaft roller implemented to have a larger diameter than the auxiliary roller. According to claim 1,
X-ray fluorescence analysis system for continuous print thickness measurement, characterized in that it further comprises a photo sensor for sensing and notifying whether a pattern is formed. The method of claim 5, wherein the X-ray fluorescence analyzer
An X-ray fluorescence analysis system for continuous print thickness measurement, characterized in that the X-ray detection operation is selectively performed only on the pattern formation area. The edge image of the edge area of the printed material is acquired through the edge camera installed at the point of entry of the printed material, and the center image of the center area of the printed material is captured through the center camera installed between the edge camera and the X-ray fluorescence analyzer. obtaining;
extracting an edge position value from the edge image, and coarsely controlling a position of the X-ray fluorescence analyzer based on the edge position value;
further extracting and using a center value from the center image to fine control the position of the X-ray fluorescence analyzer once again; and
X-ray fluorescence analysis method for continuous printing thickness measurement comprising the step of irradiating X-rays to the base of the printed matter through the X-ray fluorescence analyzer, and then calculating and notifying the print thickness of the printed matter by receiving and analyzing the reflected wave of the X-rays. 8. The method of claim 7,
Sensing whether a pattern is formed through a photo sensor located at the front end of the X-ray fluorescence analyzer, and determining whether or not the X-ray fluorescence analyzer detects X-rays according to whether the pattern is formed. X-ray fluorescence analysis method for measurement.

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