KR20210153984A - Method of measuring the multi-layered sludge blanket level - Google Patents

Abstract

The present invention relates to a method for measuring a multi-layered sludge interface, which is able to measure an interface between a high-concentration sludge and a low-concentration sludge by an apparatus for measuring a sludge interface including an ultrasonic sensor, and which can comprise: (a) a step of transmitting a high-concentration frequency using the ultrasonic sensor to the interface; (b) a step of receiving the high-concentration frequency return signal reflected in and returned from the interface, and calculating a first reception time information; (c) a step of calculating a height (S1) of the high-concentration sludge interface by using the high-concentration frequency return signal and the first reception time information; (d) a step of transmitting a low-concentration frequency using the ultrasonic sensor to the interface; (e) a step of receiving a low-concentration frequency return signal reflected in and returned from the interface, and calculating a second reception time information; (f) a step of calculating a height (S2) of the low-concentration sludge interface by using the low-concentration frequency return signal and the second reception time information; and (g) a step of calculating a border level (S3) between the high-concentration sludge and the low-concentration sludge by using the difference between the height (S1) of the high-concentration sludge interface and the height (S2) of the low-concentration sludge interface. The present invention aims to provide a method for measuring a multi-layered sludge interface, which is capable of improving reliability of the measurement.

Description

Method of measuring the multi-layered sludge blanket level

The present invention relates to a multi-layered sludge interface measuring method capable of separately measuring the boundary level between a high-concentration sludge layer and a low-concentration sludge layer.

The device for measuring the sludge interface in domestic water supply and sewage and wastewater treatment plants is mainly installed in facilities for discharging sludge (sedimentation, adjustment and concentration), and various types of products have been released so far.

The sludge jersey, which is a simple interface measuring device that allows the operator to manually measure the amount of sludge deposited on the site, is made of acrylic, so its durability is poor and the measurement accuracy is inaccurate. In order to solve these inaccuracies and inconveniences, online interface measuring devices have been mainly introduced in recent years, and the interface measuring devices are classified into ultrasonic type and optical type.

The ultrasonic method is an automated device that measures the return time of the reflected wave to measure the depth. As an automated device, there is no burden on the measurement work, and since it is a floating type that does not come into contact with sludge, it has the advantage of less contamination of the sensor. However, there is a problem that the sensitivity and intensity of the sensor must be adjusted according to the usage environment, and the error rapidly increases depending on the amount and type of contaminants present in the fluid, the presence or absence of bubbles, and the like.

Since the optical interface is a contact sensor with sludge, the lenses of the light emitting part and the light receiving part must be kept clean at all times.

Above all, the conventional sludge interface measuring device measures only one item, the sludge interface, but there is a difficulty in field operation, such as cases where the sludge in the treatment tank overflows and contaminates the river due to the lack of reliability and instability of the device.

In the end, the sludge interface information by the unreliable measuring device causes insufficient capacity of the sludge treatment facility due to the rise of the sludge interface and the deterioration of the water quality of the overflowing symbol water. This leads to a vicious cycle of reduced operational efficiency.

Korean Patent No. 10-1923165 (Title of the invention: Ultrasonic sludge interface measuring device of digital filter method that displays the shape of the sludge interface as a color image and calculates the concentration value of the sludge interface according to the color)

The present invention for solving the above problems can measure the height of the sludge more accurately using an ultrasonic sensor, and calculate the sludge boundary level in which high and low concentration sludge are mixed, so that accurate interface management for multi-layered sludge is possible An object of the present invention is to provide a multi-layered sludge interface measurement method to be achieved.

However, the technical task to be achieved by the present embodiment is not limited to the technical task as described above, and other technical tasks may exist.

The multi-layered sludge interface measuring method according to an embodiment of the present invention for achieving the above-described technical problem is a multi-layered sludge interface measuring method for measuring the interface between the high-concentration sludge and the low-concentration sludge by a sludge interface measuring device including an ultrasonic sensor In the method, (a) transmitting a high-concentration frequency using the ultrasonic sensor to the interface; (b) receiving a high-concentration frequency carrier signal reflected and carried from the interface, and calculating first reception time information; (c) calculating the height (S1) of the high-concentration sludge interface using the high-concentration frequency carrier signal and the first reception time information; (d) transmitting a low-concentration frequency using the ultrasonic sensor to the interface; (e) receiving a low-concentration frequency carrier signal reflected and carried from the interface, and calculating second reception time information; (f) calculating the height (S2) of the low-concentration sludge interface using the low-concentration frequency carrier signal and the second reception time information; and (g) calculating the boundary level (S3) between the high-concentration sludge and the low-concentration sludge using the difference between the height (S1) of the high-concentration sludge interface and the height (S2) of the low-concentration sludge interface. have.

The height (S1) of the interface of the high concentration sludge and the height (S2) of the interface of the low concentration sludge can be calculated using the following equation.

In the above equation, D is the distance between the ultrasonic sensor and the sludge layer, T is the reception time of the ultrasonic carrier signal, C is the sound velocity of the process water, E is the depth or height of the storage tank, and L is the height of the sludge interface.

The difference (S2-S1) between the height of the high-concentration sludge interface and the height of the low-concentration sludge interface may be calculated as the boundary level (S3) between the high-concentration sludge and the low-concentration sludge.

In the step (g), the sludge interface measuring device may display the high-concentration sludge and the low-concentration sludge to be distinguished, but to be displayed separately by placing a difference in wave density or color.

In the step (g), the sludge interface device, according to the user's selection, the height of the high-concentration sludge interface (S1), the height of the low-concentration sludge interface (S2), and the boundary level between the high-concentration sludge and the low-concentration sludge (S3) display output can be set.

On the other hand, the multi-layered sludge interface measuring method according to another embodiment of the present invention for achieving the above object is a multi-layered sludge interface for measuring the interface between the high-concentration sludge and the low-concentration sludge by a sludge interface measuring device including an ultrasonic sensor. A measuring method, comprising the steps of: (a) transmitting a first frequency using the ultrasonic sensor to the interface, and calculating first reception time information by receiving a first frequency carrier signal reflected and returned from the interface; (b) calculating the height (S1) of the interface of the high concentration sludge using the first frequency carrier signal and the first reception time information; (c) transmitting a second frequency using the ultrasonic sensor to the interface, and calculating second reception time information by receiving a second frequency carrier signal reflected and returned from the interface; and (d) the high concentration sludge Calculating the section of the low concentration sludge based on the height of the interface (S1), but calculating the range of the section of the low concentration sludge through a measurement algorithm based on the threshold voltage a certain number of times, and the range of the low concentration sludge of the predetermined number of times If the average value for , satisfies the reference value, calculating the range of the low-concentration sludge as the boundary level S3 between the high-concentration sludge and the low-concentration sludge.

In step (d), the sludge interface measuring device may display the high-concentration sludge, the low-concentration sludge, and the boundary level to be distinguished, but to be displayed separately by placing a difference in wave density or color.

In the step (d), the sludge interface device, according to the user's selection, the height of the high-concentration sludge interface (S1), the height of the low-concentration sludge interface (S2), and the boundary level between the high-concentration sludge and the low-concentration sludge (S3) display output can be set.

In the step (d), the measurement algorithm sets the measurement width (Measure Width) to 1/3 log low concentration sludge (Empty), and the distance (Distance) to the low concentration sludge level (Empty Sludge level), and the distance measurement width ( The measurement range is calculated by subtracting the distance from the Distance Measure Width (Distance Measure Width - Distance), and the measurement range is averaged by dividing the measurement width (Measure Width) by the number of measurements. point) can be calculated.

In step (d), the measurement algorithm sums the data of the number of measurements, calculates an average value by performing the data summation N times, and when the calculated average value satisfies a reference value, the low-concentration sludge interface can be recognized as

According to the present invention, by using an ultrasonic sensor, it is possible to distinguish not only the high-concentration sludge interfacial layer but also the low-concentration sludge interfacial layer in which a relatively thin layer of low-concentration sludge exists compared to the high-concentration sludge. Therefore, it is possible to improve the reliability of the measurement of the interface between the high and low concentrations, thereby making it possible to achieve more accurate and reliable interface management for multi-layered sludge.

In addition, it is possible to measure the height of each sludge more accurately with respect to the high-concentration sludge and the low-concentration sludge by using the ultrasonic sensor.

And, the present invention can be applied not only to the first and last needles in sewage treatment plants, but also to the thickening and sedimentation tanks in water purification plants, lime sludge storage in power plants, smelter sedimentation sludge, ironworks blast furnace sedimentation sludge, and paper/semiconductor wastewater sedimentation process. .

1 is a view for explaining the configuration of a multi-layer sludge interface measuring apparatus according to an embodiment of the present invention.
FIG. 2 is a block diagram illustrating an ultrasonic sensor and a control device of FIG. 1 .
3 is a flowchart illustrating a method for measuring a multi-layered sludge interface according to an embodiment of the present invention.
4 is a view for explaining the high-concentration sludge interface height, the low-concentration sludge interface height, and the sludge boundary level according to FIG. 3 .
5 is a flowchart illustrating a multi-layered sludge interface measurement method according to another embodiment of the present invention.
6 is a view for explaining the characteristics of the low-concentration sludge using the first ultrasonic carrier signal of the present invention.
FIG. 7 is a view for explaining the sludge boundary level detected by FIG. 5 .
8 is a configuration diagram schematically showing the configuration of a color display device for displaying the N-th interface executed in the multi-layered sludge interface measuring device according to the present invention by color.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those of ordinary skill in the art can easily implement them. However, the present invention may be embodied in several different forms and is not limited to the embodiments described herein. And in order to clearly explain the present invention in the drawings, parts irrelevant to the description are omitted, and similar reference numerals are attached to similar parts throughout the specification.

Throughout the specification, when a part is "connected" with another part, this includes not only the case of being "directly connected" but also the case of being "electrically connected" with another element interposed therebetween. . In addition, when a part "includes" a certain component, it means that other components may be further included, rather than excluding other components, unless otherwise stated, and one or more other features However, it is to be understood that the existence or addition of numbers, steps, operations, components, parts, or combinations thereof is not precluded in advance.

The following examples are detailed descriptions according to one embodiment to help the understanding of the present invention, and do not limit the scope of the present invention. Accordingly, an invention of the same scope performing the same function as the present invention will also fall within the scope of the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a diagram for explaining the configuration of a multi-layered sludge interface measuring apparatus according to an embodiment of the present invention, and FIG. 2 is a block diagram for explaining the ultrasonic sensor and control device of FIG. 1 .

1 and 2, the sludge interface measuring device is a measuring device that measures the height of the sludge being deposited in various storage tanks (second hand, bell needle, etc.) 1 in real time, and controls the sludge interface height in real time to control scrapers, valves, pumps, etc. Such multi-layered sludge interface measuring devices are sewage treatment plants (second hand, bell needle, thickener), water purification plant (sedimentation tank, thickener, storage tank), power plant, ironworks sedimentation sludge (blast furnace discharge water, steelmaking thickener), and various plant water treatment processes (paper, food and beverage) , petrochemicals, semiconductors, etc.).

The multi-layer sludge interface measuring device drives the ultrasonic sensor 11 and the ultrasonic sensor 11 used for S1G, corrosion, chemical resistance, and high temperature used in general fields, and analyzes the signal and outputs the measured value. (20). The ultrasonic sensor 11 may be a sensor that transmits an ultrasonic signal, transmits a high-concentration detection frequency and a low-concentration detection frequency, and receives a carrier signal corresponding thereto.

In addition, the multi-layer sludge interface measuring device may further include a sensor cleaning device, a sensor protection device, and a structure for removing floating sludge floating on the top of the settling tank.

The sensor cleaning device is used to remove various floating substances (scum, hair, etc.) in the field adhering to the surface of the ultrasonic sensor 11 operating in water, and a cleaning nozzle is attached to the inside of the ultrasonic sensor 11, so that the sensor cleaning device Since air can be supplied from the ultrasonic sensor 11 , the surface of the ultrasonic sensor 11 can be automatically cleaned.

In general, structures such as a scum skimmer for removing suspended matter on the water surface are operated in the second hand, the bell needle and the thickener of the sewage treatment plant.

The sensor protection device protects the ultrasonic sensor 11 from the rotating skimmer and enables continuous measurement.

When measuring the interface between the high-concentration sludge and the low-concentration sludge, the multi-layer sludge interface measuring device transmits a high-concentration frequency using the ultrasonic sensor 11 to the interface, and receives a high-concentration frequency carrier signal that is reflected and returned from the interface to receive the first reception Time information is calculated, and the height S1 of the interface of the high concentration sludge is calculated using the high concentration frequency carrier signal and the first reception time information.

Next, the multilayer sludge interface measuring device transmits a low concentration frequency using an ultrasonic sensor to the interface, receives a low concentration frequency carrier signal reflected and returned from the interface, calculates second reception time information, and the low concentration frequency carrier signal and the second The height S2 of the low-concentration sludge interface is calculated using the reception time information.

Next, the multi-layer sludge interface measuring device calculates the boundary level (S3) between the high-concentration sludge and the low-concentration sludge by using the difference value between the height (S1) of the high-concentration sludge interface and the height (S2) of the low-concentration sludge interface.

3 is a flowchart illustrating a multi-layered sludge interface measurement method according to an embodiment of the present invention, and FIG. 4 is a diagram illustrating a high-concentration sludge interface height, a low-concentration sludge interface height, and a sludge boundary level according to FIG. 3 .

Referring to FIG. 3 , the control device 20 transmits a first ultrasonic frequency using the ultrasonic sensor 11 to the interface at a first time interval ( S11 ), and transmits the ultrasonic wave at a second time interval to intersect the first time interval ( S11 ). The second ultrasonic frequency using the sensor 11 is transmitted to the interface (S12).

The control device 20 continuously receives the first ultrasonic carrier signal in which the transmitted first ultrasonic frequency is reflected by the interface, and extracts reception time information of the first ultrasonic carrier signal (S13).

The control device 20 continuously receives the second ultrasonic carrier signal in which the transmitted second ultrasonic frequency is reflected by the interface and is carried, and extracts reception time information of the second ultrasonic carrier signal (S14).

The control device 20 calculates the interface height of the high concentration sludge using the first ultrasonic transport signal and the reception time information (S15), and calculates the interface height of the low concentration sludge by using the second ultrasonic transport signal and the reception time information (S16) ).

As shown in Equation 1 below, the control device 20 measures the time (T) at which the transmitted ultrasonic carrier signal hits the interface (the interface where the sludge and the supernatant are divided) and returns, and multiplies this by the speed of sound (C) to the ultrasonic sensor Calculate the distance (equal number) from (11) to the interface. And the control device 20 can measure the height (L) of the sludge interface in real time by subtracting the measured supernatant value from the previously input distance to the floor.

In Equation 1, D is the distance between the ultrasonic sensor and the sludge layer, T is the reception time of the ultrasonic carrier signal, C is the sound velocity of the process water, E is the depth or height of the storage tank, and L is the height of the sludge interface, respectively.

As shown in FIG. 4 , the control device 20 obtains the height S1 of the high-concentration sludge interface and the height S2 of the low-concentration sludge interface using Equation 1, and then returns the first ultrasonic transport signal and the second ultrasonic wave. Using the difference value of the signal, the boundary level of the high-concentration sludge and the low-concentration sludge (S3) is calculated (S17).

That is, the multilayer sludge interface measuring device uses the difference value (S2-S1) between the height (S1) of the high-concentration sludge interface and the height (S2) of the low-concentration sludge interface to determine the boundary level (S3) between the high-concentration sludge and the low-concentration sludge. To calculate the height (L).

In this case, the multi-layer sludge interface measuring device may display the high-concentration sludge and the low-concentration sludge to be distinguished, but to be displayed separately by placing a difference in wave density or color.

In addition, the multi-layer sludge interface measuring device can set the display output of the high concentration sludge interface height (S1), the low concentration sludge interface height (S2), and the boundary level between high concentration sludge and low concentration sludge (S3) according to the user's selection. have.

5 is a flowchart illustrating a multi-layered sludge interface measurement method according to another embodiment of the present invention, FIG. 6 is a diagram illustrating the characteristics of low-concentration sludge using the first ultrasonic carrier signal of the present invention, and FIG. 7 is FIG. It is a figure explaining the sludge boundary level detected by 5.

5 to 7, in the multilayer sludge interface measurement method, the beam width of the first frequency signal and the second frequency signal of the ultrasonic sensor 11 is set to overlap each other (S21), and the first using the ultrasonic sensor The ultrasonic frequency S1 is transmitted to the interface (S22), and a second ultrasonic frequency using the ultrasonic sensor is transmitted to the interface (S23).

The control device 20 receives the first ultrasonic carrier signal in which the transmitted first ultrasonic frequency is reflected by the interface and is carried, and extracts reception time information of the first ultrasonic carrier signal (S24).

Also, the control device 20 receives in real time the second ultrasonic carrier signal in which the transmitted second ultrasonic frequency is reflected by the interface and is carried, and extracts reception time information of the second ultrasonic carrier signal ( S25 ).

The control device 20 calculates the high-concentration sludge interface height S1 using the first ultrasonic transport signal and the reception time information using Equation 1, and the low-concentration sludge interface by using the second ultrasonic transport signal and the reception time information. The height S2 is calculated (S26).

The control device 20 sets a threshold voltage Vt based on a signal level difference between the first ultrasonic carrier signal and the second ultrasonic carrier signal (S27), and applies the second ultrasonic carrier signal to the first ultrasonic carrier signal. An ultrasonic superimposition signal in which an effective beam width region is formed by overlapping processing is generated (S28).

Thereafter, the control device 20 controls a section in which the signal level equal to or greater than the threshold voltage (Vt) appears at a preset ratio (P1) within the set measurement time T0 set as the low-concentration sludge check time range among the ultrasonic superimposition signals, the low-concentration sludge and the high-concentration sludge is calculated as the boundary level (S3) of (S29).

As shown in FIG. 5, the high-concentration sludge interfacial layer has stable sludge sedimentation compared to the low-concentration sludge interfacial layer in which a thin layer of sludge exists. However, in the low-concentration sludge interfacial layer, sludge sedimentation is unstable and suspended matter is in an unstable state. Therefore, looking at the second ultrasonic carrier signal received in real time, it exhibits a characteristic that the deviation in the low-concentration sludge layer is deepened at the sludge boundary level.

Using these signal characteristics, the control device 20 superimposes the second ultrasonic carrier signal for each frequency band on the first ultrasonic carrier signal using the high-concentration sludge interface layer stably measured through the first ultrasonic carrier signal as a reference point. If the total number of times (N1) of the signal level (or sampled signal value) exceeding the threshold voltage for the ultrasonic overlap signal for time T0 is within P1 (N1/T1×100), it is determined as the sludge boundary level (S3).

The multi-layered sludge interface measuring device according to the present invention may display high-concentration sludge, low-concentration sludge and boundary levels to be distinguished, but to be displayed separately by placing a difference in wave density or color.

In addition, the multilayer sludge interface device can set the display output of the height S1 of the high-concentration sludge interface and the boundary level S3 between the high-concentration sludge and the low-concentration sludge according to the user's selection.

The measurement algorithm according to the present invention, as shown in Equation 2 below, the measurement width (Measure Width) is 1/3 log low concentration sludge (Empty), and the distance (Distance) is low concentration sludge level (Empty Sludge level), The measurement range is calculated by subtracting the Distance from the Distance Measure Width (Distance Measure Width - Distance), and the measurement range is averaged by dividing the measurement width by the number of measurements. Point (Measure Point) can be calculated.

In addition, the measurement algorithm, as in the following Equation 3, sums the data of the number of measurements, calculates an average value by performing the data summation N times, and when the calculated average value satisfies the reference value (Reference Value), low-concentration sludge It can be recognized as an interface (secondary interface).

In Equation 3, n represents the number of Measure Points and is fixed, and p represents the number of Measure Sums and can be set according to the measurement environment, and can be set by increasing the p value as the measurement variability increases. The measurement algorithm calculates a stable average value by performing data summation N times in an unstable signal state.

The measurement algorithm repeats the above process and when a satisfactory value is calculated, it is recognized as an Nth-order interface. At this time, the measurement algorithm can measure the Nth low-concentration section by repeating continuously up to the maximum high-order number (dead zone) level.

In addition, the measurement algorithm, if the criterion is satisfied, the range is shifted to the maximum dead zone and measurement is possible, and the low concentration interface position is calculated based on the final layer. As an option, the N-th interface may be displayed by color through the color display device, but the colors may be displayed separately for each layer.

On the other hand, the multi-layered sludge interface measuring method according to an embodiment of the present invention can correct the interface height and sludge boundary level of the sludge calculated using the other embodiments described above.

That is, the control device 20 superimposes the second ultrasonic carrier signal on the first ultrasonic carrier signal to generate an ultrasonic superimposed signal in which an effective beam width region is formed, and then, among the ultrasonic superimposed signals, the threshold voltage within the set measurement time T0. A section in which a signal level equal to or greater than (Vt) appears at a preset ratio P1 is calculated as a correction section.

Then, the sludge boundary level calculated by using the signal difference value between the first ultrasonic carrier signal and the second ultrasonic carrier signal is corrected based on the correction section, and the interface height and high concentration of low-concentration sludge based on the corrected sludge boundary level. The interface height of the sludge can be corrected.

In this case, the control device 20 may calculate the distance between the sensor and the interface by various methods of measuring the distance using the ultrasonic sensor in addition to Equation 1 above. The method of measuring the ultrasonic signal in FIGS. 3 and 5 is a versatile method that accurately detects the effective signal reflected from the interface by using the height, width, and other various information of the signal in addition to the time axis information of the received signal for stable measurement. The signal measurement algorithm used in the interface measurement method using ultrasonic waves (Registration Patent No. 10-0781092) can be used.

On the other hand, the multilayer sludge interface measuring device according to the present invention can display the color by layer by classifying the N-th interface by color through the color display device by executing the measurement algorithm, the color display device is shown in FIG. It has a structure as shown. 8 is a configuration diagram schematically showing the configuration of a color display device for displaying the N-th interface executed in the multi-layered sludge interface measuring device according to the present invention by color.

Referring to FIG. 8 , the color display device to which the present invention is applied is implemented as an organic light emitting display device, and a gate metal layer 113 including a gate electrode and signal wiring is formed on a substrate 100 . Here, the substrate 100 may be made of a flexible plastic material having a flexible characteristic so that the display performance can be maintained even when the organic light emitting display device is bent like paper.

In addition, the gate metal layer 113 may include a first metal material having a low resistance characteristic, for example, aluminum (Al), aluminum alloy (AlNd), copper (Cu), copper alloy, molybdenum (Mo), and molybdenum (MoTi). It may be formed in a single-layer structure made of any one of these, or a double-layer or triple-layer structure by being made of two or more first metal materials. The gate metal layer 113 forms the lower electrode of the capacitor C1 and extends to form the gate electrode 1131 of the driving thin film transistor DRT.

In addition, the gate insulating layer 115 and the etch stop layer 116 made _{of an insulating material, for example, silicon oxide (SiO 2} ) or silicon nitride (SiNx), which are inorganic insulating materials, are formed on the entire surface of the display area of the substrate including the gate metal layer 113 . ) is formed.

Between the upper portion of the gate insulating layer 115 and the etch stop layer 116, a semiconductor layer 121 made of any one selected from amorphous silicon, polysilicon, and semiconductor oxide corresponding to each of the thin film transistors SWT, SST, and DRT. this is formed A portion of the semiconductor layer 121 is exposed through a contact hole formed on the etch stop layer 116 , and a driving thin film transistor (DRT) is formed on the insulating layer 115 including the contact hole and the etch stop layer 116 . ), the first source and drain metal layer 122 including the source and drain electrodes 1221 , the data signal (Vdata) applying wiring 1222 , and the power supply voltage (ELVDD) applying wiring 1223 are formed.

Here, the first source and drain metal layers 122 are, for example, aluminum (Al), aluminum alloy (AlNd), copper (Cu), copper alloy, molybdenum (Mo), moly titanium (MoTi), chromium (Cr) and It may be made of any one of titanium (Ti) or a combination of two or more materials.

In particular, a source electrode and a drain electrode 1221 made of the metal material are formed in the driving thin film transistor DRT, which are spaced apart from each other and contact the semiconductor layer 121 exposed through the contact hole, respectively. Accordingly, the gate electrode 1131 , the gate insulating layer 115 , the semiconductor layer 121 , and the source and drain electrodes 1221 form one driving thin film transistor DRT. In addition, in addition to the driving thin film transistor (DRT), the switching thin film transistor (SWT) and the sensing thin film transistor (SST) are also formed in the same stacked structure.

Here, the gate electrode and the drain electrode of the switching thin film transistor (SWT) are connected to the scan line and the data line, respectively, and the source electrode of the switching thin film transistor (SWT) is electrically connected to the gate electrode of the driving thin film transistor (DRT). and source electrodes of the sensing thin film transistor SST and the driving thin film transistor DRT are connected to each other.

In addition, in the first source and drain metal layer 122 , the data signal applying wiring 1222 forms the upper electrode of the capacitor C1 .

Meanwhile, in the drawings, both the first source and drain metal layers 122 have a single-layer structure as an example, but a double-layer or triple-layer structure may be formed by a combination of two metal materials.

In addition, a passivation layer 125 is formed on the first source and drain metal layer 122 to cover the driving thin film transistor DRT and to expose a portion of the first source and drain metal layer 122 . In particular, a partial region of the passivation layer 125 is etched to expose the power supply voltage application wiring 1223 of the lower first source and drain metal layer 122 , and is in contact with the upper second source and drain metal layer 127 . make it possible

A second source and drain metal layer 127 is formed on the passivation layer 125 . The second source and drain metal layers 127 may be formed of the same material as the first source and drain metal layers 122 . In particular, the second source and drain metal layers 127 are patterned on the upper portion of the driving thin film transistor DRT to form the same material as the gate electrode 1131 . It includes an auxiliary gate electrode 1271 that forms a dual gate structure when a voltage is applied thereto.

As the second source and drain metal layer 127 extends to a region where the power supply voltage application wiring 1223 of the first source and drain metal layer 122 is exposed and comes into contact, a signal supplied therefrom is transmitted to the anode metal layer 143 . to be authorized

In addition, an interlayer insulating layer 131 is formed on the second source and drain metal layer 127 . A first contact hole 141 exposing the lower second source and drain metal layer 127 is formed in a partial region of the interlayer insulating film 131 , and the interlayer insulating film ( 131) An anode metal layer 143 having a shape separated for each pixel is formed on the upper portion.

Here, the region exposed by the first contact hole 141 overlaps the capacitor C1 formed by the data signal applying wiring 1222 of the gate metal layer 113 and the first source and drain metal layer 122 downward, It is defined as a first region in which the second source and drain metal layer 127 and the anode metal layer 142 contact each other.

In the first region, the data signal applying wiring 1222 of the first source and drain metal layer 122 and the second source and drain metal layer 127 are insulated from each other by the passivation layer 125 .

The anode metal layer 143 constitutes the anode electrode of the organic light emitting diode, and although not shown, an organic light emitting layer composed of an organic light emitting pattern (not shown) that emits red, green and blue light respectively on the upper portion of the anode metal layer 143 . and a cathode electrode (not shown) are formed. Accordingly, the anode metal layer 143 and the cathode electrode and the organic light emitting layer interposed between the two electrodes form an organic light emitting diode.

Here, the organic light emitting layer may be composed of a single layer made of an organic light emitting material, or a hole injection layer, a hole transporting layer, a light emitting material layer, to increase luminous efficiency. It may be composed of multiple layers of an electron transporting layer and an electron injection layer.

In particular, the anode metal layer 143 of the present invention extends in one direction to expose the second source and drain metal layers 127 that do not overlap with the passivation layer 125, not the first contact hole 141 ( It extends to the second contact hole 142 of the 131 , and is in double contact with the second source and drain metal layers 127 .

That is, in the interlayer insulating film 131 included in one pixel, not only the first contact hole 141 formed in the region overlapping the passivation film 125 but also the passivation film 125 are etched to form the first source and drain metal layers. A second contact hole 142 is further formed to correspond to a region in which the power supply voltage applying wiring 1223 of 122 and the second source and drain metal layers 127 are in contact, and the anode metal layer up to the second contact hole 142 is formed. 143 extends so that the second source and drain metal layer 127 and the anode metal layer 143 come into contact with each other in redundancy.

Here, the region exposed by the second contact hole 142 includes the gate metal layer 113, the power supply voltage application wiring 1223 of the first source and drain metal layer 122, the second source and drain metal layer 127, The anode metal layer 142 is sequentially formed and is defined as a second region in direct contact with each other.

According to this structure, even if an open failure of the second source and drain metal layer 127 occurs due to the step difference of the passivation film 125 in the etching process of the second source and drain metal layer 127, the anode metal layer ( 143) and the electrical connection between the second source and drain metal layers 127 remain unchanged. The signal supplied to the anode metal layer 143 is the power supply voltage ELVDD applied through the driving thin film transistor DRT.

On the other hand, at least one passivation film, an organic film, and a protective film are further provided on the upper portion of the anode metal layer 143 to prevent moisture penetration into the organic light emitting layer, thereby forming one organic light emitting display device.

As described above, the present invention can measure the height of the sludge more accurately by using an ultrasonic sensor, and calculates the sludge boundary level in which the high and low concentration sludge are mixed so that the accurate interface management for the multi-layered sludge is made. A multi-layered sludge interface measurement method can be realized.

The multi-layered sludge interface measuring method according to the embodiment of the present invention described above may be implemented in the form of a recording medium including instructions executable by a computer, such as a program module executed by a computer. Such recording media includes computer-readable media, and computer-readable media can be any available media that can be accessed by a computer, and includes both volatile and nonvolatile media, removable and non-removable media. Computer readable media also includes computer storage media, which include volatile and nonvolatile embodied in any method or technology for storage of information, such as computer readable instructions, data structures, program modules, or other data. , including both removable and non-removable media.

The description of the present invention described above is for illustration, and those of ordinary skill in the art to which the present invention pertains can understand that it can be easily modified into other specific forms without changing the technical spirit or essential features of the present invention. will be. Therefore, it should be understood that the embodiments described above are illustrative in all respects and not restrictive. For example, each component described as a single type may be implemented in a dispersed form, and likewise components described as distributed may also be implemented in a combined form.

The scope of the present invention is indicated by the following claims rather than the above detailed description, and all changes or modifications derived from the meaning and scope of the claims and their equivalents should be interpreted as being included in the scope of the present invention. do.

11: ultrasonic sensor 20: control device

Claims (10)

In the multi-layered sludge interface measuring method for measuring the interface between high-concentration sludge and low-concentration sludge by a sludge interface measuring device including an ultrasonic sensor,
(a) transmitting a high-concentration frequency using the ultrasonic sensor to the interface;
(b) receiving a high-concentration frequency carrier signal reflected and carried from the interface, and calculating first reception time information;
(c) calculating the height (S1) of the high-concentration sludge interface using the high-concentration frequency carrier signal and the first reception time information;
(d) transmitting a low-concentration frequency using the ultrasonic sensor to the interface;
(e) receiving a low-concentration frequency carrier signal reflected and carried from the interface, and calculating second reception time information;
(f) calculating the height (S2) of the low-concentration sludge interface using the low-concentration frequency carrier signal and the second reception time information; and
(g) calculating the boundary level (S3) of the high-concentration sludge and the low-concentration sludge using the difference between the height (S1) of the high-concentration sludge interface and the height (S2) of the low-concentration sludge interface;
Including, a multi-layered sludge interface measurement method. The method of claim 1,
A multi-layered sludge interface measuring method for calculating the height (S1) of the high-concentration sludge interface and the height (S2) of the low-concentration sludge interface using Equation 1 below.
[Equation 1]

D: Distance between ultrasonic sensor and sludge layer
T: the reception time of the ultrasonic carrier signal,
C: Process water speed of sound
E: depth or height of the reservoir
L: the height of the sludge interface 3. The method of claim 2,
A multi-layered sludge interface measuring method for calculating the difference (S2-S1) between the height of the high-concentration sludge interface and the height of the low-concentration sludge interface as the boundary level (S3) between the high-concentration sludge and the low-concentration sludge. The method of claim 1,
In the step (g), the sludge interface measuring device, but the high-concentration sludge and the low-concentration sludge are displayed so as to be distinguished, the multi-layered sludge interface measuring method is displayed by placing a difference in wave density or color. The method of claim 1,
In step (g), the sludge interface measuring device is, according to the user's selection, the height of the high-concentration sludge interface (S1), the height of the low-concentration sludge interface (S2), and the boundary level between the high-concentration sludge and the low-concentration sludge (S3). ), a multi-layered sludge interface measurement method to set the display output. In the multi-layered sludge interface measuring method for measuring the interface between high-concentration sludge and low-concentration sludge by a sludge interface measuring device including an ultrasonic sensor,
(a) transmitting a first frequency using the ultrasonic sensor to the interface, and calculating a first reception time information by receiving a first frequency carrier signal reflected and returned from the interface;
(b) calculating the height (S1) of the interface of the high concentration sludge using the first frequency carrier signal and the first reception time information;
(c) transmitting a second frequency using the ultrasonic sensor to the interface, and calculating second reception time information by receiving a second frequency carrier signal reflected and returned from the interface; and
(d) calculating the section of the low concentration sludge based on the height (S1) of the interface of the high concentration sludge, but calculating the range of the section of the low concentration sludge through the measurement algorithm based on the threshold voltage a certain number of times, and the predetermined number of times Calculating the range of the low-concentration sludge as the boundary level (S3) between the high-concentration sludge and the low-concentration sludge when the average value for the range of the low-concentration sludge of the low-concentration sludge satisfies the reference value;
Including, a multi-layered sludge interface measurement method. 7. The method of claim 6,
In the step (g), the sludge interface measuring device, but the high-concentration sludge and the low-concentration sludge are displayed so as to be distinguished, the multi-layered sludge interface measuring method is displayed by placing a difference in wave density or color. 7. The method of claim 6,
In step (g), the sludge interface device, according to the user's selection, the height of the high-concentration sludge interface (S1), the height of the low-concentration sludge interface (S2), and the boundary level between the high-concentration sludge and the low-concentration sludge (S3) A multi-layered sludge interface measurement method to set the display output of. 7. The method of claim 6,
In the step (d), the sludge interface measuring device sets the measurement width (Measure Width) to 1/3 log low concentration sludge (Empty), and the distance (Distance) to the low concentration sludge level (Empty Sludge level), measuring the distance Measure range is calculated by subtracting Distance from Distance Measure Width (Distance), and the measurement range is averaged by dividing the measurement width by the number of measurements. (Measure Point), a multi-layered sludge interface measurement method. 10. The method of claim 9,
In step (d), the sludge interface measuring device adds up the data of the number of measurements, calculates an average value by performing the data summation N times, and the calculated average value satisfies a reference value. A multi-layered sludge interface measurement method that is recognized as a sludge interface.

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