KR20210014308A - Projection system of 3 dimensional scanning using pattern mask and the method thereof - Google Patents

Abstract

The present invention relates to a projection system of three-dimensional scanning using a pattern mask and a method thereof. The projection system of three-dimensional scanning using the pattern mask comprises: a light source; a condenser lens which collects light emitted from the light source; the pattern mask which has a single pattern formed to make the light pass through the condenser lens; a driving unit which mechanically moves the pattern mask, and drives the emission of light in accordance with the light source; and a projection lens which emits the light which has passed through the pattern mask. The driving unit mechanically moves the pattern mask and emits a black pattern, single pattern, and white pattern through the projection lens. The present invention is able to perform the three-dimensional scanning for a subject in a simplified projector structure.

Description

A projection system for 3D scanning using a pattern mask, and its method {PROJECTION SYSTEM OF 3 DIMENSIONAL SCANNING USING PATTERN MASK AND THE METHOD THEREOF}

The present invention relates to a projection system and a method for 3D scanning using a pattern mask, and more particularly, to a technology for projecting a black pattern, a single pattern, and a white pattern on a subject using a pattern mask of a single pattern.

Three-dimensional (3D) scanning is an optical device that acquires 3D shape and color information of a subject (or object) and is used in a wide range of fields such as commerce, architecture, medicine, industry, science, and culture. 3D scanning can be implemented by various methods such as laser trigonometry, structured light projection, and time of flight (TOF), and the 3D shape information of the acquired object is saved in a 3D file format that can be used in a computer.

3D scanning technology acquires shape information of an object and stores it as a computer model, and its demand is gradually increasing in the fields of robot driving, part defect inspection, reverse engineering, HCI (Human Computer Interaction), and cultural property restoration. Are doing.

In the existing 3D scanning technology, a plurality of multi-patterns are projected on a subject to be photographed, and the subject is 3D scanned through image combination using depth information from acquired images.

Korean Patent Registration No. 10-1842141 (registered on March 20, 2018), “3D scanning apparatus and method”

An object of the present invention is to provide a technology capable of performing 3D scanning on a subject in a simplified projector structure by projecting a black pattern, a single pattern, and a white pattern on a subject using a pattern mask on which a single pattern is formed. do.

In addition, an object of the present invention is to provide a technology capable of three-dimensional scanning a subject with only a single pattern by mechanically moving a pattern mask and driving light emission according to a light source.

The projection system for three-dimensional scanning using a pattern mask according to an embodiment of the present invention includes a light source, a condenser lens for condensing light emitted from the light source, a pattern mask having a single pattern for passing light passing through the condenser lens, the A driving unit that mechanically moves a pattern mask and drives light emission according to the light source, and a projection lens that emits light that has passed through the pattern mask, wherein the driving unit mechanically moves the pattern mask to the projection lens. The black pattern, the single pattern, and the white pattern are emitted through.

The pattern mask may include the single pattern that passes light passing through the condenser lens and is projected onto a subject.

The pattern mask is limited in movement by a blocking portion positioned on a side surface, and may have left and right fluidity by rail portions positioned at an upper end and a lower end.

The driving unit may drive the rail unit to mechanically move the pattern mask left and right from the blocking unit to the length of the rail unit.

The driving unit positions the pattern mask on a line of light through which light passing through the condenser lens passes, and drives the single pattern to be emitted to the subject through the projection lens, or positions the pattern mask in addition to the line of light. So that the white pattern is emitted to the subject through the projection lens.

The driving unit may block light emitted from the light source and drive the black pattern to be emitted to the subject through the projection lens.

In addition, the projection system for 3D scanning using a pattern mask according to an embodiment of the present invention may further include a processing unit for processing an image for scanning using the black pattern, the single pattern, and the white pattern projected to a subject. have.

The processor determines the white part and the black-and-white part of each pattern by comparing preset threshold values based on the pixel values of the black pattern, the single pattern, and the white pattern, and for scanning the subject based on the determination result. Image processing can be performed.

A projection system for 3D scanning using a pattern mask according to another embodiment of the present invention includes a light source, a condenser lens for condensing light emitted from the light source, a pattern mask in which a single pattern for passing light passing through the condenser lens is formed, A driving unit for driving light emission according to the light source, an optical element for dispersing or refracting light that has passed through the pattern mask or light that has not passed through the pattern mask, and a projection lens for emitting light that has passed through the optical element However, the driving unit drives the light source so that light that has passed through the pattern mask or light that has not passed through the pattern mask is emitted through the projection lens to emit the black pattern, the single pattern, and the white pattern.

A projection system for 3D scanning using a pattern mask according to another embodiment of the present invention includes a light source, a condenser lens condensing light emitted from the light source, and a first optical element for dispersing or refracting light passing through the condenser lens. , A pattern mask having a single pattern for passing light passing through the first optical element, a reflecting plate for reflecting light passing through the first optical element, a driving unit driving light emission according to the light source, and the pattern mask A second optical element that disperses or refracts light that has passed or does not pass through the pattern mask, and a projection lens that emits light that has passed through the optical element, wherein the driving unit blocks light incident on the pattern mask. The black pattern, the single pattern, and the white pattern are emitted by driving the first blocking unit and the second blocking unit blocking light incident to the second optical element through the reflector.

In the method of operating a projection system for 3D scanning using a pattern mask according to an embodiment of the present invention, irradiating light from a light source, condensing light emitted from the light source through a condenser lens, and forming a single pattern. Passing light that has passed through the condenser lens using a pattern mask, and emitting light that has passed through the pattern mask through a projection lens, wherein the light that has passed through the condenser lens is passed using the pattern mask. In the step of mechanically moving the pattern mask, the black pattern, the single pattern, and the white pattern are emitted through the projection lens.

In the step of passing the light passing through the condenser lens using the pattern mask, the rail units located at the top and bottom of the pattern mask are driven, so that the length of the rail unit from the blocking unit located on the side surface of the pattern mask The pattern mask can be mechanically moved left and right.

In the step of passing the light passing through the condenser lens using the pattern mask, the single pattern is emitted to the subject through the projection lens by placing the pattern mask on a line of light through which the light passing through the condenser lens passes. It may be driven so that the white pattern is emitted to the subject through the projection lens by positioning the pattern mask outside the line of light.

In the step of irradiating light from the light source, light emitted from the light source may be blocked, and the black pattern may be emitted to the subject through the projection lens.

In addition, the projection method of 3D scanning using a pattern mask according to an embodiment of the present invention may further include processing an image for scanning using the black pattern, the single pattern, and the white pattern projected to a subject. have.

The scanning may include determining a white part and a black-and-white part of each pattern by comparing preset threshold values based on pixel values of the black pattern, the single pattern, and the white pattern, and scanning the subject based on the determination result. You can do image processing for

According to an exemplary embodiment of the present invention, by projecting a black pattern, a single pattern, and a white pattern on a subject using a pattern mask on which a single pattern is formed, 3D scanning of a subject can be performed in a simplified projector structure.

In addition, according to an embodiment of the present invention, by mechanically moving the pattern mask and driving light emission according to the light source, it is possible to 3D scan a subject with only a single pattern.

1 shows an example for explaining a 3D scanning device.
2 shows the structure of a projection system for 3D scanning using a pattern mask according to an embodiment of the present invention.
3 shows an example of a structure of a pattern mask according to an embodiment of the present invention.
4 shows an example of a pattern of a pattern mask according to an embodiment of the present invention.
5 is a diagram illustrating a structure of a projection system for 3D scanning using a pattern mask according to another embodiment of the present invention.
6 is a diagram illustrating a structure of a projection system for 3D scanning using a pattern mask according to another embodiment of the present invention.
7 is a diagram illustrating an example of image acquisition using a pixel value and a threshold value of each pattern according to an exemplary embodiment of the present invention.
8 is a flowchart illustrating a projection method of 3D scanning using a pattern mask according to an embodiment of the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the present invention is not limited or limited by the embodiments. In addition, the same reference numerals shown in each drawing denote the same member.

In addition, terms used in the present specification are terms used to properly express preferred embodiments of the present invention, which may vary depending on the intention of viewers or operators, or customs in the field to which the present invention belongs. Accordingly, definitions of these terms should be made based on the contents throughout the present specification.

1 shows an example for explaining a 3D scanning device.

Referring to FIG. 1, a 3D scanning device is a device for 3D scanning an object 200 to be scanned, and uses a projection system 100 and a camera 300 for 3D scanning using a pattern mask according to an embodiment of the present invention. Include.

In general, in the case of three-dimensional scanning of a subject, a specific pattern is irradiated on the subject using a projector, and a relationship between the projector and the camera, that is, calibration is set through the specific pattern. Thereafter, 3D scanning is performed by recognizing 3D coordinates of the subject based on the set relationship.

Referring to FIG. 1, the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention projects a pattern mask in which a single pattern is formed on a subject 200, and the camera 300 is a subject 200 ), and 3D scanning of the subject 200 may be performed through coordinates and depth values for each pixel.

At this time, the camera 300 acquires at least three image data by capturing each of the black pattern, the single pattern, and the white pattern projected onto the subject 200, and calculates coordinates and depth values from the image data to obtain the subject 200 It may represent a scanning device that performs 3D scanning for

In addition, the projection system 100 for three-dimensional scanning using a pattern mask according to an embodiment of the present invention projects a single pattern to the subject 200 in synchronization with the photographing time, and the projection time and the photographing time are also control means of the device. (Or may be controlled by the driving unit 150).

2 shows the structure of a projection system for 3D scanning using a pattern mask according to an embodiment of the present invention.

Referring to FIG. 2, a projection system for 3D scanning using a pattern mask according to an embodiment of the present invention projects a black pattern, a single pattern, and a white pattern on a subject using a pattern mask of a single pattern.

To this end, the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention includes a light source 110, a condenser lens 120, a pattern mask 130, a projection lens 140, and a driving unit 150. ). In addition, the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention may further include a processing unit 160.

The condenser lens 120 collects light emitted from the light source 110.

For example, the light source 110 emits light for projecting light onto a subject, and for this purpose, a light emitting diode (LED) may be used, but various examples are not limited thereto. Depending on the embodiment, the light source 110 may include a blue LED for outputting a single blue light, a green LED for outputting a single green light, and a red LED for outputting a single red light.

In this case, light must be collected to increase the intensity and uniformity of light emitted from the light source 110, and for this purpose, the condenser lens 120 is disposed in front of the light source 110 to absorb the light emitted from the light source 110. It can condense.

The pattern mask 130 has a single pattern for passing light that has passed through the condenser lens 120, and the projection lens 140 emits light that has passed through the pattern mask 130.

Here, the size, shape, and material of the condenser lens 120 and the projection lens 140 are not limited to those shown in FIG. 2, and various examples are possible.

The pattern mask 130 passes light passing through the condenser lens 120 and may include a single pattern projected onto the subject. In addition, the pattern mask 130 is limited in movement by a blocking portion positioned on the side, and may have left and right fluidity by rail portions positioned at the top and bottom. Depending on the embodiment, the pattern mask 130 may be driven by including a plate in which a single pattern and an inverse single pattern representing an inverse pattern of the single pattern are placed side by side or vertically.

Hereinafter, the structure and pattern of the pattern mask 130 according to an embodiment of the present invention will be described in detail with reference to FIGS. 3 and 4.

3 shows an example of a structure of a pattern mask according to an embodiment of the present invention, and FIG. 4 shows an example of a pattern of a pattern mask according to an embodiment of the present invention.

Referring to FIG. 3, movement of the pattern mask 130 is restricted by the blocking portion 131 positioned at the side, and may have left and right fluidity by rail portions 132 positioned at the top and bottom.

The blocking part 131 is for stopping the mechanical movement of the pattern mask 130, and may be formed at at least one of the right and left sides of the pattern mask 130.

The rail unit 132 may be in the form of a rail or a lead screw, and may be positioned at upper and lower ends of the pattern mask 130 to provide left and right flowability of the pattern mask 130.

Referring to FIG. 2, for example, the pattern mask 130 on which a single pattern is formed is positioned on the line of light passing through the condenser lens 120 or outside the line of light, according to an embodiment of the present invention. The projection system 100 for 3D scanning using a pattern mask may project a single pattern, a white pattern, and a black pattern as a subject.

For this reason, in FIG. 3, the length of the rail part 132 is preferably at least 1.5 times the length of the pattern mask 130, and the rail part 132 is a pattern mask on the line of light passing through the condenser lens 120. It is possible to provide 130 left and right mobility.

At this time, the pattern mask 130 has a single pattern formed, and the single pattern of the pattern mask 130 projected onto the subject by the projection system 100 for 3D scanning using the pattern mask according to the embodiment of the present invention is As in the example shown in FIG. 4A, various stripe patterns having different widths in the vertical direction, various stripe patterns having different widths in the horizontal direction, as in the example shown in FIG. 4B, and shown in FIG. 4C As in the previous example, it may be in the form of either a grid pattern or a check pattern. Of course, the single pattern projected by the projection system 100 for 3D scanning according to an embodiment of the present invention is not limited to the patterns shown in FIG. 4, and may be various patterns applicable such as a cross pattern and an X-shaped pattern. have.

Referring back to FIG. 2, the driving unit 150 of the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention drives light emission according to the light source 110, and the pattern mask 130 ) Is mechanically moved to emit a black pattern, a single pattern, and a white pattern through the projection lens 140.

The driving unit 150 may drive the rail unit 132 to mechanically move the pattern mask 130 from the blocking unit 131 to the length of the rail unit 132 left and right.

For example, the driving unit 150 may block light emitted from the light source 110 and drive the black pattern to be emitted to the subject through the projection lens 140, and the projection lens by driving light from the light source 110 Through 140, a white pattern and a single pattern may be emitted to the subject. More specifically, the driving unit 150 positions the pattern mask 130 having a single pattern formed on a line of light through which the light passing through the light source 110 and the condenser lens 120 passes (passing), so that the projection lens 140 ) To emit a single pattern to the subject, or by positioning the pattern mask 130 in addition to the line of light through which the light passing through the light source 110 and the condenser lens 120 passes (passing), the projection lens 140 It can be driven to emit a white pattern to the subject through.

In this case, the black pattern and the white pattern represent black light (or black light) and white light (or white light), and the light and light source 110 that is driven by the driving unit 150 to block light emission from the light source 110 It may represent single light or white light emitted from.

That is, the projection system 100 for three-dimensional scanning using a pattern mask according to an embodiment of the present invention drives or blocks light emitted from the light source 110 and allows the left and right flowability of the pattern mask 130 on which a single pattern is formed. By projecting a black pattern, a single pattern, and a white pattern as a subject by using, it is possible to provide a process of recognizing 3D coordinates of the subject using only a single pattern.

Further, the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention is a technology for performing 3D scanning on a subject, and is formed of a single pattern and a single light source, and a simplified structure of a projector or projection System can be provided.

As shown in Fig. 2, the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention processes an image for scanning using a black pattern, a single pattern, and a white pattern projected onto a subject. It may include a processing unit 160.

The gist of the present invention is to perform three-dimensional scanning using a single black/white pattern without using grayscale or color used by existing technologies. In this case, in order to distinguish the black portion and the white portion of the pattern projected onto the subject through image processing, in general, whether the black portion of the pattern is projected onto each pixel depending on whether light reaches the pixel for each pixel of the image, or It is necessary to determine a threshold to determine whether the white part is projected. To accomplish this, the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention includes a white pattern image acquired while brightly illuminating all subjects on which the pattern is projected, and a single pattern used for scanning. It is characterized by using a single pattern image projected from and a black pattern image obtained when all light is blocked.

The projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention uses two or more patterns of a black pattern and a white pattern, and the threshold value is a black pattern image and a white pattern image divided by two. Can be determined by value.

The processing unit 160 determines the white part and the black part of each pattern by comparing preset threshold values based on the pixel values of the black pattern, the single pattern, and the white pattern projected to the subject, and based on the determination result, Scanning can be performed. More specifically, the threshold value is set as an average of a pixel value when a black pattern is projected at each pixel position, a pixel value when a single pattern is projected, and a pixel value when a white pattern is projected.

Accordingly, the processing unit 160 determines that a pixel having a difference greater than or equal to the threshold value between the white pattern and the black pattern is at the position where the pattern is projected, and at the same position in the pixel, the pixel value of the single pattern image is If the value is greater than or equal to the threshold value between each pixel value of the black pattern image, it may be determined as a white part of a single pattern, and if it is less than that, it may be determined as a black part of a single pattern.

Also, the processing unit 160 may determine that an error has occurred in the corresponding pixel when the pixel value at the position where the white portion of the single pattern is projected is less than the threshold value. Accordingly, the projection system 100 for 3D scanning using a pattern mask according to an embodiment of the present invention uses a pixel value and a threshold value at a position where the pattern is projected through the processing unit 160 to determine the white or black color of the pattern. Since the 3D scanning of the subject is considered by determining the part and determining the error of the pixel, the effect of improving the accuracy of the scanning is provided.

5 is a diagram illustrating a structure of a projection system for 3D scanning using a pattern mask according to another embodiment of the present invention.

Referring to FIG. 5, a projection system 500 for 3D scanning using a pattern mask according to another embodiment of the present invention includes a light source 510, a condenser lens 520, a pattern mask 530, and a projection lens 540. , An optical element 550 and a driving unit 570 are included.

The projection system 500 for 3D scanning using a pattern mask according to another embodiment of the present invention includes a first light source 511 or a second light source 512 in order to emit a black pattern, a single pattern, and a white pattern to a subject. Control.

For example, when a single pattern is emitted to a subject, the driving unit 570 of the projection system 500 for 3D scanning using a pattern mask according to another embodiment of the present invention drives the first light source 511, and 1 The condenser lens 521 condenses light emitted from the first light source 511, and the light passing through the first condenser lens 521 passes through the pattern mask 530 in which a single pattern is formed, and the optical element 550 And it is emitted through the projection lens 540, a single pattern may be projected on the subject.

In this case, the optical element 550 may disperse light passing through the pattern mask 530, and the projection lens 540 may emit light passing through the optical element 550. For example, the optical element 550 may be a prism.

As another example, when a white pattern is emitted to a subject, the driving unit 570 of the projection system 500 for 3D scanning using a pattern mask according to another embodiment of the present invention drives the second light source 512, and 2 The condenser lens 522 may collect light emitted from the second light source 512, and the reflector 560 may reflect the collected light. Thereafter, the optical element 550 refracts the light reflected by the reflector 560, and the light passing through the optical element 550 is emitted through the projection lens 540, and a white pattern can be projected on the subject. .

In this case, the optical element 550 refracts light that has not passed through the pattern mask 530, and the projection lens 540 may emit light that has passed through the optical element 550.

As another example, when a black pattern is emitted to a subject, the driving unit 570 of the projection system 500 for 3D scanning using a pattern mask according to another embodiment of the present invention is light emitted from the light sources 511 and 512 Is blocked to drive the black pattern to be emitted to the subject through the projection lens 540, and the black pattern may be projected on the subject.

In this case, the black pattern and the white pattern represent black light (or black light) and white light (or white light), and the light and light source 510 that are driven by the driving unit 570 to block light emission from the light source 510 It may represent single light or white light emitted from.

In addition, the pattern mask 530 is characterized in that it has a fixed shape, not movable left and right.

6 is a diagram illustrating a structure of a projection system for 3D scanning using a pattern mask according to another embodiment of the present invention.

Referring to FIG. 6, a projection system 600 for 3D scanning using a pattern mask according to another embodiment of the present invention includes a light source 610, a condenser lens 620, a pattern mask 630, and a projection lens 640. ), an optical element 650 and a driving unit 670.

The projection system 600 for 3D scanning using a pattern mask according to another embodiment of the present invention includes a light source 610 and a first blocking unit 681 in order to emit a black pattern, a single pattern, and a white pattern to a subject. And controlling the second blocking unit 682.

As an example, when a single pattern is emitted to a subject, the driving unit 670 of the projection system 600 for 3D scanning using a pattern mask according to another embodiment of the present invention drives the first blocking unit 681 , It is possible to block the second blocking unit 682. Further, light emitted by the light source 610 and collected through the condenser lens 620 may be dispersed by the first optical element 651 to reach the pattern mask 630 in which a single pattern is formed. The light passing through the pattern mask 630 on which the single pattern is formed is reflected by the first reflecting plate 661, refracted by the second optical element 652 and emitted through the projection lens 640, and a single pattern is formed on the subject. Can be projected.

As another example, when emitting a white pattern to a subject, the driving unit 670 of the projection system 600 for three-dimensional scanning using a pattern mask according to another embodiment of the present invention blocks the first blocking unit 681 , It is possible to drive the second blocking unit 682. Further, the light emitted by the light source 610 and collected through the condenser lens 620 is refracted by the first optical element 651 to reach the second optical element 652 through the second reflector 662. I can. Thereafter, light that has not passed through the pattern mask 630 is dispersed by the second optical element 652 and emitted through the projection lens 640, so that a white pattern may be projected on the subject.

As another example, when a black pattern is emitted to a subject, the driving unit 670 of the projection system 600 for 3D scanning using a pattern mask according to another embodiment of the present invention transmits light emitted from the light source 610. It is blocked and driven to emit a black pattern to the subject through the projection lens 640, and the black pattern may be projected on the subject.

In this case, the black pattern and the white pattern represent black light (or black light) and white light (or white light), and the light and light source 610 driven by the driving unit 670 to block light emission from the light source 610 It may represent single light or white light emitted from.

In addition, the pattern mask 630 is characterized in that it is in a fixed shape, not movable left and right.

7 is a diagram illustrating an image acquisition example using a pixel value and a threshold value of each pattern according to an embodiment of the present invention.

Referring to FIG. 7, in the projection system of 3D scanning using a pattern mask according to an embodiment of the present invention, a black pattern projected onto a subject, a single pattern, and a black pattern image obtained by a white pattern (MIN. Image), and a single pattern A pattern image and a white pattern image (MAX. Image) are acquired, and at each pixel position, the average of the pixel values of the black pattern image (MIN. Image) and the pixel values of the white pattern image (MAX. Image) is used. A threshold image may be obtained by obtaining a threshold value.

Thereafter, the projection system of 3D scanning using a pattern mask according to an embodiment of the present invention compares the threshold image based on the threshold value and the single pattern image to compare the white part and the black part of the subject. It is possible to acquire a binary image.

For example, in the projection system of 3D scanning using a pattern mask according to an embodiment of the present invention, when a difference between a pixel value of a white pattern and a black pattern projected from a specific pixel to a subject exceeds a threshold value, It can be determined that the pattern is in the projected position. Thereafter, in the projection system of 3D scanning using a pattern mask according to an embodiment of the present invention, when a pixel value of a single pattern image in a specific pixel is greater than or equal to a pixel value of a threshold image, a white portion of a single pattern (result=1) And, if it is less than, it can be determined as a black portion of a single pattern (result=0).

Through this, the projection system for 3D scanning using a pattern mask according to an embodiment of the present invention can obtain a binary image of a subject by determining the white portion and the black portion of a single pattern.

According to an embodiment, in the case of the white pattern path in FIGS. 6 and 7, a structure in which an inverse single pattern is located in the middle of the white pattern path may be possible.

8 is a flowchart illustrating a projection method of 3D scanning using a pattern mask according to an embodiment of the present invention.

The method of FIG. 8 may be performed by a projection system of 3D scanning using a pattern mask according to the embodiment of the present invention shown in FIG. 2.

Referring to FIG. 8, in step 810, light is irradiated from a light source.

Operation 810 may be a step of driving or blocking light emitted from a light source. For example, in step 810, the light emitted from the light source is blocked so that the black pattern is emitted through the condenser lens, the pattern mask, and the projection lens, and the light emitted from the light source is driven through the condenser lens, the pattern mask, and the projection lens. A single pattern and a white pattern can be emitted.

For example, the light source emits light for projecting light onto a subject, and for this, an LED may be used, but various examples are not limited thereto. According to an embodiment, the light source may include a blue LED outputting a single blue light, a green LED outputting a single green light, and a red LED outputting a single red light.

In step 820, light emitted from a light source is condensed through a condenser lens.

For example, light must be collected to increase the intensity and uniformity of light emitted from the light source. To this end, in step 820, a condenser lens may be disposed in front of the light source to condense light emitted from the light source.

In step 830, light passing through the condenser lens is passed using a pattern mask on which a single pattern is formed. In this case, in step 830, the pattern mask is mechanically moved, and a black pattern, a single pattern, and a white pattern are emitted through the projection lens.

The pattern mask passes light that has passed through the condenser lens, and may include a single pattern projected onto the subject. In addition, the pattern mask is limited in movement by the blocking portion positioned on the side surface, and may have left and right fluidity by rail portions positioned at the top and bottom.

Accordingly, operation 830 may be a step of mechanically moving the pattern mask left and right from the blocking portion positioned on the side of the pattern mask to the length of the rail portion by driving rail units positioned at the upper and lower ends of the pattern mask.

For example, in step 830, a pattern mask in which a single pattern is formed is positioned on a line of light through (passing) the light source and the condenser lens, and a single pattern is emitted to the subject through the projection lens, or the light source , It may be a step of driving to emit a white pattern to the subject through the projection lens by placing the pattern mask in addition to the line of light through which the light passing through the condenser lens passes (passes). In this case, it is assumed that light emitted from the light source is driven in step 810.

Thereafter, in step 840, light passing through the pattern mask is emitted through the projection lens. Here, the size, shape, and material of the condenser lens and the projection lens according to the embodiment of the present invention are not limited, and various examples are possible.

In the projection method of 3D scanning using a pattern mask according to an embodiment of the present invention, a black pattern, a single pattern, and a white pattern can be projected on a subject, respectively. For example, by driving or blocking light emitted from the light source in step 810, and positioning a pattern mask in which a single pattern is formed in addition to the line or line of light passing through the light source and the condenser lens in step 830, Each of a black pattern, a single pattern and a white pattern can be projected.

Accordingly, the projection method of 3D scanning using a pattern mask according to an exemplary embodiment of the present invention projects a black pattern, a single pattern, and a white pattern respectively as a subject, thereby recognizing the 3D coordinates of the subject with only a single pattern. Can provide.

In addition, the projection method of 3D scanning using a pattern mask according to an embodiment of the present invention further includes a step 850 of processing an image for scanning using the black pattern, the single pattern, and the white pattern projected to a subject. I can.

In operation 850, a white portion and a black portion of each pattern are determined by comparing a predetermined threshold value based on a pixel value of each of the black pattern, the single pattern, and the white pattern, and scanning of the subject may be performed based on the determination result. . More specifically, the threshold value is set as an average of a pixel value when a black pattern is projected at each pixel position and a pixel value when a white pattern is projected.

Accordingly, in step 850, a pixel having a difference of more than the threshold value between the white pattern and the black pattern is determined to be at the position where the pattern is projected, and at the same position in the pixel, the pixel value of the single pattern image is the white pattern image and the black pattern If the value is greater than or equal to the threshold value between each pixel value of the image, it may be determined as a white part of a single pattern, and if it is less than the threshold value, it may be determined as a black part of a single pattern.

The apparatus described above may be implemented as a hardware component, a software component, and/or a combination of a hardware component and a software component. For example, the devices and components described in the embodiments include, for example, a processor, a controller, an arithmetic logic unit (ALU), a digital signal processor, a microcomputer, a field programmable array (FPA), It can be implemented using one or more general purpose computers or special purpose computers, such as a programmable logic unit (PLU), a microprocessor, or any other device capable of executing and responding to instructions. The processing device may execute an operating system (OS) and one or more software applications executed on the operating system. In addition, the processing device may access, store, manipulate, process, and generate data in response to the execution of software. For the convenience of understanding, although it is sometimes described that one processing device is used, one of ordinary skill in the art, the processing device is a plurality of processing elements and/or a plurality of types of processing elements. It can be seen that it may include. For example, the processing device may include a plurality of processors or one processor and one controller. In addition, other processing configurations are possible, such as a parallel processor.

The software may include a computer program, code, instructions, or a combination of one or more of these, configuring the processing unit to behave as desired or processed independently or collectively. You can command the device. Software and/or data may be interpreted by a processing device or to provide instructions or data to a processing device, of any type of machine, component, physical device, virtual equipment, computer storage medium or device. , Or may be permanently or temporarily embodyed in a transmitted signal wave. The software may be distributed over networked computer systems and stored or executed in a distributed manner. Software and data may be stored on one or more computer-readable recording media.

The method according to the embodiment may be implemented in the form of program instructions that can be executed through various computer means and recorded in a computer-readable medium. The computer-readable medium may include program instructions, data files, data structures, etc. alone or in combination. The program instructions recorded on the medium may be specially designed and configured for the embodiment, or may be known and usable to those skilled in computer software. Examples of computer-readable recording media include magnetic media such as hard disks, floppy disks, and magnetic tapes, optical media such as CD-ROMs and DVDs, and magnetic media such as floptical disks. -A hardware device specially configured to store and execute program instructions such as magneto-optical media, and ROM, RAM, flash memory, and the like. Examples of program instructions include not only machine language codes such as those produced by a compiler but also high-level language codes that can be executed by a computer using an interpreter or the like. The hardware device described above may be configured to operate as one or more software modules to perform the operation of the embodiment, and vice versa.

As described above, although the embodiments have been described by the limited embodiments and drawings, various modifications and variations are possible from the above description by those of ordinary skill in the art. For example, the described techniques are performed in a different order from the described method, and/or components such as a system, structure, device, circuit, etc. described are combined or combined in a form different from the described method, or other components Alternatively, even if substituted or substituted by an equivalent, an appropriate result can be achieved.

Therefore, other implementations, other embodiments, and claims and equivalents fall within the scope of the claims to be described later.

100: 3D scanning projection system using a pattern mask
110: light source
120: condenser lens
130: pattern mask
131: blocking portion
132: rail part
140: projection lens

Claims (16)

Light source;
A condenser lens for condensing light emitted from the light source;
A pattern mask having a single pattern for passing light passing through the condenser lens;
A driving unit that mechanically moves the pattern mask and drives light emission according to the light source; And
Including a projection lens for emitting light passing through the pattern mask,
The driving unit mechanically moves the pattern mask so that the black pattern, the single pattern, and the white pattern are emitted through the projection lens. 3D scanning projection system using a pattern mask. The method of claim 1,
The pattern mask is
A projection system for three-dimensional scanning using a pattern mask, comprising: the single pattern projected onto a subject by passing light that has passed through the condenser lens. The method of claim 2,
The pattern mask is
A projection system for three-dimensional scanning using a pattern mask, which is limited in movement by a blocking portion positioned on the side and has left and right fluidity by rail portions positioned at the top and bottom. The method of claim 3,
The driving part
3D scanning projection system using a pattern mask, characterized in that by driving the rail unit to mechanically move the pattern mask from the blocking unit to the length of the rail unit. The method of claim 4,
The driving part
The pattern mask is positioned on a line of light through which the light passing through the condenser lens passes, and the single pattern is emitted to the subject through the projection lens, or the pattern mask is positioned in addition to the line of light to project the projection. A projection system for three-dimensional scanning using a pattern mask, which drives the white pattern to be emitted to a subject through a lens. The method of claim 5,
The driving part
Blocking light emitted from the light source and driving the black pattern to be emitted to a subject through the projection lens, a three-dimensional scanning projection system using a pattern mask. The method of claim 1,
A processing unit that processes an image for scanning using the black pattern, the single pattern, and the white pattern projected onto a subject
3D scanning projection system using a pattern mask further comprising a. The method of claim 7,
The processing unit
Comparing the black pattern, the single pattern, and the pixel value of each of the white patterns with a preset threshold value to determine the white part and the black part of each pattern, and processing an image for scanning the subject based on the determination result 3D scanning projection system using a pattern mask, characterized in that. Light source;
A condenser lens for condensing light emitted from the light source;
A pattern mask having a single pattern for passing light passing through the condenser lens;
A driving unit driving light emission according to the light source;
An optical element for dispersing or refracting light that has passed through the pattern mask or light that has not passed through the pattern mask; And
Including a projection lens for emitting light passing through the optical element,
The driving unit drives the light source to allow light passing through the pattern mask or light not passing through the pattern mask to emit a black pattern, the single pattern, and a white pattern through the projection lens. Projection system. Light source;
A condenser lens for condensing light emitted from the light source;
A first optical element for dispersing or refracting light passing through the condenser lens;
A pattern mask in which a single pattern for passing light passing through the first optical element is formed;
A reflector for reflecting light passing through the first optical element;
A driving unit driving light emission according to the light source;
A second optical element for dispersing or refracting light that has passed through the pattern mask or light that has not passed through the pattern mask; And
Including a projection lens for emitting light passing through the optical element,
The driving part
A first blocking unit blocking light incident on the pattern mask and a second blocking unit blocking light incident on the second optical element through the reflector are driven so that the black pattern, the single pattern and the white pattern are emitted 3D scanning projection system using a pattern mask. In the operating method of a projection system for 3D scanning using a pattern mask,
Irradiating light from a light source;
Condensing light emitted from the light source through a condenser lens;
Passing light passing through the condenser lens using a pattern mask having a single pattern formed thereon; And
Including the step of emitting light that has passed through the pattern mask through a projection lens,
The step of passing the light passing through the condenser lens using the pattern mask
A projection method of 3D scanning using a pattern mask in which the pattern mask is mechanically moved and the black pattern, the single pattern, and the white pattern are emitted through the projection lens. The method of claim 11,
The step of passing the light passing through the condenser lens using the pattern mask
By driving rail units located at the top and bottom of the pattern mask, the pattern mask is mechanically moved left and right from the blocking unit located on the side surface of the pattern mask to the length of the rail unit. 3D scanning projection method. The method of claim 12,
The step of passing the light passing through the condenser lens using the pattern mask
The pattern mask is positioned on a line of light through which the light passing through the condenser lens passes, and the single pattern is emitted to the subject through the projection lens, or the pattern mask is positioned in addition to the line of light to project the projection. A projection method of 3D scanning using a pattern mask, which drives the white pattern to be emitted to a subject through a lens. The method of claim 13,
Irradiating light from the light source
Blocking light emitted from the light source, and allowing the black pattern to be emitted to a subject through the projection lens, a 3D scanning projection method using a pattern mask. The method of claim 11,
Processing an image for scanning using the black pattern, the single pattern, and the white pattern projected onto a subject
3D scanning projection method using a pattern mask further comprising a. The method of claim 15,
The scanning step
Comparing the black pattern, the single pattern, and the pixel value of each of the white patterns with a preset threshold value to determine the white part and the black part of each pattern, and processing an image for scanning the subject based on the determination result 3D scanning projection method using a pattern mask, characterized in that.

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