KR20200066044A - 소결광 제조용 철광석의 품질 평가방법 - Google Patents
소결광 제조용 철광석의 품질 평가방법 Download PDFInfo
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- KR20200066044A KR20200066044A KR1020180153086A KR20180153086A KR20200066044A KR 20200066044 A KR20200066044 A KR 20200066044A KR 1020180153086 A KR1020180153086 A KR 1020180153086A KR 20180153086 A KR20180153086 A KR 20180153086A KR 20200066044 A KR20200066044 A KR 20200066044A
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- iron ore
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- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 title claims abstract description 198
- 229910052742 iron Inorganic materials 0.000 title claims abstract description 98
- 238000000034 method Methods 0.000 title claims abstract description 25
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 239000000470 constituent Substances 0.000 claims abstract description 21
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 30
- 239000010453 quartz Substances 0.000 claims description 28
- NLYAJNPCOHFWQQ-UHFFFAOYSA-N kaolin Chemical compound O.O.O=[Al]O[Si](=O)O[Si](=O)O[Al]=O NLYAJNPCOHFWQQ-UHFFFAOYSA-N 0.000 claims description 21
- 229910052622 kaolinite Inorganic materials 0.000 claims description 21
- 229910052598 goethite Inorganic materials 0.000 claims description 20
- 229910052595 hematite Inorganic materials 0.000 claims description 20
- 239000011019 hematite Substances 0.000 claims description 20
- AEIXRCIKZIZYPM-UHFFFAOYSA-M hydroxy(oxo)iron Chemical compound [O][Fe]O AEIXRCIKZIZYPM-UHFFFAOYSA-M 0.000 claims description 20
- SZVJSHCCFOBDDC-UHFFFAOYSA-N iron(II,III) oxide Inorganic materials O=[Fe]O[Fe]O[Fe]=O SZVJSHCCFOBDDC-UHFFFAOYSA-N 0.000 claims description 19
- LIKBJVNGSGBSGK-UHFFFAOYSA-N iron(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Fe+3].[Fe+3] LIKBJVNGSGBSGK-UHFFFAOYSA-N 0.000 claims description 18
- 239000011148 porous material Substances 0.000 claims description 10
- -1 gibbstite Substances 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims description 4
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000013441 quality evaluation Methods 0.000 claims 1
- 239000002245 particle Substances 0.000 description 6
- 238000005245 sintering Methods 0.000 description 5
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 2
- 229910052500 inorganic mineral Inorganic materials 0.000 description 2
- 239000011707 mineral Substances 0.000 description 2
- 238000011002 quantification Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000001195 anabolic effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005469 granulation Methods 0.000 description 1
- 230000003179 granulation Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000011027 product recovery Methods 0.000 description 1
- 230000002250 progressing effect Effects 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000001603 reducing effect Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/202—Constituents thereof
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- Life Sciences & Earth Sciences (AREA)
- Pathology (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacture And Refinement Of Metals (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
도 2는 철광석의 각 성분 함량에 따라 철광석의 동화율이 변화하는 모습을 나타낸 그래프이다.
구분 (중량%) |
Keno-magnetite | Hematite | Hydro-hematite | Vitreous goethite | Ochreous goethite | Kaolinite | Quartz | Pores (%) |
시편1 | 0.0876 | 1.83 | 0 | 5.31 | 9.65 | 80.12 | 2.99 | 23.08 |
시편2 | 0.0970 | 97.92 | 0.0569 | 1.26 | 0.49 | 0.3 | 0.0405 | 18.11 |
시편3 | 1.57 | 97.02 | 0.15 | 0.85 | 0.36 | 0.0493 | 0.0033 | 5.27 |
시편4 | 0.053 | 1.39 | 0.0408 | 75.65 | 21.3 | 1.53 | 0.0262 | 17.56 |
시편5 | 0.93 | 84.88 | 0.59 | 11.65 | 1.86 | 0.0573 | 0.026 | 6.24 |
시편6 | 0.58 | 79.19 | 0.19 | 15.86 | 3.94 | 0.22 | 0.0265 | 14.84 |
시편7 | 0.37 | 34.07 | 0.18 | 45.94 | 18 | 1.41 | 0.040 | 21.28 |
시편8 | 1.18 | 38.97 | 0.61 | 53.08 | 5.97 | 0.13 | 0.0493 | 10.9 |
구분 | 동화율(%) | 밀도(g/mm3) | 유해원소 함량1 | 유해원소 함량2 |
시편1 | 98.47 | 3.82 | 5.82 | 1.59 |
시편2 | 98.11 | 3.91 | 4.56 | 1.86 |
시편3 | 87.14 | 4.23 | 4.92 | 2.72 |
시편4 | 91.00 | 4.79 | 1.52 | 1.54 |
시편5 | 79.80 | 4.75 | 6.16 | 0.55 |
시편6 | 83.54 | 4.83 | 4.59 | 1.54 |
시편7 | 94.32 | 3.84 | 5.74 | 1.88 |
시편8 | 91.68 | 4.31 | 4.75 | 2.24 |
Claims (8)
- 소결광의 제조를 위한 철광석의 명암이 나타나는 이미지를 촬영하는 단계;
상기 이미지로부터 상기 철광석에 포함된 구성 성분의 함량 및 공극율에 대한 정보를 수득하는 단계; 및
상기 구성 성분의 함량과 상기 공극율을 통해 상기 철광석의 품질을 도출하는 단계;를 포함하는 소결광 제조용 철광석의 품질 평가방법. - 제1항에 있어서,
상기 이미지를 촬영하는 단계에서,
광학 카메라를 이용하여 상기 철광석에 광을 조사하고, 상기 철광석으로부터 반사되는 광의 휘도 값에 따라 상기 철광석의 명암이 나타나는 이미지를 생성하는 소결광 제조용 철광석의 품질 평가방법. - 제1항에 있어서,
상기 정보를 수득하는 단계는,
상기 이미지에서 명암별로 상기 철광석에 포함된 구성 성분 및 공극을 구분하는 단계; 및
상기 명암별로 구분된 이미지의 면적을 산출하여 상기 철광석에 포함된 구성 성분의 함량 및 공극율에 대한 정보를 수득하는 단계;를 포함하는 소결광 제조용 철광석의 품질 평가방법. - 제3항에 있어서,
상기 구성 성분 및 공극을 구분하는 단계에서,
상기 철광석에 포함된 마그네타이트(Magnetite), 헤마타이트(Hematite), 괴타이트(Goethite), 카올리나이트(Kaolinite), 깁스타이트(Gibbstite), 석영(Quartz) 및 공극을 구분하는 소결광 제조용 철광석의 품질 평가방법. - 제1항에 있어서,
상기 정보를 수득하는 단계에서,
상기 이미지로부터 상기 철광석의 구성 성분 중, 마그네타이트(Magnetite), 헤마타이트(Hematite), 괴타이트(Goethite), 카올리나이트(Kaolinite), 깁스타이트(Gibbstite) 및 석영(Quartz)의 함량 및 공극율에 대한 정보를 수득하는 소결광 제조용 철광석의 품질 평가방법. - 제5항에 있어서,
상기 도출하는 단계에서,
상기 카올리나이트(Kaolinite), 깁스타이트(Gibbstite), 및 석영(Quartz)의 함량 및 상기 공극율을 통해, 상기 철광석의 동화율을 측정하는 소결광 제조용 철광석의 품질 평가방법. - 제5항에 있어서,
상기 도출하는 단계에서,
상기 마그네타이트(Magnetite), 헤마타이트(Hematite), 괴타이트(Goethite), 카올리나이트(Kaolinite), 깁스타이트(Gibbstite) 및 석영(Quartz)의 함량 및 상기 공극율을 통해, 상기 철광석의 밀도를 측정하는 소결광 제조용 철광석의 품질 평가방법. - 제5항에 있어서,
상기 도출하는 단계에서,
상기 마그네타이트(Magnetite), 헤마타이트(Hematite), 괴타이트(Goethite), 카올리나이트(Kaolinite), 깁스타이트(Gibbstite) 및 석영(Quartz)의 함량 및 상기 공극율을 통해, 상기 철광석의 유해원소 함량을 측정하는 소결광 제조용 철광석의 품질 평가방법.
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2856298B2 (ja) * | 1992-12-22 | 1999-02-10 | 宇部興産株式会社 | 原料鉱石の品質監視方法 |
JP2014137344A (ja) * | 2013-01-18 | 2014-07-28 | Nippon Steel & Sumitomo Metal | 焼結鉱の顕微鏡画像解析方法 |
KR20160052856A (ko) * | 2014-10-29 | 2016-05-13 | 주식회사 포스코 | 소결광 성분의 정량화 방법 |
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JP2856298B2 (ja) * | 1992-12-22 | 1999-02-10 | 宇部興産株式会社 | 原料鉱石の品質監視方法 |
JP2014137344A (ja) * | 2013-01-18 | 2014-07-28 | Nippon Steel & Sumitomo Metal | 焼結鉱の顕微鏡画像解析方法 |
KR20160052856A (ko) * | 2014-10-29 | 2016-05-13 | 주식회사 포스코 | 소결광 성분의 정량화 방법 |
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