KR20180029518A - Apparatus and method for detecting short circuit among output pins out and among driver ics - Google Patents

Abstract

According to the present invention, the present invention relates to an apparatus for diagnosing output pins of a driving IC, which comprises: a driving unit for driving a load; a plurality of test voltage applying switches for applying a test voltage to an output pin to be tested among a plurality of output pins in accordance with a diagnosis command of a short circuit between the output pins; a plurality of voltage dividers for applying a default voltage different from the test voltage to the output pin which is not to be tested among the output pins; a multiplexer for sequentially selecting and outputting a voltage value applied to the output pins; a driving IC including a diagnosis signal generating unit for generating a diagnosis signal for the voltage value; and a control unit for transmitting the diagnosis command of the short circuit between the output pins to the driving IC, and determining a short circuit pin among the output pins on the basis of the diagnosis signal. Therefore, according to the present invention, all outputs are set by a specific voltage before a system operation, and a different voltage is applied only to a pin to be tested so as to monitor an output of the pin, thereby detecting not only a ground short circuit but also a short circuit between pins. In particular, even when an output short circuit between driving ICs occurs, a specific test voltage is all applied to one IC output, and then an output of the remaining IC is monitored to diagnose/detect a short circuit between the driving ICs.

Description

TECHNICAL FIELD [0001] The present invention relates to an apparatus and a method for short-circuit diagnosis between an output pin of a driving IC and a driving IC,

The present invention relates to an air bag system, and more particularly, to an apparatus and method for diagnosing an IC output short circuit in an air bag system.

In recent years, the number of airbags mounted on a vehicle has increased in accordance with the demand of consumers. Recently released vehicles are equipped with more than 6 basic airbags such as driver's seat, passenger's seat, side airbags and curtain airbags.

Therefore, in order to control a plurality of airbags, an airbag control IC (integrated circuit) incorporates a multi-channel high / low side (HS / LS, high side / low side) driving part to control an external load such as an airbag igniter (inflator) .

However, since it is configured to be connected by an external load and a long conductor in multiple channels, there is a possibility that a short-circuit failure between the channels occurs. Accordingly, existing technologies for diagnosing short-circuiting of the airbag output pin by comparing the predicted dental difference by receiving the voltage state of the airbag output pin during system operation to diagnose such short-circuit failure have been developed.

However, it is difficult to judge the short-circuit state between the output pins of the driving IC before the system operation because the existing technology judges whether or not the abnormality occurs only during circuit operation. In addition, although the number of airbag driving ICs increases with the increase in the number of airbags, there is no means to inspect short-circuit faults between the driving ICs as well as interchannel short-circuit faults in the airbag.

SUMMARY OF THE INVENTION The present invention has been made in order to address the above-mentioned technical problems, and it is an object of the present invention to provide a method and a system for monitoring a voltage of an output pin to be tested before a system operation, Which can detect a short circuit of a driving IC.

It is another object of the present invention to provide a semiconductor integrated circuit device capable of diagnosing / detecting a short circuit between drive ICs by monitoring a voltage value of output pins of other ICs after applying an inspection voltage to one IC output even when an output short- And a method for diagnosing a short circuit between the driving ICs.

According to an aspect of the present invention, there is provided an apparatus for diagnosing a short circuit between drive IC output pins, comprising: a driver for driving a load; A plurality of test voltage application switches for applying an inspection voltage to an output pin to be inspected among a plurality of output pins in accordance with an output pin short-circuit diagnosis command; A plurality of voltage dividers for applying a default voltage different from the inspection voltage to the output pins not to be inspected among the plurality of output pins; A multiplexer for sequentially selecting and outputting a voltage value applied to the plurality of output pins; And a diagnostic IC for generating a diagnostic signal for the voltage value; And a controller for transmitting the output pin short-circuit diagnosis command to the driving IC and determining a short pin among the plurality of output pins based on the diagnostic signal.

In this case, the plurality of inspection voltage application switches may be connected between the inspection power source for applying the inspection voltage and the output nodes of the plurality of voltage divider, respectively.

In addition, the drive IC may be turned off when the output pin short-circuit diagnosis command is issued.

Also, the default voltage may be a voltage distributed by the voltage divider.

Meanwhile, an apparatus for short-circuit diagnosis between drive ICs according to an embodiment of the present invention includes a first drive IC; A second driving IC; And a control unit for transmitting a short-circuit diagnosis command between the first driving IC and the first driving IC and transmitting a short-circuit diagnosis command between the second driving IC to the second driving IC, wherein the first driving IC and the second The driving IC includes: a driving unit for driving a load; A plurality of test voltage application switches for applying an inspection voltage to an output pin to be inspected among a plurality of output pins in accordance with the short-circuit diagnosis command between the first drive ICs; A plurality of voltage dividers for applying a default voltage different from the inspection voltage to an output pin not to be inspected among the plurality of output pins; A multiplexer sequentially selecting and outputting a voltage value applied to at least a part of the plurality of output pins; And a diagnostic signal generator for generating a diagnostic signal for the voltage value, wherein the output pin to be inspected is determined in accordance with the short-circuit diagnosis command between the first drive ICs, And to determine the shorting pin among the plurality of output pins of the second driving IC.

The plurality of test voltage application switches may be connected between an inspection power source for applying the inspection voltage and an output node of the plurality of voltage divider devices.

In addition, the drive IC may be turned off when the output pin short-circuit diagnosis command is issued.

Also, the default voltage may be a voltage distributed by the voltage divider.

The plurality of test voltage application switches may be configured to be turned on at the same time according to the short-circuit diagnostic command between the first drive ICs.

According to another aspect of the present invention, there is provided a method of diagnosing an output pin short-circuit of a driving IC, the method comprising the steps of: driving the driving IC in a driving system including a driving IC and a control unit, Turning off the driving unit of the driving unit; Applying a test voltage to an inspection target output pin among a plurality of output pins of the driving IC and applying a default voltage to the output pins other than the inspection target output pin among the plurality of output pins; Sequentially selecting a voltage value of the output pins other than the inspection target output pin among the plurality of output pins and outputting the selected voltage value to the diagnostic signal generator and generating a diagnostic signal; And determining a shorting pin of the plurality of output pins based on the diagnostic signal.

In this case, it may further comprise storing the determined shorting pin in a flag.

In addition, the step of determining the shorting pin may include comparing the voltage value with the default voltage to determine the shorting pin.

The generating of the diagnostic signal may include transmitting the converted digital voltage value through the analog-to-digital converter to the controller.

Designating any one of the output pins other than the output pin to be inspected as a second inspection target; Sequentially selecting a voltage value of the output pins other than the second check target output pin among the plurality of output pins and outputting the selected voltage value to the diagnostic signal generator and generating a diagnostic signal; And determining a shorting pin of the plurality of output pins based on the diagnostic signal.

Meanwhile, a method for short-circuit diagnosis between drive ICs according to the present invention is a method for short-circuit diagnosis between drive ICs including a first drive IC, a second drive IC and a control unit, wherein the control unit controls the first drive IC Short-diagnosis command between the first and second driving ICs is transmitted to the second driving IC, and turning off the driving units of the first driving IC and the second driving IC; Applying an inspection voltage to an inspection target output pin of the first driving IC in accordance with a short circuit diagnostic command between the first driving ICs; Sequentially selecting a voltage applied to the plurality of output pins of the second driving IC and outputting the selected voltage to the diagnostic signal generator; Outputting a diagnostic signal for the plurality of output pins of the second driving IC; And determining a shorting pin of the plurality of output pins based on the diagnostic signal.

The method may further include storing the determined shorting pin in a flag.

Also, determining the shorting pin may include comparing the voltage value to a default voltage to determine the shorting pin.

The generating of the diagnostic signal may include transmitting the converted digital voltage value through the analog-to-digital converter to the controller.

Further, after the step of determining the shorting pin, The controller transmits a short-circuit diagnosis command to the first driver IC between the second driver ICs and transmits a short-circuit diagnosis command between the first driver ICs to the second driver IC; Applying an inspection voltage to an inspection target output pin of the second driving IC according to a short circuit diagnostic command between the first driving ICs; Sequentially selecting a voltage applied to the plurality of output pins of the first driving IC and outputting the selected voltage to the diagnostic signal generating unit; Outputting a diagnostic signal for the plurality of output pins of the first driving IC; And determining a shorting pin among the plurality of output pins of the first driving IC based on a diagnostic signal for the plurality of output pins of the first driving IC.

In addition, the inspection target output pin may be configured to apply all of the output pins of the first driving IC and the inspection voltage at the same time.

The present invention is capable of detecting a short circuit between output pins by setting the output pin to the default voltage before the system operation and monitoring the voltage value of the output pin by applying the inspection voltage only to the inspection target output pin. Further, even when a short circuit occurs between a plurality of driving ICs, it is possible to diagnose / detect a short circuit between the driving ICs by monitoring the voltages of the output pins of the other ICs after applying the inspection voltage to all of the driving ICs.

Therefore, it is possible to diagnose / detect a short circuit between the driving ICs only by controlling the microcontroller unit without communication between the driving ICs independent of each other. The present invention solves the operation timing problem between the driving ICs and simplifies the diagnosis method when diagnosing a short circuit between the driving ICs, thereby facilitating the diagnosis of the system and shortening the inspection time.

1 is a block diagram showing the configuration of a drive IC output pin short-circuit diagnosis apparatus according to an embodiment of the present invention.
2 is a circuit diagram showing the detailed circuit of the driving IC shown in Fig.
3 is a diagram showing an example of a case where a short circuit between output pins of the driving IC shown in Fig. 1 occurs.
4 is a circuit diagram showing a detailed circuit of a driving IC when a short-circuit between output pins of the driving IC shown in Fig. 2 occurs.
5 is a flowchart illustrating a method of diagnosing a short-circuit between output output pins of a driving IC according to an embodiment of the present invention.
6 is a block diagram showing the configuration of an apparatus for short-circuit diagnosis between drive ICs according to an embodiment of the present invention.
7 is a circuit diagram showing detailed circuits of the first and second driving ICs shown in Fig.
8 is a diagram showing an example of a case where a short circuit occurs between the driving ICs shown in FIG.
9 is a flowchart illustrating a method of diagnosing a short circuit between drive ICs according to an embodiment of the present invention.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. It should be understood, however, that the invention is not limited to the disclosed embodiments, but may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, Is provided to fully inform the user. In addition, for convenience of explanation, components may be exaggerated or reduced in size. However, it should be understood that the following embodiments are provided so that those skilled in the art will be able to fully understand the present invention, and that various modifications may be made without departing from the scope of the present invention. It is not.

1 is a block diagram showing a configuration of an apparatus for diagnosing a short-circuit between drive IC output pins according to an embodiment of the present invention. 2 is a circuit diagram showing the detailed circuit of the driving IC shown in Fig. 3 is a diagram showing an example of a case where a short circuit between output pins of the driving IC shown in Fig. 1 occurs. 4 is a circuit diagram showing a detailed circuit of a driving IC when a short-circuit between output pins of the driving IC shown in Fig. 2 occurs.

The driving IC output pin short-circuit diagnosis apparatus according to an embodiment of the present invention includes a driving IC 100 and a control unit 200 and is connected to an external load 300 such as an airbag igniter. However, in the present invention, an example of the airbag igniter is described as the external load 300, but the present invention is not limited thereto. Those skilled in the art can apply the present invention to apparatuses and methods employing a driving IC having a plurality of output pins in addition to an airbag system and an airbag igniter.

The IC 100 includes a plurality of drivers 121 and 125 and a diagnostic circuit 110.

The plurality of drivers 121 and 125 can drive the external load 300 by supplying current during normal driving. The plurality of driving units 121 and 125 include an HS driving unit 121 and an LS driving unit. Each of the driving units 122, 123, 126, and 127 includes a driving driver 128 and a driving switch 129. Each of the drivers 122, 123, 126, and 127 is cut off at the time of diagnosis of the output pin short-circuit.

The diagnostic circuit 110 includes a plurality of voltage dividers 112, 115, 116 and 117, test voltage applying switches 111 and 114, a multiplexer 140 and a diagnostic signal generating unit 130.

The plurality of voltage dividers 112, 115, 116 and 117 are connected to the plurality of driving units 121 and 125 and the plurality of HS / LS output pins H # 1 to H # n, L # 1 to L # and n is the number of pins). The inspection voltage application switches 111 and 114 are installed between the inspection power source V_test and the output nodes 113 of the voltage dividers 112 and 115 connected to the HS driving units 122 and 123, respectively.

The inspection power source V_test is applied simultaneously with the turn-on of only the inspection voltage application switch 112 to be inspected among the plurality of inspection voltage application switches 111 and 114 at the time of diagnosis of short-circuit between output pins. However, the objects to be inspected are sequentially changed. That is, the inspection voltage application switch 112 and the inspection voltage application switch 114 are turned on one by one in a predetermined order.

For convenience of explanation, a part of the plurality of voltage applying switches and voltage dividers shown in the drawing is referred to as a first inspection voltage application switch 111, a first HS voltage divider 112, a first LS voltage divider 117, The inspection voltage application switch 114, the second HS voltage divider 115, and the second LS voltage divider 116, respectively. Although the first and second embodiments are referred to herein for convenience of explanation, a person skilled in the art can arrange as many inspection voltage application switches and voltage dividers as necessary.

1, the output node 113, the first HS output pin H # 1, the first LS output pin L # 1, and the external load 300 of the first HS voltage divider An equipotential surface 350 is formed in the first channel. The second channel including the output node of the second HS voltage divider, the second HS output pin H # 2, the second LS output pin L # 2 and another external load 300 also has an equipotential surface Respectively.

The first inspection voltage application switch 111 is turned on so that the inspection power source V_test and the output node 113 are connected and the inspection voltage is applied to the equipotential surface 350 formed in the first channel. In this case, since the second inspection voltage application switch 114 is turned off, the inspection power is supplied to the equipotential surface formed on the second channel by the voltage distributed by the second HS voltage divider 115, that is, Quot;) is applied to the terminal.

As shown in FIGS. 3 and 4, when a short between the output pins of the first channel and the second channel occurs, the voltage of the test power source V_test is also applied to the second channel. Then, the first channel and the second channel are formed with the equipotential surface 355.

The multiplexer 140 sequentially applies a voltage for each output pin to the diagnostic signal generating unit 130 based on the channel selection signal 150. The diagnostic signal generator 130 may include an analog-to-digital converter. In this case, the diagnostic signal generator 130 transmits the voltage value of each channel converted to the digital signal to the controller 200. Or the diagnostic signal generator 130 may include a comparator. In the case of a comparator, the reference voltage and the voltage value for each channel are compared. If an abnormality occurs, an abnormal signal can be generated as a diagnostic signal and transmitted to the controller 200.

Preferably, the reference voltage may be a default voltage when the inspection voltage is not applied (that is, a voltage distributed by the voltage divider 115 of the inspection power source), and the diagnostic signal may be, for example, It can be determined that the pin is a shorting pin and stored in a flag indicating whether each channel is short-circuited and transmitted to the control unit 200. [

For example, when a short circuit occurs between the first channel and the second channel as shown in FIGS. 3 and 4, when the voltage value of the second channel is read by the diagnostic signal generation unit 130, the same voltage as the inspection power source V_test When the voltage value of another channel is read, the above-mentioned default voltage is read. In this case, the output pins of the first channel and the second channel are determined as shorting pins, and the first output pins H # 1 and L # 1 and the second output pins H # 2 and L # Can be stored in the flag.

The control unit 200 may be a microcontroller unit (MCU). Then, the driving IC output pin short-circuit diagnosis command is supplied to the driving IC 100 to turn off the plurality of driving units 121 and 125, sequentially turn on the plurality of inspection voltage application switches, May be applied to the multiplexer 140 to transmit the voltage value of each channel to the diagnostic signal generating unit 130. [

The diagnosis signal generating unit 130 and / or the multiplexer 140 may be included in the driving IC 100 or may be included in the control unit 200 and may be separate from the driving IC 100 and the control unit 200 Chip.

Hereinafter, with reference to FIG. 5, a description will be given of a method of diagnosing short-circuiting between drive IC output pins in an airbag system according to an embodiment of the present invention. 5 is a flowchart illustrating a method of diagnosing short-circuiting between drive IC output pins according to an embodiment of the present invention.

The control unit 200 provides a driving IC output pin short-circuit diagnosis command to the driving IC 100. [ In this case, the drive IC enters the output pin short-circuit diagnosis mode and turns off all the drivers 121 and 125 (step S504). Then, the inspection power supply (V_test) is supplied to all the voltage dividers, so that a default voltage is supplied to all the output pins.

Thereafter, the driving IC 100 turns on the inspection voltage application switch corresponding to the output pin to be inspected in response to the drive IC output pin short-circuit diagnosis command. When the corresponding inspection voltage applying switch is turned on, the inspection voltage is applied to the inspection target output pin. As described above, the inspection voltage differs from the default voltage. If the first inspection target is the first channel described above, an equipotential surface of the inspection voltage is formed in the first channel (step S504).

In this case, when there is no short-circuit failure, the remaining channels except for the first channel have an equipotential surface of the default voltage. However, the output pin of the first channel and the short-circuited channel are supplied with the inspection voltage as it is.

The multiplexer 140 sequentially selects the voltages of the remaining output pins except for the output pin to be tested according to the channel selection signal, and outputs the voltages to the diagnostic signal generator 130 (step S506).

The diagnostic signal generator 130 determines whether there is a short circuit of the remaining output from the multiplexer 140 and outputs a diagnostic signal (step S508). When the diagnostic signal generating unit 130 is implemented as a comparator, the voltage of the remaining output pin is compared with a default voltage to generate a diagnostic signal. When the diagnostic signal generator 130 is implemented as an analog-to-digital converter, the voltage value of each output pin is output to the controller 200 (step S508).

The control unit 200 or the driving IC 100 may store the short circuit fault flag of the output pin where a short circuit occurs, based on the diagnostic signal (S510). For example, the control unit 200 may receive the voltage value of each output pin and compare the output voltage with the direct default voltage to store the short-circuit failure flag in the control IC 200. In the drive IC 100, a short- And transmit the same to the control unit 200.

The control unit 200 or the driving IC 100 may repeat the steps S502 to S510 until the output pin to be tested is changed according to a predetermined order and the short circuit between all the output pins is determined.

Therefore, according to the embodiment of the present invention, it is possible to determine whether there is a short-circuit failure before the operation of the system, unlike the prior art in which inspection was possible only during operation.

6 is a block diagram showing a configuration for checking short-circuit diagnosis between drive ICs according to an embodiment of the present invention. 7 is a circuit diagram showing detailed circuits of the first and second driving ICs shown in Fig. 8 is a diagram showing an example of a case where a short circuit occurs between the plurality of driving ICs shown in Fig.

Referring to FIGS. 6 and 7, an apparatus for short-circuit diagnosis between drive ICs according to an embodiment of the present invention includes a plurality of drive ICs 500 and 600 and a controller 700.

The plurality of drive ICs 500 and 600 each have the same structure as the drive IC shown in Fig. For the sake of simplicity of description, the same description will be omitted. In the following, although the invention has been described using two drive ICs 500 and 600, the present invention is also applicable to two or more drive ICs.

The control unit 700 can transmit a short-circuit diagnosis command between the first IC 500 and the second IC 600. [ In this case, the first drive IC 500 and the second drive IC 600 enter the short circuit diagnostic mode between the drive ICs.

The short-circuit diagnostic command between the driving ICs may include two instructions. For example, the control unit 700 may transmit the first drive IC diagnosis command to the first drive IC and the second drive IC diagnostic command to the second drive IC.

The first drive IC diagnostic command may include, for example, an instruction to turn off all of the drivers 121 and 125 and apply an inspection voltage to an inspection target output pin of the drive IC in the voltage application mode. Preferably, the inspection voltage may be simultaneously applied to the output pin to be inspected of all the driving ICs.

The second drive IC diagnosis command may include, for example, a command to turn off all of the drivers 121 and 125 and sequentially output the voltages of the plurality of output pins to the diagnostic signal generator 130.

Therefore, the inspection voltage is applied to the inspection target output pin of the first driving IC and the voltage of the output pins of the second driving IC is monitored to diagnose a short circuit between the first driving IC and the second driving IC.

Hereinafter, the operation and principle of the present invention will be described with reference to Figs. 7 and 8. Fig.

The first driving IC 500 turns off all the driving units 510 according to the short-circuit diagnosis command between the first driving ICs, and when the inspection voltage applying switch 520 corresponding to the output pin to be inspected is turned on, H # n). The inspection voltage may be applied to all the output pins of the first driving IC 500 simultaneously.

In accordance with the short-circuit diagnosis command between the second driving ICs, all the driving units 610 are turned off in the second driving IC 600, and the output pins are sequentially selected by the multiplexer 640. The diagnostic signal generator 650 generates diagnostic signals based on the voltage values of the output pins sequentially output from the multiplexer 640.

The diagnostic signal is transmitted to the controller 700. The short diagnosis command is transmitted to the first driver IC and the short drive diagnostic command is sent to the second driver IC. do. In this case, as shown in Figs. 7 and 8, when there is a short circuit between the driving ICs, the inspection voltage is detected at the output pin of the monitoring target driving IC.

Hereinafter, a method for diagnosing a short circuit between a plurality of driving ICs according to an embodiment of the present invention will be described with reference to FIG. 9 is a flowchart illustrating a method of diagnosing a short circuit between drive ICs according to an embodiment of the present invention.

 The control unit 700 sets the first driving IC 500 to the voltage application mode when all of the first driving ICs 500 and the first driving IC 500 are connected to each other, (510) is turned off. In addition, the controller 700 turns on the inspection voltage applying switch 520 corresponding to the inspection subject output pin and applies the inspection voltage to the inspection subject output pin (step S902). As described above, preferably, all the output pins are to be inspected and the inspection voltage can be applied at the same time.

Meanwhile, the controller 700 transmits a short-circuit diagnosis command between the second driving ICs to the second driving IC 600 to set the second driving IC 600 in the monitoring mode, and the driving unit 600 of the second driving IC 600 610 are all turned off. The voltage of the output pin of the second driver IC 600 is sequentially output to the diagnostic signal generator 650 through the multiplexer 640 of the second driver IC 600 (S904)

The diagnostic signal generator 650 of the second driver IC 600 sequentially generates a diagnostic signal by comparing the voltage value applied to the output pins from the multiplexer 640 with a default value through a comparator and outputs the diagnostic signal to the controller 700 Or converts the voltage value into a digital value as a diagnostic signal and transmits the digital value to the controller 700 (step S906).

The controller 700 determines that the output pin of the second driving IC to which the voltage different from the default value is applied is short-circuited to the first driving IC 500 and stores the output pin in the flag based on the diagnostic signals (step S908 ).

After finishing the application of the inspection voltage to all the output pins of the first driving IC, the first driving IC and the second driving IC are interchanged with the submode, and steps S902 to S908 are repeated (step S910). Therefore, according to the embodiment of the present invention, it is possible to confirm whether the drive IC is short-circuited.

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, It is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, is intended to cover various modifications and similarities. Accordingly, the scope of the present invention should be construed as being limited to the embodiments described, and it is intended that the scope of the present invention encompasses not only the following claims, but also equivalents thereto.

100: driving IC
110: diagnostic circuit
121, 125:
200, 700:
300, 800: load
500: first driving IC
510, 610: HS / LS driver
600: second driving IC

Claims (20)

A driving unit for driving the load; A plurality of test voltage application switches for applying an inspection voltage to an output pin to be inspected among a plurality of output pins in accordance with an output pin short-circuit diagnosis command; A plurality of voltage dividers for applying a default voltage different from the inspection voltage to the output pins not to be inspected among the plurality of output pins; A multiplexer for sequentially selecting and outputting a voltage value applied to the plurality of output pins; And a diagnostic IC for generating a diagnostic signal for the voltage value; And
And a controller for transmitting the output pin short-circuit diagnosis command to the drive IC and determining a short-circuit pin among the plurality of output pins based on the diagnostic signal
Short circuit diagnosis device between output pin of drive IC.
The method according to claim 1,
The plurality of inspection voltage application switches are connected between an inspection power source for applying the inspection voltage and the output nodes of the plurality of voltage divider
Short circuit diagnosis device between output pin of drive IC.
The method according to claim 1,
Wherein the drive IC turns off the drive unit when the output pin short-
Short circuit diagnosis device between output pin of drive IC.
The method according to claim 1,
Wherein the default voltage is a voltage that the inspection voltage is distributed by the voltage divider,
Short circuit diagnosis device between output pin of drive IC.
A first driving IC;
A second driving IC; And
And a controller for transmitting a short-circuit diagnosis command between the first driving ICs to the first driving IC and transmitting a short-circuit diagnosis command between the second driving ICs to the second driving IC,
The first driving IC and the second driving IC are
A driving unit for driving the load;
A plurality of test voltage application switches for applying an inspection voltage to an output pin to be inspected among a plurality of output pins in accordance with the short-circuit diagnosis command between the first drive ICs;
A plurality of voltage dividers for applying a default voltage different from the inspection voltage to an output pin not to be inspected among the plurality of output pins;
A multiplexer sequentially selecting and outputting a voltage value applied to at least a part of the plurality of output pins; And
And a diagnostic signal generator for generating a diagnostic signal for the voltage value,
The output pin to be inspected is determined in accordance with the short-circuit diagnosis command between the first driving ICs, and the control unit is configured to determine a shorting pin among the plurality of output pins of the second driving IC based on the diagnosis signal
Short circuit diagnosis device between drive ICs.
6. The method of claim 5,
The plurality of inspection voltage application switches are connected between an inspection power source for applying the inspection voltage and the output nodes of the plurality of voltage divider
Short circuit diagnosis device between drive ICs.
6. The method of claim 5,
Wherein the drive IC turns off the drive unit when the output pin short-
Short circuit diagnosis device between drive ICs.
6. The method of claim 5,
Wherein the default voltage is a voltage that the inspection voltage is distributed by the voltage divider,
Short circuit diagnosis device between drive ICs.
6. The method of claim 5,
Wherein the plurality of inspection voltage application switches are configured to be turned on simultaneously according to a short-circuit diagnosis command between the first drive ICs,
Short circuit diagnosis device between drive ICs.
In a drive system including a drive IC and a control section,
Turning off the driving unit of the driving IC by the driving IC according to an output pin short-circuit diagnostic command transmitted from the control unit;
Applying a test voltage to an inspection target output pin among a plurality of output pins of the driving IC and applying a default voltage to the output pins other than the inspection target output pin among the plurality of output pins;
Sequentially selecting a voltage value of the output pins other than the inspection target output pin among the plurality of output pins and outputting the selected voltage value to the diagnostic signal generator and generating a diagnostic signal; And
And determining a shorting pin of the plurality of output pins based on the diagnostic signal.
A method of short-circuit diagnosis between output pins of a driving IC.
11. The method of claim 10,
Further comprising the step of storing said determined shorting pin in a flag,
A method of short-circuit diagnosis between output pins of a driving IC.
11. The method of claim 10,
Wherein determining the shorting pin comprises comparing the voltage value to the default voltage to determine the shorting pin.
A method of short-circuit diagnosis between output pins of a driving IC.
11. The method of claim 10,
Wherein the generating of the diagnostic signal comprises transmitting the converted digital voltage value through the analog to digital converter to the controller.
A method of short-circuit diagnosis between output pins of a driving IC.
11. The method of claim 10,
Designating any one of the output pins other than the output pin to be inspected as a second inspection target;
Sequentially selecting a voltage value of the output pins other than the second check target output pin among the plurality of output pins and outputting the selected voltage value to the diagnostic signal generator and generating a diagnostic signal; And
Further comprising determining a shorting pin of the plurality of output pins based on the diagnostic signal,
A method of short-circuit diagnosis between output pins of a driving IC.
A method for short-circuit diagnosis between drive ICs including a first drive IC, a second drive IC, and a control unit,
The control unit transmits a short-circuit diagnosis command between the first driving ICs to the first driving IC, transmits a short-circuit diagnosis command between the second driving ICs to the second driving IC, Turning off the driving unit;
Applying an inspection voltage to an inspection target output pin of the first driving IC in accordance with a short circuit diagnostic command between the first driving ICs;
Sequentially selecting a voltage applied to the plurality of output pins of the second driving IC and outputting the selected voltage to the diagnostic signal generator;
Outputting a diagnostic signal for the plurality of output pins of the second driving IC; And
And determining a shorting pin of the plurality of output pins based on the diagnostic signal.
A method for short - circuit diagnosis between drive ICs.
16. The method of claim 15,
Further comprising the step of storing said determined shorting pin in a flag,
A method for short - circuit diagnosis between drive ICs.
16. The method of claim 15,
Wherein determining the shorting pin comprises comparing the voltage value to a default voltage to determine the shorting pin.
A method for short - circuit diagnosis between drive ICs.
16. The method of claim 15,
Wherein the generating of the diagnostic signal comprises transmitting the converted digital voltage value through the analog to digital converter to the controller.
A method for short - circuit diagnosis between drive ICs.
16. The method of claim 15,
After determining the shorting pin,
The controller transmits a short-circuit diagnosis command to the first driver IC between the second driver ICs and transmits a short-circuit diagnosis command between the first driver ICs to the second driver IC;
Applying an inspection voltage to an inspection target output pin of the second driving IC according to a short circuit diagnostic command between the first driving ICs;
Sequentially selecting the voltages applied to the plurality of output pins of the first driving IC and outputting the selected voltages to the diagnostic signal generating unit;
Outputting a diagnostic signal for the plurality of output pins of the first driving IC; And
Further comprising determining a shorting pin of the plurality of output pins of the first driving IC based on a diagnostic signal for the plurality of output pins of the first driving IC.
A method for short - circuit diagnosis between drive ICs.
16. The method of claim 15,
Wherein the output pin to be tested is all the output pins of the first driver IC and is configured to simultaneously apply an inspection voltage.
Short circuit diagnosis device between drive ICs.

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