KR20160082276A - Method for correcting pixel defect of oled substrate and apparatus and method for correcting pixel defect of oled substrate - Google Patents

Abstract

According to an aspect of the present invention, a method for correcting a defect in a pixel formed on an OLED substrate comprises following steps of: adjusting at least one among an incident angle of light, an intensity of light, and a wavelength of light to emit light from an optical source to a substrate; photographing the light reflected by a pixel formed on the substrate by using a camera to form an image; generating data on the intensity of the light reflected from the image; filtering the generated data; determining a pixel corresponding to remaining data after the filtering as defective; and spraying ink on the pixel, which is determined as defective, to correct the defect. According to the present invention, it is possible to determine a defect in a pixel and correct the defect quickly.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a method for correcting a pixel defect in an OLED substrate and a method for correcting a pixel defect in an OLED substrate,

The present invention relates to a pixel defect correction method for an OLED substrate and a pixel defect correction apparatus for an OLED substrate. More particularly, the present invention relates to a pixel defect correction method for an OLED substrate and a pixel defect correction apparatus for an OLED substrate that can accurately determine and correct defects of a pixel that may occur on an OLED substrate.

2. Description of the Related Art Flat panel displays such as a liquid crystal display (LCD), a plasma display panel (PDP) and an organic light emitting diode (OLED) are widely used as display devices have.

As a method for forming the pixels of the flat panel display device, a bank is formed on a substrate or a mask is disposed on a substrate. Organic light emission corresponding to R, G, and B, respectively, There is a method of forming a pixel by injecting ink containing a material through an ink ejection unit.

At this time, if the ink ejecting nozzle is clogged or the ink is not ejected accurately due to a control error or the like, it may cause an error more than an allowable value in the amount of ink to be injected into the substrate, A defect may occur in the pixel. In addition, in the ink injection process, particles existing in the process chamber adhere to the pixel, which may cause defects in the pixel. Such defects in the pixels cause product defects and deteriorate the productivity, and it is therefore necessary to inspect the defects of the pixels to correct the defects.

Korean Patent Publication No. 10-2013-0125631 (published on November 19, 2013)

The present invention provides a method of correcting a pixel defect of an OLED substrate and an apparatus of correcting a pixel defect of an OLED substrate which can accurately determine and correct defects of a pixel that may occur in an OLED substrate.

According to an aspect of the present invention, there is provided a correction method for correcting a defect of a pixel formed on an OLED substrate, the method including: a light incidence angle; Adjusting at least one of a wavelength of light and irradiating the substrate with light from a light source; Generating an image by photographing light reflected by a pixel formed on the substrate using a camera; Generating data on the intensity of the reflected light from the image; Filtering the generated data; Determining a pixel corresponding to the remaining data by the filtering as a defect, and correcting the defect by ejecting ink to the pixel determined as the defect.

The step of filtering the data may include filtering using reference data by a repeated pattern.

The filtering of the data may include filtering using a preset range of light intensity.

The step of irradiating the substrate with the light from the light source in advance before the step of photographing using the camera may further include the step of previously determining the intensity of the light to be irradiated to the substrate, the incident angle of incidence, can do.

The step of correcting defects by discharging the ink may include a step of calculating the number of drops of the ink according to the size of the defect and discharging the ink.

The number of drops of the ink to be ejected can be determined by the following equation.

The correction constant may be determined by viscosity or scattering of the ink ejected to correct the defect.

According to another aspect of the present invention, there is provided a substrate processing apparatus including: a substrate stage on which a substrate is loaded; An imaging unit including a light source for irradiating the substrate with light, and a camera for capturing light reflected from the substrate; A determination unit for extracting data on the intensity of light from the image picked up by the image pickup unit and determining whether a pixel formed on the substrate is defective using the data, And an ink ejection unit that corrects defects by ejecting ink to the defects of the pixels.

The determining unit may determine whether a pixel defect occurs by filtering the generated data using reference data or filtering using a preset light intensity range.

According to the embodiment of the present invention, after the light is irradiated on the OLED substrate, the presence or absence of a defect in a pixel formed on the substrate is determined based on the intensity of reflected light, and ink is ejected to a pixel determined to be defective, There is provided a method for correcting a pixel defect of an OLED substrate and an apparatus for correcting a pixel defect of the OLED substrate.

1 is a block diagram of a pixel defect correction apparatus for an OLED substrate according to an embodiment of the present invention.
2 is a flowchart of a method of correcting a pixel defect of an OLED substrate according to an embodiment of the present invention.
3 is a graph showing the intensity of reflected light.

BRIEF DESCRIPTION OF THE DRAWINGS The present invention is capable of various modifications and various embodiments, and specific embodiments are illustrated in the drawings and described in detail in the detailed description. It is to be understood, however, that the invention is not to be limited to the specific embodiments, but includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

Hereinafter, a pixel defect correction method for an OLED substrate and a pixel defect correction apparatus for an OLED substrate according to the present invention will be described in detail with reference to the accompanying drawings, wherein like or corresponding components Are denoted by the same reference numerals, and redundant description thereof will be omitted.

Hereinafter, an embodiment of a pixel defect correction apparatus for an OLED substrate according to the present invention will be described in detail with reference to the accompanying drawings.

1 is a block diagram of a pixel defect correction apparatus for an OLED substrate according to an embodiment of the present invention. 1 shows a substrate stage 11, a substrate 13, a pixel 15, an image pickup unit 20, a light source 23, a camera 25, an ink discharging unit 30, a judging unit 40, 50 are shown.

Referring to FIG. 1, an OLED substrate pixel defect correction apparatus according to the present embodiment includes a substrate stage 11 on which a substrate 13 is loaded; An image pickup unit (20) including a light source (23) that emits light to the substrate (13); and a camera (25) that captures light reflected by the substrate (13); A determination unit (40) for extracting data on the intensity of light from the image taken by the image pickup unit (20) and determining whether the pixel (15) formed on the substrate (13) And an ink ejection unit 30 for correcting the defects by ejecting ink to the defects of the pixels 15 while moving the upper part of the substrate 13 in accordance with the judgment of the control unit 40. [

The substrate stage 11 is disposed inside a process chamber (not shown), and the substrate 13 is seated on the substrate stage 11. An internal space is formed in the process chamber (not shown) so that the pixel 15 defect remediation device is located, and the internal space may be kept vacuum or the process gas may be supplied at normal pressure.

The image pickup unit 20 includes a light source 23 that emits light to the substrate 13 and a camera 25 that captures the light reflected by the substrate 13 and includes a substrate 13 of a process chamber As shown in FIG. The image pickup unit 20 can be coupled to the transfer unit and can be moved in the X-axis, Y-axis, and Z-axis directions.

The light source 23 emits light to the pixel 15 formed on the substrate 13 and the light source 23 emits light to the substrate 13 by adjusting the intensity of light, the angle of incidence of incidence, and the wavelength of light . The camera 25 irradiates the pixel 15 of the substrate 13 with the light emitted from the light source 23 and captures the reflected light to generate an image.

The determination unit 40 extracts data on the intensity of light from the image captured by the image pickup unit 20 and determines whether the pixel 15 formed on the substrate 13 is defective by using the data. The determination unit 40 extracts data on the intensity of light from the image captured by the camera 25 and transmitted. The extracted data is filtered based on light intensity to determine whether the pixel 15 formed on the substrate 13 is defective or not. Specifically, the determination unit 40 determines whether the pixel 15 is defective by filtering the generated data using reference data or a predetermined light intensity range.

The ink ejection unit 30 corrects the defect by ejecting ink to the defect of the pixel 15 while moving the upper portion of the substrate 13 in accordance with the determination of the determination unit 40. [ The ink ejected from the ink ejection unit 30 may include an organic light emitting material corresponding to R, G, The ink ejection unit 30 is installed in the transfer unit and can be moved in the X-axis, Y-axis, and Z-axis directions. Although the ink ejection unit 30 and the image pickup unit 20 are provided in the same transfer unit in this embodiment, the ink ejection unit 30 and the image pickup unit 20 may be installed in different transfer units It is possible.

The determination unit 40 determines that the pixel 15 has a defect and the ink ejection unit 30 moves to a position where the ink is defective and ejects the ink to correct the defect. At this time, the ink ejection unit 30 can be controlled to eject the ink in the form of a droplet.

Hereinafter, a pixel defect correction method for an OLED substrate using the pixel defect correction apparatus for an OLED substrate having the above-described structure will be described in detail with reference to FIGS. 2 and 3. FIG.

2 is a flowchart of a method of correcting a pixel defect of an OLED substrate according to an embodiment of the present invention.

According to the present embodiment, a method of correcting defects of a pixel 15 formed on an OLED substrate 13 is a correction method for correcting defects of a pixel 15 formed on an OLED substrate 13, wherein the incident angle of light, the intensity of light, (S10) irradiating light from the light source (23) onto the substrate (13) by adjusting at least one of the wavelengths of the light; (S20) photographing light reflected by the pixel 15 formed on the substrate 13 using the camera 25 to generate an image; Generating (S30) data on the intensity of light reflected from the image; Filtering the generated data (S40); (S50) of judging the pixel (15) corresponding to the remaining data by filtering to be a defect (S50), and correcting the defect by discharging ink to the pixel (15) It is possible to correct the defect of the pixel 15 by determining the presence or absence of a defect in the pixel 15 formed in the pixel 15.

First, at least one of the incident angle of light, the intensity of light, and the wavelength of light is adjusted to irradiate light from the light source 23 onto the substrate 13 (S10). The state of light reflected by the deposition material deposited on the OLED substrate 13 or the substrate 13 placed on the substrate stage 11 may be different from each other. The incident angle, the intensity of light, and the wavelength of light. This is because the state of light reflected from the light source 23 and reflected by the substrate 13 can be changed according to the condition of the light source 23. The irradiation range of the light by the light source 23 can be set to the entire substrate 13 or a partial area of the substrate 13. [

Next, by using the camera 25, light reflected by the pixel 15 formed on the substrate 13 is photographed to generate an image (S20). The illuminated light is reflected by hitting the pixel 15 formed on the substrate 13, and the camera 25 photographs the reflected light to generate an image.

Next, data on the intensity of light reflected from the image is generated (S30). The image photographed and generated by the camera 25 is transmitted to the determination unit 40. The determination unit 40 generates data on the intensity of the reflected light.

Next, the determination unit 40 filters the generated data (S40), and determines that the pixel 15 corresponding to the remaining data is defective by filtering (S50).

Filtering the data may include filtering using reference data by a repeating pattern. 3, the determination unit 40 generates data on the intensity of reflected light of the pixel 15 from the image transmitted by the image pickup unit 20, and determines the intensity of light forming a certain pattern as a reference As a result, the pixel 15 having light intensity deviating from this pattern can be determined as a defective pixel 15 by comparing it with the reference data.

The step of filtering the data may include filtering using a preset intensity range of light. The determination unit 40 may determine the pixel 15 corresponding to the intensity of the light that is out of the predetermined light intensity range to be the defective pixel 15. [

Although it has been described in the present embodiment that the above-described filtering method is performed to determine the defective pixel 15, any one filtering method is performed and another filtering method is performed to detect the defective pixel 15 It is also possible to judge. In one embodiment, the determination unit 40 primarily filters reference data to remove noise, and secondarily filters the data using a light intensity range to remove noise, It is possible to determine that the pixel 15 having the pixel value?

On the other hand, before the step S10 of photographing using the camera 25, light is irradiated from the light source 23 to the substrate 13 of the same type as the substrate 13, An incident angle of incidence, and a wavelength region to be irradiated to the substrate. The state of light reflected may vary depending on the deposition material deposited on the OLED substrate 13 or the substrate 13 placed on the substrate stage 11.

Next, ink is ejected to the pixel 15 judged as a defect to correct the defect (S60). If the determination unit 40 determines that the specific pixel 15 has a defect, the ink ejection unit 30 moves to the defective pixel 15 to eject the ink to correct the defect.

The step of correcting defects by discharging the ink can calculate the number of drops of the ink according to the size of the defect and discharge the ink. The number of drops of ink to be ejected can be determined by the following equation.

Number of drops = (defect size) / (droplet size of one drop) + correction constant

At this time, the correction constant can be determined by the viscosity or scattering of the ink ejected to correct the defect.

The controller 50 calculates the number of drops of the ink according to the size of the defect, and determines the number of drops of the ink in consideration of the characteristics of the ink discharged at a value obtained by dividing the defect size by the droplet size of one drop. The ink ejection unit 30 corrects defects of the pixel 15 by ejecting ink according to the determined number of drops. If the size of the modified pixel 15 is larger than the defect size of the pixel 15 before the modification based on the size of the modified pixel 15, the controller 50 determines that the defect modification is completed, If the defect size of the pre-modification pixel 15 is equal to or smaller than the size of the modified pixel 15, it is determined that the defect correction is not completed and the correction operation by ink ejection is repeated.

As described above, according to the pixel defect correction method of the OLED substrate and the pixel defect correction apparatus of the OLED substrate described above, after the light is irradiated on the OLED substrate, And defects are corrected by ejecting ink to the pixels judged to be defective, thereby reducing the product defects and improving the productivity.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the following claims And changes may be made without departing from the spirit and scope of the invention.

11: substrate stage 13: substrate
15: pixel 20: image pickup unit
23: light source 25: camera
30: ink ejection unit 40:
50:

Claims (9)

A correction method for correcting a defect of a pixel formed on an OLED substrate,
Adjusting at least one of an incident angle of light, intensity of light, and wavelength of light to irradiate light onto the substrate from a light source;
Generating an image by photographing light reflected by a pixel formed on the substrate using a camera;
Generating data on the intensity of the reflected light from the image;
Filtering the generated data;
Determining a pixel corresponding to the remaining data by the filtering as a defect, and
And correcting the defect by ejecting ink to the pixel determined as the defect.
The method according to claim 1,
Wherein filtering the data comprises:
And filtering the pixel defect using reference data by a repetitive pattern.
The method according to claim 1,
Wherein filtering the data comprises:
And filtering the image using a preset range of light intensity.
The method according to claim 1,
Before the step of photographing using the camera,
Further comprising the step of irradiating the substrate with light from the light source in advance to determine the intensity of the light to be irradiated to the substrate, the incident angle of incidence, and the wavelength region in advance according to the reflection characteristic of the light, How to fix it.
The method according to claim 1,
The step of correcting defects by ejecting the ink includes:
And calculating the number of drops of ink according to the size of the defect to eject the ink.
6. The method of claim 5,
The number of drops of the ink to be ejected,
Wherein the defective pixel defect is determined by the following equation.

The method according to claim 6,
Wherein the correction constant is determined by viscosity or scattering of the ink ejected to correct the defect.
A substrate stage on which the substrate is loaded;
An imaging unit including a light source for irradiating the substrate with light, and a camera for capturing light reflected from the substrate;
A determination unit for extracting data on intensity of light from the image photographed by the imaging unit and determining whether the pixel formed on the substrate is defective using the data;
And an ink ejecting unit for ejecting ink to the defects of the pixel while correcting the defects while moving the upper part of the substrate according to the judgment of the judging unit.
9. The method of claim 8,
Wherein,
Wherein the defective pixel is determined by filtering the generated data by using the reference data or by filtering using the predetermined range of light intensity.

Images