KR20160036768A - The method for measuring the temporal stability of release film and the release film - Google Patents
The method for measuring the temporal stability of release film and the release film Download PDFInfo
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- KR20160036768A KR20160036768A KR1020140128651A KR20140128651A KR20160036768A KR 20160036768 A KR20160036768 A KR 20160036768A KR 1020140128651 A KR1020140128651 A KR 1020140128651A KR 20140128651 A KR20140128651 A KR 20140128651A KR 20160036768 A KR20160036768 A KR 20160036768A
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/40—Adhesives in the form of films or foils characterised by release liners
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N19/00—Investigating materials by mechanical methods
- G01N19/04—Measuring adhesive force between materials, e.g. of sealing tape, of coating
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Abstract
Providing a release film comprising a substrate layer and a release layer; Preparing a laminate having an adhesive layer on one side of the release layer; Measuring a first release force after storing the first stack at a first temperature for a first time; Storing the second laminate at a second temperature higher than the first temperature for a second time longer than the first time and then measuring a second release force; And measuring an aging rate by the following general formula (1).
[Formula 1]
% Change with time = (second releasing force - first releasing force) / first releasing force x 100
Also provided is a release film having a percent change with time of 30% or less as measured according to the above-mentioned method for measuring stability with time of release film.
Description
A method of measuring the stability with time of a release film, and a release film.
The release film facilitates the handling and transportation of the product, and can be easily separated and used for various purposes. For example, such a release film can be used as a carrier film of an adhesive film. In the case of judging whether or not such a release film is suitable for use as a carrier film, the release film can be easily separated even after a long time with the release film adhered to the adhesive film, Whether or not to give is one of the important factors. Therefore, there is a need for a method for judging whether or not it is qualified as a release film before processing into a product.
One embodiment of the present invention provides a method for measuring aging stability, which can effectively determine whether or not the release film is easily deformable without being deformed according to the passage of time before processing the product into a product.
Another embodiment of the present invention provides a release film having excellent long-term stability selected according to the above-mentioned method of measuring the aging stability.
In one embodiment of the present invention, there is provided a method of manufacturing a semiconductor device, comprising: providing a release film comprising a substrate layer and a release layer; Preparing a laminate having an adhesive layer on one side of the release layer; Measuring a first release force after storing the first stack at a first temperature for a first time; Storing the second laminate at a second temperature higher than the first temperature for a second time longer than the first time and then measuring a second release force; And measuring an aging rate by the following general formula (1).
[Formula 1]
% Change with time = (second releasing force - first releasing force) / first releasing force x 100
The difference between the first temperature and the second temperature may be from about 20 ° C to about 80 ° C, and the difference between the first and second times may be from about 48 hours to about 144 hours.
The first temperature may be from about 20 [deg.] C to about 40 [deg.] C, and the first time may be from about 20 hours to about 30 hours.
The second temperature may be from about 40 ° C to about 120 ° C, and the second time may be from about 68 hours to about 174 hours.
Wherein the releasing layer is at least one selected from the group consisting of a silicone releasing agent, a melamine releasing agent, a polyolefin releasing agent, an epoxy releasing agent, an acrylic releasing agent, a fluorine releasing agent, a cellulose releasing agent, a paraffin releasing agent, an epoxy- .
The base layer may comprise at least one selected from the group consisting of paper, nonwoven fabric, polyethylene terephthalate (PET), polyethylene (PE), polyvinyl alcohol (PVA), and combinations thereof.
The adhesive layer may include at least one selected from the group consisting of an acrylic adhesive, a silicone adhesive, a rubber adhesive, and a combination thereof.
In another embodiment of the present invention, there is provided a release film having a percent change with time of 30% or less, which is measured according to the method for measuring the stability of the release film with aging.
The method for measuring the stability with time of the releasing film provides a method for determining whether the releasing film has appropriate stability over time before processing into a product, thereby reducing the defective rate of the product containing the releasing film, have.
In addition, a release film having a long-term stability measured according to the above-described measurement method satisfies specific conditions can be utilized for various applications based on excellent physical properties.
FIG. 1 schematically shows a method for measuring the stability of a release film according to an embodiment of the present invention.
2 is a cross-sectional view schematically showing an embodiment of a release film used in the method for measuring the stability of the releasing film with time.
3 is a cross-sectional view schematically showing one embodiment of the laminate used in the method for measuring the stability of the release film with time.
BRIEF DESCRIPTION OF THE DRAWINGS The above and other features and advantages of the present invention will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings in which: These embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art to which the invention pertains. Only. Like reference numerals refer to like elements throughout the specification.
One embodiment of the present invention provides a method of manufacturing a semiconductor device, comprising: providing a release film comprising a substrate layer and a release layer; Preparing a laminate having an adhesive layer on one side of the release layer; Measuring a first release force after storing the first stack at a first temperature for a first time; Storing the second laminate at a second temperature higher than the first temperature for a second time longer than the first time and then measuring a second release force; And measuring an aging rate by the following general formula (1).
[Formula 1]
% Change with time = (second releasing force - first releasing force) / first releasing force x 100
The release film facilitates the handling and transportation of the product, and can be easily separated, and can be used for various purposes, and is widely used as a carrier for the adhesive layer. However, when the release film is attached to the adhesive layer and transported, the functional groups remaining on the release film may react with the components of the adhesive layer over time, which may cause adhesion when the release film is peeled The aging problem may occur where the layer is damaged or is not easily separated.
On the other hand, in the method of measuring the stability with time of the release film, it is determined through a simple method whether the release film has suitable physical properties as a carrier use of the adhesive layer. The stability of the releasing film over time can be determined in advance through the above-described measuring method. From this, the defective rate of the product including the releasing film can be reduced and the reliability can be improved.
FIG. 1 schematically shows a method for measuring the stability with time of the releasing film. Referring to FIG. 1, the method of measurement may comprise providing a
The measuring method may include the step of preparing a
FIG. 2 schematically shows an embodiment of a
Referring to Fig. 1, the above-mentioned measuring method can be referred to as a first laminate and a second laminate, respectively, by preparing two of the laminate in the same manner, and the first laminate and the second laminate are made to be different from each other Environment. ≪ / RTI >
Specifically, the first laminate is stored at a first temperature for a first time, and the second laminate is stored at a second temperature higher than the first temperature for a second time that is longer than the first time . In addition, the measurement method can measure the first releasing force and the second releasing force after storing the first laminate and the second laminate in different environments, respectively.
By storing the first laminate and the second laminate in different environments as described above, accurate and reliable results can be obtained in determining the stability over time with temperature and time.
Specifically, the first releasing force and the second releasing force are the release force between the releasing
The aging stability measuring method may include measuring an aging change rate according to the general formula (1) using the first releasing force and the second releasing force. The aged change rate indicates the degree of change of mold releasing force according to the storage time and the temperature change, and the smaller the degree, the better the aging stability.
The first laminate and the second laminate may be stored at a first temperature and a second temperature, respectively, and the second temperature may be higher than the first temperature. Specifically, the difference between the first temperature and the second temperature may be between about 20 캜 and about 80 캜.
In addition, the first laminate and the second laminate may be stored for a first time and a second time, respectively, and the second time may be longer than the first time. Specifically, the difference between the first time and the second time may be from about 48 hours to about 144 hours .
When the difference between the first temperature and the second temperature and the difference between the first time and the second time all satisfy the above range, due to the difference in the environment in which the first laminate and the second laminate are stored The stability over time can be effectively measured and judged, and a reliable result can be obtained.
Specifically, the stability of the releasing film with respect to time may be measured by storing the first laminate at the first temperature for a first time, and the first time may be about 20 hours to about 30 hours. In general, the releasing film may start to change in releasing force after a lapse of the time in the range after application, and the first releasing force may be measured after storing the first laminate for the time in the range, A reasonable reference value of the measurement can be derived.
Also, the first temperature may be between about 20 ° C and about 40 ° C. The range of the first temperature is close to the range of room temperature and the time point at which the release force of the release film is changed can be effectively detected by keeping the first laminate at the temperature within the range for the first time, A reasonable reference value of the measurement can be derived.
The stability of the release film over time may be such that the second laminate is kept at the second temperature for a second time, and the second time may be from about 68 hours to about 174 hours. The releasing film may have a maximum change in releasing force at a time point after the application of the releasing film has elapsed after the application of the releasing film, and the second releasing force may be measured after storing the second laminate for the time period It is possible to derive a reasonable reference value.
Also, the second temperature may be between about 40 ° C and about 120 ° C. By keeping the release film in the range of the second temperature for the second time, it is possible to effectively detect the time point at which the release force is maximally changed, and it is possible to derive a reasonable reference value for the measurement of the rate of change with time.
2 schematically shows one embodiment of the release film used in the method for measuring the stability of the releasing film over time.
The
For example, the
Specifically, the
For example, the
The releasing
Specifically, the pressure-
For example, the pressure-
Another embodiment of the present invention can provide a release film having an elapsed time change rate of about 30% or less as measured according to the method for measuring stability with time of release film.
The rate of change with time of the release film may be about 30% or less, for example, about 20% or less. When the release film has a time-dependent change rate in the above-mentioned range, excellent stability over time can be ensured, and when the release film is applied to a product, excellent physical properties can be realized.
Hereinafter, specific embodiments of the present invention will be described. However, the embodiments described below are only intended to illustrate or explain the present invention, and thus the present invention should not be limited thereto.
Example One
A polyethylene terephthalate (PET) base layer having a thickness of 50 mu m was provided, and a releasing film having a 200 nm thick release layer laminated with a polydimethylsiloxane (PDMS) release agent was provided on one side of the base layer. An adhesive tape (tesa7475) including an adhesive layer formed of an acrylic adhesive was prepared, and the adhesive layer was reciprocated three times with a roller of 2 kg so as to adhere to the release layer to prepare a first laminate. A second laminate having the same base layer, releasing layer and adhesive layer laminated was produced in the same manner as in the above first laminate.
After the first laminate was stored at 20 DEG C for 24 hours, the first release force between the release layer and the adhesive layer was measured. Then, after the second laminate was stored at 60 DEG C for 170 hours, the second release force between the release layer and the pressure-sensitive adhesive layer was measured.
Specifically, the first releasable force and the second releasable force were obtained by binding the adhesive layer to a jig of a measuring instrument (Chemical Instrument, AR-1000), measuring the peeling speed at 30 cm / min and the peeling angle at 180, And the force separating from the release layer was measured.
Subsequently, the aging change rate according to the general formula (1) was measured using the first releasing force and the second releasing force.
The aging rate of each of the three types of laminated samples was measured by the method of Example 1, and the composition and content of the release layer of each sample were as shown in Table 1 below.
Experimental Example 1: Measurement of aging stability
The first releasing force, the second releasing force and the elapsed time change rate of each sample measured in Example 1 are shown in Table 2 below. Table 2 also shows the results of judging the elapsed time stability of each sample based on the change with time. The stability with time was evaluated according to the criteria of Excellent (∘) when the change rate with time was 30% or less, △ when it was more than 30%, less than 100%, and inferiority (Х) when it was 100% or more.
Table 2 shows the stability of the releasing film according to the aging stability measurement method of Example 1. The stability of the releasing film with respect to time was found to be less than 30% , And the elapsed time change rate of the sample 2 was more than 100%, indicating that the stability with time was inferior. In addition, it can be seen that the elapsed time change rate of the sample 3 is in the range of more than 30% and less than 100%, so that the stability with the passage of time is normal. In this way, information on the durability according to temperature and time can be obtained in the commercialization of the release film by judging the stability with time of the sample in advance, and the defective rate of the product can be reduced. In addition, a variety of articles having excellent physical properties can be obtained by commercializing a sample having an elapsed time change rate measured by the above method of not more than about 30%, for example, not more than about 20%, as a release film.
100: release film
200: laminate
10: substrate layer
20:
30: Adhesive layer
Claims (8)
Preparing a laminate having an adhesive layer on one side of the release layer;
Measuring a first release force after storing the first stack at a first temperature for a first time;
Storing the second laminate at a second temperature higher than the first temperature for a second time longer than the first time and then measuring a second release force; And
Measuring a change rate over time according to the following general formula
Method for measuring stability of releasing film over time.
[Formula 1]
% Change with time = (second releasing force - first releasing force) / first releasing force x 100
Wherein the difference between the first temperature and the second temperature is from 20 캜 to 80 캜,
Wherein the difference between the first time and the second time is from 48 hours to 144 hours
Method for measuring stability of releasing film over time.
Wherein the first temperature is from 20 캜 to 40 캜,
Wherein the first time is from 20 hours to 30 hours
Method for measuring stability of releasing film over time.
The second temperature is between 40 ° C and 120 ° C,
And the second time is from 68 hours to 174 hours
Method for measuring stability of releasing film over time.
Wherein the releasing layer is at least one selected from the group consisting of a silicone releasing agent, a melamine releasing agent, a polyolefin releasing agent, an epoxy releasing agent, an acrylic releasing agent, a fluorine releasing agent, a cellulose releasing agent, a paraffin releasing agent, an epoxy- Included
Method for measuring stability of releasing film over time.
Wherein the substrate layer comprises at least one selected from the group consisting of paper, nonwoven fabric, polyethylene terephthalate (PET), polyethylene (PE), polyvinyl alcohol (PVA)
Method for measuring stability of releasing film over time.
Wherein the pressure-sensitive adhesive layer comprises at least one selected from the group consisting of an acrylic pressure-sensitive adhesive, a silicone pressure-sensitive adhesive, a rubber pressure-sensitive adhesive,
Method for measuring stability of releasing film over time.
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20190024413A (en) * | 2017-08-31 | 2019-03-08 | 주식회사 두산 | Carrier for semiconductor package and preparing method thereof |
CN118225676A (en) * | 2024-04-02 | 2024-06-21 | 浙江巨美特种材料有限公司 | A accurate detection device for from production of type membrane |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20190024413A (en) * | 2017-08-31 | 2019-03-08 | 주식회사 두산 | Carrier for semiconductor package and preparing method thereof |
CN118225676A (en) * | 2024-04-02 | 2024-06-21 | 浙江巨美特种材料有限公司 | A accurate detection device for from production of type membrane |
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