KR20150113937A - Method for testing device under test - Google Patents

Abstract

A method for testing a device under test (DUT) according to the present invention uses a test device connected to a PC through a GPIB cable and a jig connected to the PC through a UART cable or a USB cable and connected to the test device through a UTP cable to test a DUT mounted on the jig. The method for testing the DUT comprises: a step where the PC connects a spectrum analyzer of the test device and a signal distributor to set a test mode of the test device to a transmission test mode; a step where the PC transmits a transmission test command to the DUT; a step where the DUT responds to the transmission test command to generate a transmission test signal and transmit the generated transmission test signal to the test device; a step where the spectrum analyzer of the test device analyzes the transmission test signal received through the signal distributor and generates transmission test data according to a analysis result; and a step where the test device transmits the transmission test data to the PC.

Description

{METHOD FOR TESTING DEVICE UNDER TEST}

The present invention relates to a method of testing a device under test (DUT), and more particularly, to a method of automatically testing the DUT using a test apparatus and a PC (personal computer) wiredly connected to the DUT.

Products manufactured at factories are subjected to quality testing procedures after they are completed. Particularly, in the case of mass-produced products, the quality of the products is not the same, and defective products may occur among the products depending on various problems occurring in the manufacturing process.

This process and phenomenon are the same in manufacturing a terminal. In particular, in the case of a communication terminal capable of wireless communication, the communication function of the communication terminal must be tested using specialized equipment. Unlike some products that are external to the product and can be tested with the naked eye or simple equipment, it is important that the communication terminal is functioning normally within the communication function that operates internally.

In testing these communication terminals, the test items are very diverse, and accordingly, the equipment used for testing is also various. Therefore, in testing a communication terminal, i.e., a device under test (DUT), a technician skilled in controlling the devices is required, and the technician needs to know the test standards for each item accurately.

At present, the test for the communication terminal is performed manually by a skilled engineer, and the test result is handwritten by the engineer, so that it takes a lot of time to test the communication terminal, But also the inconvenience.

Although various methods for solving such problems have been proposed, the test is still being performed by a skilled engineer, and it is a reality that the expert is preparing the test result by hand.

1. Korean Published Patent Application No. 10-2008-0082309 (published on September 11, 2008) 2. Korean Patent Publication No. 10-2012-0056178 (published on June 01, 2012)

SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and it is an object of the present invention to provide a communication terminal capable of automatically testing a communication terminal using a PC, And to provide a DUT test method that can be conveniently managed.

A test apparatus connected to a PC via a general purpose interface bus (GPIB) cable, a test apparatus connected to the PC through a UART cable or a USB cable, and connected to the test apparatus via a UTP cable, according to an embodiment of the present invention; A method of testing a device under test (DUT) mounted on the jig using a test instrument includes connecting the spectrum analyzer and the signal distributor of the test apparatus to set the test mode of the test apparatus to a transmit test mode , The PC sending a transmission test command to the DUT, the DUT generating a transmission test signal in response to the transmission test command and transmitting the generated transmission test signal to the test apparatus, Wherein the spectrum analyzer analyzes the transmission test signal received via the signal distributor and outputs Generating a transmit test data according to the result of, and a step in which the test device transmits the test data transmitted by the PC.

The method of testing the DUT may further include analyzing the transmission test data using the reference data and outputting transmission test result data according to the analysis result.

The method for testing the DUT further includes the step of the PC transmitting the transmission test result data to the server via the network.

The method of testing the DUT further includes outputting data corresponding to the test failure of the DUT if the PC fails to receive the transmission test data within the reference time.

The step of connecting the spectrum analyzer and the signal distributor includes reading the register information of the spectrum analyzer and confirming whether the spectrum analyzer is completely set up and whether the spectrum analyzer is connected to the signal distributor .

The method of testing DUT according to the embodiment of the present invention allows the PC to automatically control the test so that it is possible to test the test equipment well or to perform the test even for a novice who is not familiar with the test specification, have.

In addition, the method of testing a DUT according to an embodiment of the present invention can solve the inconvenience of preparing a test result by hand because the test result can be stored in a database that the PC can connect to a storage medium or a server.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS In order to more fully understand the drawings recited in the detailed description of the present invention, a detailed description of each drawing is provided.
1 is a schematic block diagram of a system for performing a method of testing a device under test (DUT) in accordance with an embodiment of the present invention.
2 is a schematic block diagram of the test apparatus shown in Fig.
FIG. 3 is a flowchart showing a schematic step of a method of testing a DUT according to an embodiment of the present invention.
4 is a data flow diagram for the transmission test of the DUT.
5 is a data flow chart for a DUT reception test.

It is to be understood that the specific structural or functional descriptions of embodiments of the present invention disclosed herein are only for the purpose of illustrating embodiments of the inventive concept, But may be embodied in many different forms and is not limited to the embodiments set forth herein.

Embodiments in accordance with the concepts of the present invention are capable of various modifications and may take various forms, so that the embodiments are illustrated in the drawings and described in detail herein. It should be understood, however, that it is not intended to limit the embodiments according to the concepts of the present invention to the particular forms disclosed, but includes all modifications, equivalents, or alternatives falling within the spirit and scope of the invention.

The terms first, second, etc. may be used to describe various elements, but the elements should not be limited by the terms. The terms are intended to distinguish one element from another, for example, without departing from the scope of the invention in accordance with the concepts of the present invention, the first element may be termed the second element, The second component may also be referred to as a first component.

It is to be understood that when an element is referred to as being "connected" or "connected" to another element, it may be directly connected or connected to the other element, . On the other hand, when an element is referred to as being "directly connected" or "directly connected" to another element, it should be understood that there are no other elements in between. Other expressions that describe the relationship between components, such as "between" and "between" or "neighboring to" and "directly adjacent to" should be interpreted as well.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The singular expressions include plural expressions unless the context clearly dictates otherwise. In this specification, the terms "comprises ", or" having ", and the like, specify that the presence of stated features, integers, , Steps, operations, components, parts, or combinations thereof, as a matter of principle.

Unless otherwise defined, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Terms such as those defined in commonly used dictionaries are to be interpreted as having a meaning consistent with the meaning of the context in the relevant art and, unless explicitly defined herein, are to be interpreted as ideal or overly formal Do not.

BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, the present invention will be described in detail with reference to the preferred embodiments of the present invention with reference to the accompanying drawings.

1 is a schematic block diagram of a system for performing a method of testing a device under test (DUT) in accordance with an embodiment of the present invention.

Referring to Figure 1, a system 10 capable of performing a method of testing a DUT includes a personal computer 20, a jig 30, a DUT 40, and a test apparatus 100 .

The PC 20 may control the operation of the DUT 40 and the test apparatus 100 to perform the overall test procedure. Although a PC 20 is shown in FIG. 1 for convenience of description, a smart phone, a tablet PC, a laptop computer, or a mobile internet device (MID) may be used instead of the PC 20 It is possible.

The PC 20 may store a program (e.g., software) necessary for performing a transmission / reception test procedure for the DUT 40 in a memory, and may execute the transmission / reception test procedure by executing a program stored in the memory.

The memory may be an internal memory of the PC 20 or an external memory that can be connected to the PC 20. [ The external memory may be a USB flash drive or a solid state drive (SSD).

According to an embodiment, the PC 20 may store test result data in a memory. The memory may be a hard disk drive (HDD), a solid state drive (SSD), an external HDD, an external SSD, a universal flash storage (UFS), or a USB flash drive, but is not limited thereto.

The jig 30 can be connected to the PC 20 via the second cable 60. [ For example, the second cable 60 may be implemented as a universal asynchronous receiver transmitter (UART) cable or a universal serial bus (USB) cable 60. However, the second cable 60 connecting the jig 30 and the PC 20 60 is not limited to a UART cable or a USB cable, but may be a different type of wired cable.

Since the jig 30 and the DUT 40 are electrically connected to each other and the wireless transmitting and receiving function through the antenna of the DUT 40 is cut off during the transmission and reception test, The test signal may be transmitted or received via the corresponding cable 60 and / or 70.

The DUT 40 is a terminal (or wireless communication device) that is tested by the system 10, and in accordance with an embodiment, the DUT 40 may be a wireless security terminal with bidirectional communication capability. The DUT 40 can communicate with the PC 20 and / or the test apparatus 100 using the jig 30. [ For example, the wireless security terminal may refer to a wireless communication terminal that can be used in an unmanned security system.

The test apparatus 100 can be connected to the PC 20 via the first cable 50. [ For example, the first cable 50 may be a general purpose interface bus (GPIB) cable 50, but is not limited thereto.

The test apparatus 100 can be connected to the jig 30 via the third cable 70. [ For example, the third cable 70 may be an unshielded twisted pair (UTP) cable 70, but is not limited thereto. The operation of the test apparatus 100 can be controlled by the PC 20 and the test data measured by the test apparatus 100 is transmitted to the PC 20 via the first cable 50 and then transmitted to the PC 20 (E.g., analyzed).

In accordance with an embodiment, the system 10 may communicate with the server 80.

The server 80 can receive the test result data output from the PC 20 and store the test result data in the database 90 that can be accessed by the server 80. [ For example, the server 80 and the PC 20 can exchange data through a wired network or a wireless network.

2 is a schematic block diagram of the test apparatus shown in Fig.

1 and 2, a test apparatus 100 includes a spectrum analyzer 110, a signal generator 120, a signal distributor 130, an ammeter 140, a voltmeter 150, and a plurality of interfaces .

The spectrum analyzer 110 may be used (or operated) when the test mode for the DUT 40 is the transmit test mode. For example, the spectrum analyzer 110 may analyze the spectrum of the transmitted test signal transmitted from the DUT 40 and transmit the results of the analysis (e.g., test data) to the signal distributor 130, the first interface (e.g., GPIB interface) And a first cable (e.g., a GPIB cable) 50 to the PC 20.

The signal generator 120 may be used (or actuated) when the test mode for the DUT 40 is the receive test mode. For example, the signal generator 120 generates a reception test signal in response to a reception test command output from the PC 20, and outputs the generated reception test signal to the signal distributor 130, a second interface (e.g., a UTP interface) And a DUT 40 mounted on the jig 30 through a second cable (e.g., a UTP cable) 70.

According to an embodiment, the signal distributor 130 may be connected to a DUT 40 mounted on a jig 30 via a second interface (e.g., a UTP interface) and a third cable (e.g., a UTP cable) have. According to another embodiment, the signal distributor 130 may be connected to the DUT 40 mounted on the jig 30 via a cable other than the UTP cable. At this time, the UTP interface may be replaced with an interface corresponding to the other cable.

The signal distributor 130 is connected to the spectrum analyzer 110 under the control of the PC 20 when the test mode for the DUT 40 is the transmission test mode. The signal distributor 130 is connected to the signal generator 120 under the control of the PC 20 when the test mode for the DUT 40 is the receive test mode. For example, the signal distributor 130 may be a relay, but is not limited thereto.

That is, the connection between the spectrum analyzer 110 and the signal distributor 130 and the connection between the signal generator 120 and the signal distributor 130 can be controlled by the PC 20.

The ammeter 140 measures the consumed current during the test operation on the DUT 40 and transmits the result of the measurement to the PC 20 and / or the DUT 40 via the signal distributor 130 and / .

According to an embodiment, the test apparatus 100 may further include a voltmeter 150. A voltmeter 150 may be used to supply the operating voltage to the DUT 40.

FIG. 3 is a flow chart showing a schematic step of a method of testing a DUT according to an embodiment of the present invention, and FIGS. 4 and 5 are data flow charts detailing a transmission test mode and a reception test mode, respectively.

Referring to FIGS. 1 to 3, the PC 20 may set the test mode of the test apparatus 100 to a transmit test mode or a receive test mode (S110).

For example, the PC 20 may transmit a transmission test mode setting signal to the test apparatus 100 for connecting the spectrum analyzer 110 and the signal distributor 130 via the first cable 50 have.

The signal distributor 130 is connected to the spectrum analyzer 110 in response to the transmission test mode setting signal input through the first interface and transmits the transmission test mode setting signal to the spectrum analyzer 110.

The spectrum analyzer 110 is set to be capable of performing a transmission test in response to the transmission test mode setting signal. For example, the spectrum analyzer 110 stores information indicating whether connection to the signal distributor 130 is established and information indicating whether the setting is completed in an internal register. Therefore, the test apparatus 100 is set to the transmission test mode.

The PC 20 transmits the transmission test mode setting signal to the test apparatus 100 and then reads the information stored in the internal register of the spectrum analyzer 110 (hereinafter referred to as internal register information) It is possible to determine (or confirm) whether the setting of the spectrum analyzer 110 is completed and whether the spectrum analyzer 110 and the signal distributor 130 are connected.

The PC 20 determines that the test mode of the test apparatus 100 is set to the transmit test mode based on the register information and then the PC 20 transmits the transmit test command for the transmit test to the first cable 60, To the DUT 40 mounted on the jig 30 (S120).

The DUT 40 generates a transmission test signal in response to the transmission test command, and transmits the generated transmission test signal to the test apparatus 100 via the third cable 70.

The spectrum analyzer 110 of the test apparatus 100 set in the transmission test mode analyzes (measures) the transmission test signal inputted through the second interface and the signal distributor 130, and performs a test And transmits the generated test data to the PC 20 via the first cable 50 (S130).

For example, the spectrum analyzer 110 may generate test data for one or more transmission test items.

The transmission test items include analysis (or measurement) of the frequency of the transmission test signal, analysis (or measurement) of the transmission power to the transmission test signal, analysis (or measurement) of the Adjacent Channel Power Ratio (ACPR) (Or measuring) the radiated power of the transmitted test signal, analysis (or measurement) of the occupied bandwidth of the transmitted test signal, and analysis (or measurement) of the modulation index (or modulation) of the transmitted test signal.

A constant voltage may be supplied to the spectrum analyzer 110 for analysis on frequency, analysis of transmission power, analysis of ACPR, analysis of radiation power, analysis of occupied frequency bandwidth, and analysis of modulation index (or modulation) . In this case, the supply of the constant voltage can be measured by the voltmeter 150.

For example, the test data for the transmit power may include the transmit power measured by the spectrum analyzer 110 and the consumed current measured by the ammeter 140.

The test data generated by the test apparatus 100 may include only the test data measured by the spectrum analyzer 110 or may be different from the test data measured by the spectrum analyzer 110, , And / or voltmeter 150). ≪ / RTI >

The number and order of test items that can be analyzed or measured by the spectrum analyzer 110 can be variously changed according to design specifications.

The PC 20 analyzes the test data transmitted from the test apparatus 100 using the reference data (S140), generates test result data corresponding to the result of the analysis, and outputs the generated test result data (S150). Here, the reference data may mean a reference value for the test items or a value defined as a standard.

Accordingly, the PC 20 compares each of the standard values included in the reference data with the measured value for each of the test items corresponding to the test data, and generates test result data for each of the test items according to the result of the comparison .

However, when the PC 20 fails to receive the test data from the test apparatus 100 within the reference time, the PC 20 can output the data corresponding to the test failure to the DUT 40. [

The PC 20 transmits the generated test result data to the server 80 via the wired network or the wireless network and the server 80 may store the received test result data in the database 90 at step S150.

The PC 20 can also transmit a receive test mode setting signal to the test device 100 for connecting the signal generator 120 and the signal distributor 130 via the first cable 50 for a receive test (S110).

The signal distributor 130 connects to the signal generator 120 in response to a receive test mode setting signal input through the first interface and the signal generator 120 performs a receive test in response to the receive test mode setting signal Lt; / RTI > The signal generator 120 stores in the internal register information indicating whether the setting is completed and whether the signal distributor 130 is connected. Thus, the test apparatus 100 is set to the receive test mode.

The PC 20 transmits the reception test mode setting signal to the test apparatus 100 and then reads the register information stored in the internal register of the signal generator 120 and reads the register information stored in the internal register of the signal generator 120, (Or confirms whether the signal distributor 120 is connected to the signal distributor 130).

The PC 20 determines that the test mode of the test apparatus 100 is set to the receive test mode based on the register information and then the PC 20 transmits a receive test command to the test apparatus 100 via the first cable 50, (S120).

The signal generator 120 generates a reception test signal in response to the reception test command and transmits the generated reception test signal to the DUT 40 via the second interface, the third cable 70, and the jig 30 .

Thereafter, in response to the reception test start signal transmitted from the PC 20, the DUT 40 receives the reception test signal transmitted from the test apparatus 100 (S130).

After receiving the reception test signal, the DUT 40 transmits the reception test data corresponding to the reception test signal to the PC 20 via the jig 30 and the second cable 60.

However, when the PC 20 fails to receive the reception test data from the DUT 40 within the reference time after the PC 20 transmits the reception test start signal to the DUT 40, 40). ≪ / RTI > The reference time (for example, 3 seconds) may be calculated from the time when the PC 20 transmits a reception test start signal to the DUT 40.

The PC 20 analyzes the received test data using the reference data (S140), generates test result data corresponding to the result of the analysis, and outputs the generated test result data (S150).

The PC 20 transmits the generated test result data to the server 80 via the wired network or the wireless network and the server 80 may store the received test result data in the database 90 at step S150.

3 and 4, the PC 20 transmits a transmission test mode setting signal TTMSS for setting the test apparatus 100 to the transmission test mode according to the test mode through the first cable 50, (S210).

The test apparatus 100 sets the test mode of the test apparatus 100 to the transmit test mode in response to the transmit test mode setting signal TTMSS (S220). At this time, the spectrum analyzer 110 and the signal distributor 130 are connected.

According to the embodiment, the PC 20 may wait for a predetermined time after transmitting the transmission test mode setting signal TTMSS to the test apparatus 100 for the next step (CASE1 in S230).

According to another embodiment, the PC 20 can read the register information R_READ of the spectrum analyzer 110 and confirm whether the test apparatus 100 is set to the transmit test mode (CASE2 in S230).

After the predetermined time has elapsed or the setting to the transmission test mode is completed, the PC 20 transmits a transmission test command TCMD to the DUT 140 mounted on the jig 30 via the second cable 60 S240).

The DUT 40 generates a transmission test signal TTS in response to a transmission test command TCMD and transmits the generated transmission test signal TTS to the test apparatus 100 at step S250.

The transmission test command (TCMD) may include the number and order of the above-described transmission test items.

The transmission test signal TTS output from the DUT 40 is transmitted to the spectrum analyzer 110 through the signal distributor 130 and the spectrum analyzer 110 analyzes or measures the transmission test signal TTS at step S260. . The transmission test signal (TTS) includes a signal related to the transmission test item.

Thereafter, the spectrum analyzer 110 transmits the analyzed or measured transmission test data TD to the PC via the first cable 50 (S270). According to an embodiment, the ammeter 140 measures the current consumed in the DUT 40 via the second interface, the second cable 70, and the jig 30 and sends the measured current to the first interface (50) to the PC (20).

The PC 20 analyzes the received test data TD using the reference data (S280), and outputs test result data corresponding to the result of the analysis (S290).

According to the embodiment, the PC 20 may store the test result data in a memory (internal memory or external memory) or send it to the server 80 (S290). The server 80 may store the received test result data in the database (S290).

Referring to FIGS. 3 and 5, the PC 20 transmits a setting signal RTMSS to set the test mode of the test apparatus 100 to the receive test mode (S310).

The test apparatus 100 sets the test mode of the test apparatus 100 to the receive test mode in response to the receive test mode setting signal RTMSS (S320). The test apparatus 100 connects the signal generator 120 and the signal distributor 130 in response to the receive test mode setting signal RTMSS.

According to the embodiment, the PC 20 may wait for a predetermined time after transmitting the reception test mode setting signal (RTMSS) to the test apparatus 100 for the next step (CASE1 in S330).

According to another embodiment, the PC 20 may read the register information R_READ of the signal generator 130 and check whether the test apparatus 100 is set to the receive test mode (CASE2 of S330).

After the predetermined time has elapsed or the setting to the transmission test mode is completed, the PC 20 transmits a reception test command (RCMD) to the signal generator 120 through the first cable 50 (S340).

The signal generator 120 generates a reception test signal RTS in response to a reception test command RCMD and transmits the generated reception test signal RTS to the DUT 40 in operation S350.

The PC 20 transmits a reception test start signal RTSS to the DUT 40 and the DUT 40 receives the reception test signal RTSS in response to the reception test start signal RTSS And starts the reception test (S360).

The receive test signal RTS generated by the signal generator 120 is transmitted to the DUT 40 through the signal distributor 130, the second interface, the third cable 70 and the jig 30, 40 generates reception test data RS corresponding to the reception test signal RTS and transmits the generated reception test data RS to the PC 20 via the second cable 60 at step S370.

The receive test signal RTS generated by the signal generator 120 is transmitted to the DUT 12 in accordance with the physical characteristics of the transmission path (e.g., the second interface, the third cable 70, and the transmission path formed by the jig 30) May be different from the received test signal (RTS) received by the receiver (40).

Therefore, the reception test data RS does not mean the reception test signal RTS generated by the signal generator 120, but refers to the reception test signal received by the DUT 40. Therefore, from the viewpoint of the DUT 40, the reception test signal RTS and the reception test data RS may be the same.

The PC 20 analyzes the received test data RS transmitted from the DUT 40 using the reference data (S380). According to the embodiment, the PC 20 can measure the bit error rate (BER) of the received test data RS generated by the signal generator 120. [

According to another embodiment, the PC 20 may measure the received signal strength indication (RSSI) of the received test data RS.

For example, the PC 20 can generate the test result data by comparing the BER of the reception test data RS with the reference BER. Further, the PC 20 can generate the test result data by comparing the RSSI of the reception test data RS with the reference RSSI.

The PC 20 outputs the test result data (S390). According to the embodiment, the PC 20 may store the test result data in a memory (internal memory or external memory) or send it to the server 80 (S390). The server 80 may store the received test result data in the database (S390).

According to the embodiment, one of the transmission test and the reception test may be performed first, and then the remaining one test may be automatically performed by the PC 20.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims. Accordingly, the true scope of the present invention should be determined by the technical idea of the appended claims.

10: DUT test system 90: database
20: PC 100: Test device
30: jig 110: spectrum analyzer
40: device under test (DUT) 120: signal generator
50: GPIB cable 130: signal distributor
60: UART or USB cable 140: Ammeter
70: UTP cable 150: voltmeter
80: Server

Claims (5)

A test apparatus connected to a PC via a GPIB (general purpose interface bus) cable, a test apparatus connected to the PC through a UART cable or a USB cable, and connected to the jig using a jig connected to the test apparatus via a UTP cable A method of testing a mounted device under test (DUT)
Connecting the spectrum analyzer and the signal distributor of the test apparatus so that the PC sets the test mode of the test apparatus to a transmit test mode;
The PC sending a transmit test command to the DUT;
The DUT generating a transmission test signal in response to the transmission test command and transmitting the generated transmission test signal to the test apparatus;
The spectrum analyzer of the test apparatus analyzing the transmit test signal received via the signal distributor and generating transmit test data according to the result of the analysis; And
And the test device sending the transmission test data to the PC. The method according to claim 1,
The PC analyzing the transmission test data using reference data and outputting transmission test result data according to the analysis result. 3. The method of claim 2,
And the PC transmitting the transmission test result data to a server via a network. The method according to claim 1,
And outputting data corresponding to a test failure of the DUT if the PC fails to receive the transmission test data within a reference time. The method of claim 1, wherein connecting the spectrum analyzer and the signal distributor comprises:
Wherein the PC reads register information of the spectrum analyzer and confirms whether the spectrum analyzer is completely set up and whether the spectrum analyzer is connected to the signal distributor.

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