KR20150072811A - The Method And Device For Real-Time Optical Spectrum Analysis - Google Patents

Abstract

The present invention relates to a method and a device for real-time optical spectrum analysis. The method comprises: a first cutting step of an analysis object of cutting a metal material in a state before processing in a predetermined size and length to be suitable for an analyzer; a second cutting step of an analysis object of precisely cutting the metal material cut to be suitable for the analyzer, in a rectangular shape suitable for optical wavelength detection; a diffraction angle forming step of an analysis object of forming diffraction angles by cutting the precisely cut metal material to analyze an optical wavelength according to optical wavelength bands; an inner communication space forming step of an analysis object of forming a communication space in the analysis object such that an optical irradiation path communicates from the diffraction angles to the inside; a diffraction angle surface grinding step of an analysis object of polishing coarseness of a cut portion surface on which the diffraction angles are formed and polishing the whole surface by grinding in a soft form; and a mechanism portion bonding step of bonding the mechanism portion by applying an adhesive onto the ground surface of the diffraction angles. The device manufactured by the method comprises: a housing plate which protects the inside; an analysis object which is installed and fixed in the housing plate, and integrally forms the diffraction angles corresponding to a specific wavelength band area; and a mechanism portion which is bonded and fixed to each diffraction angle surface of the analysis object, and irradiates, diffracts, reflects, and detects light.

Description

[0001] The present invention relates to a method and apparatus for real-time optical spectrum analysis,

The present invention relates to a method and an apparatus required for real-time optical spectrum analysis, and more particularly, to a method and apparatus for real-time optical spectrum analysis that are capable of quickly responding to analysis of optical wavelengths, And more particularly to a method and apparatus for real-time optical spectrum analysis to reduce the cost of failed manufacture of a required analyzer.

In general, the analyzer used for wavelength analysis of optical signals is OSA (Optical Spectrum Analyzer).

These analyzers usually analyze from 800 nm to 1650 nm and analyze wavelengths using a single diffraction grating and a single photodiode.

Although analyzing the wavelength has the advantage of decomposing a wide wavelength, it has a relatively low resolution and has a disadvantage in that it requires a time of several minutes when analyzing a light signal of a small intensity or precisely controlling the diffraction grating for accurate analysis.

Therefore, when two diffraction gratings or two mirrors are used and a photodiode array (PD Array) is used, the optical signal can be measured with high resolution and in a short time.

These spectrum analyzers are commonly referred to as interrogators and are often applied to measurements requiring fast response time.

In particular, Ibsen sells a rapidly analyzing spectrum analyzer called the Interrogation Monitor (abbreviated IMON), which uses two transmission diffraction gratings that they sell.

Since a general interrogator or IMON can use only a fixed wavelength band, there is a problem in that the internal arrangement of the optical unit must be changed if the measurement wavelength band is changed.

In particular, the discrepancy of the alignment due to the light path affects the measurement performance. Therefore, in order to use the product of the desired wavelength band, it is necessary to manufacture the ODM .

In addition to the cost, OSA can measure more than 1000nm, but IMON has a range of 40 ~ 80nm, so it is common that there is no product that should use the appropriate wavelength band when the application is changed.

For example, Ibsen received a quote from the Ibsen company for product development costs of up to 100 million when requested for the 1650-nm band, which makes it difficult to apply the new wavelength range to optical devices. .

Current line surveillance monitoring system or real-time diagnosis system confirms the abnormality of the line through the reflection spectrum of FBG (Fiber Bragg Grating). In the present communication network, there is connected a 32chnnel splitter to 144core (optical cable player).

In this case, the time required for measurement due to the low signal is 3 minutes or more per port. It takes more than 7 hours when applied to all 144 cores. In this case, it is difficult to monitor more than 3 times a day, and the follow-up is slowed down because it can be confirmed that an event (event) has occurred within 7 hours after the occurrence of an anomaly.

In this paper, we propose a spectral analyzer (IMON) using two diffraction gratings of Ibsen in order to observe the light beam with 1650nm band light source.

At this time, the problem experienced in the manufacturing process is that it is difficult to arrange the alignment because the interrogator such as IMON uses various optical elements. It is possible to modify the alignment when the similar function is implemented by purchasing the product. However, since there is a disadvantage that the productivity due to the long water working process is inferior, there is a need to make an easier alignment tool.

However, in order to maximize the productivity, the problem that can occur when manufacturing optical parts without alignment function can not be corrected at the time of manufacturing, so that the failure cost for manufacturing is large.

On the other hand, domestic and overseas telecom companies have already completed an internal review to introduce a line surveillance monitoring system, and KT has already established a line surveillance system through a pilot project.

However, unlike the expectation of telcos, there are some problems to be solved in order to construct a monitoring system for optical subscriber terminals. Optical time domain reflectometer (OTDR) It is impossible to identify the optical line terminal without accurate information.

To identify each identification code, a WDM (Broadband-Division Multiplexing) method should be used in the U-band region, but this may disturb the communication signal. If a broadband light source (BLS, Broad-Band Light Source) of 1700 nm or more is used as a light source that is independent of the communication signal, it is independent of the PD sensitivity of the modem and thus has an advantage that the optical subscriber can be identified without disturbance of the communication signal.

However, in the case of the analyzer for analyzing the surveillance light, since a general InGaAs PD diode having a light sensitivity range of 1100 to 1650 nm is used, it is necessary to use a high price product of a specific company in order to analyze the monitoring light source in the 1700 nm band.

Therefore, there is a niche market for a specialized optical analyzer market that can utilize the U-band used in the surveillance optical domain to the maximum, so it is necessary to launch a product to preoccupy this field.

In addition, analyzer released from company A, which is one of the special parts for U-band, has the advantage of measuring various wavelength bands, but as it pursues a wide bandwidth target, it forms a high price due to expensive parts , Wavelength accuracy for subscriber identification and fast scan speed are required, and the resolution is degraded when covering a wide wavelength band.

Meanwhile, the conventional optical wavelength analyzer is provided in such a manner that the mechanical parts are fastened to the perforations 2 formed on the substrate 1, as shown in FIGS. 1 and 2.

That is, the light source unit 3, the first and second grating units 4 and 5, the mirror unit 6, and the PD array units 7 are disposed on the substrate with a predetermined gap therebetween, 1 in a manner such that they are fastened to the perforations 2.

The reason why the optical device parts are fastened on the substrate 1 is that it is necessary to adjust the separation distance or the diffraction angle of the mechanical parts according to the optical wavelength range, The wavelength of the light to be analyzed can be analyzed.

However, this analyzer is fastened with adjustable fastening means (such as bolts and nuts) to the perforations 2 on the substrate 1 so that adjustment to the mechanisms is required, It is difficult to analyze a desired wavelength of light when fine flow or fine motion (distortion, diffraction angle change, distance error, etc.) occurs with respect to the wavelength.

In addition, when errors (distortion, diffraction angle change, distance error, etc.) occur in the adjustment of such devices, there is a problem that the time and cost for correcting these errors are excessively consumed.

Indeed, Ibsen, one of the companies that deal with analyzing optical wavelengths, can be represented, and if you ask for an analyzer for the desired wavelength range, It is difficult to realize an analyzer suitable for the region, and correcting errors (distortion, diffraction angle change, distance error, etc.) for the above-mentioned mechanism parts.

Alignment to the optics, the complex locking of these optics, reduces the precision of the optical wavelength analysis. That is, when the mechanism parts are detachably attached to the alignment plate, it is necessary to manually control the diffraction angle adjustment, the distance, or the position of the mechanism parts suitable for the desired wavelength band. In this adjustment control, Analysis is difficult, and the more optical instruments there are, the more precise alignment work is required, and the accuracy of the analysis becomes less.

In addition, since the detachment method involves a clearance or flow of fine mechanical parts, it is difficult to meet the accuracy of the analysis relatively. Therefore, a technique capable of improving the precision of the analysis is required.

In addition, in the conventional analyzer, a method is employed in which optical instruments are fixed after digging the inside of the substrate from the top surface to the bottom surface. However, since the digging operation is difficult and inconvenient, It is not easy to realize the horizontal plane of the depressed surface.

Conventional analyzers for analyzing optical wavelengths are disclosed in U.S. Patent Nos. 2002-0154855, 2003-0067645, and 2003-0030793, filed by Ibsen, and 10- 0610534, 10-1039627, 10-1306930, 10-2003-0069799, 10-2009-0074520, etc. have been disclosed.

U.S. Patent Application Publication No. 2002-0154855, U.S. Published Patent Application No. 2003-0067645, U.S. Published Patent Application No. 2003-0030793, Korean Patent No. 10-0618534, Korean Patent No. 10-1039627, Korean Patent No. 10-1306930, Korean Patent Publication No. 10-2003-0069799, Korean Patent Publication No. 10-2009-0074520.

In order to solve the above-described problems, there is an absolute error through the operation of machining at one reference point in aligning the optical mechanism parts. However, when the diffraction angle is integrally formed in the analyzer A method for real time optical spectrum analysis and a device manufactured therefrom.

According to an aspect of the present invention, there is provided a method of manufacturing a plasma processing apparatus, comprising: a first cutting step of an analyzer for cutting a metallic material in a pre-processing state to a predetermined size and length to fit the analyzer; A second cutting step of an analyzer which precisely cuts a square shape suitable for optical wavelength detection and a diffraction grating of an analyte which is formed by cutting diffraction angles so that optical wavelength analysis can be performed on a precisely cut metallic material in accordance with a light wavelength region band A forming step of forming an internal communication space of the analyzer to form a communication space inside the analyzer so that the light irradiation path can be communicated from the diffraction angles to the inside thereof, A diffraction grating surface grinding step of grinding the grating and grinding the entire surface into a flexible shape, and a step of grinding the surface of the grating diffraction grating with an adhesive Four will be the method for real-time optical spectrum analysis that includes a bonding step of the mechanism for joining the mechanism, characterized in one example.

The diffraction angle forming step of the analyzer may be a process for forming a diffraction angle on the side surface of the analyte in order to precisely align the diffraction angle, starting from any point on the basis of the analyte, Which is a method for real-time optical spectrum analysis.

The diffraction angle forming step of the analyzer is a method for real-time optical spectrum analysis in which a step is formed in a lower part and a side part of a diffraction angle together with a diffraction angle formation by a cutting method for a side part of the analyzer .

The diffraction angle forming step of the analyzer is an example of a method for real-time optical spectrum analysis in which an analyte is worked by a milling method which is an example of a cutting method.

The internal communication space forming step is a method for real time optical spectrum analysis in which a communication space is formed by a boring method for the inside of the analyzer.

A housing plate for protecting the inside of the housing plate; an analyzer for integrally forming diffraction angles corresponding to a specific wavelength band region while being fixed inside the housing plate; And is a device for real-time optical spectrum analysis including a mechanism for performing light irradiation and diffraction, reflection, and detection.

And the diffraction angles of the analyte are formed by cutting, and are held in a fixed state along a specific wavelength band region, which is a device for real-time optical spectrum analysis.

The mechanism portion includes a light source portion corresponding to the light source, a first and second grating portions for diffracting the light emitted from the light source portion, a mirror portion for reflecting the light diffracted by the first and second grating portions, And a PD array unit for receiving the light reflected by the light source and detecting the wavelength of the light.

Wherein the collimator is a green lens capable of narrowing a spot size of an irradiation of light and includes a filter for attaching a filter for removing noise light, And is a device for optical spectrum analysis.

The first and second grating units may further include a gripper for bonding to the diffraction angle surface of the analyzer, and may be formed of a transmissive grating or a reflective grating. When the transmissive grating is used, the transmissivity of the light wavelength may be increased A device for real-time optical spectrum analysis that allows an AR (anti-reflection) coating to be applied on the front of the grating and to further engage the irregular gratings on the lens so that the angle of the transmitted light wavelength can be kept constant or narrowed or widened It is another feature of the example.

The lens is a device for real-time optical spectrum analysis using a lens made of an additive material such as germanium (Ge), zinc selenide (ZnSe) or zinc selenide (ZnSe) for improving the transmittance of far infrared ray It is characterized by another example.

As described above, the present invention can reduce the error in the optical wavelength analysis that can be caused by the arrangement alignment of the optical mechanism portions proposed in the prior art, and reduce the manufacturing time It is possible to reduce manufacturing cost as well as speed.

In addition, it is possible to improve the slow response to the optical signal which may be caused by the monitoring of the line with the broadband light source of 1650nm or more in bandwidth, to provide promptness for the follow-up action, It is possible to identify the optical subscriber without disturbance of the communication signal regardless of the PD sensitivity of the modem when using a broadband light source of 1700 nm or more and to utilize it as a low cost module to replace the high cost product group used at this time.

1 is a plan view showing a conventional analyzer;
FIG. 2 is a plan view showing in detail the enlarged view of FIG. 1; FIG.
3 is a block diagram illustrating a sequential block diagram of a method for real-time optical spectrum analysis of the present invention.
Figure 4 illustrates a process of transforming a specific shape of an analyte associated with the steps shown in the block diagram of Figure 2;
5 is a perspective view showing an apparatus of an analyte manufactured by a method for real-time optical spectral analysis of the present invention.
FIG. 6 is an exploded perspective view of the instrument of FIG.
Figure 7 is a plan view of the apparatus of the analyzer shown in Figures 5 and 6 in plan view.
FIG. 8 is a plan view of the apparatus of the analyzer shown in FIGS. 5 through 7, showing any starting points for implementing a diffraction angular shape; FIG.
9 is a schematic diagram conceptually illustrating that the apparatus of the present invention can be applied to a monitoring system for line monitoring using a broadband light source.
10 is a graph showing the optical sensitivity of an apparatus of the present invention to optical signals originating from a broadband light source region;

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the limits of scope of the invention, , And should be interpreted based on technical ideas throughout the specification of the present invention.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

The method for real-time optical spectrum analysis according to the present invention is characterized in that as shown in Figs. 3 to 4, the first cutting step S1 of the analyte, the second cutting step S2 of the analyte, A forming step S3, an internal communication space forming step S4 of the analyzer, a diffraction grating surface grinding step S5 of the analyzer, and a bonding step S6 of the mechanism part.

The analyzer refers to a metallic material collectively, and it is used as a material of a rigid material, in particular, an analyzer, and its shape can be diversified before processing.

In the first cutting step S1 of the analyte,

Before the processing, various types of analytes are prepared, and the analytes are cut to an appropriate size and length suitable for use in the analyzer.

That is, since the prepared analytes are in a state prior to processing, the size, length, and shape thereof can be diversified. Therefore, among these analytes, suitable analytes that can be used for the analyzer are classified, and then the analyte is cut to the size and length suitable for the analyzer among the classified analytes.

In the second cutting step S2 of the analyte,

Precisely cutting an analyte cut with a size and a length suitable for the analyzer, and precisely cutting the analyte into a square shape so as to be suitable for optical wavelength detection.

The diffraction angle forming step (S3)

Since the analytical body in a state of being precisely cut in a rectangular shape must have different angles depending on the region of the wavelength band, a portion corresponding to the side of the analytical body is cut by a milling cutter to form an angle.

That is, the angle refers to an angle that makes the incident direction of the incident wave and the diffraction wave when the light is irradiated from the light source, and the angular formation of the diffraction angle changes depending on the wavelength band region.

At this time, the calculation of the diffraction direction of the light can be performed by the Grating Solver (diffraction grating theory program).

In order to form such a diffraction angle, a cutting operation is performed on the side surface of the analyzer. At this time, in the diffraction angle formation, accurate alignment of the diffraction angle is required according to the region of the wavelength band. That is, the diffraction angle has an inaccurate alignment or an error occurs, which makes it impossible to accurately detect the light wavelength to be examined.

In other words, the line-by-line irradiation mechanism for the light irradiation angle, irradiation length, etc. must be accurate from the light source to the PD array where the light wavelength is finally analyzed.

For accurate alignment of the diffraction angles described above, it is preferable that the diffraction angles are sequentially formed starting from any one of the reference points of the analyte when the diffraction angle is formed on the side surface of the analyte.

Further, at the time of forming the diffraction angle of the analyte, an operation of forming an L-shaped step at the lower end and the side end of the diffraction angle may be performed concurrently.

The internal communication space forming step (S4)

After the formation of the diffraction angle, a boring operation is performed on the inside of the analyzer so that a communication space can be secured inside the analyzer so that there is no interference with the irradiation in the transmission process along with the transmission of the light source into the diffraction angle.

Of course, in the case of such boring, it is possible to borate the inside of one analyzer, but it is also possible to borrow the inside of the two analyzers after dividing the analyzer into two by the center. In this way, the division of the analyzer can facilitate the boring operation, and the time required for the operation can also be accelerated.

That is, after the internal boring of the divided analytes is finished, the divided analytes may be integrated.

The diffraction angle surface grinding step (S5) of the analyte ,

A grinding step is performed to trim the roughness of the cutting surface caused by the milling operation for forming the step of the diffraction angle and the diffraction angle surface or the boring operation for forming the internal communication space of the analyzer in the previous step.

That is, by performing a grinding step on the entire machined surface area of the analyte after the milling or boring operations in the previous step, the machined surface of the analyte is transformed into a flexible shape.

In the bonding step (S6)

Mechanism portions respectively corresponding to a plurality of diffraction angle portions formed on the side of the analyte are fixed to each diffraction angle surface by bonding using an adhesive.

That is, the mechanism units include a collimator corresponding to the light source unit, first and second gratings for diffracting the light emitted from the collimator, mirrors for reflecting the light diffracted through the first and second grating units, A PD array that receives the light reflected from the mirror and finally detects the optical wavelength, and the like.

Accordingly, the mechanical parts are bonded and fixed to the corresponding diffraction angular surface formed on the sides of the analyzer with an adhesive, thereby providing a method for real-time optical spectrum analysis of the present invention according to a specific wavelength band.

Hereinafter, an apparatus for real-time optical spectrum analysis of the present invention manufactured through the above-described method will be described in detail.

As shown in FIGS. 5 to 8, the housing 10 includes a housing plate (not shown) for protecting the inside thereof, an analyzer 10 installed in the housing plate, And a mechanism portion that is provided in the housing.

The housing plate (not shown) protects the inside of the analyzer 10 from the outside, and the analyzer 10 forms the diffraction angles 11, 12, 13, The formation of the diffraction angles (11, 12, 13, 14) and the bar (11, 12, 13, 14) is started from any point in the analyte (10) that can be implemented to realize a series of precise irradiation angle mechanisms, Are sequentially formed.

That is, the diffraction angles 11, 12, 13 and 14 are applied differently depending on the wavelength region, and the formation of the diffraction angles 11, 12, 13 and 14 can be applied differently depending on the required wavelength region.

The surfaces of the respective diffraction angles (11, 12, 13, 14) formed on the analyte (10) are in a state of being bonded to the respective mechanical parts, and the mechanism part is composed of a collimator corresponding to the light source part (20) The first and second grating portions 21 and 22 for diffracting the light, the mirror portion 23 for reflecting light, and the PD array portion 24 for receiving the light and detecting the light wavelength.

The first and second grating portions 21 and 22 are bonded to the surfaces of the diffraction gratings 11 and 12 and the grating portions 21 and 22 are bonded to the surfaces of the diffraction gratings 11 and 12, The mirror portion 23 is bonded to the surface of the diffraction angle 13 and the PD array portion 24 is bonded to the surface of the diffraction angle 14. [

At this time, the communication spaces communicating with the inside are formed on the surfaces of the diffraction angles 11, 12, 13, and 14, that is, the communication space 11a is formed on the surface of the diffraction angle 11, A communication space 12a is formed on the surface of the diffraction grating 12 and a communication space of the same type as that of the communication spaces 11a and 12a is formed on the surfaces of the diffraction gratings 13 and 14 Respectively. That is, it is not shown in the drawing.

The first and second grating portions 21 and 22, the mirror portion 23 and the PD array portion 24 are fixed to respective surfaces of the diffraction gratings 11, 12, The step portions 15 and 16 are formed on one side and the other side of the surface of the diffraction gratings 11, 12, 13 and 14, respectively. That is, the stepped portions 15 and 16 may be connected to each other, or the stepped portions 15 may be formed on both the left and right sides with respect to the stepped portion 16 formed in the lower direction.

The first and second grating portions 21 and 22 are one type of diffraction grating that is one of the spectroscopic elements using optical diffraction and the PD array portion 24 is an abbreviation of a photodiode. It is a kind of optical sensor that converts into energy.

At this time, the light emitted from the collimator, which is the light source unit 20, is reflected through the mirror unit 23 in a state of being sequentially diffracted through the first grating unit 21 and the second grating unit 22 And the optical wavelength is analyzed by the eddy-current array unit 24.

The light source part 20, the first and second grating parts 21 and 22, the mirror part 23 and the PD array part 24 are formed on the surfaces of the diffraction angles 11, 12, 13 and 14 of the analyte 10, It is possible to prevent fine movement or manipulation which may be caused by the optical mechanism provided in the detachable form on the conventional analysis plate.

That is, in the conventional analyzer, it is important to set the diffraction angle of the optical instrument. If the diffraction angle of the mechanical part set according to the requirement of the specific wavelength band is changed by fine movement or operation, The wavelengths can not be fully analyzed by the mechanism parts.

By knowing these points and adjusting the angle setting or cutting the diffraction angles (11, 12, 13, 14) corresponding to the specific wavelength band region from the fabrication stage upon request of the specific wavelength band to the analyte .

Therefore, since the diffraction angles 11, 12, 13, and 14 formed on the analyte 10 have a fixed state, the mechanical parts bonded to the diffraction angles 11, 12, 13, So that it is possible to continuously analyze the optical wavelength of a specific wavelength band by reducing the diffraction angle error of the conventional mechanical unit.

Characterized in that the analyzer (10) forms a diffraction angle (11, 12, 13, 14) in a manner of being cut on its side so that there is no arbitrary manipulation or fine movement on the mechanism parts.

That is, the mechanical parts bonded to the diffraction angles (11, 12, 13, 14) by the formation of the fixed diffraction angles (11, 12, 13, 14) , And diffraction angles (11, 12, 13, 14) capable of detecting an accurate light wavelength are formed on the analyte (10).

A collimator may be used as the light source unit 20. The collimator may employ a green lens. The green lens may reduce the spot size when the light is irradiated. (Not shown) for attaching a filter when the analyzer 10 is placed in the seating hole 10a of the analyzer 10, so that the analyzer 10 has a characteristic of being able to remove noise light.

The first and second grating portions 21 and 22 may further include a gripper (not shown) at the time of bonding to the surfaces of the diffraction angles 11, 12, 13 and 14 of the analyzer 10 At this time, the gripper can further strengthen the bonding of the first and second grating portions 21 and 22, and the problem of falling due to the weakening of the adhesive is compensated.

The first and second grating portions 21 and 22 may use both transmissive gratings and reflective gratings for light wavelengths. In this case, an AR (anti reflection) coating may be applied to the entire surface of the grating when using the transmission grating It increases the transmittance of the optical wavelength.

In addition, the first and second grating portions 21 and 22 may have a concave-convex grating formed in the lens so that the angle of the wavelength of the transmitted light can be constantly maintained, narrowed, or widened, And can be utilized for various functions. It is needless to say that the lens uses a concave lens or a convex lens.

The first and second grating portions 21 and 22 may be formed by adding materials such as germanium (Ge), zinc selenide (ZnSe) and zinc selenide (ZnSe) in order to increase the transmittance of far- May be used.

In addition, the apparatus of the present invention configured as described above can be applied to a system for real-time optical spectrum analysis of a U-band monitoring optical signal, as shown in FIG.

That is, in the non-communication region of the U-band region, since existing PD has a characteristic of having sensitivity in the region of 1620 to 1750 nm, it can cause confusion with the signal light in the wide band light source (SLED) centered at 1625 nm or 1650 nm, The present invention can be applied to a Narrow Band (NB) light source that can block the problem area by using Chirped Fiber Bragg Grating (CFBG).

As shown in FIG. 10, when InGaAs having different optical sensitivities are used, for example, when the 1650 nm band or the 1700 nm wavelength band is used as the wavelength for subscriber monitoring, the modem has the characteristics of the conventional InGaAs PD, And the information of each subscriber can be confirmed by tagging the information of the subscriber using the FBG sensor and converting the information through signal analysis.

In general, in the broadband area, the modem can only reflect the area of 1650 wavelengths, and there is a problem in that the light sensitivity is significantly lowered in the higher wavelength range because the modem can not detect it due to the confusion between the normal signal and the optical signal .

Therefore, when the optical signal ranging from the 1650 nm wavelength range to the 1750 nm wavelength range is used, the problem that the conventional modem can not detect light can be solved.

In other words, a typical example would be a 1625 nm or 1650 nm signal from a 124-core line that can be detected from an OSA (Optical Spectrum Analyzer) through a modem filter (FBG), where the filter (FBG) The normal signal and the surveillance signal are all transmitted through the filter (FBG), thereby causing confusion in the PD (photodiode).

Accordingly, when the device of the present invention is used in a wavelength range exceeding 1650 nm, which is out of the area of the conventional PD (photodiode), it is possible to eliminate the cause of the crosstalk described above.

Of course, the wavelength band of 1650 nm to 1700 nm is an example and can be applied to other wavelength ranges, for example, the wavelength band of 800 nm instead of the monitoring light source of the wavelength band of 1650 nm to 1700 nm.

In addition, it can be applied not only to the U-band but also to the communication area, the visible light area, and the far-infrared area.

10: Analyte 10a: Placement hole
11, 12, 13, 14: diffraction angles 11a, 12a:
15, 16:
20: light source unit 21, 22: first and second grating units
23: mirror part 24:

Claims (11)

A first cutting step of an analyzer which cuts a metallic material in a pre-processing state to a predetermined size and length to fit the analyzer;
A second cutting step of an analyzer which precisely cuts a metallic material cut to fit the analyzer into a square shape suitable for light wavelength detection;
A step of forming a diffraction angle of an analyte to be formed by cutting out diffraction angles so that optical wavelength analysis can be performed on a precisely cut metallic material according to a light wavelength region;
A step of forming an internal communication space of the analyzer to form a communication space inside the analyzer so that the light irradiation path can be communicated from the diffraction angles to the inside thereof;
A diffraction grating surface grinding step of grinding the grinding surface of the cutting surface forming the diffraction angle and grinding the entire surface into a flexible shape;
A bonding step of applying a glue to the surface of the ground diffraction angle to bond the mechanism part;
/ RTI > A method for real-time optical spectrum analysis. The method according to claim 1, wherein the diffraction angle forming step of the analyzer comprises:
Characterized in that, for accurate alignment of the diffraction angles, a diffraction angle is formed sequentially starting from any one point which is the reference of the analyte when forming the diffraction angle on the side of the analyte Lt; / RTI > The method according to claim 1, wherein the diffraction angle forming step of the analyzer comprises:
Characterized in that a cutting method for the side of the analyzer is combined with the formation of a step at the lower and side of the diffraction angle with the formation of the diffraction angle. The method according to claim 3, wherein the diffraction angle forming step of the analyzer comprises:
A method for real-time optical spectrum analysis, characterized in that the analyte is fabricated by milling, an example of a cutting method. The method according to claim 1, wherein the internal communication space forming step comprises:
Wherein a communication space is formed by a boring method for the inside of the analyzer. A housing plate for protecting the interior;
An analyzing body integrally formed with the diffraction angles corresponding to a specific wavelength band region while being fixed inside the housing plate;
A mechanism for irradiating and diffracting, reflecting, and detecting light while being fixedly bonded to each diffraction grating surface of the analyzer;
And an optical spectrum analyzer for analyzing the optical spectrum. The method according to claim 6,
Wherein the diffracted angles of the analyte are maintained in a fixed state along a specific wavelength band region while being formed by cutting. 8. The apparatus according to claim 7,
A light source unit corresponding to a light source;
First and second grating portions for diffracting light emitted from the light source portion;
A mirror portion that reflects light diffracted by the first and second grating portions;
A PD array unit receiving light reflected by the mirror unit and detecting an optical wavelength;
Wherein the optical spectrum analyzer comprises: The light source unit according to claim 8,
Wherein a collimator is used and the collimator is further comprised of a green lens capable of narrowing an irradiation spot radius of the light and further comprises a filter mounting fixture for removing noise light, Apparatus for optical spectrum analysis. [10] The apparatus of claim 8,
A diffraction grating of the analyte is further provided with a gripper upon bonding, and is composed of a transmissive grating or a reflective grating. An AR (anti reflection) coating is applied on the entire surface of the grating so as to increase the transmittance of the light wavelength when using the transmission grating So as to further engage the concave-convex grid in the lens so that the angle of the transmitted light wavelength is kept constant or narrowed or widened. 11. The lens of claim 10,
Wherein a lens made of an additive material such as germanium (Ge) or zinc selenide (ZnSe) is used for improving the transmittance of far-infrared rays during light irradiation.

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